image digitised, -enhanced in an image processor

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G01N2223/42

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/42image digitised, -enhanced in an image processor

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Patents Grantslast 30 patents

Information Patent Grant
Flat panel detector and manufacturing method thereof
- Patent number 12,072,452
- Issue date Aug 27, 2024
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Jianxing Shang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 12,056,840
- Issue date Aug 6, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus and control method thereof, radiography...
- Patent number 12,036,061
- Issue date Jul 16, 2024
- Canon Kabushiki Kaisha
- Takeshi Noda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method to use artificial intelligence to enhance visual inspection...
- Patent number 11,988,630
- Issue date May 21, 2024
- Robert Bosch GmbH
- Craig Magera
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for crack detection
- Patent number 11,946,883
- Issue date Apr 2, 2024
- United States as represented by the Administrator of NASA
- Ajay M Koshti
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
Calibration method and device therefor
- Patent number 11,885,752
- Issue date Jan 30, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Grant
System and method for synthesizing a projection image
- Patent number 11,875,430
- Issue date Jan 16, 2024
- Shanghai United Imaging Healthcare Co., Ltd.
- Jonathan Maltz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for the proscriptive determination of parameters...
- Patent number 11,816,765
- Issue date Nov 14, 2023
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Characterizing a sample by material basis decomposition
- Patent number 11,808,565
- Issue date Nov 7, 2023
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Andrea Brambilla
- G01 - MEASURING TESTING
Information Patent Grant
System and method for material characterization
- Patent number 11,796,479
- Issue date Oct 24, 2023
- Southern Innovation International Pty Ltd
- Paul Scoullar
- E21 - EARTH DRILLING MINING
Information Patent Grant
System and method for identifying lithology based on images and XRF...
- Patent number 11,796,493
- Issue date Oct 24, 2023
- Shandong University
- Zhenhao Xu
- G01 - MEASURING TESTING
Information Patent Grant
System for providing a spectral image
- Patent number 11,744,532
- Issue date Sep 5, 2023
- Koninklijke Philips N.V.
- Michael Grass
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for detecting defects in devices using X-rays
- Patent number 11,688,067
- Issue date Jun 27, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Method of non-destructive imaging of the internal structure and dev...
- Patent number 11,670,053
- Issue date Jun 6, 2023
- RADALYTICA A.S.
- Josef Uher
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for printed circuit board design based on autom...
- Patent number 11,662,479
- Issue date May 30, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for manufacturing printed circuit board based o...
- Patent number 11,651,492
- Issue date May 16, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Serial Moire scanning phase contrast x-ray imaging
- Patent number 11,639,903
- Issue date May 2, 2023
- Battelle Memorial Institute
- Erin A. Miller
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Inspection device, inspection method, and method for producing obje...
- Patent number 11,639,904
- Issue date May 2, 2023
- Nikon Corporation
- Takeshi Ohbayashi
- G01 - MEASURING TESTING
Information Patent Grant
Radiation imaging apparatus, radiation imaging method, and non-tran...
- Patent number 11,635,392
- Issue date Apr 25, 2023
- Canon Kabushiki Kaisha
- Takeshi Noda
- G01 - MEASURING TESTING
Information Patent Grant
X-ray mass flow rate sensors for high pressure processes
- Patent number 11,629,984
- Issue date Apr 18, 2023
- Board of Regents, The University of Texas System
- Vivek Singhal
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for product failure prediction based on X-ray i...
- Patent number 11,615,533
- Issue date Mar 28, 2023
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection method for electrode structural body
- Patent number 11,598,731
- Issue date Mar 7, 2023
- Honda Motor Co., Ltd.
- Hiroaki Shimizu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 11,594,001
- Issue date Feb 28, 2023
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method acquiring projection image, control apparatus, control progr...
- Patent number 11,543,367
- Issue date Jan 3, 2023
- Rigaku Corporation
- Yoshihiro Takeda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System, kit, and method for x-ray imaging with removably attachable...
- Patent number 11,448,606
- Issue date Sep 20, 2022
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Imaging system for industrial equipment and process
- Patent number 11,442,030
- Issue date Sep 13, 2022
- Marcio Issamu Haraguchi
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, image processing method, and program
- Patent number 11,430,161
- Issue date Aug 30, 2022
- Canon Kabushiki Kaisha
- Atsushi Iwashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for process control based on X-ray inspection
- Patent number 11,430,118
- Issue date Aug 30, 2022
- Bruker Nano, Inc.
- David Lewis Adler
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING TH...
- Publication number 20240192154
- Publication date Jun 13, 2024
- Samsung Electronics Co., Ltd.
- Kwangeun Kim
- G01 - MEASURING TESTING
Information Patent Application
Procedure for generating fluoroscopic images for the reconstruction...
- Publication number 20240159691
- Publication date May 16, 2024
- Comet Yxlon GmbH
- Mareike Töpperwien
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...
- Publication number 20240151660
- Publication date May 9, 2024
- Diagnostic Instruments, Inc.
- Philip T. Merlo
- G01 - MEASURING TESTING
Information Patent Application
X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER
- Publication number 20240142392
- Publication date May 2, 2024
- MULTICT IMAGING LTD
- Nathan HERMONY
- G01 - MEASURING TESTING
Information Patent Application
Calibration Method and Device Therefor
- Publication number 20240134083
- Publication date Apr 25, 2024
- Rapiscan Holdings, Inc.
- Emmanuel St-Aubin
- G01 - MEASURING TESTING
Information Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
- Publication number 20240102945
- Publication date Mar 28, 2024
- Shimadzu Corporation
- Kana KOJIMA
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Generating High-Energy Three-Dimensional Co...
- Publication number 20240094147
- Publication date Mar 21, 2024
- Rapiscan Holdings, Inc.
- Mark Procter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTONOMOUSLY REMOVING FASTENERS EMBEDDED IN W...
- Publication number 20240046451
- Publication date Feb 8, 2024
- Urban Machine, Inc.
- Alexander Thiele
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
- Publication number 20230375484
- Publication date Nov 23, 2023
- The University of North Carolina at Chapel Hill
- Christina Inscoe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20230298295
- Publication date Sep 21, 2023
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR AUTONOMOUSLY REMOVING FASTENERS EMBEDDED IN W...
- Publication number 20230281793
- Publication date Sep 7, 2023
- Urban Machine, Inc.
- Alexander Thiele
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION SYSTEM FOR QUALITY ANALYSIS OF A PRODUCT TO BE INSPECTED
- Publication number 20230152240
- Publication date May 18, 2023
- MULTISCAN TECHNOLOGIES, S.L.
- Simon Hendrik E. VAN OLMEN
- G01 - MEASURING TESTING
Information Patent Application
RADIOGRAPHIC INSPECTION METHOD, RADIOGRAPHIC INSPECTION APPARATUS,...
- Publication number 20230128795
- Publication date Apr 27, 2023
- Hamamatsu Photonics K.K.
- Tatsuya ONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Measuring Dimensions Relative to Bounded Object
- Publication number 20230042608
- Publication date Feb 9, 2023
- Multiscale Technologies, Inc.
- Srinivasa R Kalidindi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR IDENTIFYING LITHOLOGY BASED ON IMAGES AND XRF...
- Publication number 20230003674
- Publication date Jan 5, 2023
- Shandong University
- Zhenhao XU
- G01 - MEASURING TESTING
Information Patent Application
FLAT PANEL DETECTOR AND MANUFACTURING METHOD THEREOF
- Publication number 20220390623
- Publication date Dec 8, 2022
- BEIJING BOE SENSOR TECHNOLOGY CO., LTD.
- Jianxing SHANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
IMAGE PROCESSING APPARATUS AND CONTROL METHOD THEREOF, RADIOGRAPHY...
- Publication number 20220142597
- Publication date May 12, 2022
- Canon Kabushiki Kaisha
- Takeshi Noda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND STORAGE ME...
- Publication number 20220091050
- Publication date Mar 24, 2022
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
System, Kit, and Method for X-Ray Imaging with Removably Attachable...
- Publication number 20220091054
- Publication date Mar 24, 2022
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SINGLE-PIXEL CAMERA BASED ON X-RAY COMPUTATIONAL CORRELATED I...
- Publication number 20220042928
- Publication date Feb 10, 2022
- INSTITUTE OF PHYSICS, CHINESE ACADEMY OF SCIENCES
- Aixin ZHANG
- G01 - MEASURING TESTING
Information Patent Application
System and Method for the Proscriptive Determination of Parameters...
- Publication number 20220028130
- Publication date Jan 27, 2022
- Carl Zeiss X-ray Microscopy, Inc.
- Matthew Andrew
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM FOR PROVIDING A SPECTRAL IMAGE
- Publication number 20210338182
- Publication date Nov 4, 2021
- Koninklijke Philips N.V.
- Michael GRASS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DUAL-ENERGY CT THROUGH PRIMARY BEAM MODULATION
- Publication number 20210247331
- Publication date Aug 12, 2021
- Georgia Tech Research Corporation
- Lei ZHU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20210225088
- Publication date Jul 22, 2021
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION
- Publication number 20210199592
- Publication date Jul 1, 2021
- Southern Innovation International Pty Ltd
- Paul Scoullar
- G01 - MEASURING TESTING
Information Patent Application
CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION
- Publication number 20210199429
- Publication date Jul 1, 2021
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Andrea BRAMBILLA
- G01 - MEASURING TESTING

image digitised, -enhanced in an image processor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Flat panel detector and manufacturing method thereof

Rotational X-ray inspection system and method

Methods and systems for generating three-dimensional images that en...

Image processing apparatus and control method thereof, radiography...

Method to use artificial intelligence to enhance visual inspection...

System and method for crack detection

Screening system

Calibration method and device therefor

System and method for synthesizing a projection image

System and method for the proscriptive determination of parameters...

Characterizing a sample by material basis decomposition

System and method for material characterization

System and method for identifying lithology based on images and XRF...

System for providing a spectral image

Methods and systems for detecting defects in devices using X-rays

Method of non-destructive imaging of the internal structure and dev...

Methods and systems for printed circuit board design based on autom...

Methods and systems for manufacturing printed circuit board based o...

Serial Moire scanning phase contrast x-ray imaging

Inspection device, inspection method, and method for producing obje...

Radiation imaging apparatus, radiation imaging method, and non-tran...

X-ray mass flow rate sensors for high pressure processes

Methods and systems for product failure prediction based on X-ray i...

Inspection method for electrode structural body

Methods and systems for generating three-dimensional images that en...

Method acquiring projection image, control apparatus, control progr...

System, kit, and method for x-ray imaging with removably attachable...

Imaging system for industrial equipment and process

Image processing apparatus, image processing method, and program

Methods and systems for process control based on X-ray inspection

Patents Applicationslast 30 patents

Methods and Systems for Generating Three-Dimensional Images that En...

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

PATTERN INSPECTION APPARATUS AND PATTERN INSPECTION METHOD USING TH...

Procedure for generating fluoroscopic images for the reconstruction...

SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...

X-RAY COMPUTED TOMOGRAPHY (CT) SCANNER

Calibration Method and Device Therefor

X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...

Systems and Methods for Generating High-Energy Three-Dimensional Co...

SYSTEM AND METHOD FOR AUTONOMOUSLY REMOVING FASTENERS EMBEDDED IN W...

SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...

Methods and Systems for Generating Three-Dimensional Images that En...

SYSTEM AND METHOD FOR AUTONOMOUSLY REMOVING FASTENERS EMBEDDED IN W...

INSPECTION SYSTEM FOR QUALITY ANALYSIS OF A PRODUCT TO BE INSPECTED

RADIOGRAPHIC INSPECTION METHOD, RADIOGRAPHIC INSPECTION APPARATUS,...

Method for Measuring Dimensions Relative to Bounded Object

SYSTEM AND METHOD FOR IDENTIFYING LITHOLOGY BASED ON IMAGES AND XRF...

FLAT PANEL DETECTOR AND MANUFACTURING METHOD THEREOF

IMAGE PROCESSING APPARATUS AND CONTROL METHOD THEREOF, RADIOGRAPHY...

IMAGE PROCESSING APPARATUS, IMAGE PROCESSING METHOD, AND STORAGE ME...

System, Kit, and Method for X-Ray Imaging with Removably Attachable...

X-RAY SINGLE-PIXEL CAMERA BASED ON X-RAY COMPUTATIONAL CORRELATED I...

System and Method for the Proscriptive Determination of Parameters...

SYSTEM FOR PROVIDING A SPECTRAL IMAGE

DUAL-ENERGY CT THROUGH PRIMARY BEAM MODULATION

Methods and Systems for Generating Three-Dimensional Images that En...

SYSTEM AND METHOD FOR MATERIAL CHARACTERIZATION

CHARACTERIZING A SAMPLE BY MATERIAL BASIS DECOMPOSITION