Illuminating optical parts

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CPC
G01N2201/063

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/063Illuminating optical parts

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Systems and methods for live projection imaging for fluorescence mi...
- Patent number 12,366,740
- Issue date Jul 22, 2025
- The Board of Regents of the University of Texas System
- Reto Fiolka
- G01 - MEASURING TESTING
Information Patent Grant
Phase retrieval
- Patent number 12,366,525
- Issue date Jul 22, 2025
- Applied Materials Israel Ltd.
- Benny Kirshner
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method using the same
- Patent number 12,360,055
- Issue date Jul 15, 2025
- Samsung Display Co., Ltd.
- Sungwoo Jung
- G01 - MEASURING TESTING
Information Patent Grant
Characteristic information extraction method and portable detection...
- Patent number 12,360,047
- Issue date Jul 15, 2025
- Jiangsu University
- Quansheng Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Enhanced evanescent prism coupling systems and methods for characte...
- Patent number 12,345,629
- Issue date Jul 1, 2025
- Corning Incorporated
- Rostislav Vatchev Roussev
- G01 - MEASURING TESTING
Information Patent Grant
Ellipsometer and apparatus for inspecting semiconductor device incl...
- Patent number 12,345,626
- Issue date Jul 1, 2025
- Samsung Electronics Co., Ltd.
- Yasuhiro Hidaka
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas detection device and gas detection method
- Patent number 12,345,631
- Issue date Jul 1, 2025
- Kabushiki Kaisha Toshiba
- Yasutomo Shiomi
- G01 - MEASURING TESTING
Information Patent Grant
Fully compensated optical gas sensing system and apparatus
- Patent number 12,345,632
- Issue date Jul 1, 2025
- Analog Devices, Inc.
- Shrenik Deliwala
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of textile fiber composition
- Patent number 12,339,224
- Issue date Jun 24, 2025
- VALVAN NV
- Frank Vandeputte
- G01 - MEASURING TESTING
Information Patent Grant
Dissolved gas sensing system and method
- Patent number 12,332,169
- Issue date Jun 17, 2025
- Woods Hole Oceanographic Institution
- Jason Kapit
- G01 - MEASURING TESTING
Information Patent Grant
System for, and calibration and testing of directed beam ellipsomet...
- Patent number 12,332,163
- Issue date Jun 17, 2025
- J. A. Woollam Co., Inc.
- Ping He
- G01 - MEASURING TESTING
Information Patent Grant
Dual lens inspection device
- Patent number 12,332,181
- Issue date Jun 17, 2025
- Sun Yang Optics Development Co., Ltd.
- Sheng Che Wu
- G01 - MEASURING TESTING
Information Patent Grant
Test device for body fluid analysis
- Patent number 12,329,492
- Issue date Jun 17, 2025
- Ji Hoon Kim
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection system for manufactured components
- Patent number 12,326,406
- Issue date Jun 10, 2025
- General Inspection, LLC
- Mike Nygaard
- G01 - MEASURING TESTING
Information Patent Grant
Multi-mode illumination system
- Patent number 12,320,749
- Issue date Jun 3, 2025
- ESSENLIX CORPORATION
- Ji Qi
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for multi-view episcopic selective plane illumina...
- Patent number 12,320,966
- Issue date Jun 3, 2025
- CZ Biohub SF, LLC.
- Bin Yang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of ambient gas sensing in a vehicle
- Patent number 12,313,536
- Issue date May 27, 2025
- Joyson Safety Systems Acquisition LLC
- Salvatore Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Successive optical analysis system and successive optical analysis...
- Patent number 12,306,101
- Issue date May 20, 2025
- VIEWORKS CO., LTD.
- Young Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for obtaining information about a sample
- Patent number 12,306,100
- Issue date May 20, 2025
- LAVCHIEFF Analytics GmbH
- Ventsislav Lavchiev
- G01 - MEASURING TESTING
Information Patent Grant
Seamless integrating cavity of monolithic fumed silica
- Patent number 12,298,235
- Issue date May 13, 2025
- Southwest Research Institute
- Thomas Moore
- G01 - MEASURING TESTING
Information Patent Grant
Coating condition detection method, coating condition detection dev...
- Patent number 12,297,143
- Issue date May 13, 2025
- Sumitomo Electric Industries, Ltd.
- Tadashi Enomoto
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
System and method for reducing sample noise using selective markers
- Patent number 12,298,254
- Issue date May 13, 2025
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,292,386
- Issue date May 6, 2025
- VIENEX CORPORATION
- Yukihiro Kagawa
- G01 - MEASURING TESTING
Information Patent Grant
Miniature multispectral detection system having multiple spectromet...
- Patent number 12,292,376
- Issue date May 6, 2025
- LIGHTSENSE TECHNOLOGY, INC.
- Wade Martin Poteet
- G01 - MEASURING TESTING
Information Patent Grant
System for locating a woven preform tracer
- Patent number 12,287,281
- Issue date Apr 29, 2025
- SAFRAN
- Benoît Vincent Pierre Lasjaunias
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Fluorescence scanning system for analytical ultracentrifugation
- Patent number 12,287,265
- Issue date Apr 29, 2025
- The United States of America, as represented by the Secretary, Department of...
- Peter W. Schuck
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic Raman device
- Patent number 12,287,290
- Issue date Apr 29, 2025
- Shimadzu Corporation
- Tomoyo Tao
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-micro defect detection apparatus and detection method thereof
- Patent number 12,288,318
- Issue date Apr 29, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Homogenized coherent excitation of a sample for determining molecul...
- Patent number 12,281,987
- Issue date Apr 22, 2025
- Indian Institute of Science
- Siva Umapathy
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE
- Publication number 20250237607
- Publication date Jul 24, 2025
- Cerillo, Inc.
- Kevin Seitter
- G01 - MEASURING TESTING
Information Patent Application
TEST OBJECT ANALYSIS METHOD
- Publication number 20250237608
- Publication date Jul 24, 2025
- HAMAMTSU PHOTONICS K.K.
- Kazuhiko FUJIWARA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS
- Publication number 20250234096
- Publication date Jul 17, 2025
- Panasonic Intellectual Property Management Co., Ltd.
- Yusuke KITAGAWA
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE
- Publication number 20250224342
- Publication date Jul 10, 2025
- Hitachi High-Tech Corporation
- Tomoharu NAGASHIMA
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION APPARATUS AND WAFER INSPECTION SYSTEM INCLUDING TH...
- Publication number 20250224345
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Jun Taek OH
- G01 - MEASURING TESTING
Information Patent Application
SPECTROSCOPIC ELLIPSOMETER AND SUBSTRATE ANALYSIS METHOD USING THE...
- Publication number 20250224326
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Jaeho KIM
- G01 - MEASURING TESTING
Information Patent Application
WHITE LIGHT SCATTERING IN OPTICAL BIOMOLECULE INTERACTION ANALYSIS
- Publication number 20250216328
- Publication date Jul 3, 2025
- Miltenyi Biotec B.V. & Co. KG
- Heinrich SPIECKER
- G01 - MEASURING TESTING
Information Patent Application
COMPACT INJECTION MOLDED OPTICAL MODULE FOR GAS SENSING
- Publication number 20250216327
- Publication date Jul 3, 2025
- Renesas Electronics America Inc.
- Mohammad Taghi FATHI
- G01 - MEASURING TESTING
Information Patent Application
OBJECT IMAGING APPARATUS AND OBJECT RECOGNITION APPARATUS
- Publication number 20250205745
- Publication date Jun 26, 2025
- PFU Limited
- Masanobu HONGO
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM
- Publication number 20250208059
- Publication date Jun 26, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Boris GOLBERG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING HEAD AND MEASUREMENT APPARATUS FOR PERFORMING SURFACE-ENH...
- Publication number 20250208047
- Publication date Jun 26, 2025
- Justin Moretto
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEMS AND RELATED METHODS
- Publication number 20250208053
- Publication date Jun 26, 2025
- Gemological Institute of America, Inc.
- Zhen WANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Optical Modulator, Laser Interferometer, And Spectroscopic Apparatus
- Publication number 20250198913
- Publication date Jun 19, 2025
- SEIKO EPSON CORPORATION
- Kohei YAMADA
- G01 - MEASURING TESTING
Information Patent Application
Device and Method to Capture High Resolution Images of a Moving Obj...
- Publication number 20250198884
- Publication date Jun 19, 2025
- Derrick Schmenk
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
PROCEDURE FOR COMMISSIONING A MEASURING SYSTEM, MEASURING SYSTEM AN...
- Publication number 20250198911
- Publication date Jun 19, 2025
- Endress + Hauser Conducta GmbH + Co. KG
- Thilo Krätschmer
- G01 - MEASURING TESTING
Information Patent Application
Mirror Movement Mechanism And Interferometer
- Publication number 20250198922
- Publication date Jun 19, 2025
- SEIKO EPSON CORPORATION
- Koji CHINDO
- G01 - MEASURING TESTING
Information Patent Application
IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
- Publication number 20250189459
- Publication date Jun 12, 2025
- Corning Incorporated
- Davide Giassi
- G01 - MEASURING TESTING
Information Patent Application
MULTIPASS ABSORPTION CELL
- Publication number 20250189433
- Publication date Jun 12, 2025
- Alpes Lasers SA
- Richard MAULINI
- G01 - MEASURING TESTING
Information Patent Application
RADIATION EMITTER AND MEASUREMENT SYSTEM
- Publication number 20250189444
- Publication date Jun 12, 2025
- Industrial Technology Research Institute
- Karthickraj Muthuramalingam
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- Chia-Liang LIN
- G01 - MEASURING TESTING
Information Patent Application
TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...
- Publication number 20250189445
- Publication date Jun 12, 2025
- TSINGHUA UNIVERSITY
- Ziran ZHAO
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR FLUORESCENCE DETECTION IN ELECTRONIC DEVIC...
- Publication number 20250180484
- Publication date Jun 5, 2025
- ORBOTECH LTD.
- Ophir Eyal
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...
- Publication number 20250180475
- Publication date Jun 5, 2025
- OPSOLUTION GMBH
- BJOERN MAGNUSSEN
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ACQUISITION DEVICE AND ACQUISITION METHOD FOR DETECTING TARGE...
- Publication number 20250172500
- Publication date May 29, 2025
- EzDiaTech Inc.
- Yong-Gyun JUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NON-INTRUSIVE LASER-BASED TECHNIQUE FOR MONITOR AND CONTROL OF PROT...
- Publication number 20250172496
- Publication date May 29, 2025
- Erica BELMONT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY
- Publication number 20250164410
- Publication date May 22, 2025
- TOKYO ELECTRON LIMITED
- Holger Tuitje
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR RESOLVING IMAGING PROBLEMS CAUSED BY THE MENISCUS
- Publication number 20250161946
- Publication date May 22, 2025
- Amgen Inc.
- Graham F. Milne
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
COOLING UNIT, OBJECTIVE LENS MODULE, AND SEMICONDUCTOR INSPECTION A...
- Publication number 20250155339
- Publication date May 15, 2025
- Hamamatsu Photonics K.K.
- Akihiro NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE
- Publication number 20250146928
- Publication date May 8, 2025
- Japan Display Inc.
- Tomoyuki ISHIHARA
- G01 - MEASURING TESTING
Information Patent Application
power transformer fault detection device
- Publication number 20250146932
- Publication date May 8, 2025
- Zhejiang Wanli University
- Danjiang Chen
- G01 - MEASURING TESTING

Illuminating optical parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Systems and methods for live projection imaging for fluorescence mi...

Phase retrieval

Inspection system and inspection method using the same

Characteristic information extraction method and portable detection...

Enhanced evanescent prism coupling systems and methods for characte...

Ellipsometer and apparatus for inspecting semiconductor device incl...

Gas detection device and gas detection method

Fully compensated optical gas sensing system and apparatus

Method and apparatus for determination of textile fiber composition

Dissolved gas sensing system and method

System for, and calibration and testing of directed beam ellipsomet...

Dual lens inspection device

Test device for body fluid analysis

Inspection system for manufactured components

Multi-mode illumination system

Method and system for multi-view episcopic selective plane illumina...

Detection method of crease degree of screen and visual detection ap...

Systems and methods of ambient gas sensing in a vehicle

Successive optical analysis system and successive optical analysis...

Measurement system and method for obtaining information about a sample

Seamless integrating cavity of monolithic fumed silica

Coating condition detection method, coating condition detection dev...

System and method for reducing sample noise using selective markers

Foreign substance/defect inspection device, image generation device...

Miniature multispectral detection system having multiple spectromet...

System for locating a woven preform tracer

Fluorescence scanning system for analytical ultracentrifugation

Microscopic Raman device

Ultra-micro defect detection apparatus and detection method thereof

Homogenized coherent excitation of a sample for determining molecul...

Patents Applicationslast 30 patents

AN APPARATUS FOR MEASURING LIQUID SAMPLE TRANSMITTANCE

TEST OBJECT ANALYSIS METHOD

OPTICAL APPARATUS

OPTICAL-TYPE FOREIGN MATTER INSPECTION DEVICE

WAFER INSPECTION APPARATUS AND WAFER INSPECTION SYSTEM INCLUDING TH...

SPECTROSCOPIC ELLIPSOMETER AND SUBSTRATE ANALYSIS METHOD USING THE...

WHITE LIGHT SCATTERING IN OPTICAL BIOMOLECULE INTERACTION ANALYSIS

COMPACT INJECTION MOLDED OPTICAL MODULE FOR GAS SENSING

OBJECT IMAGING APPARATUS AND OBJECT RECOGNITION APPARATUS

MIRROR-BASED RELAY FOR AN OPTICAL INSPECTION SYSTEM

MEASURING HEAD AND MEASUREMENT APPARATUS FOR PERFORMING SURFACE-ENH...

IMAGING SYSTEMS AND RELATED METHODS

Optical Modulator, Laser Interferometer, And Spectroscopic Apparatus

Device and Method to Capture High Resolution Images of a Moving Obj...

PROCEDURE FOR COMMISSIONING A MEASURING SYSTEM, MEASURING SYSTEM AN...

Mirror Movement Mechanism And Interferometer

IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS

MULTIPASS ABSORPTION CELL

RADIATION EMITTER AND MEASUREMENT SYSTEM

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD

TERAHERTZ SIGNAL-BASED IMAGE COLLECTION METHOD AND IMAGE COLLECTION...

APPARATUS AND METHOD FOR FLUORESCENCE DETECTION IN ELECTRONIC DEVIC...

NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...

IMAGE ACQUISITION DEVICE AND ACQUISITION METHOD FOR DETECTING TARGE...

NON-INTRUSIVE LASER-BASED TECHNIQUE FOR MONITOR AND CONTROL OF PROT...

OPTICAL METROLOGY

APPARATUS FOR RESOLVING IMAGING PROBLEMS CAUSED BY THE MENISCUS

COOLING UNIT, OBJECTIVE LENS MODULE, AND SEMICONDUCTOR INSPECTION A...

DETECTION DEVICE

power transformer fault detection device