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H01L2224/13188

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Parent Industries

HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00

Current Industry

H01L2224/13188Glasses

Industries

Patents Grantslast 30 patents

Information Patent Grant
Detecting defective connections in stacked memory devices
- Patent number 9,607,716
- Issue date Mar 28, 2017
- Internatiional Business Machines Corporation
- Charles A. Kilmer
- G11 - INFORMATION STORAGE
Information Patent Grant
Microelectronic packages and methods therefor
- Patent number 7,554,206
- Issue date Jun 30, 2009
- Tessera, Inc.
- Belgacem Haba
- G01 - MEASURING TESTING
Information Patent Grant
Microelectronic packages and methods therefor
- Patent number 7,176,043
- Issue date Feb 13, 2007
- Tessera, Inc.
- Belgacem Haba
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LIQUID METAL SHIELD FOR FINE PITCH INTERCONNECTS
- Publication number 20240145420
- Publication date May 2, 2024
- Intel Corporation
- Bok Eng CHEAH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR MANUFACTURING SAME
- Publication number 20230238344
- Publication date Jul 27, 2023
- Kabushiki Kaisha Toshiba
- Tomohiro SAITO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SEMICONDUCTOR APPARATUS AND METHOD FOR FABRICATING THE SAME
- Publication number 20120273940
- Publication date Nov 1, 2012
- Hynix Semiconductor Inc.
- Seung Hee JO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Microelectronic packages and methods therefor
- Publication number 20070077677
- Publication date Apr 5, 2007
- Tessera, Inc.
- Belgacem Haba
- G01 - MEASURING TESTING
Information Patent Application
Microelectronic packages and methods therefor
- Publication number 20050181544
- Publication date Aug 18, 2005
- Tessera, Inc.
- Belgacem Haba
- G01 - MEASURING TESTING