Illuminating optical parts

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CPC
G01N2201/063

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/063Illuminating optical parts

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automated detection and repositioning of micro-objects in microflui...
- Patent number 12,272,048
- Issue date Apr 8, 2025
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for assessing optical quality of gemstones
- Patent number 12,270,765
- Issue date Apr 8, 2025
- Gemological Institute of America, Inc.
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Gas detection device
- Patent number 12,270,759
- Issue date Apr 8, 2025
- Kabushiki Kaisha Toshiba
- G01 - MEASURING TESTING
Information Patent Grant
Clinical spectrophotometer for general chemistry, immuno-assay and...
- Patent number 12,269,032
- Issue date Apr 8, 2025
- In Diagnostics, Inc.
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Wafer defect detection device
- Patent number 12,265,038
- Issue date Apr 1, 2025
- PlayNitride Display Co., Ltd.
- Yi-Chia Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and water quality analysis system
- Patent number 12,265,028
- Issue date Apr 1, 2025
- HORIBA ADVANCED TECHNO, CO., LTD.
- Issei Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Compact imaging-based sensors
- Patent number 12,265,019
- Issue date Apr 1, 2025
- ESSENLIX CORPORATION
- Stephen Y. Chou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Shearography and interferometry sensor with multidirectional dynami...
- Patent number 12,265,024
- Issue date Apr 1, 2025
- Petroleo Brasileiro S.A. Petrobras
- Sergio Damasceno Soares
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Broadband pulsed light source apparatus and spectroscopic measureme...
- Patent number 12,259,317
- Issue date Mar 25, 2025
- Ushio Denki Kabushiki Kaisha
- Junki Sahara
- G01 - MEASURING TESTING
Information Patent Grant
Light-source apparatus, inspection apparatus, and adjustment method
- Patent number 12,259,339
- Issue date Mar 25, 2025
- Lasertec Corporation
- Jun Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Biological sample image collection device and gene sequencer
- Patent number 12,259,310
- Issue date Mar 25, 2025
- BGI SHENZHEN
- Zhonghai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for simulating a solar spectrum
- Patent number 12,247,918
- Issue date Mar 11, 2025
- USA as Represented by the Secretary of the Army
- Hajin Kim
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexing of an active sensor detector using structured illumina...
- Patent number 12,241,833
- Issue date Mar 4, 2025
- Illumina, Inc.
- Thomas Baker
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting chemical compounds in soil
- Patent number 12,241,829
- Issue date Mar 4, 2025
- S4 Mobile Laboratories, LLC
- Lamalani Suarez
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for resolving imaging problems caused by the meniscus
- Patent number 12,226,777
- Issue date Feb 18, 2025
- Amgen Inc.
- Graham F. Milne
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Optical switch devices
- Patent number 12,223,794
- Issue date Feb 11, 2025
- Wavefront Technology, Inc.
- Christopher Chapman Rich
- B42 - BOOKBINDING ALBUMS FILES SPECIAL PRINTED MATTER
Information Patent Grant
Measurement apparatus
- Patent number 12,216,045
- Issue date Feb 4, 2025
- Shimadzu Corporation
- Tatsuya Ikehara
- G01 - MEASURING TESTING
Information Patent Grant
Fourier transform spectrometer and method of Fourier transform spec...
- Patent number 12,216,047
- Issue date Feb 4, 2025
- The University of Manchester
- Nawapong Unsuree
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus
- Patent number 12,216,048
- Issue date Feb 4, 2025
- Ricoh Company, Ltd.
- Ryosuke Kasahara
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,209,971
- Issue date Jan 28, 2025
- VIENEX CORPORATION
- Osamu Iwasaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Real-time detection of deflections and ruptures of EUV pellicle mem...
- Patent number 12,209,975
- Issue date Jan 28, 2025
- Intel Corporation
- John Ferdinand Magana
- G01 - MEASURING TESTING
Information Patent Grant
Optical nanostructure rejecter for an integrated device and related...
- Patent number 12,203,853
- Issue date Jan 21, 2025
- Quantum-Si Incorporated
- Ali Kabiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polar-azimuth spectral imaging and analysis device with modular sam...
- Patent number 12,203,850
- Issue date Jan 21, 2025
- Florida Polytechnic University
- Nathan Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Multi-element super resolution optical inspection system
- Patent number 12,203,857
- Issue date Jan 21, 2025
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
High throughput snapshot spectral encoding device for fluorescence...
- Patent number 12,196,679
- Issue date Jan 14, 2025
- University of Southern California
- Francesco Cutrale
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe comprising a waveguide and method for real-time and i...
- Patent number 12,196,676
- Issue date Jan 14, 2025
- CHRYSALABS INC.
- Gabriel Mangeat
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus
- Patent number 12,181,691
- Issue date Dec 31, 2024
- Disco Corporation
- Nobuyuki Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition device, image acquisition method, and spatial lig...
- Patent number 12,174,120
- Issue date Dec 24, 2024
- Hamamatsu Photonics K.K.
- Yuu Takiguchi
- G01 - MEASURING TESTING
Information Patent Grant
Plasma treatment apparatus, a method of monitoring a process of man...
- Patent number 12,170,233
- Issue date Dec 17, 2024
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing package, optical module and method for detecting light
- Patent number 12,169,170
- Issue date Dec 17, 2024
- Advanced Semiconductor Engineering, Inc.
- Wei-Hao Chang
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
METROLOGY INTEGRATED WITH VACUUM PROCESSING
- Publication number 20250112065
- Publication date Apr 3, 2025
- TOKYO ELECTRON LIMITED
- Ivan MALEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATING SPHERE-BASED FLUORESCENCE DETECTION SYSTEM FOR REAL-TIM...
- Publication number 20250110052
- Publication date Apr 3, 2025
- Kai ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MICROSCOPE AND METHOD FOR ADJUSTING SAME
- Publication number 20250110324
- Publication date Apr 3, 2025
- Shimadzu Corporation
- Yuka MORITANI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC PHOTONIC SENSOR
- Publication number 20250110379
- Publication date Apr 3, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Loïc LAPLATINE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...
- Publication number 20250102446
- Publication date Mar 27, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G01 - MEASURING TESTING
Information Patent Application
Electronic Devices With Relative Humidity Sensors
- Publication number 20250102425
- Publication date Mar 27, 2025
- Apple Inc.
- Fehmi Civitci
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102434
- Publication date Mar 27, 2025
- Lasertec Corporation
- Mizuki KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION OPTICAL UNIT FOR A MASK INSPECTION SYSTEM
- Publication number 20250093770
- Publication date Mar 20, 2025
- Carl Zeiss SMT GMBH
- Sören Schmidt
- G01 - MEASURING TESTING
Information Patent Application
LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...
- Publication number 20250093261
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- Unjeong Kim
- G01 - MEASURING TESTING
Information Patent Application
LIGHT ENERGY EXCITER
- Publication number 20250093566
- Publication date Mar 20, 2025
- Illumina, Inc.
- Alexa HUDNUT
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECTRAL IMAGING
- Publication number 20250076189
- Publication date Mar 6, 2025
- Teknologian Tutkimuskeskus VTT Oy
- Jussi SOUKKAMÄKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...
- Publication number 20250076186
- Publication date Mar 6, 2025
- Government of the United States of America, as Represented by the Secretary o...
- Young Jong Lee
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...
- Publication number 20250067680
- Publication date Feb 27, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Dong Hoon SONG
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE FOR AN OPTICAL SAMPLE AND METHOD FOR TESTING AN OPTI...
- Publication number 20250067659
- Publication date Feb 27, 2025
- Trioptics GmbH
- Aiko RUPRECHT
- G01 - MEASURING TESTING
Information Patent Application
AN OPTICAL SPECTROMETER AND A METHOD FOR SPECTRALLY RESOLVED TWO-DI...
- Publication number 20250060309
- Publication date Feb 20, 2025
- Mantis Photonics AB
- Diego GUÉNOT
- G01 - MEASURING TESTING
Information Patent Application
Active Transmission Measurement of Optical Metasurface during Etch...
- Publication number 20250050453
- Publication date Feb 13, 2025
- GAMDAN Optics, Inc.
- Thomas C Hutchens
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
PORTABLE INSTRUMENT FOR MEASURING GAS CONCENTRATION
- Publication number 20250052670
- Publication date Feb 13, 2025
- HEALTHY PHOTON (NINGBO) TECHNOLOGY CO., LTD.
- Yin WANG
- G01 - MEASURING TESTING
Information Patent Application
DUAL LENS INSPECTION DEVICE
- Publication number 20250052690
- Publication date Feb 13, 2025
- SUN YANG OPTICS DEVELOPMENT CO., LTD.
- SHENG CHE WU
- G01 - MEASURING TESTING
Information Patent Application
Substrates and Optical Systems and Methods of Use Thereof
- Publication number 20250043345
- Publication date Feb 6, 2025
- Pacific Biosciences of California, Inc.
- Cheng Frank Zhong
- G01 - MEASURING TESTING
Information Patent Application
SUBSTANCE COMPONENT DETECTION APPARATUS AND METHOD
- Publication number 20250044224
- Publication date Feb 6, 2025
- Huawei Technologies Co., Ltd
- Li Zheng
- G01 - MEASURING TESTING
Information Patent Application
SINGLE-PIXEL MULTISPECTRAL IMAGER FOR FLARE AND BURNER COMBUSTION E...
- Publication number 20250044219
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Sebastien Catheline
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for Multi-Modal Polarization Holographic Spect...
- Publication number 20250035538
- Publication date Jan 30, 2025
- The University of Hong Kong
- Yanmin ZHU
- G01 - MEASURING TESTING
Information Patent Application
IMAGING DEVICE, INSPECTION DEVICE, AND IMAGING METHOD
- Publication number 20250035561
- Publication date Jan 30, 2025
- KABUSHIKI KAISHA N-TECH
- Tohru Watanabe
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND OPTICAL MEASURING APPARATUS
- Publication number 20250027874
- Publication date Jan 23, 2025
- YOKOGAWA ELECTRIC CORPORATION
- Takeshi SAWADA
- G01 - MEASURING TESTING
Information Patent Application
DEVICE FOR INSPECTING A HUMAN BODY PORTION AND ASSOCIATED METHOD
- Publication number 20250020587
- Publication date Jan 16, 2025
- L'Oreal
- Benjamin ASKENAZI
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive In-situ Measurement Device and Method for High-Comp...
- Publication number 20250020595
- Publication date Jan 16, 2025
- TSINGHUA UNIVERSITY
- Chen Wang
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20250012712
- Publication date Jan 9, 2025
- Horiba, Ltd.
- Kohei TACHIBANA
- G01 - MEASURING TESTING
Information Patent Application
MILKING SYSTEM WITH SAMPLING AND ANALYSIS
- Publication number 20250012729
- Publication date Jan 9, 2025
- Lely Patent N.V.
- Johannes Adriaan DRONKERT
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20250012726
- Publication date Jan 9, 2025
- Lasertec Corporation
- Shota FUJIKI
- G01 - MEASURING TESTING

Illuminating optical parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated detection and repositioning of micro-objects in microflui...

Apparatus and method for assessing optical quality of gemstones

Gas detection device

Clinical spectrophotometer for general chemistry, immuno-assay and...

Wafer defect detection device

Optical measurement device and water quality analysis system

Compact imaging-based sensors

Shearography and interferometry sensor with multidirectional dynami...

Broadband pulsed light source apparatus and spectroscopic measureme...

Light-source apparatus, inspection apparatus, and adjustment method

Biological sample image collection device and gene sequencer

Method and device for simulating a solar spectrum

Multiplexing of an active sensor detector using structured illumina...

Method and apparatus for detecting chemical compounds in soil

Apparatus for resolving imaging problems caused by the meniscus

Optical switch devices

Measurement apparatus

Fourier transform spectrometer and method of Fourier transform spec...

Measuring apparatus

Foreign substance/defect inspection device, image generation device...

Real-time detection of deflections and ruptures of EUV pellicle mem...

Optical nanostructure rejecter for an integrated device and related...

Polar-azimuth spectral imaging and analysis device with modular sam...

Multi-element super resolution optical inspection system

High throughput snapshot spectral encoding device for fluorescence...

Optical probe comprising a waveguide and method for real-time and i...

Inspecting apparatus

Image acquisition device, image acquisition method, and spatial lig...

Plasma treatment apparatus, a method of monitoring a process of man...

Sensing package, optical module and method for detecting light

Patents Applicationslast 30 patents

METROLOGY INTEGRATED WITH VACUUM PROCESSING

INTEGRATING SPHERE-BASED FLUORESCENCE DETECTION SYSTEM FOR REAL-TIM...

RAMAN MICROSCOPE AND METHOD FOR ADJUSTING SAME

INTERFEROMETRIC PHOTONIC SENSOR

OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...

Electronic Devices With Relative Humidity Sensors

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

ILLUMINATION OPTICAL UNIT FOR A MASK INSPECTION SYSTEM

LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...

LIGHT ENERGY EXCITER

METHOD AND APPARATUS FOR SPECTRAL IMAGING

LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...

ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...

TESTING DEVICE FOR AN OPTICAL SAMPLE AND METHOD FOR TESTING AN OPTI...

AN OPTICAL SPECTROMETER AND A METHOD FOR SPECTRALLY RESOLVED TWO-DI...

Active Transmission Measurement of Optical Metasurface during Etch...

PORTABLE INSTRUMENT FOR MEASURING GAS CONCENTRATION

DUAL LENS INSPECTION DEVICE

Substrates and Optical Systems and Methods of Use Thereof

SUBSTANCE COMPONENT DETECTION APPARATUS AND METHOD

SINGLE-PIXEL MULTISPECTRAL IMAGER FOR FLARE AND BURNER COMBUSTION E...

WAFER DEFECT INSPECTION SYSTEM

Method and apparatus for Multi-Modal Polarization Holographic Spect...

IMAGING DEVICE, INSPECTION DEVICE, AND IMAGING METHOD

OPTICAL SYSTEMS AND OPTICAL MEASURING APPARATUS

DEVICE FOR INSPECTING A HUMAN BODY PORTION AND ASSOCIATED METHOD

Non-destructive In-situ Measurement Device and Method for High-Comp...

ANALYSIS DEVICE AND ANALYSIS METHOD

MILKING SYSTEM WITH SAMPLING AND ANALYSIS

INSPECTION APPARATUS AND INSPECTION METHOD