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G01N2223/40
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/40
Imaging
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Overview
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Patents Grants
last 30 patents
Information
Patent Grant
Correction of images
Patent number
11,983,859
Issue date
May 14, 2024
Smiths Detection France S.A.S.
Serge Maitrejean
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Adaptive specimen image acquisition
Patent number
11,982,634
Issue date
May 14, 2024
FEI Company
Pavel Potocek
G01 - MEASURING TESTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,982,635
Issue date
May 14, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for determining variability of cryo-EM protein...
Patent number
11,977,039
Issue date
May 7, 2024
Ali Punjani
G01 - MEASURING TESTING
Information
Patent Grant
Sample inspection system comprising a beam former to project a poly...
Patent number
11,971,371
Issue date
Apr 30, 2024
The Nottingham Trent University
Paul Evans
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Surface analyzer
Patent number
11,965,841
Issue date
Apr 23, 2024
Shimadzu Corporation
Akira Ogoshi
G01 - MEASURING TESTING
Information
Patent Grant
System and method to adjust a kinetics model of surface reactions d...
Patent number
11,966,203
Issue date
Apr 23, 2024
KLA Corporation
Ankur Agarwal
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Geometry based three dimensional reconstruction of a semiconductor...
Patent number
11,953,316
Issue date
Apr 9, 2024
Applied Materials Israel Ltd.
Rafael Bistritzer
G01 - MEASURING TESTING
Information
Patent Grant
Converting borehole images into three dimensional structures for nu...
Patent number
11,954,800
Issue date
Apr 9, 2024
Saudi Arabian Oil Company
Hussain AlBahrani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Semiconductor-based biosensors for base calling
Patent number
11,953,464
Issue date
Apr 9, 2024
Illumina, Inc.
Dietrich Dehlinger
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for crack detection
Patent number
11,946,883
Issue date
Apr 2, 2024
United States as represented by the Administrator of NASA
Ajay M Koshti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray inspection apparatus
Patent number
11,940,393
Issue date
Mar 26, 2024
ISHIDA CO., LTD.
Hiroshi Hori
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method for improving an EBSD/TKD map
Patent number
11,940,396
Issue date
Mar 26, 2024
Bruker Nano GmbH
Daniel Radu Goran
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detection device, recording medium, and positioning method
Patent number
11,940,397
Issue date
Mar 26, 2024
Horiba, Ltd.
Tomoki Aoyama
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device, packaging machine, and package inspection method
Patent number
11,933,742
Issue date
Mar 19, 2024
CKD Corporation
Takamasa Ohtani
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Device for hosting a probe solution of molecules in a plurality of...
Patent number
11,933,746
Issue date
Mar 19, 2024
Paul Scherrer Institut
Soichiro Tsujino
G01 - MEASURING TESTING
Information
Patent Grant
Item inspection by radiation imaging using an iterative projection-...
Patent number
11,927,586
Issue date
Mar 12, 2024
Universiteit Antwerpen
Jan De Beenhouwer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
11,918,863
Issue date
Mar 5, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
G01 - MEASURING TESTING
Information
Patent Grant
Progressive scans with multiple pulsed X-ray source-in-motion tomos...
Patent number
11,918,403
Issue date
Mar 5, 2024
AlxSCAN, Inc.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Lateral recess measurement in a semiconductor specimen
Patent number
11,921,063
Issue date
Mar 5, 2024
Applied Materials Israel Ltd.
Michael Chemama
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Screening system
Patent number
11,913,890
Issue date
Feb 27, 2024
Halo X Ray Technologies Limited
Anthony Dicken
G01 - MEASURING TESTING
Information
Patent Grant
Method and system to calculate the point spread function of a digit...
Patent number
11,915,402
Issue date
Feb 27, 2024
AGFA NV
Marc Cresens
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
11,904,214
Issue date
Feb 20, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Imaging method using jointly a PET reconstruction and a compton rec...
Patent number
11,898,972
Issue date
Feb 13, 2024
DAMAVAN IMAGING
Alain Iltis
G01 - MEASURING TESTING
Information
Patent Grant
Material properties from two-dimensional image
Patent number
11,885,757
Issue date
Jan 30, 2024
BP Corporation North America Inc.
Glen L. Gettemy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tolerance error estimating apparatus, method, program, reconstructi...
Patent number
11,885,754
Issue date
Jan 30, 2024
Rigaku Corporation
Takumi Ota
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Positioning of x-ray imaging system using an optical camera
Patent number
11,879,854
Issue date
Jan 23, 2024
Baker Hughes Oilfield Operations LLC
Jing Xu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for synthesizing a projection image
Patent number
11,875,430
Issue date
Jan 16, 2024
Shanghai United Imaging Healthcare Co., Ltd.
Jonathan Maltz
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for correcting a spectral image
Patent number
11,872,071
Issue date
Jan 16, 2024
Commissariat a l'Energie Atomique et Aux Energies Alternatives
Odran Pivot
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Tube weld X-ray inspection device comprising an X-ray source, an X-...
Patent number
11,860,113
Issue date
Jan 2, 2024
DIGIRAY CORP.
Sang Sub Kong
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
FLUOROSCOPIC IMAGE CAPTURING APPARATUS
Publication number
20240151659
Publication date
May 9, 2024
Hitachi, Ltd
Hiroyuki TAKAGI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR IMAGE ACQUISITION, ANALYSIS, AND CHARACTERIZATION OF TIS...
Publication number
20240151660
Publication date
May 9, 2024
Diagnostic Instruments, Inc.
Philip T. Merlo
G01 - MEASURING TESTING
Information
Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
Publication number
20240122568
Publication date
Apr 18, 2024
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Artificial Intelligence-Based Dual Energy X-Ray Image Motion Correc...
Publication number
20240122566
Publication date
Apr 18, 2024
GE Precision Healthcare LLC
Balázs P. Cziria
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
Publication number
20240102949
Publication date
Mar 28, 2024
NEUF Inc.
Myoung Chan NA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY PHASE IMAGING APPARATUS AND DISPLAY METHOD OF PREVIEW IMAGE I...
Publication number
20240102945
Publication date
Mar 28, 2024
Shimadzu Corporation
Kana KOJIMA
G01 - MEASURING TESTING
Information
Patent Application
ADAPTIVE SPECIMEN IMAGE ACQUISITION USING AN ARTIFICIAL NEURAL NETWORK
Publication number
20240094151
Publication date
Mar 21, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
STYRYL PHENOLS, DERIVATIVES AND THEIR USE IN METHODS OF ANALYTE DET...
Publication number
20240077489
Publication date
Mar 7, 2024
AAT BIOQUEST, INC.
Zhenjun Diwu
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR AUTOMATICALLY SETTING UP COMPUTED TOMOGRAPHY SCAN PARAME...
Publication number
20240077434
Publication date
Mar 7, 2024
Lumafield, Inc.
Adam P. Damiano
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IMAGING SYSTEM AND LEARNED MODEL PRODUCTION METHOD
Publication number
20240068962
Publication date
Feb 29, 2024
Shimadzu Corporation
Hiroaki TSUSHIMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OVERLAY MEASURING METHOD
Publication number
20240060916
Publication date
Feb 22, 2024
Samsung Electronics Co., Ltd.
Wonjun YANG
G01 - MEASURING TESTING
Information
Patent Application
BATTERY WETTING STATE DETECTION METHOD AND APPARATUS, DEVICE, SYSTE...
Publication number
20240053283
Publication date
Feb 15, 2024
CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
Si LIN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
Publication number
20240044815
Publication date
Feb 8, 2024
NEC Corporation
Masahiro KAJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
Publication number
20240044816
Publication date
Feb 8, 2024
NEC Corporation
Masahiro KAJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
Publication number
20240044814
Publication date
Feb 8, 2024
NEC Corporation
Masahiro KAJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY BASED MEASUREMENTS IN PATTERNED STRUCTURE
Publication number
20240044819
Publication date
Feb 8, 2024
NOVA LTD
Gilad Barak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR ESTIMATING HYDROCARBON SATURATION OF A ROCK
Publication number
20240044768
Publication date
Feb 8, 2024
Nishank SAXENA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SORTING SUPPORT APPARATUS, SORTING SUPPORT SYSTEM, SORTING SUPPORT...
Publication number
20240044817
Publication date
Feb 8, 2024
NEC Corporation
Masahiro KAJI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR AUTONOMOUSLY REMOVING FASTENERS EMBEDDED IN W...
Publication number
20240046451
Publication date
Feb 8, 2024
Urban Machine, Inc.
Alexander Thiele
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
METHOD OF EXAMINING A SAMPLE USING A CHARGED PARTICLE MICROSCOPE
Publication number
20240027377
Publication date
Jan 25, 2024
FEI Company
Jan Klusácek
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS TO CONFIGURE RADIOGRAPHY SYSTEMS
Publication number
20240019384
Publication date
Jan 18, 2024
Illinois Tool Works Inc.
Camaron Lemmer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERMINATION OF MATERIAL
Publication number
20240003831
Publication date
Jan 4, 2024
Smiths Detection France S.A.S.
Serge MAITREJEAN
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR MAPPING CHEMICAL ELEMENTS IN A SAMPLE
Publication number
20240003837
Publication date
Jan 4, 2024
Bar Ilan University
Sharon SHWARTZ
G01 - MEASURING TESTING
Information
Patent Application
WIDE RANGE MULTI-PHASE FLOW METER
Publication number
20230417583
Publication date
Dec 28, 2023
Saudi Arabian Oil Company
Salman D. Gamber
E21 - EARTH DRILLING MINING
Information
Patent Application
SYSTEMS AND METHODS FOR NON-DESTRUCTIVE INSPECTION OF SEMICONDUCTOR...
Publication number
20230417687
Publication date
Dec 28, 2023
SANDISK TECHNOLOGIES LLC
Shogo TOMITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE ASSESSMENT OF CORN ROOTWORM DAMAGE
Publication number
20230408426
Publication date
Dec 21, 2023
PIONEER HI-BRED INTERNATIONAL, INC.
DENNY JOSEPH BRUCK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIATION IMAGING APPARATUS, INFORMATION PROCESSING APPARATUS, INFO...
Publication number
20230404506
Publication date
Dec 21, 2023
Canon Kabushiki Kaisha
Kosuke TERUI
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
X-RAY PHASE IMAGING APPARATUS
Publication number
20230384244
Publication date
Nov 30, 2023
SHIMADZU CORPORATION
Takahiro DOKI
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR UTILIZATION OF PHOTON COUNTING FOR COLORIZATI...
Publication number
20230384243
Publication date
Nov 30, 2023
KUB Technologies Inc.
Chester Lowe
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL C...
Publication number
20230375484
Publication date
Nov 23, 2023
The University of North Carolina at Chapel Hill
Christina Inscoe
G06 - COMPUTING CALCULATING COUNTING