Holding, conveying or contacting devices

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CPC
G01R31/2808

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/2808Holding, conveying or contacting devices

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Diagnostic device
- Patent number 12,203,981
- Issue date Jan 21, 2025
- The Boeing Company
- Ian M. Dayton
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 12,169,217
- Issue date Dec 17, 2024
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electronic circuit board testing system
- Patent number 12,163,996
- Issue date Dec 10, 2024
- MAGNALYTIX, LLC
- Michael L. Bixenman
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for printed circuit board components
- Patent number 12,153,083
- Issue date Nov 26, 2024
- Aptiv Technologies AG
- Biswadeep Das Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Autonomous detection of memory insertion into test equipment withou...
- Patent number 12,117,481
- Issue date Oct 15, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G01 - MEASURING TESTING
Information Patent Grant
Detection apparatus and anti-bending device thereof
- Patent number 12,099,083
- Issue date Sep 24, 2024
- JTRON TECHNOLOGY CORP.
- Chen-Nan Chen
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig and circuit board inspection apparatus including the...
- Patent number 12,055,579
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Kohei Tsumura
- G01 - MEASURING TESTING
Information Patent Grant
Securing a probe to a device under test
- Patent number 12,055,578
- Issue date Aug 6, 2024
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Circuit board inspecting apparatus
- Patent number 12,055,580
- Issue date Aug 6, 2024
- Nidec-Read Corporation
- Toshihide Matsukawa
- G01 - MEASURING TESTING
Information Patent Grant
Carrier mechanism and processing equipment including the carrier me...
- Patent number 11,988,705
- Issue date May 21, 2024
- HON. PRECISION, INC.
- Tzu-Wei Li
- G01 - MEASURING TESTING
Information Patent Grant
Electrical connection test for unpopulated printed circuit boards
- Patent number 11,940,481
- Issue date Mar 26, 2024
- Dyconex AG
- Daniel Luchsinger
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods and devices for high-speed input/output margin tes...
- Patent number 11,940,483
- Issue date Mar 26, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Grant
Functional test head for printed circuit boards
- Patent number 11,940,480
- Issue date Mar 26, 2024
- Anora, LLC
- Pramodchandran Variyam
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device
- Patent number 11,940,482
- Issue date Mar 26, 2024
- Nidec-Read Corporation
- Takashi Isa
- G01 - MEASURING TESTING
Information Patent Grant
Inspection jig, and inspection device
- Patent number 11,933,837
- Issue date Mar 19, 2024
- Nidec-Read Corporation
- Minoru Kato
- G01 - MEASURING TESTING
Information Patent Grant
Jig for inspection apparatus, inspection apparatus, and inspection set
- Patent number 11,921,151
- Issue date Mar 5, 2024
- Koh Young Technology Inc.
- Myong Kang
- G01 - MEASURING TESTING
Information Patent Grant
Electronic die testing device and method
- Patent number 11,879,909
- Issue date Jan 23, 2024
- STMicroelectronics (Grenoble 2) SAS
- Klodjan Bidaj
- G01 - MEASURING TESTING
Information Patent Grant
Transfer apparatus for inspection apparatus, inspection apparatus,...
- Patent number 11,867,747
- Issue date Jan 9, 2024
- Koh Young Technology Inc.
- Myong Kang
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 11,821,940
- Issue date Nov 21, 2023
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assembly for checking the functionality of a measuring object
- Patent number 11,815,543
- Issue date Nov 14, 2023
- Neuroloop GmbH
- Fabian Kimmig
- G01 - MEASURING TESTING
Information Patent Grant
Conduction inspection jig, and inspection method of printed wiring...
- Patent number 11,789,063
- Issue date Oct 17, 2023
- Ibiden Co., Ltd.
- Takayuki Mori
- G01 - MEASURING TESTING
Information Patent Grant
Test fixture for printed circuit board components
- Patent number 11,719,740
- Issue date Aug 8, 2023
- Aptiv Technologies Limited
- Biswadeep Das Gupta
- G01 - MEASURING TESTING
Information Patent Grant
Methods and assemblies for tuning electronic modules
- Patent number 11,693,029
- Issue date Jul 4, 2023
- NXP USA, INC.
- Joshua Bennett English
- G01 - MEASURING TESTING
Information Patent Grant
Modular electronic testing system with flexible test PCB format
- Patent number 11,674,996
- Issue date Jun 13, 2023
- MODUS TEST, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Grant
Adjustable anchor for printed circuit board environmental sensor
- Patent number 11,644,500
- Issue date May 9, 2023
- Cisco Technology, Inc.
- Mohammed Ghouse
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Device, system, and method for testing printed circuit board
- Patent number 11,644,499
- Issue date May 9, 2023
- HKC CORPORATION LIMITED
- Guang Hui Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Electronics tester
- Patent number 11,635,459
- Issue date Apr 25, 2023
- AEHR Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method, method of inspecting magnetic disk device, and electronic c...
- Patent number 11,609,285
- Issue date Mar 21, 2023
- Kabushiki Kaisha Toshiba
- Yoshihiro Amemiya
- G01 - MEASURING TESTING
Information Patent Grant
Multi-angle sample holder with integrated micromanipulator
- Patent number 11,604,212
- Issue date Mar 14, 2023
- Meta Platforms, Inc.
- Pradip Sairam Pichumani
- G01 - MEASURING TESTING
Information Patent Grant
Method for manufacturing system analysis and/or maintenance
- Patent number 11,598,801
- Issue date Mar 7, 2023
- Arch Systems Inc.
- Timothy Matthew Burke
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Diagnostic Device
- Publication number 20240418773
- Publication date Dec 19, 2024
- The Boeing Company
- Ian M. Dayton
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...
- Publication number 20240402217
- Publication date Dec 5, 2024
- Smiths Interconnect Americas, Inc.
- Khaled Elmadbouly
- G01 - MEASURING TESTING
Information Patent Application
PINBOARD REPAIR JIG AND PINBOARD ASSEMBLY
- Publication number 20240393385
- Publication date Nov 28, 2024
- SAMSUNG DISPLAY CO., LTD.
- WOONGIL CHOI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR ADJUSTING THE POSITION OF PROBING BASE AND PROBING MACHI...
- Publication number 20240393386
- Publication date Nov 28, 2024
- MPI CORPORATION
- YA-HUNG LO
- G01 - MEASURING TESTING
Information Patent Application
Test head for a finger tester, and method for testing printed circu...
- Publication number 20240385215
- Publication date Nov 21, 2024
- ATG LUTHER & MAELZER GMBH
- Christian Weindel
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD OF BARE CIRCUIT BOARD
- Publication number 20240310428
- Publication date Sep 19, 2024
- Unimicron Technology Corp.
- Chun-Hsien CHIEN
- G01 - MEASURING TESTING
Information Patent Application
CONTACT DEVICE
- Publication number 20240310430
- Publication date Sep 19, 2024
- Feinmetall GmbH
- Lutz Benedix
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICAL CONNECTOR, ADAPTER AND TEST DEVICE WITH SMOOTH IMPEDANCE...
- Publication number 20240310429
- Publication date Sep 19, 2024
- LUXSHARE PRECISION INDUSTRY COMPANY LIMITED
- Chien-Yu HSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC BOARD PROBING STATION
- Publication number 20240280629
- Publication date Aug 22, 2024
- NVIDIA Corporation
- Akhilesh Sandeep Thakur
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD DETECTION DEVICE
- Publication number 20240248129
- Publication date Jul 25, 2024
- MPI Corporation
- Wen-Wei Lin
- G01 - MEASURING TESTING
Information Patent Application
AUTONOMOUS DETECTION OF MEMORY INSERTION INTO TEST EQUIPMENT WITHOU...
- Publication number 20240210464
- Publication date Jun 27, 2024
- Intelligent Memory Limited
- Mike Hossein Amidi
- G01 - MEASURING TESTING
Information Patent Application
FLEXIBLE CIRCUIT BOARD TEST DEVICE
- Publication number 20240192264
- Publication date Jun 13, 2024
- Honor Device Co., Ltd.
- Ruifei WANG
- G01 - MEASURING TESTING
Information Patent Application
MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...
- Publication number 20240133945
- Publication date Apr 25, 2024
- Mohanraj Prabhugoud
- G01 - MEASURING TESTING
Information Patent Application
CUSTOMIZABLE SAFETY ENCLOSURE FOR A DEVICE UNDER TEST
- Publication number 20240118336
- Publication date Apr 11, 2024
- Tektronix, Inc.
- David Thomas Engquist
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20240036103
- Publication date Feb 1, 2024
- Aehr Test Systems
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TESTING DEVICE AND METHOD, AND NON-TRANSITORY COMPUTER-READABLE REC...
- Publication number 20240019483
- Publication date Jan 18, 2024
- TOKYO ELECTRON LIMITED
- Shinjiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
MODULAR ELECTRONIC TESTING SYSTEM WITH FLEXIBLE TEST PCB FORMAT
- Publication number 20230341457
- Publication date Oct 26, 2023
- Modus Test, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Application
FORCE, DEFLECTION, RESISTANCE, AND TEMPERATURE TESTING SYSTEM AND M...
- Publication number 20230296663
- Publication date Sep 21, 2023
- Modus Test, LLC
- Lynwood Adams
- G01 - MEASURING TESTING
Information Patent Application
Test Fixture for Printed Circuit Board Components
- Publication number 20230258708
- Publication date Aug 17, 2023
- Aptiv Technologies Limited
- Biswadeep Das Gupta
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC ASSEMBLY CARRIER WITH BUILT-IN SHUNT
- Publication number 20230251301
- Publication date Aug 10, 2023
- Nebulon, Inc.
- EUGENE YAN KI HSUE
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC CIRCUIT BOARD TESTING SYSTEM
- Publication number 20230236240
- Publication date Jul 27, 2023
- Magnalytix, LLC
- Michael L. Bixenman
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONICS TESTER
- Publication number 20230204651
- Publication date Jun 29, 2023
- AEHR TEST SYSTEMS
- Jovan Jovanovic
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Test Fixture for Printed Circuit Board Components
- Publication number 20230176109
- Publication date Jun 8, 2023
- Aptiv Technologies Limited
- Biswadeep Das Gupta
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION JIG AND CIRCUIT BOARD INSPECTION APPARATUS INCLUDING THE...
- Publication number 20230127957
- Publication date Apr 27, 2023
- NIDEC-READ CORPORATION
- Kohei TSUMURA
- G01 - MEASURING TESTING
Information Patent Application
FUNCTIONAL TEST HEAD FOR PRINTED CIRCUIT BOARDS
- Publication number 20230120501
- Publication date Apr 20, 2023
- Anora, LLC
- Pramodchandran Variyam
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT BOARD INSPECTING APPARATUS
- Publication number 20230115469
- Publication date Apr 13, 2023
- NIDEC-READ CORPORATION
- Toshihide MATSUKAWA
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TESTER HAVING AN INTERPOSER TRANSFER BOARD
- Publication number 20230068075
- Publication date Mar 2, 2023
- Circuit Check, Inc.
- William E. CROWTHER
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MANUFACTURING SYSTEM ANALYSIS AND/OR MAINTENANCE
- Publication number 20230032751
- Publication date Feb 2, 2023
- Timothy Matthew Burke
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DIE TESTING DEVICE AND METHOD
- Publication number 20230036484
- Publication date Feb 2, 2023
- STMicroelectronics (Grenoble 2) SAS
- Klodjan BIDAJ
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE
- Publication number 20230024921
- Publication date Jan 26, 2023
- NIDEC-READ CORPORATION
- Takashi ISA
- G01 - MEASURING TESTING

Holding, conveying or contacting devices

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Diagnostic device

Electronics tester

Electronic circuit board testing system

Test fixture for printed circuit board components

Autonomous detection of memory insertion into test equipment withou...

Detection apparatus and anti-bending device thereof

Inspection jig and circuit board inspection apparatus including the...

Securing a probe to a device under test

Circuit board inspecting apparatus

Carrier mechanism and processing equipment including the carrier me...

Electrical connection test for unpopulated printed circuit boards

Systems, methods and devices for high-speed input/output margin tes...

Functional test head for printed circuit boards

Inspection device

Inspection jig, and inspection device

Jig for inspection apparatus, inspection apparatus, and inspection set

Electronic die testing device and method

Transfer apparatus for inspection apparatus, inspection apparatus,...

Electronics tester

Assembly for checking the functionality of a measuring object

Conduction inspection jig, and inspection method of printed wiring...

Test fixture for printed circuit board components

Methods and assemblies for tuning electronic modules

Modular electronic testing system with flexible test PCB format

Adjustable anchor for printed circuit board environmental sensor

Device, system, and method for testing printed circuit board

Electronics tester

Method, method of inspecting magnetic disk device, and electronic c...

Multi-angle sample holder with integrated micromanipulator

Method for manufacturing system analysis and/or maintenance

Patents Applicationslast 30 patents

Diagnostic Device

SYSTEMS AND METHODS FOR COAXIAL TEST SOCKET AND PRINTED CIRCUIT BOA...

PINBOARD REPAIR JIG AND PINBOARD ASSEMBLY

METHOD FOR ADJUSTING THE POSITION OF PROBING BASE AND PROBING MACHI...

Test head for a finger tester, and method for testing printed circu...

INSPECTION SYSTEM AND INSPECTION METHOD OF BARE CIRCUIT BOARD

CONTACT DEVICE

ELECTRICAL CONNECTOR, ADAPTER AND TEST DEVICE WITH SMOOTH IMPEDANCE...

AUTOMATIC BOARD PROBING STATION

CIRCUIT BOARD DETECTION DEVICE

AUTONOMOUS DETECTION OF MEMORY INSERTION INTO TEST EQUIPMENT WITHOU...

FLEXIBLE CIRCUIT BOARD TEST DEVICE

MODULAR LOW LEVEL CONTACT RESISTANCE TESTING APPARATUS FOR PROCESS...

CUSTOMIZABLE SAFETY ENCLOSURE FOR A DEVICE UNDER TEST

ELECTRONICS TESTER

TESTING DEVICE AND METHOD, AND NON-TRANSITORY COMPUTER-READABLE REC...

MODULAR ELECTRONIC TESTING SYSTEM WITH FLEXIBLE TEST PCB FORMAT

FORCE, DEFLECTION, RESISTANCE, AND TEMPERATURE TESTING SYSTEM AND M...

Test Fixture for Printed Circuit Board Components

ELECTRONIC ASSEMBLY CARRIER WITH BUILT-IN SHUNT

ELECTRONIC CIRCUIT BOARD TESTING SYSTEM

ELECTRONICS TESTER

Test Fixture for Printed Circuit Board Components

INSPECTION JIG AND CIRCUIT BOARD INSPECTION APPARATUS INCLUDING THE...

FUNCTIONAL TEST HEAD FOR PRINTED CIRCUIT BOARDS

CIRCUIT BOARD INSPECTING APPARATUS

CIRCUIT TESTER HAVING AN INTERPOSER TRANSFER BOARD

METHOD FOR MANUFACTURING SYSTEM ANALYSIS AND/OR MAINTENANCE

ELECTRONIC DIE TESTING DEVICE AND METHOD

INSPECTION DEVICE