Imaging

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CPC
G01N2223/40

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/40Imaging

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for imaging a subject
- Patent number 12,201,466
- Issue date Jan 21, 2025
- Medtronic Navigation, Inc.
- Patrick A. Helm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing and detection of discontinuities in battery cells
- Patent number 12,203,880
- Issue date Jan 21, 2025
- GM Global Technology Operations LLC
- Sean Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for adaptive blending in computed tomography im...
- Patent number 12,205,253
- Issue date Jan 21, 2025
- GE Precision Healthcare LLC
- Brian Edward Nett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Structure information acquisition method and structure information...
- Patent number 12,196,690
- Issue date Jan 14, 2025
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING
Information Patent Grant
Methods for growing crystals on QCM sensors
- Patent number 12,195,840
- Issue date Jan 14, 2025
- Saudi Arabian Oil Company
- Ayrat Gizzatov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Spent or decommissioned accumulator treatment plant and process
- Patent number 12,191,463
- Issue date Jan 7, 2025
- Engitec Technologies S.p.A.
- Gianfranco Diegoli
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
X-ray system
- Patent number 12,181,427
- Issue date Dec 31, 2024
- The Nottingham Trent University
- Paul Evans
- G01 - MEASURING TESTING
Information Patent Grant
Utilize machine learning in selecting high quality averaged SEM ima...
- Patent number 12,182,983
- Issue date Dec 31, 2024
- ASML Netherlands B.V.
- Chen Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for computed tomography examination of fragments in gel block
- Patent number 12,174,213
- Issue date Dec 24, 2024
- The United States of America, as represented by the Secretary of the Navy
- Kyle D. Stoll
- F42 - AMMUNITION BLASTING
Information Patent Grant
Method and apparatus for Schottky TFE inspection
- Patent number 12,165,834
- Issue date Dec 10, 2024
- NUFLARE TECHNOLOGY, INC.
- Victor Katsap
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Artificial intelligence training with multiple pulsed x-ray source-...
- Patent number 12,144,670
- Issue date Nov 19, 2024
- AIXSCAN INC.
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, radiography system, image processing me...
- Patent number 12,140,553
- Issue date Nov 12, 2024
- FUJIFILM Corporation
- Kengo Nomura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
- Patent number 12,140,552
- Issue date Nov 12, 2024
- Konica Minolta, Inc.
- Sumiya Nagatsuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation detector and method for manufacturing radiation detector
- Patent number 12,140,715
- Issue date Nov 12, 2024
- Kyoto University
- Keiji Abe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated circumferential pipe scanning system
- Patent number 12,135,297
- Issue date Nov 5, 2024
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Grant
Variable zoom X-ray computed tomography method for composites
- Patent number 12,130,245
- Issue date Oct 29, 2024
- Board of Regents, The University of Texas System
- Andrew Makeev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method of producing a tomogram
- Patent number 12,131,411
- Issue date Oct 29, 2024
- ADAPTIX LTD
- Gil Travish
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system to characterize and monitor the sharpness of a di...
- Patent number 12,118,701
- Issue date Oct 15, 2024
- AGFA NV
- Marc Cresens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Fast 3D radiography with multiple pulsed X-ray sources by deflectin...
- Patent number 12,102,469
- Issue date Oct 1, 2024
- AIXSCAN INC.
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system, determination processing apparatus, and inspecti...
- Patent number 12,105,033
- Issue date Oct 1, 2024
- JGC CORPORATION
- Teruaki Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Radio-opaque fillers in multiple layers of golf balls
- Patent number 12,090,371
- Issue date Sep 17, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- G01 - MEASURING TESTING
Information Patent Grant
Surface determination using three-dimensional voxel data
- Patent number 12,086,923
- Issue date Sep 10, 2024
- Faro Technologies, Inc.
- Ariane Stiebeiner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation imaging system
- Patent number 12,082,967
- Issue date Sep 10, 2024
- Canon Kabushiki Kaisha
- Satoshi Kamei
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...
- Publication number 20250029225
- Publication date Jan 23, 2025
- JEOL Ltd.
- Yuka Ebata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR POWERLINE INSPECTION
- Publication number 20250029224
- Publication date Jan 23, 2025
- Abhinav Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PHOTOELECTRON EMISSION MICROSCOPE
- Publication number 20250020604
- Publication date Jan 16, 2025
- HITACHI HIGH-TECH CORPORATION
- Momoyo ENYAMA
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...
- Publication number 20250012740
- Publication date Jan 9, 2025
- KIOXIA Corporation
- Takeshi OWAKI
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...
- Publication number 20250012742
- Publication date Jan 9, 2025
- VG SYSTEMS LIMITED
- Austin Penrose DAY
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...
- Publication number 20250003899
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Tim HOUBEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...
- Publication number 20250003895
- Publication date Jan 2, 2025
- Canon Kabushiki Kaisha
- Atsushi IWASHITA
- G01 - MEASURING TESTING
Information Patent Application
FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...
- Publication number 20250003898
- Publication date Jan 2, 2025
- HITACHI HIGH-TECH CORPORATION
- Wei SUN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION
- Publication number 20250006456
- Publication date Jan 2, 2025
- ASML NETHERLANDS B.V.
- Wei FANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
- Publication number 20240415482
- Publication date Dec 19, 2024
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AN X-RAY SYSTEM
- Publication number 20240418658
- Publication date Dec 19, 2024
- THE NOTTINGHAM TRENT UNIVERSITY
- Paul EVANS
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR SCATTER ESTIMATION IN COMPUTED TOMOGRAPHY...
- Publication number 20240412426
- Publication date Dec 12, 2024
- CANON MEDICAL SYSTEMS CORPORATION
- Yujie Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Three-Dimensional Image Data Alignment Method and X-Ray Imaging App...
- Publication number 20240412388
- Publication date Dec 12, 2024
- Shimadzu Corporation
- Shuhei ONISHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
- Publication number 20240412476
- Publication date Dec 12, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
- Publication number 20240402098
- Publication date Dec 5, 2024
- Rapiscan Holdings, Inc.
- Brendan Edward Allman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES
- Publication number 20240402103
- Publication date Dec 5, 2024
- FEI Company
- Erik Michiel Franken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...
- Publication number 20240394867
- Publication date Nov 28, 2024
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Lucas JALOUSTRE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
- Publication number 20240393269
- Publication date Nov 28, 2024
- Carl Zeiss SMT GMBH
- Jens Oster
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING HONEYCOMB CERAMIC STRUCTURES USI...
- Publication number 20240386540
- Publication date Nov 21, 2024
- Corning Incorporated
- Patrick Garret Cigno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA
- Publication number 20240377339
- Publication date Nov 14, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONVERTING METROLOGY DATA
- Publication number 20240377343
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Yunbo GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL AND ELECTRODE DEFECT DETECTION METHOD
- Publication number 20240354932
- Publication date Oct 24, 2024
- LG ELECTRONICS INC.
- Duho LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE
- Publication number 20240345003
- Publication date Oct 17, 2024
- Faxitron Bioptics, LLC
- Ciaran PURDY
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
- Publication number 20240328970
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for imaging a subject

Image processing and detection of discontinuities in battery cells

Systems and methods for adaptive blending in computed tomography im...

Method for measuring distribution of pores in electrode for seconda...

Structure information acquisition method and structure information...

X-ray based measurements in patterned structure

Imaging systems and methods of operating the same

Methods for growing crystals on QCM sensors

Spent or decommissioned accumulator treatment plant and process

System and method for inspecting defects of structure by using X-ray

X-ray system

Utilize machine learning in selecting high quality averaged SEM ima...

Method for computed tomography examination of fragments in gel block

Method and apparatus for Schottky TFE inspection

Artificial intelligence training with multiple pulsed x-ray source-...

Image processing apparatus, radiography system, image processing me...

Dynamic imaging quality control device, storage medium, and dynamic...

Radiation detector and method for manufacturing radiation detector

Automated circumferential pipe scanning system

Variable zoom X-ray computed tomography method for composites

Apparatus and method of producing a tomogram

Method and system to characterize and monitor the sharpness of a di...

Serial arrangement having multiple plies of asymmetric filter media...

Fast 3D radiography with multiple pulsed X-ray sources by deflectin...

Inspection system, determination processing apparatus, and inspecti...

Methods and apparatus for electron backscatter diffraction sample c...

Radio-opaque fillers in multiple layers of golf balls

Surface determination using three-dimensional voxel data

Radiation imaging system

Adaptive specimen image acquisition using an artificial neural network

Patents Applicationslast 30 patents

Spectrum Processing Device, Specimen Analyzing Device, and Spectrum...

SYSTEM AND METHOD FOR POWERLINE INSPECTION

PHOTOELECTRON EMISSION MICROSCOPE

TRANSMISSION ELECTRON MICROSCOPE AND SAMPLE ANALYSIS METHOD USING T...

METHODS AND APPARATUS FOR ELECTRON BACKSCATTER DIFFRACTION SAMPLE C...

METHOD AND SYSTEM OF IMAGE ANALYSIS AND CRITICAL DIMENSION MATCHING...

IMAGE PROCESSING APPARATUS, RADIATION IMAGING SYSTEM, IMAGE PROCESS...

FOREIGN OBJECT HEIGHT MEASUREMENT METHOD AND CHARGED PARTICLE BEAM...

CROSS-TALK CANCELLATION IN MULTIPLE CHARGED-PARTICLE BEAM INSPECTION

Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...

AN X-RAY SYSTEM

METHOD AND APPARATUS FOR SCATTER ESTIMATION IN COMPUTED TOMOGRAPHY...

Three-Dimensional Image Data Alignment Method and X-Ray Imaging App...

Methods and Systems for Generating Three-Dimensional Images that En...

Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...

METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES

METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...

METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...

SYSTEMS AND METHODS FOR INSPECTING HONEYCOMB CERAMIC STRUCTURES USI...

Analysis Device and Analysis Method

SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA

METHOD FOR CONVERTING METROLOGY DATA

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

RAY SCANNING APPARATUS

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

TERMINAL AND ELECTRODE DEFECT DETECTION METHOD

3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE

INSPECTION SYSTEM AND METHOD

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...