High frequency probes

Industry

CPC
G01R1/06772

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06772High frequency probes

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multi-mode measurement probe
- Patent number 12,210,039
- Issue date Jan 28, 2025
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Grant
Probe system and machine apparatus thereof
- Patent number 12,196,779
- Issue date Jan 14, 2025
- MPI CORPORATION
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Waveguide component for high frequency testing
- Patent number 12,199,691
- Issue date Jan 14, 2025
- SAGE Millimeter, Inc.
- Yonghui Shu
- G01 - MEASURING TESTING
Information Patent Grant
Probe assembly, system and method for testing rf device of phased a...
- Patent number 12,174,243
- Issue date Dec 24, 2024
- TRON FUTURE TECH INC.
- Yu-Jiu Wang
- G01 - MEASURING TESTING
Information Patent Grant
Probe tip with rigid frame and flexible tip portion
- Patent number 12,169,210
- Issue date Dec 17, 2024
- Keysight Technologies, Inc.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Grant
Simple waveguide load pull tuner
- Patent number 12,111,347
- Issue date Oct 8, 2024
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Coaxial probe
- Patent number 12,111,343
- Issue date Oct 8, 2024
- Xcerra Corporation
- Yukang Feng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe adapter
- Patent number 12,092,657
- Issue date Sep 17, 2024
- Raytheon Company
- Susanne L. Stuart
- G01 - MEASURING TESTING
Information Patent Grant
Optical detection system and alignment method for a predetermined t...
- Patent number 12,092,658
- Issue date Sep 17, 2024
- MPI CORPORATION
- Sebastian Giessmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sensor device, water amount measurement device, water amount measur...
- Patent number 12,066,461
- Issue date Aug 20, 2024
- Sony Group Corporation
- Atsushi Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Sensor device for detecting electrical defects based on resonance f...
- Patent number 12,055,582
- Issue date Aug 6, 2024
- Keysight Technologies, Inc.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit
- Patent number 11,994,535
- Issue date May 28, 2024
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,921,133
- Issue date Mar 5, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Test point adaptor for coaxial cable connections
- Patent number 11,860,241
- Issue date Jan 2, 2024
- PPC Broadband, Inc.
- Kim Eriksen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for assembling ultrahigh-frequency spring probe test assembly
- Patent number 11,835,567
- Issue date Dec 5, 2023
- SUZHOU UIGREEN MICRO&NANO TECHNOLOGY CO. LTD.
- Xiaochen Qian
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for probing device-under-test
- Patent number 11,821,942
- Issue date Nov 21, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,808,788
- Issue date Nov 7, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Test arrangement for testing high-frequency components, particularl...
- Patent number 11,782,072
- Issue date Oct 10, 2023
- Advantest Corporation
- José Moreira
- G01 - MEASURING TESTING
Information Patent Grant
Probe unit
- Patent number 11,782,074
- Issue date Oct 10, 2023
- NHK Spring Co., Ltd.
- Tsuyoshi Inuma
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency test connector device, high frequency testing system...
- Patent number 11,747,364
- Issue date Sep 5, 2023
- Ingun Prüfmittelbau GmbH
- Thomas Schrodi
- G01 - MEASURING TESTING
Information Patent Grant
Probe cable assembly and method
- Patent number 11,733,266
- Issue date Aug 22, 2023
- Rohde & Schwarz GmbH & Co. KG
- Franz Strasser
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test device
- Patent number 11,726,111
- Issue date Aug 15, 2023
- LEENO INDUSTRIAL INC.
- Changhyun Song
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency coaxial attenuator
- Patent number 11,705,611
- Issue date Jul 18, 2023
- Ryan Letcher
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-frequency data differential testing probe
- Patent number 11,698,390
- Issue date Jul 11, 2023
- Signal Microwave, LLC
- William Rosas
- G01 - MEASURING TESTING
Information Patent Grant
Testing head having improved frequency properties
- Patent number 11,668,732
- Issue date Jun 6, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Integrated waveguide tuner
- Patent number 11,662,364
- Issue date May 30, 2023
- Christos Tsironis
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Test probe assembly and test socket
- Patent number 11,639,945
- Issue date May 2, 2023
- LEENO INDUSTRIAL INC.
- Jae-hwan Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Test device
- Patent number 11,609,245
- Issue date Mar 21, 2023
- Leeno Industrial Inc.
- Dong-hoon Park
- G01 - MEASURING TESTING
Information Patent Grant
Hermetic load and source pull wafer probe station
- Patent number 11,598,790
- Issue date Mar 7, 2023
- Christos Tsironis
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
QUICK COUPLING PROBE HEAD
- Publication number 20250044322
- Publication date Feb 6, 2025
- MPI CORPORATION
- Ya-Hung Lo
- G01 - MEASURING TESTING
Information Patent Application
CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...
- Publication number 20250035671
- Publication date Jan 30, 2025
- MPI Corporation
- CHENG-NIEN SU
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...
- Publication number 20240410918
- Publication date Dec 12, 2024
- STAR TECHNOLOGIES, INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...
- Publication number 20240410936
- Publication date Dec 12, 2024
- FormFactor, Inc.
- Ernest Gammon McReynolds
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE, WATER AMOUNT MEASUREMENT DEVICE, WATER AMOUNT MEASUR...
- Publication number 20240377435
- Publication date Nov 14, 2024
- SONY GROUP CORPORATION
- Atsushi YAMADA
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF
- Publication number 20240377436
- Publication date Nov 14, 2024
- CHUNGHWA PRECISION TEST TECH. CO., LTD.
- YU-JU LU
- G01 - MEASURING TESTING
Information Patent Application
WAVEGUIDE COMPONENT FOR HIGH FREQUENCY TESTING
- Publication number 20240348286
- Publication date Oct 17, 2024
- SAGE Millimeter, Inc.
- Yonghui Shu
- G01 - MEASURING TESTING
Information Patent Application
STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...
- Publication number 20240329083
- Publication date Oct 3, 2024
- MPI CORPORATION
- CHIA-NAN CHOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE TIP WITH RIGID FRAME AND FLEXIBLE TIP PORTION
- Publication number 20240272199
- Publication date Aug 15, 2024
- KEYSIGHT TECHNOLOGIES, INC.
- Nicholas Fernandez
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL PAD PROBE TOOLING
- Publication number 20240241154
- Publication date Jul 18, 2024
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Jeffrey Fitzgerald
- G01 - MEASURING TESTING
Information Patent Application
PROBE ASSEMBLY, SYSTEM AND METHOD FOR TESTING RF DEVICE OF PHASED A...
- Publication number 20240201245
- Publication date Jun 20, 2024
- TRON FUTURE TECH INC.
- YU-JIU WANG
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD FOR HIGH-FREQUENCY TESTING
- Publication number 20240168057
- Publication date May 23, 2024
- STAR TECHNOLOGIES, INC.
- HUNG-CHUN HUANG
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT PATTERN, MEASUREMENT PATTERN SET, CALCULATION METHOD, N...
- Publication number 20240159817
- Publication date May 16, 2024
- Sumimoto Electric Industries, Ltd.
- Ken KIKUCHI
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20240151744
- Publication date May 9, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
Ground Reference Lead
- Publication number 20240151745
- Publication date May 9, 2024
- PMK Mess- und Kommunikationstechnik, GmbH
- Michael Engels
- G01 - MEASURING TESTING
Information Patent Application
COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD
- Publication number 20240085454
- Publication date Mar 14, 2024
- Federal Institute of Metrology METAS
- Johannes Hoffmann
- G01 - MEASURING TESTING
Information Patent Application
PROBE CARD, METHOD FOR DESIGNING PROBE CARD, METHOD FOR PRODUCING T...
- Publication number 20240077519
- Publication date Mar 7, 2024
- MPI CORPORATION
- Yang-Hung Cheng
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES OF SAMPLE...
- Publication number 20240053394
- Publication date Feb 15, 2024
- Beijing Institute of Nanoenergy and Nanosystems
- Zhonglin Wang
- G01 - MEASURING TESTING
Information Patent Application
FILLING LEVEL MEASURING DEVICE AND METHOD FOR THE IN-LINE CALIBRATI...
- Publication number 20240044692
- Publication date Feb 8, 2024
- Endress+Hauser SE+Co. KG
- Ulrich Heitz
- G01 - MEASURING TESTING
Information Patent Application
PROBE HOLDER AND PROBE UNIT
- Publication number 20240019460
- Publication date Jan 18, 2024
- NHK Spring Co., Ltd.
- Osamu Ito
- G01 - MEASURING TESTING
Information Patent Application
IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...
- Publication number 20240012025
- Publication date Jan 11, 2024
- TECHNOPROBE S.P.A.
- Roberto CRIPPA
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR PROBING DEVICE-UNDER-TEST
- Publication number 20240012046
- Publication date Jan 11, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-WIDEBAND INTERCONNECTION PROBES
- Publication number 20240012024
- Publication date Jan 11, 2024
- UNIVERSIDAD CARLOS III DE MADRID
- Guillermo CARPINTERO DEL BARRIO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLEXIBLE MEMBRANE ADAPTED TO CARRY HIGH-FREQUENCY (RF) POWER SIGNAL...
- Publication number 20230408548
- Publication date Dec 21, 2023
- TECHNOPROBE S.P.A.
- Flavio MAGGIONI
- G01 - MEASURING TESTING
Information Patent Application
TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES
- Publication number 20230333142
- Publication date Oct 19, 2023
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
TEMPERATURE-COMPENSATED DIELECTRIC-CONSTANT MEASURING DEVICE
- Publication number 20230304955
- Publication date Sep 28, 2023
- Endress+Hauser SE+Co. KG
- Pablo Ottersbach
- G01 - MEASURING TESTING
Information Patent Application
SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...
- Publication number 20230136914
- Publication date May 4, 2023
- KEYSIGHT TECHNOLOGIES, INC.
- Tie Qiu
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR PROBING DEVICE-UNDER-TEST
- Publication number 20230068552
- Publication date Mar 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chuan-Hsiang Sun
- G01 - MEASURING TESTING
Information Patent Application
PROBE SYSTEM AND MACHINE APPARATUS THEREOF
- Publication number 20230059740
- Publication date Feb 23, 2023
- MPI Corporation
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
PROBE CABLE ASSEMBLY AND METHOD
- Publication number 20230024181
- Publication date Jan 26, 2023
- Rohde& Schwarz GmbH & Co. KG
- Franz STRASSER
- G01 - MEASURING TESTING

High frequency probes

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-mode measurement probe

Probe system and machine apparatus thereof

Waveguide component for high frequency testing

Probe assembly, system and method for testing rf device of phased a...

Probe tip with rigid frame and flexible tip portion

Simple waveguide load pull tuner

Coaxial probe

Test probe adapter

Optical detection system and alignment method for a predetermined t...

Sensor device, water amount measurement device, water amount measur...

Sensor device for detecting electrical defects based on resonance f...

Probe unit

Probe head for a testing apparatus of electronic devices with enhan...

Testing head having improved frequency properties

Test point adaptor for coaxial cable connections

Method for assembling ultrahigh-frequency spring probe test assembly

Apparatus and method for probing device-under-test

Testing head having improved frequency properties

Test arrangement for testing high-frequency components, particularl...

Probe unit

High-frequency test connector device, high frequency testing system...

Probe cable assembly and method

Test device

High-frequency coaxial attenuator

High-frequency data differential testing probe

Testing head having improved frequency properties

Integrated waveguide tuner

Test probe assembly and test socket

Test device

Hermetic load and source pull wafer probe station

Patents Applicationslast 30 patents

QUICK COUPLING PROBE HEAD

CONTACT PROBE AND CONTACTING MEMBER THEREOF, METHOD OF MANUFACTURIN...

PROBE CARD STRUCTURE FOR HIGH FREQUENCY TEST AND TESTING METHOD THE...

SPACE TRANSFORMERS CONFIGURED TO BE UTILIZED IN A PROBE SYSTEM, PRO...

SENSOR DEVICE, WATER AMOUNT MEASUREMENT DEVICE, WATER AMOUNT MEASUR...

PROBE CARD DEVICE AND TUNNEL-TYPE PROBE THEREOF

WAVEGUIDE COMPONENT FOR HIGH FREQUENCY TESTING

STATIONARY PROBE, MOVABLE PROBE, AND PROBING DEVICE CAPABLE OF ADJU...

PROBE TIP WITH RIGID FRAME AND FLEXIBLE TIP PORTION

COAXIAL PAD PROBE TOOLING

PROBE ASSEMBLY, SYSTEM AND METHOD FOR TESTING RF DEVICE OF PHASED A...

PROBE CARD FOR HIGH-FREQUENCY TESTING

MEASUREMENT PATTERN, MEASUREMENT PATTERN SET, CALCULATION METHOD, N...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

Ground Reference Lead

COAXIAL WAFER PROBE AND CORRESPONDING MANUFACTURING METHOD

PROBE CARD, METHOD FOR DESIGNING PROBE CARD, METHOD FOR PRODUCING T...

METHOD AND APPARATUS FOR MEASURING ELECTRICAL PROPERTIES OF SAMPLE...

FILLING LEVEL MEASURING DEVICE AND METHOD FOR THE IN-LINE CALIBRATI...

PROBE HOLDER AND PROBE UNIT

IMPROVED CONTACT ELEMENT FOR A PROBE HEAD FOR TESTING HIGH-FREQUENC...

APPARATUS FOR PROBING DEVICE-UNDER-TEST

ULTRA-WIDEBAND INTERCONNECTION PROBES

FLEXIBLE MEMBRANE ADAPTED TO CARRY HIGH-FREQUENCY (RF) POWER SIGNAL...

TESTING HEAD HAVING IMPROVED FREQUENCY PROPERTIES

TEMPERATURE-COMPENSATED DIELECTRIC-CONSTANT MEASURING DEVICE

SENSOR DEVICE FOR DETECTING ELECTRICAL DEFECTS BASED ON RESONANCE F...

APPARATUS AND METHOD FOR PROBING DEVICE-UNDER-TEST

PROBE SYSTEM AND MACHINE APPARATUS THEREOF

PROBE CABLE ASSEMBLY AND METHOD