Imaging

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CPC
G01N2223/40

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/40Imaging

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Electron spectroscopy based techniques for determining various chem...
- Patent number 12,326,410
- Issue date Jun 10, 2025
- COZAI LTD
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Method for quantitatively characterizing dendrite segregation and d...
- Patent number 12,326,434
- Issue date Jun 10, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Dongling Li
- G01 - MEASURING TESTING
Information Patent Grant
Multiplexed computed tomography x-ray imaging
- Patent number 12,320,761
- Issue date Jun 3, 2025
- Arizona Board of Regents on behalf of the University of Arizona
- Amit Ashok
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,311,236
- Issue date May 27, 2025
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Transmission image-based non-destructive inspecting method, method...
- Patent number 12,315,135
- Issue date May 27, 2025
- RAYDISOFT INC.
- Seok Won Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection apparatus and X-ray inspection method
- Patent number 12,313,572
- Issue date May 27, 2025
- Anritsu Corporation
- Masaru Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing prostate biopsy
- Patent number 12,306,172
- Issue date May 20, 2025
- ProSight Ltd.
- Meir Weksler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for defects detection and classification using...
- Patent number 12,307,668
- Issue date May 20, 2025
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting aging-dictated damage or delamin...
- Patent number 12,306,264
- Issue date May 20, 2025
- Siemens Aktiengesellschaft
- Robert Baumgartner
- G01 - MEASURING TESTING
Information Patent Grant
Dual-purpose system for collectible card authentication, identifica...
- Patent number 12,306,116
- Issue date May 20, 2025
- Aharon N. Wayne
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for stress testing of materials using laser accel...
- Patent number 12,298,263
- Issue date May 13, 2025
- Institut National de la Recherche Scientifique
- Patrizio Antici
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray phase imaging apparatus
- Patent number 12,292,393
- Issue date May 6, 2025
- Shimadzu Corporation
- Takahiro Doki
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,285,656
- Issue date Apr 29, 2025
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
System and method for utilization of photon counting for colorizati...
- Patent number 12,287,298
- Issue date Apr 29, 2025
- Kub Technologies Inc
- Chester Lowe
- G01 - MEASURING TESTING
Information Patent Grant
Parameterizing x-ray scattering measurement using slice-and-image t...
- Patent number 12,288,706
- Issue date Apr 29, 2025
- Carl Zeiss SMT GmbH
- Hans Michael Stiepan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
High resolution continuous rotation industrial radiography imaging...
- Patent number 12,281,993
- Issue date Apr 22, 2025
- Illinois Tool Works Inc.
- Camaron Mitchell Lemmer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
State change tracking device, X-ray imaging system, state change tr...
- Patent number 12,276,622
- Issue date Apr 15, 2025
- Konica Minolta, Inc.
- Tadashi Arimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Artificial intelligence-based dual energy x-ray image motion correc...
- Patent number 12,274,575
- Issue date Apr 15, 2025
- GE Precision Healthcare LLC
- Balázs P. Cziria
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for monitoring feature sizes in digital X-ray i...
- Patent number 12,270,770
- Issue date Apr 8, 2025
- QSA GLOBAL INC.
- Paul Benson
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for determining information regarding chemica...
- Patent number 12,253,480
- Issue date Mar 18, 2025
- Imagine Scientific, Inc.
- Eric H. Silver
- G01 - MEASURING TESTING
Information Patent Grant
Detecting downhole fluid composition utilizing photon emission
- Patent number 12,221,884
- Issue date Feb 11, 2025
- Halliburton Energy Services, Inc.
- Christopher Michael Jones
- G01 - MEASURING TESTING
Information Patent Grant
System and method for imaging a subject
- Patent number 12,201,466
- Issue date Jan 21, 2025
- Medtronic Navigation, Inc.
- Patrick A. Helm
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing and detection of discontinuities in battery cells
- Patent number 12,203,880
- Issue date Jan 21, 2025
- GM Global Technology Operations LLC
- Sean Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for adaptive blending in computed tomography im...
- Patent number 12,205,253
- Issue date Jan 21, 2025
- GE Precision Healthcare LLC
- Brian Edward Nett
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for measuring distribution of pores in electrode for seconda...
- Patent number 12,196,651
- Issue date Jan 14, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Hoon Han
- G01 - MEASURING TESTING
Information Patent Grant
Structure information acquisition method and structure information...
- Patent number 12,196,690
- Issue date Jan 14, 2025
- Rigaku Corporation
- Masashi Kageyama
- G01 - MEASURING TESTING
Information Patent Grant
X-ray based measurements in patterned structure
- Patent number 12,196,691
- Issue date Jan 14, 2025
- Nova Ltd.
- Gilad Barak
- G01 - MEASURING TESTING
Information Patent Grant
Imaging systems and methods of operating the same
- Patent number 12,196,693
- Issue date Jan 14, 2025
- SHENZHEN XPECTVISION TECHNOLOGY CO., LTD.
- Peiyan Cao
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
IMAGE GENERATION DEVICE, LEARNED MODEL GENERATION DEVICE, AND X-RAY...
- Publication number 20250182258
- Publication date Jun 5, 2025
- ISHIDA CO., LTD.
- Shinya IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING
- Publication number 20250172511
- Publication date May 29, 2025
- Siemens Healthineers AG
- Philipp ROSER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
- Publication number 20250172509
- Publication date May 29, 2025
- SK On Co., Ltd.
- Hyung Joon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-Ray System for Generating Multi-Spectrum Image Data
- Publication number 20250172512
- Publication date May 29, 2025
- Teledyne Dalsa B.V.
- Korthout Alouisius Wilhelmus Marinus
- G01 - MEASURING TESTING
Information Patent Application
MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING
- Publication number 20250164416
- Publication date May 22, 2025
- GE Precision Healthcare LLC
- Johannes Loberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POROUS SAMPLE WETTABILITY PARAMETER DETERMINING METHOD AND RELATED...
- Publication number 20250155347
- Publication date May 15, 2025
- TOTALENERGIES ONETECH
- Mohamed REGAIEG
- G01 - MEASURING TESTING
Information Patent Application
System And Method For Imaging A Subject
- Publication number 20250152120
- Publication date May 15, 2025
- Medtronic Navigation, Inc.
- Patrick A. HELM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RAIL DIAGNOSTIC INSPECTION APPARATUS
- Publication number 20250155383
- Publication date May 15, 2025
- TESMEC S.P.A.
- Silvestro Di Gioia
- G01 - MEASURING TESTING
Information Patent Application
Ion Milling Device, and Inspection System
- Publication number 20250149288
- Publication date May 8, 2025
- Hitachi High-Tech Corporation
- Naohiro FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FIDUCIALS FOR X-RAY DEVICE
- Publication number 20250146959
- Publication date May 8, 2025
- Lumafield, Inc.
- Adam P. Damiano
- G01 - MEASURING TESTING
Information Patent Application
DETERMINATION OF MATERIAL
- Publication number 20250146957
- Publication date May 8, 2025
- Smiths Detection France S.A.S.
- Serge MAITREJEAN
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE EQUIPMENT QUALITY CONTROL
- Publication number 20250137943
- Publication date May 1, 2025
- CARESTREAM HEALTH, INC.
- Luca BOGONI
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...
- Publication number 20250130181
- Publication date Apr 24, 2025
- Canon Kabushiki Kaisha
- NAOTO SHIBATA
- G01 - MEASURING TESTING
Information Patent Application
DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...
- Publication number 20250130183
- Publication date Apr 24, 2025
- Applied Materials, Inc.
- Alexander Buhse Brady
- G01 - MEASURING TESTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250124564
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF
- Publication number 20250125431
- Publication date Apr 17, 2025
- Samsung SDI Co., Ltd.
- Seong Ho WOO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...
- Publication number 20250116617
- Publication date Apr 10, 2025
- Yeda Research and Development Co. Ltd.
- Michael Elbaum
- G01 - MEASURING TESTING
Information Patent Application
ARTICLE INSPECTION APPARATUS
- Publication number 20250116616
- Publication date Apr 10, 2025
- Anritsu Corporation
- Takashi KANAI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System to Assess Golf ball quality using multiple orientations of x...
- Publication number 20250110065
- Publication date Apr 3, 2025
- Guilherme Cardoso
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
ITEM INSPECTION SYSTEMS AND METHODS
- Publication number 20250110067
- Publication date Apr 3, 2025
- Smiths Detection France S.A.S.
- Jean-Michel FAUGIER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF
- Publication number 20250093283
- Publication date Mar 20, 2025
- Anritsu Corporation
- Akira OHASHI
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR IDENTIFYING AND DISPLAYING MATERIAL TYPES...
- Publication number 20250095333
- Publication date Mar 20, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Ji Wook JEONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES
- Publication number 20250095955
- Publication date Mar 20, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Konstantin Chirko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Multispectral In-Vivo Imaging Probe Device for Enhanced Tissue Visu...
- Publication number 20250076201
- Publication date Mar 6, 2025
- CytoVeris Inc.
- Alexandre Dumont
- G01 - MEASURING TESTING
Information Patent Application
UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...
- Publication number 20250078244
- Publication date Mar 6, 2025
- ASML NETHERLANDS B.V.
- Chen ZHANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...
- Publication number 20250062048
- Publication date Feb 20, 2025
- UNIVERSITAET HAMBURG
- Jonas BAUMANN
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...
- Publication number 20250052699
- Publication date Feb 13, 2025
- FPI FOOD PROCESSING INNOVATION GMBH & CO. KG
- Christoph Fabian Isernhagen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...
- Publication number 20250054107
- Publication date Feb 13, 2025
- Billion Prima Sdn Bhd
- Ameer Safuan Bin MUHAMAD KAHIRI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF ANALYSING A GEOLOGICAL SAMPLE
- Publication number 20250052700
- Publication date Feb 13, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Electron spectroscopy based techniques for determining various chem...

Method for quantitatively characterizing dendrite segregation and d...

Multiplexed computed tomography x-ray imaging

Method and system utilizing imaging analysis for golf balls

Transmission image-based non-destructive inspecting method, method...

X-ray inspection apparatus and X-ray inspection method

Method and system for analyzing prostate biopsy

Methods and systems for defects detection and classification using...

Method and apparatus for detecting aging-dictated damage or delamin...

Dual-purpose system for collectible card authentication, identifica...

Customizable axes of rotation for industrial radiography systems

Method and system for stress testing of materials using laser accel...

X-ray phase imaging apparatus

Method and system utilizing imaging analysis for golf balls

System and method for utilization of photon counting for colorizati...

Parameterizing x-ray scattering measurement using slice-and-image t...

High resolution continuous rotation industrial radiography imaging...

State change tracking device, X-ray imaging system, state change tr...

Artificial intelligence-based dual energy x-ray image motion correc...

Systems and methods for monitoring feature sizes in digital X-ray i...

Material detection in X-ray security screening

Methods and apparatus for determining information regarding chemica...

Detecting downhole fluid composition utilizing photon emission

System and method for imaging a subject

Image processing and detection of discontinuities in battery cells

Systems and methods for adaptive blending in computed tomography im...

Method for measuring distribution of pores in electrode for seconda...

Structure information acquisition method and structure information...

X-ray based measurements in patterned structure

Imaging systems and methods of operating the same

Patents Applicationslast 30 patents

IMAGE GENERATION DEVICE, LEARNED MODEL GENERATION DEVICE, AND X-RAY...

MATERIAL DECOMPOSITION IN DUAL-ENERGY X-RAY IMAGING

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

X-Ray System for Generating Multi-Spectrum Image Data

MATERIAL WEIGHTING OF PROJECTION BASED SPECTRAL X-RAY IMAGING

POROUS SAMPLE WETTABILITY PARAMETER DETERMINING METHOD AND RELATED...

System And Method For Imaging A Subject

RAIL DIAGNOSTIC INSPECTION APPARATUS

Ion Milling Device, and Inspection System

FIDUCIALS FOR X-RAY DEVICE

DETERMINATION OF MATERIAL

PROTECTIVE EQUIPMENT QUALITY CONTROL

RADIATION IMAGING APPARATUS, RADIATION IMAGING SYSTEM, METHOD OF CO...

DETERMINING TILT ANGLE OF SUBSTRATE STRUCTURES UTILIZING ANGULAR FO...

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

DEFORMATION ANALYSIS DEVICE FOR SECONDARY BATTERY AND METHOD THEREOF

SYSTEM AND METHOD FOR EXTRACTION OF STRUCTURAL DATA OF A SAMPLE FRO...

ARTICLE INSPECTION APPARATUS

System to Assess Golf ball quality using multiple orientations of x...

ITEM INSPECTION SYSTEMS AND METHODS

X-RAY INSPECTION DEVICE AND CALIBRATION METHOD THEREOF

APPARATUS AND METHOD FOR IDENTIFYING AND DISPLAYING MATERIAL TYPES...

METHOD AND SYSTEM FOR CALIBRATION OF DIFFRACTION ANGLES

Multispectral In-Vivo Imaging Probe Device for Enhanced Tissue Visu...

UTILIZE MACHINE LEARNING IN SELECTING HIGH QUALITY AVERAGED SEM IMA...

X-RAY IRRADIATION APPARATUS, INCLUDING A SPECTRALLY SHAPING X-RAY O...

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

METHOD, DEVICES AND ARRANGEMENTS FOR LOCATING BONY PARTS PRESENT IN...

CARGO INSPECTION SYSTEM AND A METHOD FOR DISCRIMINATING MATERIAL IN...

METHOD OF ANALYSING A GEOLOGICAL SAMPLE