Imaging

Industry

CPC
G01N2223/40

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/40Imaging

Industries

Patents Grantslast 30 patents

Information Patent Grant
Artificial intelligence training with multiple pulsed x-ray source-...
- Patent number 12,144,670
- Issue date Nov 19, 2024
- AIXSCAN INC.
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, radiography system, image processing me...
- Patent number 12,140,553
- Issue date Nov 12, 2024
- FUJIFILM Corporation
- Kengo Nomura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
- Patent number 12,140,552
- Issue date Nov 12, 2024
- Konica Minolta, Inc.
- Sumiya Nagatsuka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation detector and method for manufacturing radiation detector
- Patent number 12,140,715
- Issue date Nov 12, 2024
- Kyoto University
- Keiji Abe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated circumferential pipe scanning system
- Patent number 12,135,297
- Issue date Nov 5, 2024
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Grant
Variable zoom X-ray computed tomography method for composites
- Patent number 12,130,245
- Issue date Oct 29, 2024
- Board of Regents, The University of Texas System
- Andrew Makeev
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method of producing a tomogram
- Patent number 12,131,411
- Issue date Oct 29, 2024
- ADAPTIX LTD
- Gil Travish
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system to characterize and monitor the sharpness of a di...
- Patent number 12,118,701
- Issue date Oct 15, 2024
- AGFA NV
- Marc Cresens
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
- Patent number 12,115,502
- Issue date Oct 15, 2024
- Sartorius Stedim Biotech GmbH
- Volkmar Thom
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Fast 3D radiography with multiple pulsed X-ray sources by deflectin...
- Patent number 12,102,469
- Issue date Oct 1, 2024
- AIXSCAN INC.
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system, determination processing apparatus, and inspecti...
- Patent number 12,105,033
- Issue date Oct 1, 2024
- JGC CORPORATION
- Teruaki Sano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
- Patent number 12,099,024
- Issue date Sep 24, 2024
- FEI Company
- Austin Penrose Day
- G01 - MEASURING TESTING
Information Patent Grant
Radio-opaque fillers in multiple layers of golf balls
- Patent number 12,090,371
- Issue date Sep 17, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- G01 - MEASURING TESTING
Information Patent Grant
Surface determination using three-dimensional voxel data
- Patent number 12,086,923
- Issue date Sep 10, 2024
- Faro Technologies, Inc.
- Ariane Stiebeiner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Radiation imaging system
- Patent number 12,082,967
- Issue date Sep 10, 2024
- Canon Kabushiki Kaisha
- Satoshi Kamei
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Adaptive specimen image acquisition using an artificial neural network
- Patent number 12,085,523
- Issue date Sep 10, 2024
- FEI Company
- Pavel Potocek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
- Patent number 12,080,513
- Issue date Sep 3, 2024
- ASML Netherlands B.V.
- Wei Fang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for performing serial electron diffraction nano...
- Patent number 12,072,304
- Issue date Aug 27, 2024
- R. J. Dwayne Miller
- G01 - MEASURING TESTING
Information Patent Grant
Rotational X-ray inspection system and method
- Patent number 12,061,156
- Issue date Aug 13, 2024
- VIKEN DETECTION CORPORATION
- Peter J. Rothschild
- G01 - MEASURING TESTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,053,675
- Issue date Aug 6, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for generating three-dimensional images that en...
- Patent number 12,056,840
- Issue date Aug 6, 2024
- Rapiscan Systems, Inc.
- Mala Sivakumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Correlative multimodal chemical imaging via machine learning
- Patent number 12,057,304
- Issue date Aug 6, 2024
- UT-Battelle, LLC
- Olga S. Ovchinnikova
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection and imaging of electric fields, using polarized neutrons
- Patent number 12,055,500
- Issue date Aug 6, 2024
- National Technology & Engineering Solutions of Sandia, LLC
- Yuan-Yu Jau
- G01 - MEASURING TESTING
Information Patent Grant
Contact imaging sensor head for computed radiography
- Patent number 12,044,637
- Issue date Jul 23, 2024
- Leidos, Inc.
- Rex David Richardson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for measuring fastener concentricity
- Patent number 12,038,393
- Issue date Jul 16, 2024
- The Boeing Company
- Thomas Maeder
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus and control method thereof, radiography...
- Patent number 12,036,061
- Issue date Jul 16, 2024
- Canon Kabushiki Kaisha
- Takeshi Noda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection method and defect inspection device
- Patent number 12,039,716
- Issue date Jul 16, 2024
- HITACHI HIGH-TECH CORPORATION
- Takashi Hiroi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Motion compensated high throughput fast 3D radiography system with...
- Patent number 12,023,193
- Issue date Jul 2, 2024
- AIXSCAN, Inc.
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,023,555
- Issue date Jul 2, 2024
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Correction method, correction apparatus, radiography system, and co...
- Patent number 12,025,574
- Issue date Jul 2, 2024
- FUJIFILM Corporation
- Kengo Nomura
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING HONEYCOMB CERAMIC STRUCTURES USI...
- Publication number 20240386540
- Publication date Nov 21, 2024
- Corning Incorporated
- Patrick Garret Cigno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Analysis Device and Analysis Method
- Publication number 20240385131
- Publication date Nov 21, 2024
- JEOL Ltd.
- Takeshi Otsuka
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA
- Publication number 20240377339
- Publication date Nov 14, 2024
- KUB TECHNOLOGIES, INC. DBA KUBTEC
- Vikram Butani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CONVERTING METROLOGY DATA
- Publication number 20240377343
- Publication date Nov 14, 2024
- ASML NETHERLANDS B.V.
- Yunbo GUO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
- Publication number 20240377340
- Publication date Nov 14, 2024
- Greyscale AI
- Brian Green
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240369499
- Publication date Nov 7, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
- Publication number 20240369500
- Publication date Nov 7, 2024
- Robert Koch
- G01 - MEASURING TESTING
Information Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
- Publication number 20240353355
- Publication date Oct 24, 2024
- CiTEX Holding GmbH
- Arno NEUMEISTER
- G01 - MEASURING TESTING
Information Patent Application
TERMINAL AND ELECTRODE DEFECT DETECTION METHOD
- Publication number 20240354932
- Publication date Oct 24, 2024
- LG ELECTRONICS INC.
- Duho LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE
- Publication number 20240345003
- Publication date Oct 17, 2024
- Faxitron Bioptics, LLC
- Ciaran PURDY
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD
- Publication number 20240345005
- Publication date Oct 17, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
- Publication number 20240328970
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G01 - MEASURING TESTING
Information Patent Application
3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY
- Publication number 20240331179
- Publication date Oct 3, 2024
- Carl Zeiss SMT GMBH
- Dmitry Klochkov
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
- Publication number 20240328967
- Publication date Oct 3, 2024
- Anritsu Corporation
- Itaru MIYAZAKI
- G01 - MEASURING TESTING
Information Patent Application
DIGITAL RADIOGRAPHY SYSTEM AND DIGITAL RADIOGRAPHY METHOD
- Publication number 20240319113
- Publication date Sep 26, 2024
- Nuctech Company Limited
- Li ZHANG
- G01 - MEASURING TESTING
Information Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
- Publication number 20240320816
- Publication date Sep 26, 2024
- Samsung Electronics Co., Ltd.
- Nohong Kwak
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
- Publication number 20240319123
- Publication date Sep 26, 2024
- ASML NETHERLANDS B.V.
- Achim WOESSNER
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT METHOD AND APPARATUS FOR SEMICONDUCTOR FEATURES WITH IN...
- Publication number 20240311698
- Publication date Sep 19, 2024
- Carl Zeiss SMT GMBH
- Alexander Freytag
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION SYSTEM AND CONTROL ARCHITECTURE FOR AN X-RAY INSPE...
- Publication number 20240302296
- Publication date Sep 12, 2024
- Smiths Detection France S.A.S.
- Jean-Michel FAUGIER
- G01 - MEASURING TESTING
Information Patent Application
Material Detection in X-Ray Security Screening
- Publication number 20240302300
- Publication date Sep 12, 2024
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
- Publication number 20240280514
- Publication date Aug 22, 2024
- Battelle Memorial Institute
- Rodney Arthur Hallgren
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Inspection Device and Inspection Method
- Publication number 20240280520
- Publication date Aug 22, 2024
- Hitachi High-Tech Corporation
- Takashi HIROI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DISCRIMINATING CARBON BLACK
- Publication number 20240280512
- Publication date Aug 22, 2024
- Sumitomo Rubber Industries, Ltd.
- Kentaro OISHI
- C01 - INORGANIC CHEMISTRY
Information Patent Application
3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUM...
- Publication number 20240281952
- Publication date Aug 22, 2024
- Carl Zeiss SMT GMBH
- Thomas Korb
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR PROVIDING A DIGITALLY SWITCHABLE X-RAY SOURCES
- Publication number 20240272093
- Publication date Aug 15, 2024
- NANO-X IMAGING LTD.
- Ukyo JEONG
- G01 - MEASURING TESTING
Information Patent Application
TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...
- Publication number 20240272094
- Publication date Aug 15, 2024
- Anastasiia Mishchenko
- G01 - MEASURING TESTING
Information Patent Application
A METHOD AND SYSTEM FOR PERFORMING CHARACTERIZATION OF ONE OR MORE...
- Publication number 20240273905
- Publication date Aug 15, 2024
- VITO NV
- Roeland GEURTS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...
- Publication number 20240272099
- Publication date Aug 15, 2024
- Carl Zeiss SMT GMBH
- Daniel Schwarz
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248048
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING
Information Patent Application
RAY SCANNING APPARATUS
- Publication number 20240248049
- Publication date Jul 25, 2024
- Nuctech Company Limited
- Zhiqiang CHEN
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Artificial intelligence training with multiple pulsed x-ray source-...

Image processing apparatus, radiography system, image processing me...

Dynamic imaging quality control device, storage medium, and dynamic...

Radiation detector and method for manufacturing radiation detector

Automated circumferential pipe scanning system

Variable zoom X-ray computed tomography method for composites

Apparatus and method of producing a tomogram

Method and system to characterize and monitor the sharpness of a di...

Serial arrangement having multiple plies of asymmetric filter media...

Fast 3D radiography with multiple pulsed X-ray sources by deflectin...

Inspection system, determination processing apparatus, and inspecti...

Methods and apparatus for electron backscatter diffraction sample c...

Radio-opaque fillers in multiple layers of golf balls

Surface determination using three-dimensional voxel data

Radiation imaging system

Adaptive specimen image acquisition using an artificial neural network

Cross-talk cancellation in multiple charged-particle beam inspection

Systems and methods for performing serial electron diffraction nano...

Rotational X-ray inspection system and method

Method and system utilizing imaging analysis for golf balls

Methods and systems for generating three-dimensional images that en...

Correlative multimodal chemical imaging via machine learning

Detection and imaging of electric fields, using polarized neutrons

Contact imaging sensor head for computed radiography

Methods and apparatus for measuring fastener concentricity

Image processing apparatus and control method thereof, radiography...

Defect inspection method and defect inspection device

Motion compensated high throughput fast 3D radiography system with...

Method and system utilizing imaging analysis for golf balls

Correction method, correction apparatus, radiography system, and co...

Patents Applicationslast 30 patents

SYSTEMS AND METHODS FOR INSPECTING HONEYCOMB CERAMIC STRUCTURES USI...

Analysis Device and Analysis Method

SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA

METHOD FOR CONVERTING METROLOGY DATA

CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD

RAY SCANNING APPARATUS

METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...

X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...

TERMINAL AND ELECTRODE DEFECT DETECTION METHOD

3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE

INSPECTION SYSTEM AND METHOD

METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...

3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY

X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM

DIGITAL RADIOGRAPHY SYSTEM AND DIGITAL RADIOGRAPHY METHOD

TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...

SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...

MEASUREMENT METHOD AND APPARATUS FOR SEMICONDUCTOR FEATURES WITH IN...

X-RAY INSPECTION SYSTEM AND CONTROL ARCHITECTURE FOR AN X-RAY INSPE...

Material Detection in X-Ray Security Screening

X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...

Inspection Device and Inspection Method

METHOD FOR DISCRIMINATING CARBON BLACK

3D VOLUME INSPECTION METHOD AND METHOD OF CONFIGURING OF A 3D VOLUM...

SYSTEM AND METHOD FOR PROVIDING A DIGITALLY SWITCHABLE X-RAY SOURCES

TWO-STAGE PIXEL DEVICE WITH ADAPTIVE FRAME GRABBING FOR X-RAY IMAGI...

A METHOD AND SYSTEM FOR PERFORMING CHARACTERIZATION OF ONE OR MORE...

HIGH RESOLUTION, LOW ENERGY ELECTRON MICROSCOPE FOR PROVIDING TOPOG...

RAY SCANNING APPARATUS

RAY SCANNING APPARATUS