Hall devices configured for spinning current measurements

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CPC
G01R33/075

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R33/00Arrangements or instruments for measuring magnetic variables

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G01R33/075Hall devices configured for spinning current measurements

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Hall electromotive force signal detection circuit having a differen...
- Patent number 11,946,987
- Issue date Apr 2, 2024
- Asahi Kasei Microdevices Corporation
- Shigeki Okatake
- G01 - MEASURING TESTING
Information Patent Grant
Hall element and electronic component
- Patent number 11,895,929
- Issue date Feb 6, 2024
- Rohm Co., Ltd.
- Tetsuya Kitade
- G01 - MEASURING TESTING
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Chopper system and method
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- Issue date Jan 2, 2024
- Infineon Technologies AG
- Mario Motz
- H03 - BASIC ELECTRONIC CIRCUITRY
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Transistor devices and methods for producing transistor devices
- Patent number 11,774,523
- Issue date Oct 3, 2023
- Infineon Technologies AG
- Stephan Leisenheimer
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing circuit for reducing ripple in an output signal o...
- Patent number 11,693,066
- Issue date Jul 4, 2023
- Infineon Technologies AG
- Yongjia Li
- G01 - MEASURING TESTING
Information Patent Grant
Hall device
- Patent number 11,678,588
- Issue date Jun 13, 2023
- Infineon Technologies AG
- Udo Ausserlechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hall sensor readout circuit, corresponding device and method
- Patent number 11,675,024
- Issue date Jun 13, 2023
- STMicroelectronics S.r.l.
- Paolo Angelini
- G01 - MEASURING TESTING
Information Patent Grant
Apparatuses and methods for electrical current sensing
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- Issue date Jun 6, 2023
- Infineon Technologies AG
- Mario Motz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Spin-based detection of terahertz and sub-terahertz electromagnetic...
- Patent number 11,639,975
- Issue date May 2, 2023
- The Regents of the University of California
- Jing Shi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Position sensing system with improved accuracy and the method thereof
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- Issue date Apr 18, 2023
- Chengdu Monolithic Power Systems Co., Ltd.
- Tianzhu Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Current sensor having stray field immunity
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- Issue date Jan 24, 2023
- ALLEGRO MICROSYSTEMS, LLC
- Robert A. Briano
- G01 - MEASURING TESTING
Information Patent Grant
Digital phase tracking filter for position sensing
- Patent number 11,536,587
- Issue date Dec 27, 2022
- Melexis Technologies SA
- Eric Sachse
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Semiconductor device
- Patent number 11,536,783
- Issue date Dec 27, 2022
- ABLIC INC.
- Takaaki Hioka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Digitally-controlled output amplitude of analog sensor signal
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- Issue date Nov 15, 2022
- Infineon Technologies AG
- Mario Motz
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Hall electromotive force signal detection circuit having a differen...
- Patent number 11,493,569
- Issue date Nov 8, 2022
- Asahi Kasei Microdevices Corporation
- Shigeki Okatake
- G01 - MEASURING TESTING
Information Patent Grant
Hall sensor circuit
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- Issue date Jun 7, 2022
- Texas Instruments Incorporated
- Arup Polley
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor
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- Issue date May 31, 2022
- Infineon Technologies AG
- Mario Motz
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor for angle detection with a phase-locked loop
- Patent number 11,287,489
- Issue date Mar 29, 2022
- ALLEGRO MICROSYSTEMS, LLC
- Steven Daubert
- G01 - MEASURING TESTING
Information Patent Grant
Bridge sensor biasing and readout
- Patent number 11,255,696
- Issue date Feb 22, 2022
- Melexis Technologies SA
- Johan Raman
- G01 - MEASURING TESTING
Information Patent Grant
Transistor devices and methods for producing transistor devices
- Patent number 11,237,226
- Issue date Feb 1, 2022
- Infineon Technologies AG
- Stephan Leisenheimer
- G01 - MEASURING TESTING
Information Patent Grant
3-contact vertical hall sensor elements connected in a ring and rel...
- Patent number 11,205,748
- Issue date Dec 21, 2021
- Infineon Technologies AG
- Udo Ausserlechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensor circuit with offset compensation
- Patent number 11,163,020
- Issue date Nov 2, 2021
- MELEXIS BULGARIA LTD
- Rumen Marinov Peev
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field sensor for angle detection with a phase-locked loop
- Patent number 11,163,022
- Issue date Nov 2, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Steven Daubert
- G01 - MEASURING TESTING
Information Patent Grant
Hall sensor apparatus and method for measuring a magnetic field
- Patent number 11,073,574
- Issue date Jul 27, 2021
- Infineon Technologies AG
- Udo Ausserlechner
- G01 - MEASURING TESTING
Information Patent Grant
Fast response magnetic field sensors and associated methods for rem...
- Patent number 11,047,933
- Issue date Jun 29, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Hernán D. Romero
- G01 - MEASURING TESTING
Information Patent Grant
Hall element for mitigating current concentration and fabrication m...
- Patent number 11,029,372
- Issue date Jun 8, 2021
- Asahi Kasei Microdevices Corporation
- Tsuyoshi Akagi
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and method of adjusting the same
- Patent number 11,016,151
- Issue date May 25, 2021
- ABLIC INC.
- Takaaki Hioka
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing arrangement for a hall sensor and signal processi...
- Patent number 11,009,563
- Issue date May 18, 2021
- ams AG
- Dominik Ruck
- G01 - MEASURING TESTING
Information Patent Grant
Component semiconductor structure
- Patent number 11,005,033
- Issue date May 11, 2021
- TDK-MICRONAS GMBH
- Martin Cornils
- G01 - MEASURING TESTING
Information Patent Grant
Ultra high-sensitivity micro magnetic sensor
- Patent number 10,989,768
- Issue date Apr 27, 2021
- Asahi Intecc Co., Ltd.
- Yoshinobu Honkura
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPIN HALL MAGNETIC SENSOR AND METHOD OF MEASURING MAGNETORESISTANCE...
- Publication number 20240393413
- Publication date Nov 28, 2024
- Hyundai Motor Company
- Joon-Hyun Kwon
- G01 - MEASURING TESTING
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MAGNETIZATION ROTATIONAL ELEMENT, MAGNETORESISTANCE EFFECT ELEMENT,...
- Publication number 20240385263
- Publication date Nov 21, 2024
- TDK Corporation
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- G01 - MEASURING TESTING
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WIDE BANDWIDTH HALL SENSING CIRCUITRY WITH OFFSET COMPENSATION AND...
- Publication number 20240337708
- Publication date Oct 10, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Dimitar Trifonov
- G01 - MEASURING TESTING
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SPIN ORBIT TORQUE BASED THERMAL SENSOR FOR INSITU MONITORING OF MAG...
- Publication number 20240310459
- Publication date Sep 19, 2024
- Western Digital Technologies, Inc.
- Quang LE
- G01 - MEASURING TESTING
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DIAMOND MAGNETIC SENSOR UNIT AND DIAMOND MAGNETIC SENSOR SYSTEM
- Publication number 20240302460
- Publication date Sep 12, 2024
- Sumitomo Electric Industries, Ltd.
- Yoshiki NISHIBAYASHI
- G01 - MEASURING TESTING
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SIGMA-DELTA ANALOG-TO-DIGITAL CONVERTER AND METHOD FOR CONVERTING A...
- Publication number 20240250693
- Publication date Jul 25, 2024
- INFINEON TECHNOLOGIES AG
- Andrei-Sorin GHEORGHE
- H03 - BASIC ELECTRONIC CIRCUITRY
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HALL EFFECT SENSOR ASSEMBLY FOR USE WITH GAME CONTROLLER JOYSTICKS
- Publication number 20240111004
- Publication date Apr 4, 2024
- Panda Hardware LLC
- Matthew Samperi
- G01 - MEASURING TESTING
Information Patent Application
Dual mode technique based on Hall effect and induction for magnetic...
- Publication number 20230341483
- Publication date Oct 26, 2023
- Anand Vikas Lalwani
- G01 - MEASURING TESTING
Information Patent Application
SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...
- Publication number 20230266413
- Publication date Aug 24, 2023
- The Regents of the University of California
- Jing Shi
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC SENSOR USING SPIN ORBIT TORQUE AND SENSING METHOD USING SAME
- Publication number 20230204692
- Publication date Jun 29, 2023
- Hyundai Motor Company
- Joon-Hyun KWON
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR, METHOD FOR PRODUCING SAME, AND METHOD FOR ME...
- Publication number 20230126694
- Publication date Apr 27, 2023
- INFINEON TECHNOLOGIES AG
- Milan AGRAWAL
- G01 - MEASURING TESTING
Information Patent Application
STRAYFIELD INSENSITIVE MAGNETIC SENSING DEVICE AND METHOD USING SPI...
- Publication number 20230066358
- Publication date Mar 2, 2023
- INFINEON TECHNOLOGIES AG
- Dieter Suess
- G01 - MEASURING TESTING
Information Patent Application
HALL ELECTROMOTIVE FORCE SIGNAL DETECTION CIRCUIT HAVING A DIFFEREN...
- Publication number 20230017847
- Publication date Jan 19, 2023
- ASAHI KASEI MICRODEVICES CORPORATION
- Shigeki OKATAKE
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC ANGLE SENSOR SYSTEM WITH STRAY FIELD COMPENSATION
- Publication number 20220393554
- Publication date Dec 8, 2022
- INFINEON TECHNOLOGIES AG
- Gernot BINDER
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
POSITION SENSING SYSTEM WITH IMPROVED ACCURACY AND THE METHOD THEREOF
- Publication number 20220236345
- Publication date Jul 28, 2022
- Chengdu Monolithic Power Systems Co., Ltd.
- Tianzhu Zhang
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR CIRCUIT
- Publication number 20220179015
- Publication date Jun 9, 2022
- TEXAS INSTRUMENTS INCORPORATED
- Arup POLLEY
- G01 - MEASURING TESTING
Information Patent Application
TRANSISTOR DEVICES AND METHODS FOR PRODUCING TRANSISTOR DEVICES
- Publication number 20220146603
- Publication date May 12, 2022
- INFINEON TECHNOLOGIES AG
- Stephan LEISENHEIMER
- G01 - MEASURING TESTING
Information Patent Application
HALL ELEMENT AND ELECTRONIC COMPONENT
- Publication number 20210367144
- Publication date Nov 25, 2021
- Rohm Co., Ltd.
- Tetsuya Kitade
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHOPPER SYSTEM AND METHOD
- Publication number 20210344315
- Publication date Nov 4, 2021
- INFINEON TECHNOLOGIES AG
- Mario MOTZ
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DEVICE AND METHOD FOR DETECTING A MAGNETIC FIELD USING THE SPIN ORB...
- Publication number 20210311139
- Publication date Oct 7, 2021
- INFINEON TECHNOLOGIES AG
- Dieter SUESS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIGITAL PHASE TRACKING FILTER FOR POSITION SENSING
- Publication number 20210302200
- Publication date Sep 30, 2021
- Melexis Technologies SA
- Eric SACHSE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
CURRENT SENSOR HAVING STRAY FIELD IMMUNITY
- Publication number 20210285794
- Publication date Sep 16, 2021
- ALLEGRO MICROSYSTEMS, LLC
- Robert A. Briano
- G01 - MEASURING TESTING
Information Patent Application
HALL SENSOR READOUT CIRCUIT, CORRESPONDING DEVICE AND METHOD
- Publication number 20210208212
- Publication date Jul 8, 2021
- STMicroelectronics S.r.l
- Paolo Angelini
- G01 - MEASURING TESTING
Information Patent Application
HALL ELECTROMOTIVE FORCE SIGNAL DETECTION CIRCUIT HAVING A DIFFEREN...
- Publication number 20210199732
- Publication date Jul 1, 2021
- ASAHI KASEI MICRODEVICES CORPORATION
- Shigeki OKATAKE
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING CIRCUIT FOR A HALL SENSOR AND SIGNAL PROCESSING M...
- Publication number 20210181272
- Publication date Jun 17, 2021
- INFINEON TECHNOLOGIES AG
- Yongjia LI
- G01 - MEASURING TESTING
Information Patent Application
SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...
- Publication number 20210109172
- Publication date Apr 15, 2021
- The Regents of the University of California
- Jing Shi
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC FIELD SENSOR FOR ANGLE DETECTION WITH A PHASE-LOCKED LOOP
- Publication number 20200408857
- Publication date Dec 31, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Steven Daubert
- G01 - MEASURING TESTING
Information Patent Application
Fast Response Magnetic Field Sensors and Associated Methods For Rem...
- Publication number 20200319272
- Publication date Oct 8, 2020
- ALLEGRO MICROSYSTEMS, LLC
- Hernán D. Romero
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SEMICONDUCTOR DEVICE
- Publication number 20200249284
- Publication date Aug 6, 2020
- ABLIC Inc.
- Takaaki Hioka
- G01 - MEASURING TESTING
Information Patent Application
BRIDGE SENSOR WITH DUMMY RESISTOR STRUCTURE
- Publication number 20200241082
- Publication date Jul 30, 2020
- Melexis Technologies SA
- Daan VAN DEN MEERSSCHAUT
- G01 - MEASURING TESTING

Hall devices configured for spinning current measurements

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Hall electromotive force signal detection circuit having a differen...

Hall element and electronic component

Chopper system and method

Transistor devices and methods for producing transistor devices

Signal processing circuit for reducing ripple in an output signal o...

Hall device

Hall sensor readout circuit, corresponding device and method

Apparatuses and methods for electrical current sensing

Spin-based detection of terahertz and sub-terahertz electromagnetic...

Position sensing system with improved accuracy and the method thereof

Current sensor having stray field immunity

Digital phase tracking filter for position sensing

Semiconductor device

Digitally-controlled output amplitude of analog sensor signal

Hall electromotive force signal detection circuit having a differen...

Hall sensor circuit

Magnetic field sensor

Magnetic field sensor for angle detection with a phase-locked loop

Bridge sensor biasing and readout

Transistor devices and methods for producing transistor devices

3-contact vertical hall sensor elements connected in a ring and rel...

Sensor circuit with offset compensation

Magnetic field sensor for angle detection with a phase-locked loop

Hall sensor apparatus and method for measuring a magnetic field

Fast response magnetic field sensors and associated methods for rem...

Hall element for mitigating current concentration and fabrication m...

Semiconductor device and method of adjusting the same

Signal processing arrangement for a hall sensor and signal processi...

Component semiconductor structure

Ultra high-sensitivity micro magnetic sensor

Patents Applicationslast 30 patents

SPIN HALL MAGNETIC SENSOR AND METHOD OF MEASURING MAGNETORESISTANCE...

MAGNETIZATION ROTATIONAL ELEMENT, MAGNETORESISTANCE EFFECT ELEMENT,...

WIDE BANDWIDTH HALL SENSING CIRCUITRY WITH OFFSET COMPENSATION AND...

SPIN ORBIT TORQUE BASED THERMAL SENSOR FOR INSITU MONITORING OF MAG...

DIAMOND MAGNETIC SENSOR UNIT AND DIAMOND MAGNETIC SENSOR SYSTEM

SIGMA-DELTA ANALOG-TO-DIGITAL CONVERTER AND METHOD FOR CONVERTING A...

HALL EFFECT SENSOR ASSEMBLY FOR USE WITH GAME CONTROLLER JOYSTICKS

Dual mode technique based on Hall effect and induction for magnetic...

SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...

MAGNETIC SENSOR USING SPIN ORBIT TORQUE AND SENSING METHOD USING SAME

MAGNETIC FIELD SENSOR, METHOD FOR PRODUCING SAME, AND METHOD FOR ME...

STRAYFIELD INSENSITIVE MAGNETIC SENSING DEVICE AND METHOD USING SPI...

HALL ELECTROMOTIVE FORCE SIGNAL DETECTION CIRCUIT HAVING A DIFFEREN...

MAGNETIC ANGLE SENSOR SYSTEM WITH STRAY FIELD COMPENSATION

POSITION SENSING SYSTEM WITH IMPROVED ACCURACY AND THE METHOD THEREOF

HALL SENSOR CIRCUIT

TRANSISTOR DEVICES AND METHODS FOR PRODUCING TRANSISTOR DEVICES

HALL ELEMENT AND ELECTRONIC COMPONENT

CHOPPER SYSTEM AND METHOD

DEVICE AND METHOD FOR DETECTING A MAGNETIC FIELD USING THE SPIN ORB...

DIGITAL PHASE TRACKING FILTER FOR POSITION SENSING

CURRENT SENSOR HAVING STRAY FIELD IMMUNITY

HALL SENSOR READOUT CIRCUIT, CORRESPONDING DEVICE AND METHOD

HALL ELECTROMOTIVE FORCE SIGNAL DETECTION CIRCUIT HAVING A DIFFEREN...

SIGNAL PROCESSING CIRCUIT FOR A HALL SENSOR AND SIGNAL PROCESSING M...

SPIN-BASED DETECTION OF TERAHERTZ AND SUB-TERAHERTZ ELECTROMAGNETIC...

MAGNETIC FIELD SENSOR FOR ANGLE DETECTION WITH A PHASE-LOCKED LOOP

Fast Response Magnetic Field Sensors and Associated Methods For Rem...

SEMICONDUCTOR DEVICE

BRIDGE SENSOR WITH DUMMY RESISTOR STRUCTURE