Illuminating optical parts

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CPC
G01N2201/063

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

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G01N2201/063Illuminating optical parts

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Optical nanostructure rejecter for an integrated device and related...
- Patent number 12,203,853
- Issue date Jan 21, 2025
- Quantum-Si Incorporated
- Ali Kabiri
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Polar-azimuth spectral imaging and analysis device with modular sam...
- Patent number 12,203,850
- Issue date Jan 21, 2025
- Florida Polytechnic University
- Nathan Dawson
- G01 - MEASURING TESTING
Information Patent Grant
Multi-element super resolution optical inspection system
- Patent number 12,203,857
- Issue date Jan 21, 2025
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
High throughput snapshot spectral encoding device for fluorescence...
- Patent number 12,196,679
- Issue date Jan 14, 2025
- University of Southern California
- Francesco Cutrale
- G01 - MEASURING TESTING
Information Patent Grant
Optical probe comprising a waveguide and method for real-time and i...
- Patent number 12,196,676
- Issue date Jan 14, 2025
- CHRYSALABS INC.
- Gabriel Mangeat
- G01 - MEASURING TESTING
Information Patent Grant
Inspecting apparatus
- Patent number 12,181,691
- Issue date Dec 31, 2024
- Disco Corporation
- Nobuyuki Kimura
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition device, image acquisition method, and spatial lig...
- Patent number 12,174,120
- Issue date Dec 24, 2024
- Hamamatsu Photonics K.K.
- Yuu Takiguchi
- G01 - MEASURING TESTING
Information Patent Grant
Plasma treatment apparatus, a method of monitoring a process of man...
- Patent number 12,170,233
- Issue date Dec 17, 2024
- Samsung Electronics Co., Ltd.
- Meehyun Lim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sensing package, optical module and method for detecting light
- Patent number 12,169,170
- Issue date Dec 17, 2024
- Advanced Semiconductor Engineering, Inc.
- Wei-Hao Chang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical interrogation system and method
- Patent number 12,169,173
- Issue date Dec 17, 2024
- Universite Laval
- Maxime Joly
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,163,892
- Issue date Dec 10, 2024
- Nova Ltd.
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Grant
Gas detection device, gas detection system, and gas detection method
- Patent number 12,163,881
- Issue date Dec 10, 2024
- NEC Platforms, Ltd.
- Fujio Okumura
- G01 - MEASURING TESTING
Information Patent Grant
Digital mirror device based code-division multiplexed Raman optical...
- Patent number 12,163,891
- Issue date Dec 10, 2024
- CytoVeris, Inc.
- Alan Kersey
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Adjustable extended focus raman system
- Patent number 12,158,425
- Issue date Dec 3, 2024
- Thermo Scientific Portable Analytical Instruments Inc.
- Malcolm C. Smith
- G01 - MEASURING TESTING
Information Patent Grant
Spectrometry device
- Patent number 12,158,417
- Issue date Dec 3, 2024
- National University Corporation Kagawa University
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Grant
Gas sensors using non-dispersive infrared materials
- Patent number 12,158,418
- Issue date Dec 3, 2024
- Lumileds LLC
- Florent Gregoire Monestier
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for multi-reflection solution immersed silicon-ba...
- Patent number 12,152,982
- Issue date Nov 26, 2024
- Korea Research Institute of Standards and Science
- Hyun Mo Cho
- G01 - MEASURING TESTING
Information Patent Grant
Accurate Raman spectroscopy
- Patent number 12,152,993
- Issue date Nov 26, 2024
- Nova Ltd.
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Grant
Slope, p-component and s-component measurement
- Patent number 12,146,830
- Issue date Nov 19, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device
- Patent number 12,146,840
- Issue date Nov 19, 2024
- HITACHI HIGH-TECH CORPORATION
- Eiji Arima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection device and detection method
- Patent number 12,140,531
- Issue date Nov 12, 2024
- BEIJING BOE HEALTH TECHNOLOGY CO., LTD.
- Hongquan Li
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Light emitting diode arrangements for gemstone evaluation
- Patent number 12,135,278
- Issue date Nov 5, 2024
- Gemological Institute of America, Inc. (GIA)
- Jing Zeng
- F21 - LIGHTING
Information Patent Grant
Inspection apparatus and focal position adjustment method
- Patent number 12,135,295
- Issue date Nov 5, 2024
- NuFlare Technology, Inc.
- Masaya Takeda
- G01 - MEASURING TESTING
Information Patent Grant
Synchronous detection system and detection method for trace nitroge...
- Patent number 12,123,825
- Issue date Oct 22, 2024
- Anhui University of Science and Technology
- Huawei Jin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for high speed inspection of semiconductor substr...
- Patent number 12,119,273
- Issue date Oct 15, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Sheng He Huang
- G01 - MEASURING TESTING
Information Patent Grant
Biochip device
- Patent number 12,117,397
- Issue date Oct 15, 2024
- Gen-Probe Incorporated
- Claude Weisbuch
- G01 - MEASURING TESTING
Information Patent Grant
Retro-reflectometer for measuring retro-reflectivity of objects in...
- Patent number 12,117,395
- Issue date Oct 15, 2024
- Waymo LLC
- Hui Seong Son
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for an absorbance detector with optical reference
- Patent number 12,111,212
- Issue date Oct 8, 2024
- Excelitas Technologies Corp.
- Lowell Brunson
- G01 - MEASURING TESTING
Information Patent Grant
Vibration measurement device
- Patent number 12,111,266
- Issue date Oct 8, 2024
- Shimadzu Corporation
- Takahide Hatahori
- G01 - MEASURING TESTING
Information Patent Grant
Automatic display pixel inspection system and method
- Patent number 12,112,469
- Issue date Oct 8, 2024
- LG Electronics Inc.
- Seunghwan Seok
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR INSPECTING A HUMAN BODY PORTION AND ASSOCIATED METHOD
- Publication number 20250020587
- Publication date Jan 16, 2025
- L'Oreal
- Benjamin ASKENAZI
- G01 - MEASURING TESTING
Information Patent Application
Non-destructive In-situ Measurement Device and Method for High-Comp...
- Publication number 20250020595
- Publication date Jan 16, 2025
- TSINGHUA UNIVERSITY
- Chen Wang
- G01 - MEASURING TESTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20250012712
- Publication date Jan 9, 2025
- Horiba, Ltd.
- Kohei TACHIBANA
- G01 - MEASURING TESTING
Information Patent Application
MILKING SYSTEM WITH SAMPLING AND ANALYSIS
- Publication number 20250012729
- Publication date Jan 9, 2025
- Lely Patent N.V.
- Johannes Adriaan DRONKERT
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20250012726
- Publication date Jan 9, 2025
- Lasertec Corporation
- Shota FUJIKI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND SUBSTRATE PROCESSING APPARATUS
- Publication number 20250003874
- Publication date Jan 2, 2025
- TOKYO ELECTRON LIMITED
- Yuji OTSUKI
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Measurement of Bidirectional Reflectance Distribution
- Publication number 20250003875
- Publication date Jan 2, 2025
- Datacolor Inc.
- Zhiling Xu
- G01 - MEASURING TESTING
Information Patent Application
TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...
- Publication number 20240426750
- Publication date Dec 26, 2024
- Heraeus Quartz North America LLC
- Maximilian SCHMITT
- G01 - MEASURING TESTING
Information Patent Application
Gas Absorption Spectrometer
- Publication number 20240418636
- Publication date Dec 19, 2024
- Shimadzu Corporation
- Yuta KAWASHIMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING SATURATES, AROMATICS, RESINS, AND ASPHALTENE...
- Publication number 20240418698
- Publication date Dec 19, 2024
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Shahnawaz Hossain Molla
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR SIMULATING A SOLAR SPECTRUM
- Publication number 20240418643
- Publication date Dec 19, 2024
- United States of America, as Represented by the Secretary of the Army (U.S. A...
- Hajin Kim
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLE LIGHT PATHS ARCHITECTURE AND OBSCURATION METHODS FOR SIGNA...
- Publication number 20240418644
- Publication date Dec 19, 2024
- Apple Inc.
- Chin San Han
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240418645
- Publication date Dec 19, 2024
- Samsung Electronics Co., Ltd.
- Hojun Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE SENSOR SYSTEM
- Publication number 20240418642
- Publication date Dec 19, 2024
- VIAVI SOLUTIONS INC.
- Curtis R. HRUSKA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS
- Publication number 20240407667
- Publication date Dec 12, 2024
- Hyperspectral Corp.
- David M. Palacios
- G01 - MEASURING TESTING
Information Patent Application
CELL AND OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF...
- Publication number 20240410823
- Publication date Dec 12, 2024
- Nikira Labs Inc.
- John Brian Leen
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR ABSORPTION-SPECTROSCOPIC GAS MEASUREMENT, USE...
- Publication number 20240410820
- Publication date Dec 12, 2024
- M & C TechGroup Germany GmbH
- Johann Georges des Aulnois
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL ANALYZER AND OPTICAL ANALYSIS SYSTEM THEREFOR
- Publication number 20240402076
- Publication date Dec 5, 2024
- Dalian Mega Crystal Biological Technology Co., Ltd.
- Yi-sheng TING
- G01 - MEASURING TESTING
Information Patent Application
RAMAN SPECTROSCOPY PROBE AND RAMAN SPECTROSCOPY APPARATUS
- Publication number 20240402087
- Publication date Dec 5, 2024
- CREO MEDICAL LIMITED
- Christopher Paul HANCOCK
- G01 - MEASURING TESTING
Information Patent Application
DETECTION TUBE, DETECTION SYSTEM AND OPTICAL DETECTION METHOD FOR P...
- Publication number 20240402080
- Publication date Dec 5, 2024
- SKYLA Corporation
- Chua-Zu Huang
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF PHOTOLUMINESCENCE IN A DROPLET
- Publication number 20240402084
- Publication date Dec 5, 2024
- Advanced Nano Technologies Limited
- Norman McMillan
- G01 - MEASURING TESTING
Information Patent Application
SPECTROMETRY DEVICE
- Publication number 20240385107
- Publication date Nov 21, 2024
- National University Corporation Kagawa University
- Ichiro Ishimaru
- G01 - MEASURING TESTING
Information Patent Application
MICROSCOPIC RAMAN DEVICE
- Publication number 20240385036
- Publication date Nov 21, 2024
- Shimadzu Corporation
- Ryuta SHIBUTANI
- G01 - MEASURING TESTING
Information Patent Application
CONTAINER FOR RECEIVING SEMICONDUCTOR DEVICE
- Publication number 20240387216
- Publication date Nov 21, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- HSU TUNG YEN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL SENSOR DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD
- Publication number 20240385118
- Publication date Nov 21, 2024
- Mitsubishi Electric Corporation
- Akihiro FUJIE
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS FOR INSPECTION OF SEMICONDUCTOR SUBSTRATES
- Publication number 20240379463
- Publication date Nov 14, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Sheng He HUANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLUORESCENCE DETECTION VIA OUTCOUPLERS
- Publication number 20240377324
- Publication date Nov 14, 2024
- Hewlett-Packard Development Company, L.P.
- Alexander Govyadinov
- G01 - MEASURING TESTING
Information Patent Application
HYPERSPECTRAL IMAGING WITH A SPATIAL HETERODYNE SPECTROMETER
- Publication number 20240377330
- Publication date Nov 14, 2024
- University of South Carolina
- STANLEY MICHAEL ANGEL
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED OPTICAL INSPECTION TOOL
- Publication number 20240377334
- Publication date Nov 14, 2024
- Applied Materials, Inc.
- Mark Anthony Lee
- G01 - MEASURING TESTING
Information Patent Application
ELECTRODE SURFACE INSPECTION DEVICE
- Publication number 20240372161
- Publication date Nov 7, 2024
- LG ENERGY SOLUTION, LTD.
- Hongjae KO
- H01 - BASIC ELECTRIC ELEMENTS

Illuminating optical parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical nanostructure rejecter for an integrated device and related...

Polar-azimuth spectral imaging and analysis device with modular sam...

Multi-element super resolution optical inspection system

High throughput snapshot spectral encoding device for fluorescence...

Optical probe comprising a waveguide and method for real-time and i...

Inspecting apparatus

Image acquisition device, image acquisition method, and spatial lig...

Plasma treatment apparatus, a method of monitoring a process of man...

Sensing package, optical module and method for detecting light

Optical interrogation system and method

Accurate Raman spectroscopy

Gas detection device, gas detection system, and gas detection method

Digital mirror device based code-division multiplexed Raman optical...

Adjustable extended focus raman system

Spectrometry device

Gas sensors using non-dispersive infrared materials

Device and method for multi-reflection solution immersed silicon-ba...

Accurate Raman spectroscopy

Slope, p-component and s-component measurement

Defect inspection device

Detection device and detection method

Light emitting diode arrangements for gemstone evaluation

Inspection apparatus and focal position adjustment method

Synchronous detection system and detection method for trace nitroge...

System and method for high speed inspection of semiconductor substr...

Biochip device

Retro-reflectometer for measuring retro-reflectivity of objects in...

Systems and methods for an absorbance detector with optical reference

Vibration measurement device

Automatic display pixel inspection system and method

Patents Applicationslast 30 patents

DEVICE FOR INSPECTING A HUMAN BODY PORTION AND ASSOCIATED METHOD

Non-destructive In-situ Measurement Device and Method for High-Comp...

ANALYSIS DEVICE AND ANALYSIS METHOD

MILKING SYSTEM WITH SAMPLING AND ANALYSIS

INSPECTION APPARATUS AND INSPECTION METHOD

MEASUREMENT METHOD AND SUBSTRATE PROCESSING APPARATUS

Measurement of Bidirectional Reflectance Distribution

TOMOGRAPHIC REFRACTIVE INDEX PROFILE EVALUATION OF NON-SYMMETRICAL...

Gas Absorption Spectrometer

METHOD OF DETERMINING SATURATES, AROMATICS, RESINS, AND ASPHALTENE...

METHOD AND DEVICE FOR SIMULATING A SOLAR SPECTRUM

MULTIPLE LIGHT PATHS ARCHITECTURE AND OBSCURATION METHODS FOR SIGNA...

SEMICONDUCTOR MEASUREMENT APPARATUS

IMAGE SENSOR SYSTEM

SYSTEMS AND METHODS FOR SCREENING ASYMPTOMATIC VIRUS EMITTERS

CELL AND OPTICAL CAVITY FOR ABSORPTION SPECTROSCOPY AND METHODS OF...

MEASURING DEVICE FOR ABSORPTION-SPECTROSCOPIC GAS MEASUREMENT, USE...

OPTICAL ANALYZER AND OPTICAL ANALYSIS SYSTEM THEREFOR

RAMAN SPECTROSCOPY PROBE AND RAMAN SPECTROSCOPY APPARATUS

DETECTION TUBE, DETECTION SYSTEM AND OPTICAL DETECTION METHOD FOR P...

MEASUREMENT OF PHOTOLUMINESCENCE IN A DROPLET

SPECTROMETRY DEVICE

MICROSCOPIC RAMAN DEVICE

CONTAINER FOR RECEIVING SEMICONDUCTOR DEVICE

OPTICAL SENSOR DEVICE, MEASUREMENT SYSTEM, AND MEASUREMENT METHOD

SYSTEMS FOR INSPECTION OF SEMICONDUCTOR SUBSTRATES

FLUORESCENCE DETECTION VIA OUTCOUPLERS

HYPERSPECTRAL IMAGING WITH A SPATIAL HETERODYNE SPECTROMETER

AUTOMATED OPTICAL INSPECTION TOOL

ELECTRODE SURFACE INSPECTION DEVICE