having separate detection of emissivity

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G01J2005/0074

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GPHYSICS G01Measuring instruments G01JMEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY

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G01J2005/0074having separate detection of emissivity

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Patents Grantslast 30 patents

Information Patent Grant
Thermal quality mappings
- Patent number 12,135,242
- Issue date Nov 5, 2024
- Electric Pocket Limited
- Steven Nicholas Bennett
- G01 - MEASURING TESTING
Information Patent Grant
Spectral emissivity and temperature measurements of metal powders d...
- Patent number 12,036,608
- Issue date Jul 16, 2024
- Board of Regents, The University of Texas System
- Ryan B. Wicker
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Characterizing tropospheric boundary layer thermodynamic and refrac...
- Patent number 11,614,367
- Issue date Mar 28, 2023
- Fredrick S. Solheim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for measuring the surface temperature of a sub...
- Patent number 11,454,543
- Issue date Sep 27, 2022
- LASER SYSTEMS & SOLUTIONS OF EUROPE
- Sylvain Perrot
- G01 - MEASURING TESTING
Information Patent Grant
Cavity blackbody radiation source and method of making the same
- Patent number 11,204,283
- Issue date Dec 21, 2021
- Tsinghua University
- Yang Wei
- G01 - MEASURING TESTING
Information Patent Grant
Cavity blackbody radiation source and method of making the same
- Patent number 11,125,626
- Issue date Sep 21, 2021
- Tsinghua University
- Yang Wei
- G01 - MEASURING TESTING
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,645
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,646
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Grant
Multispectral plasmonic thermal imaging device
- Patent number 10,830,647
- Issue date Nov 10, 2020
- International Business Machines Corporation
- Ali Afzali-Ardakani
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for temperature measurement with machine learni...
- Patent number 10,823,618
- Issue date Nov 3, 2020
- General Electric Company
- Guanghua Wang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Infrared contrasting color emissivity measurement system
- Patent number 10,704,963
- Issue date Jul 7, 2020
- Exergen Corporation
- Jason N. Jarboe
- G01 - MEASURING TESTING
Information Patent Grant
Safety cooking device and method
- Patent number 10,366,591
- Issue date Jul 30, 2019
- Tyco Safety Products Canada Ltd.
- Andrei Bucsa
- F23 - COMBUSTION APPARATUS COMBUSTION PROCESSES
Information Patent Grant
Infrared contrasting color temperature measurement system
- Patent number 10,054,495
- Issue date Aug 21, 2018
- Exergen Corporation
- Jason N. Jarboe
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method to measure temperature of 3D semiconductor str...
- Patent number 9,909,925
- Issue date Mar 6, 2018
- Applied Materials, Inc.
- Heng Pan
- G01 - MEASURING TESTING
Information Patent Grant
Temperature measurement device
- Patent number 9,494,466
- Issue date Nov 15, 2016
- Kabushiki Kaisha Toshiba
- Toshiyuki Uchii
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring thermal radiation to determine temp...
- Patent number 8,483,991
- Issue date Jul 9, 2013
- Fluke Corporation
- Reno Gaertner
- G01 - MEASURING TESTING
Information Patent Grant
Method for an IR-radiation—based temperature measurement and IR-rad...
- Patent number 8,368,021
- Issue date Feb 5, 2013
- Testo AG
- Martin Stratmann
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring in situ differential emissivity and temperature
- Patent number 8,192,077
- Issue date Jun 5, 2012
- SIEMENS ENERGY, INC.
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining the emissivity, area and tempe...
- Patent number 8,050,884
- Issue date Nov 1, 2011
- The Boeing Company
- Ronald N. Murata
- G01 - MEASURING TESTING
Information Patent Grant
Method of measuring in situ differential emissivity and temperature
- Patent number 7,632,012
- Issue date Dec 15, 2009
- SIEMENS ENERGY, INC.
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Grant
Pyrometer multimeter
- Patent number 6,095,682
- Issue date Aug 1, 2000
- Omega Engineering, Inc.
- Milton Bernard Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for determining the layer-thickness and the...
- Patent number 5,564,830
- Issue date Oct 15, 1996
- Fraunhofer-Gesellschaft zur Forderung der angewandten Forschung e.V.
- Friedrich Bobel
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor processing technique, including pyrometric measuremen...
- Patent number 5,442,727
- Issue date Aug 15, 1995
- AT&T Corp.
- Anthony T. Fiory
- G01 - MEASURING TESTING
Information Patent Grant
Non-contact temperature measurement of a film growing on a substrate
- Patent number 5,377,126
- Issue date Dec 27, 1994
- Massachusetts Institute of Technology
- Markus I. Flik
- G01 - MEASURING TESTING
Information Patent Grant
Multiwavelength pyrometer for gray and non-gray surfaces in the pre...
- Patent number 5,326,172
- Issue date Jul 5, 1994
- The United States of America as represented by the administrator of the Natio...
- Daniel L. P. Ng
- G01 - MEASURING TESTING
Information Patent Grant
Surface condition measurement apparatus
- Patent number 5,314,249
- Issue date May 24, 1994
- Kawasaki Steel Corporation
- Tomohiro Marui
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor processing technique, including pyrometric measuremen...
- Patent number 5,305,416
- Issue date Apr 19, 1994
- AT&T Bell Laboratories
- Anthony T. Fiory
- G01 - MEASURING TESTING
Information Patent Grant
Reflectance probe
- Patent number 5,282,017
- Issue date Jan 25, 1994
- Quantum Logic Corporation
- Ira Kasindorf
- G01 - MEASURING TESTING
Information Patent Grant
Infrared imaging system for simultaneous generation of temperature,...
- Patent number 5,272,340
- Issue date Dec 21, 1993
- Amara, Inc.
- Michael Anbar
- G01 - MEASURING TESTING
Information Patent Grant
Pyrometer
- Patent number 5,231,595
- Issue date Jul 27, 1993
- Minolta Camera Kabushiki Kaisha
- Toshiro Makino
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VISUAL MONITORING METHOD FOR CROSS-SECTION TEMPERATURE FIELDS AND R...
- Publication number 20240337538
- Publication date Oct 10, 2024
- CHINA UNIVERSITY OF MINING AND TECHNOLOGY
- Huaichun ZHOU
- G01 - MEASURING TESTING
Information Patent Application
INFRARED IMAGING DEVICE AND FIXED PATTERN NOISE DATA GENERATION METHOD
- Publication number 20240244348
- Publication date Jul 18, 2024
- Mitsubishi Electric Corporation
- Masaharu HATTORI
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ESTIMATION OF THE TEMPERATURE OF A STEEL PRODUCT
- Publication number 20240118139
- Publication date Apr 11, 2024
- ARCELORMITTAL
- Noëlle MICQUE
- G01 - MEASURING TESTING
Information Patent Application
EMISSIVITY INDEPENDENCE TUNING
- Publication number 20230392987
- Publication date Dec 7, 2023
- Applied Materials, Inc.
- Wolfgang Aderhold
- G01 - MEASURING TESTING
Information Patent Application
Multi-spectral temperature measuring device based on adaptive emiss...
- Publication number 20210293625
- Publication date Sep 23, 2021
- Harbin Engineering University
- Shan Gao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Characterizing tropospheric boundary layer thermodynamic and refrac...
- Publication number 20210041299
- Publication date Feb 11, 2021
- Fredrick S. Solheim
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THE SURFACE TEMPERATURE OF A SUB...
- Publication number 20200292390
- Publication date Sep 17, 2020
- Laser Systems & Solutions of Europe
- Sylvain PERROT
- G01 - MEASURING TESTING
Information Patent Application
Infrared Contrasting Color Emissivity Measurement System
- Publication number 20190003897
- Publication date Jan 3, 2019
- Exergen Corporation
- Jason N. Jarboe
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STR...
- Publication number 20180283957
- Publication date Oct 4, 2018
- Applied Materials, Inc.
- Heng PAN
- G01 - MEASURING TESTING
Information Patent Application
Safety Cooking Device and Method
- Publication number 20180253953
- Publication date Sep 6, 2018
- Tyco Safety Products Canada Ltd.
- Andrei Bucsa
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL NON-DESTRUCTIVE INSPECTION APPARATUS AND OPTICAL NON-DESTRU...
- Publication number 20140321497
- Publication date Oct 30, 2014
- JTEKT Corporation
- Naoki MATSUMOTO
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
TEMPERATURE MEASUREMENT DEVICE
- Publication number 20140219312
- Publication date Aug 7, 2014
- KABUSHIKI KAISHA TOSHIBA
- Toshiyuki UCHII
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR QUANTIFYING AMORPHOUS CONTENT IN BULK METALLIC GLASS PAR...
- Publication number 20140008536
- Publication date Jan 9, 2014
- Christopher D. PREST
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STR...
- Publication number 20130120737
- Publication date May 16, 2013
- Heng Pan
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR AN IR-RADIATION -- BASED TEMPERATURE MEASUREMENT AND IR-...
- Publication number 20110235918
- Publication date Sep 29, 2011
- Testo AG
- Martin Stratmann
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MEASURING THERMAL RADIATION TO DETERMINE TEMP...
- Publication number 20100292951
- Publication date Nov 18, 2010
- FLUKE CORPORATION
- Reno Gaertner
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Determining The Emissivity, Area And Tempe...
- Publication number 20100256945
- Publication date Oct 7, 2010
- The Boeing Company
- Ronald N. Murata
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MEASURING IN SITU DIFFERENTIAL EMISSIVITY AND TEMPERATURE
- Publication number 20100014555
- Publication date Jan 21, 2010
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Application
Method of measuring in situ differential emissivity and temperature
- Publication number 20070047615
- Publication date Mar 1, 2007
- Siemens Power Generation, Inc.
- Michael Twerdochlib
- G01 - MEASURING TESTING
Information Patent Application
Fire hazard prevention system
- Publication number 20040239511
- Publication date Dec 2, 2004
- Bezalel Urban
- G08 - SIGNALLING
Information Patent Application
Emissivity distribution measuring method and apparatus
- Publication number 20040008753
- Publication date Jan 15, 2004
- NORITAKE CO., LIMITED
- Miyuki Hashimoto
- G01 - MEASURING TESTING

having separate detection of emissivity

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Thermal quality mappings

Spectral emissivity and temperature measurements of metal powders d...

Characterizing tropospheric boundary layer thermodynamic and refrac...

Apparatus and method for measuring the surface temperature of a sub...

Cavity blackbody radiation source and method of making the same

Cavity blackbody radiation source and method of making the same

Multispectral plasmonic thermal imaging device

Multispectral plasmonic thermal imaging device

Multispectral plasmonic thermal imaging device

Methods and systems for temperature measurement with machine learni...

Infrared contrasting color emissivity measurement system

Safety cooking device and method

Infrared contrasting color temperature measurement system

Apparatus and method to measure temperature of 3D semiconductor str...

Temperature measurement device

Method and system for measuring thermal radiation to determine temp...

Method for an IR-radiation—based temperature measurement and IR-rad...

Method of measuring in situ differential emissivity and temperature

Method and apparatus for determining the emissivity, area and tempe...

Method of measuring in situ differential emissivity and temperature

Pyrometer multimeter

Method and arrangement for determining the layer-thickness and the...

Semiconductor processing technique, including pyrometric measuremen...

Non-contact temperature measurement of a film growing on a substrate

Multiwavelength pyrometer for gray and non-gray surfaces in the pre...

Surface condition measurement apparatus

Semiconductor processing technique, including pyrometric measuremen...

Reflectance probe

Infrared imaging system for simultaneous generation of temperature,...

Pyrometer

Patents Applicationslast 30 patents

VISUAL MONITORING METHOD FOR CROSS-SECTION TEMPERATURE FIELDS AND R...

INFRARED IMAGING DEVICE AND FIXED PATTERN NOISE DATA GENERATION METHOD

ESTIMATION OF THE TEMPERATURE OF A STEEL PRODUCT

EMISSIVITY INDEPENDENCE TUNING

Multi-spectral temperature measuring device based on adaptive emiss...

Characterizing tropospheric boundary layer thermodynamic and refrac...

APPARATUS AND METHOD FOR MEASURING THE SURFACE TEMPERATURE OF A SUB...

Infrared Contrasting Color Emissivity Measurement System

APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STR...

Safety Cooking Device and Method

OPTICAL NON-DESTRUCTIVE INSPECTION APPARATUS AND OPTICAL NON-DESTRU...

TEMPERATURE MEASUREMENT DEVICE

METHOD FOR QUANTIFYING AMORPHOUS CONTENT IN BULK METALLIC GLASS PAR...

APPARATUS AND METHOD TO MEASURE TEMPERATURE OF 3D SEMICONDUCTOR STR...

METHOD FOR AN IR-RADIATION -- BASED TEMPERATURE MEASUREMENT AND IR-...

METHOD AND SYSTEM FOR MEASURING THERMAL RADIATION TO DETERMINE TEMP...

Method And Apparatus For Determining The Emissivity, Area And Tempe...

METHOD OF MEASURING IN SITU DIFFERENTIAL EMISSIVITY AND TEMPERATURE

Method of measuring in situ differential emissivity and temperature

Fire hazard prevention system

Emissivity distribution measuring method and apparatus