Hemispheres

Industry

CPC
G01N2201/0655

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/0655Hemispheres

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Optics cup with curved bottom
- Patent number 10,731,123
- Issue date Aug 4, 2020
- POCARED DIAGNOSTICS LTD.
- Gal Ingber
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Illumination system for recognizing material and method of recogniz...
- Patent number 10,451,547
- Issue date Oct 22, 2019
- DEEDIIM SENSORS INC.
- Jang-Il Ser
- G01 - MEASURING TESTING
Information Patent Grant
Illumination system for recognizing material and method of recogniz...
- Patent number 10,161,865
- Issue date Dec 25, 2018
- DEEDIIM SENSORS INC.
- Jang-Il Ser
- G01 - MEASURING TESTING
Information Patent Grant
Optics cup with curved bottom
- Patent number 9,862,920
- Issue date Jan 9, 2018
- POCARED DIAGNOSTICS LTD.
- Gal Ingber
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Method of acquiring an image in a transparent, colored container
- Patent number 8,670,066
- Issue date Mar 11, 2014
- Parata Systems, LLC
- David Newcomb
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement apparatus, optical measurement system, and fibe...
- Patent number 8,456,638
- Issue date Jun 4, 2013
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Quantum efficiency measurement method, quantum efficiency measureme...
- Patent number 8,415,639
- Issue date Apr 9, 2013
- Otsuka Electronics Co., Ltd.
- Yoshihiro Osawa
- G01 - MEASURING TESTING
Information Patent Grant
Light scattering measurement system based on flexible sensor array
- Patent number 8,405,832
- Issue date Mar 26, 2013
- Palo Alto Research Center Incorporated
- Philipp Helmut Schmaelzle
- G01 - MEASURING TESTING
Information Patent Grant
System and method for acquiring images
- Patent number 8,284,305
- Issue date Oct 9, 2012
- Parata Systems, LLC
- David Newcomb
- G01 - MEASURING TESTING
Information Patent Grant
Quantum efficiency measurement apparatus and quantum efficiency mea...
- Patent number 8,119,996
- Issue date Feb 21, 2012
- Otsuka Electronics Co., Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Grant
Portable spectrophotometer
- Patent number 4,968,143
- Issue date Nov 6, 1990
- Maxmeyer-Duco MM.D S.p.A.
- Allen Weston
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer surface inspection apparatus and method
- Patent number 4,740,708
- Issue date Apr 26, 1988
- International Business Machines Corporation
- John S. Batchelder
- G01 - MEASURING TESTING
Information Patent Grant
Spectrophotometric method and apparatus for the non-invasive
- Patent number 4,655,225
- Issue date Apr 7, 1987
- Kurabo Industries Ltd.
- Claus Dahne
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
INSPECTION DEVICE
- Publication number 20190342477
- Publication date Nov 7, 2019
- IMAC CO., LTD.
- Shinya HATABE
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...
- Publication number 20190120759
- Publication date Apr 25, 2019
- DeeDiim Sensors Inc.
- Jang-Il SER
- G01 - MEASURING TESTING
Information Patent Application
Optics Cup With Curved Bottom
- Publication number 20180080000
- Publication date Mar 22, 2018
- POCARED DIAGNOSTICS LTD.
- Gal Ingber
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...
- Publication number 20180017486
- Publication date Jan 18, 2018
- Jang-Il SER
- G01 - MEASURING TESTING
Information Patent Application
Optics Cup With Curved Bottom
- Publication number 20140170740
- Publication date Jun 19, 2014
- Gal Ingber
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
SYSTEM AND METHOD FOR ACQUIRING IMAGES
- Publication number 20130002841
- Publication date Jan 3, 2013
- David Newcomb
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND FIBE...
- Publication number 20110235036
- Publication date Sep 29, 2011
- Otsuka Electronics Co., Ltd.
- Kazuaki OHKUBO
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREME...
- Publication number 20110226961
- Publication date Sep 22, 2011
- Otsuka Electronics Co., Ltd.
- Yoshihiro OSAWA
- G01 - MEASURING TESTING
Information Patent Application
QUANTUM EFFICIENCY MEASUREMENT APPARATUS AND QUANTUM EFFICIENCY MEA...
- Publication number 20110155926
- Publication date Jun 30, 2011
- Otsuka Electronics Co.,Ltd.
- Kazuaki Ohkubo
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SCATTERING MEASUREMENT SYSTEM BASED ON FLEXIBLE SENSOR ARRAY
- Publication number 20110141476
- Publication date Jun 16, 2011
- Palo Alto Research Center Incorporated
- PHILIPP HELMUT SCHMAELZLE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR ACQUIRING IMAGES
- Publication number 20100128165
- Publication date May 27, 2010
- David Newcomb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS
- Publication number 20080068593
- Publication date Mar 20, 2008
- HIROYUKI NAKANO
- G01 - MEASURING TESTING

Hemispheres

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optics cup with curved bottom

Illumination system for recognizing material and method of recogniz...

Illumination system for recognizing material and method of recogniz...

Optics cup with curved bottom

Method of acquiring an image in a transparent, colored container

Optical measurement apparatus, optical measurement system, and fibe...

Quantum efficiency measurement method, quantum efficiency measureme...

Light scattering measurement system based on flexible sensor array

System and method for acquiring images

Quantum efficiency measurement apparatus and quantum efficiency mea...

Portable spectrophotometer

Semiconductor wafer surface inspection apparatus and method

Spectrophotometric method and apparatus for the non-invasive

Patents Applicationslast 30 patents

INSPECTION DEVICE

ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...

Optics Cup With Curved Bottom

ILLUMINATION SYSTEM FOR RECOGNIZING MATERIAL AND METHOD OF RECOGNIZ...

Optics Cup With Curved Bottom

SYSTEM AND METHOD FOR ACQUIRING IMAGES

OPTICAL MEASUREMENT APPARATUS, OPTICAL MEASUREMENT SYSTEM, AND FIBE...

QUANTUM EFFICIENCY MEASUREMENT METHOD, QUANTUM EFFICIENCY MEASUREME...

QUANTUM EFFICIENCY MEASUREMENT APPARATUS AND QUANTUM EFFICIENCY MEA...

LIGHT SCATTERING MEASUREMENT SYSTEM BASED ON FLEXIBLE SENSOR ARRAY

SYSTEM AND METHOD FOR ACQUIRING IMAGES

METHOD AND APPARATUS FOR DETECTING DEFECTS