Illuminating optical parts

Industry

CPC
G01N2201/063

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2201/00Features of devices classified in G01N21/00

Current Industry

G01N2201/063Illuminating optical parts

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and system for multi-view episcopic selective plane illumina...
- Patent number 12,320,966
- Issue date Jun 3, 2025
- CZ Biohub SF, LLC.
- Bin Yang
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Multi-mode illumination system
- Patent number 12,320,749
- Issue date Jun 3, 2025
- ESSENLIX CORPORATION
- Ji Qi
- G01 - MEASURING TESTING
Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods of ambient gas sensing in a vehicle
- Patent number 12,313,536
- Issue date May 27, 2025
- Joyson Safety Systems Acquisition LLC
- Salvatore Brauer
- G01 - MEASURING TESTING
Information Patent Grant
Successive optical analysis system and successive optical analysis...
- Patent number 12,306,101
- Issue date May 20, 2025
- VIEWORKS CO., LTD.
- Young Ho Kim
- G01 - MEASURING TESTING
Information Patent Grant
Measurement system and method for obtaining information about a sample
- Patent number 12,306,100
- Issue date May 20, 2025
- LAVCHIEFF Analytics GmbH
- Ventsislav Lavchiev
- G01 - MEASURING TESTING
Information Patent Grant
Seamless integrating cavity of monolithic fumed silica
- Patent number 12,298,235
- Issue date May 13, 2025
- Southwest Research Institute
- Thomas Moore
- G01 - MEASURING TESTING
Information Patent Grant
Coating condition detection method, coating condition detection dev...
- Patent number 12,297,143
- Issue date May 13, 2025
- Sumitomo Electric Industries, Ltd.
- Tadashi Enomoto
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
System and method for reducing sample noise using selective markers
- Patent number 12,298,254
- Issue date May 13, 2025
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,292,386
- Issue date May 6, 2025
- VIENEX CORPORATION
- Yukihiro Kagawa
- G01 - MEASURING TESTING
Information Patent Grant
Miniature multispectral detection system having multiple spectromet...
- Patent number 12,292,376
- Issue date May 6, 2025
- LIGHTSENSE TECHNOLOGY, INC.
- Wade Martin Poteet
- G01 - MEASURING TESTING
Information Patent Grant
System for locating a woven preform tracer
- Patent number 12,287,281
- Issue date Apr 29, 2025
- SAFRAN
- Benoît Vincent Pierre Lasjaunias
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Fluorescence scanning system for analytical ultracentrifugation
- Patent number 12,287,265
- Issue date Apr 29, 2025
- The United States of America, as represented by the Secretary, Department of...
- Peter W. Schuck
- G01 - MEASURING TESTING
Information Patent Grant
Microscopic Raman device
- Patent number 12,287,290
- Issue date Apr 29, 2025
- Shimadzu Corporation
- Tomoyo Tao
- G01 - MEASURING TESTING
Information Patent Grant
Ultra-micro defect detection apparatus and detection method thereof
- Patent number 12,288,318
- Issue date Apr 29, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Homogenized coherent excitation of a sample for determining molecul...
- Patent number 12,281,987
- Issue date Apr 22, 2025
- Indian Institute of Science
- Siva Umapathy
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurements
- Patent number 12,281,984
- Issue date Apr 22, 2025
- Pacific Light & Hologram, Inc.
- Kamran Qaderi
- G01 - MEASURING TESTING
Information Patent Grant
Multi-track Raman well plate reader
- Patent number 12,281,986
- Issue date Apr 22, 2025
- Horiba Instruments Incorporated
- Nicolas Vezard
- G01 - MEASURING TESTING
Information Patent Grant
Automated detection and repositioning of micro-objects in microflui...
- Patent number 12,272,048
- Issue date Apr 8, 2025
- Fenglei Du
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for assessing optical quality of gemstones
- Patent number 12,270,765
- Issue date Apr 8, 2025
- Gemological Institute of America, Inc.
- Hiroshi Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Gas detection device
- Patent number 12,270,759
- Issue date Apr 8, 2025
- Kabushiki Kaisha Toshiba
- Masatoshi Hirono
- G01 - MEASURING TESTING
Information Patent Grant
Clinical spectrophotometer for general chemistry, immuno-assay and...
- Patent number 12,269,032
- Issue date Apr 8, 2025
- In Diagnostics, Inc.
- Octavian Florescu
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Wafer defect detection device
- Patent number 12,265,038
- Issue date Apr 1, 2025
- PlayNitride Display Co., Ltd.
- Yi-Chia Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Optical measurement device and water quality analysis system
- Patent number 12,265,028
- Issue date Apr 1, 2025
- HORIBA ADVANCED TECHNO, CO., LTD.
- Issei Kobayashi
- G01 - MEASURING TESTING
Information Patent Grant
Compact imaging-based sensors
- Patent number 12,265,019
- Issue date Apr 1, 2025
- ESSENLIX CORPORATION
- Stephen Y. Chou
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Shearography and interferometry sensor with multidirectional dynami...
- Patent number 12,265,024
- Issue date Apr 1, 2025
- Petroleo Brasileiro S.A. Petrobras
- Sergio Damasceno Soares
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Broadband pulsed light source apparatus and spectroscopic measureme...
- Patent number 12,259,317
- Issue date Mar 25, 2025
- Ushio Denki Kabushiki Kaisha
- Junki Sahara
- G01 - MEASURING TESTING
Information Patent Grant
Light-source apparatus, inspection apparatus, and adjustment method
- Patent number 12,259,339
- Issue date Mar 25, 2025
- Lasertec Corporation
- Jun Sakuma
- G01 - MEASURING TESTING
Information Patent Grant
Biological sample image collection device and gene sequencer
- Patent number 12,259,310
- Issue date Mar 25, 2025
- BGI SHENZHEN
- Zhonghai Wang
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for simulating a solar spectrum
- Patent number 12,247,918
- Issue date Mar 11, 2025
- USA as Represented by the Secretary of the Army
- Hajin Kim
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR FLUORESCENCE DETECTION IN ELECTRONIC DEVIC...
- Publication number 20250180484
- Publication date Jun 5, 2025
- ORBOTECH LTD.
- Ophir Eyal
- G01 - MEASURING TESTING
Information Patent Application
NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...
- Publication number 20250180475
- Publication date Jun 5, 2025
- OPSOLUTION GMBH
- BJOERN MAGNUSSEN
- G01 - MEASURING TESTING
Information Patent Application
IMAGE ACQUISITION DEVICE AND ACQUISITION METHOD FOR DETECTING TARGE...
- Publication number 20250172500
- Publication date May 29, 2025
- EzDiaTech Inc.
- Yong-Gyun JUNG
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
NON-INTRUSIVE LASER-BASED TECHNIQUE FOR MONITOR AND CONTROL OF PROT...
- Publication number 20250172496
- Publication date May 29, 2025
- Erica BELMONT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL METROLOGY
- Publication number 20250164410
- Publication date May 22, 2025
- TOKYO ELECTRON LIMITED
- Holger Tuitje
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS FOR RESOLVING IMAGING PROBLEMS CAUSED BY THE MENISCUS
- Publication number 20250161946
- Publication date May 22, 2025
- Amgen Inc.
- Graham F. Milne
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
COOLING UNIT, OBJECTIVE LENS MODULE, AND SEMICONDUCTOR INSPECTION A...
- Publication number 20250155339
- Publication date May 15, 2025
- Hamamatsu Photonics K.K.
- Akihiro NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
DETECTION DEVICE
- Publication number 20250146928
- Publication date May 8, 2025
- Japan Display Inc.
- Tomoyuki ISHIHARA
- G01 - MEASURING TESTING
Information Patent Application
power transformer fault detection device
- Publication number 20250146932
- Publication date May 8, 2025
- Zhejiang Wanli University
- Danjiang Chen
- G01 - MEASURING TESTING
Information Patent Application
EXCHANGEABLE SPARK UNIT, SYSTEM AND CALIBRATION METHOD
- Publication number 20250146944
- Publication date May 8, 2025
- Heraeus Electro-Nite International N.V.
- Luc VRANCKX
- G01 - MEASURING TESTING
Information Patent Application
SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING
- Publication number 20250137920
- Publication date May 1, 2025
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20250130172
- Publication date Apr 24, 2025
- NOVA LTD
- Elad Schleifer
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...
- Publication number 20250130175
- Publication date Apr 24, 2025
- Kabushiki Kaisha Toshiba
- Hideaki OKANO
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL CHAMBER BASE WITH INTEGRATED REFLECTIVE SURFACES FOR PARTIC...
- Publication number 20250123204
- Publication date Apr 17, 2025
- Honeywell International Inc.
- Massimo Bressanutti
- G01 - MEASURING TESTING
Information Patent Application
ACCURATE RAMAN SPECTROSCOPY
- Publication number 20250116605
- Publication date Apr 10, 2025
- NOVA LTD
- Eyal Hollander
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY INTEGRATED WITH VACUUM PROCESSING
- Publication number 20250112065
- Publication date Apr 3, 2025
- TOKYO ELECTRON LIMITED
- Ivan MALEEV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATING SPHERE-BASED FLUORESCENCE DETECTION SYSTEM FOR REAL-TIM...
- Publication number 20250110052
- Publication date Apr 3, 2025
- Kai ZHANG
- G01 - MEASURING TESTING
Information Patent Application
RAMAN MICROSCOPE AND METHOD FOR ADJUSTING SAME
- Publication number 20250110324
- Publication date Apr 3, 2025
- Shimadzu Corporation
- Yuka MORITANI
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC PHOTONIC SENSOR
- Publication number 20250110379
- Publication date Apr 3, 2025
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Loïc LAPLATINE
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...
- Publication number 20250102446
- Publication date Mar 27, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G01 - MEASURING TESTING
Information Patent Application
Electronic Devices With Relative Humidity Sensors
- Publication number 20250102425
- Publication date Mar 27, 2025
- Apple Inc.
- Fehmi Civitci
- G01 - MEASURING TESTING
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102434
- Publication date Mar 27, 2025
- Lasertec Corporation
- Mizuki KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION OPTICAL UNIT FOR A MASK INSPECTION SYSTEM
- Publication number 20250093770
- Publication date Mar 20, 2025
- Carl Zeiss SMT GMBH
- Sören Schmidt
- G01 - MEASURING TESTING
Information Patent Application
LIGHT ENERGY EXCITER
- Publication number 20250093566
- Publication date Mar 20, 2025
- Illumina, Inc.
- Alexa HUDNUT
- G01 - MEASURING TESTING
Information Patent Application
LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...
- Publication number 20250093261
- Publication date Mar 20, 2025
- Samsung Electronics Co., Ltd.
- Unjeong Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SPECTRAL IMAGING
- Publication number 20250076189
- Publication date Mar 6, 2025
- Teknologian Tutkimuskeskus VTT Oy
- Jussi SOUKKAMÄKI
- G01 - MEASURING TESTING
Information Patent Application
LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...
- Publication number 20250076186
- Publication date Mar 6, 2025
- Government of the United States of America, as Represented by the Secretary o...
- Young Jong Lee
- G01 - MEASURING TESTING
Information Patent Application
ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...
- Publication number 20250067680
- Publication date Feb 27, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Dong Hoon SONG
- G01 - MEASURING TESTING
Information Patent Application
TESTING DEVICE FOR AN OPTICAL SAMPLE AND METHOD FOR TESTING AN OPTI...
- Publication number 20250067659
- Publication date Feb 27, 2025
- Trioptics GmbH
- Aiko RUPRECHT
- G01 - MEASURING TESTING
Information Patent Application
AN OPTICAL SPECTROMETER AND A METHOD FOR SPECTRALLY RESOLVED TWO-DI...
- Publication number 20250060309
- Publication date Feb 20, 2025
- Mantis Photonics AB
- Diego GUÉNOT
- G01 - MEASURING TESTING

Illuminating optical parts

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for multi-view episcopic selective plane illumina...

Multi-mode illumination system

Detection method of crease degree of screen and visual detection ap...

Systems and methods of ambient gas sensing in a vehicle

Successive optical analysis system and successive optical analysis...

Measurement system and method for obtaining information about a sample

Seamless integrating cavity of monolithic fumed silica

Coating condition detection method, coating condition detection dev...

System and method for reducing sample noise using selective markers

Foreign substance/defect inspection device, image generation device...

Miniature multispectral detection system having multiple spectromet...

System for locating a woven preform tracer

Fluorescence scanning system for analytical ultracentrifugation

Microscopic Raman device

Ultra-micro defect detection apparatus and detection method thereof

Homogenized coherent excitation of a sample for determining molecul...

Optical measurements

Multi-track Raman well plate reader

Automated detection and repositioning of micro-objects in microflui...

Apparatus and method for assessing optical quality of gemstones

Gas detection device

Clinical spectrophotometer for general chemistry, immuno-assay and...

Wafer defect detection device

Optical measurement device and water quality analysis system

Compact imaging-based sensors

Shearography and interferometry sensor with multidirectional dynami...

Broadband pulsed light source apparatus and spectroscopic measureme...

Light-source apparatus, inspection apparatus, and adjustment method

Biological sample image collection device and gene sequencer

Method and device for simulating a solar spectrum

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR FLUORESCENCE DETECTION IN ELECTRONIC DEVIC...

NON-INVASIVE MEASUREMENT OF PHYSIOLOGICAL PARAMETERS OR SUBSTANCE C...

IMAGE ACQUISITION DEVICE AND ACQUISITION METHOD FOR DETECTING TARGE...

NON-INTRUSIVE LASER-BASED TECHNIQUE FOR MONITOR AND CONTROL OF PROT...

OPTICAL METROLOGY

APPARATUS FOR RESOLVING IMAGING PROBLEMS CAUSED BY THE MENISCUS

COOLING UNIT, OBJECTIVE LENS MODULE, AND SEMICONDUCTOR INSPECTION A...

DETECTION DEVICE

power transformer fault detection device

EXCHANGEABLE SPARK UNIT, SYSTEM AND CALIBRATION METHOD

SINGLE WAFER ORIENTATION TOOL-INDUCED SHIFT CLEANING

ACCURATE RAMAN SPECTROSCOPY

OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION METHOD, AND NON-TR...

OPTICAL CHAMBER BASE WITH INTEGRATED REFLECTIVE SURFACES FOR PARTIC...

ACCURATE RAMAN SPECTROSCOPY

METROLOGY INTEGRATED WITH VACUUM PROCESSING

INTEGRATING SPHERE-BASED FLUORESCENCE DETECTION SYSTEM FOR REAL-TIM...

RAMAN MICROSCOPE AND METHOD FOR ADJUSTING SAME

INTERFEROMETRIC PHOTONIC SENSOR

OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...

Electronic Devices With Relative Humidity Sensors

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

ILLUMINATION OPTICAL UNIT FOR A MASK INSPECTION SYSTEM

LIGHT ENERGY EXCITER

LINE-ILLUMINATING LIGHT SOURCE FOR IMAGING APPARATUS, IMAGING APPAR...

METHOD AND APPARATUS FOR SPECTRAL IMAGING

LIGHT INTENSITY CONTROLLER AND LASER WAVELENGTH SCANNING DOUBLE-BEA...

ILLUMINATION LIGHT SOURCE AND SUBSTRATE INSPECTION APPARATUS INCLUD...

TESTING DEVICE FOR AN OPTICAL SAMPLE AND METHOD FOR TESTING AN OPTI...

AN OPTICAL SPECTROMETER AND A METHOD FOR SPECTRALLY RESOLVED TWO-DI...