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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N2223/00
Investigating materials by wave or particle radiation
Current Industry
G01N2223/40
Imaging
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Patents Grants
last 30 patents
Information
Patent Grant
Method for computed tomography examination of fragments in gel block
Patent number
12,174,213
Issue date
Dec 24, 2024
The United States of America, as represented by the Secretary of the Navy
Kyle D. Stoll
F42 - AMMUNITION BLASTING
Information
Patent Grant
Method and apparatus for Schottky TFE inspection
Patent number
12,165,834
Issue date
Dec 10, 2024
NUFLARE TECHNOLOGY, INC.
Victor Katsap
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Artificial intelligence training with multiple pulsed x-ray source-...
Patent number
12,144,670
Issue date
Nov 19, 2024
AIXSCAN INC.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing apparatus, radiography system, image processing me...
Patent number
12,140,553
Issue date
Nov 12, 2024
FUJIFILM Corporation
Kengo Nomura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Dynamic imaging quality control device, storage medium, and dynamic...
Patent number
12,140,552
Issue date
Nov 12, 2024
Konica Minolta, Inc.
Sumiya Nagatsuka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detector and method for manufacturing radiation detector
Patent number
12,140,715
Issue date
Nov 12, 2024
Kyoto University
Keiji Abe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Automated circumferential pipe scanning system
Patent number
12,135,297
Issue date
Nov 5, 2024
Mistras Group, Inc.
John Musgrave
G01 - MEASURING TESTING
Information
Patent Grant
Variable zoom X-ray computed tomography method for composites
Patent number
12,130,245
Issue date
Oct 29, 2024
Board of Regents, The University of Texas System
Andrew Makeev
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method of producing a tomogram
Patent number
12,131,411
Issue date
Oct 29, 2024
ADAPTIX LTD
Gil Travish
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system to characterize and monitor the sharpness of a di...
Patent number
12,118,701
Issue date
Oct 15, 2024
AGFA NV
Marc Cresens
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Serial arrangement having multiple plies of asymmetric filter media...
Patent number
12,115,502
Issue date
Oct 15, 2024
Sartorius Stedim Biotech GmbH
Volkmar Thom
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Grant
Fast 3D radiography with multiple pulsed X-ray sources by deflectin...
Patent number
12,102,469
Issue date
Oct 1, 2024
AIXSCAN INC.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection system, determination processing apparatus, and inspecti...
Patent number
12,105,033
Issue date
Oct 1, 2024
JGC CORPORATION
Teruaki Sano
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and apparatus for electron backscatter diffraction sample c...
Patent number
12,099,024
Issue date
Sep 24, 2024
FEI Company
Austin Penrose Day
G01 - MEASURING TESTING
Information
Patent Grant
Radio-opaque fillers in multiple layers of golf balls
Patent number
12,090,371
Issue date
Sep 17, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
G01 - MEASURING TESTING
Information
Patent Grant
Surface determination using three-dimensional voxel data
Patent number
12,086,923
Issue date
Sep 10, 2024
Faro Technologies, Inc.
Ariane Stiebeiner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Adaptive specimen image acquisition using an artificial neural network
Patent number
12,085,523
Issue date
Sep 10, 2024
FEI Company
Pavel Potocek
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radiation imaging system
Patent number
12,082,967
Issue date
Sep 10, 2024
Canon Kabushiki Kaisha
Satoshi Kamei
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Cross-talk cancellation in multiple charged-particle beam inspection
Patent number
12,080,513
Issue date
Sep 3, 2024
ASML Netherlands B.V.
Wei Fang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Systems and methods for performing serial electron diffraction nano...
Patent number
12,072,304
Issue date
Aug 27, 2024
R. J. Dwayne Miller
G01 - MEASURING TESTING
Information
Patent Grant
Rotational X-ray inspection system and method
Patent number
12,061,156
Issue date
Aug 13, 2024
VIKEN DETECTION CORPORATION
Peter J. Rothschild
G01 - MEASURING TESTING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
12,053,675
Issue date
Aug 6, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
G01 - MEASURING TESTING
Information
Patent Grant
Correlative multimodal chemical imaging via machine learning
Patent number
12,057,304
Issue date
Aug 6, 2024
UT-Battelle, LLC
Olga S. Ovchinnikova
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Methods and systems for generating three-dimensional images that en...
Patent number
12,056,840
Issue date
Aug 6, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection and imaging of electric fields, using polarized neutrons
Patent number
12,055,500
Issue date
Aug 6, 2024
National Technology & Engineering Solutions of Sandia, LLC
Yuan-Yu Jau
G01 - MEASURING TESTING
Information
Patent Grant
Contact imaging sensor head for computed radiography
Patent number
12,044,637
Issue date
Jul 23, 2024
Leidos, Inc.
Rex David Richardson
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for measuring fastener concentricity
Patent number
12,038,393
Issue date
Jul 16, 2024
The Boeing Company
Thomas Maeder
G01 - MEASURING TESTING
Information
Patent Grant
Image processing apparatus and control method thereof, radiography...
Patent number
12,036,061
Issue date
Jul 16, 2024
Canon Kabushiki Kaisha
Takeshi Noda
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Defect inspection method and defect inspection device
Patent number
12,039,716
Issue date
Jul 16, 2024
HITACHI HIGH-TECH CORPORATION
Takashi Hiroi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Motion compensated high throughput fast 3D radiography system with...
Patent number
12,023,193
Issue date
Jul 2, 2024
AIXSCAN, Inc.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
Publication number
20240415482
Publication date
Dec 19, 2024
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
AN X-RAY SYSTEM
Publication number
20240418658
Publication date
Dec 19, 2024
THE NOTTINGHAM TRENT UNIVERSITY
Paul EVANS
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR SCATTER ESTIMATION IN COMPUTED TOMOGRAPHY...
Publication number
20240412426
Publication date
Dec 12, 2024
CANON MEDICAL SYSTEMS CORPORATION
Yujie Lu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Three-Dimensional Image Data Alignment Method and X-Ray Imaging App...
Publication number
20240412388
Publication date
Dec 12, 2024
Shimadzu Corporation
Shuhei ONISHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Methods and Systems for Generating Three-Dimensional Images that En...
Publication number
20240412476
Publication date
Dec 12, 2024
Rapiscan Systems, Inc.
Mala Sivakumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Systems and Methods for Using Multi-Dimensional X-Ray Imaging in Me...
Publication number
20240402098
Publication date
Dec 5, 2024
Rapiscan Holdings, Inc.
Brendan Edward Allman
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHODS FOR THREE-DIMENSIONAL TOMOGRAPHY OF ELONGATED SAMPLES
Publication number
20240402103
Publication date
Dec 5, 2024
FEI Company
Erik Michiel Franken
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR CHARACTERIZING A NETWORK TO BE ANALYSED COMPRISING PERIO...
Publication number
20240394867
Publication date
Nov 28, 2024
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Lucas JALOUSTRE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND DEVICE FOR ANALYSING AN IMAGE OF A MICROLITHOGRAPHIC MIC...
Publication number
20240393269
Publication date
Nov 28, 2024
Carl Zeiss SMT GMBH
Jens Oster
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEMS AND METHODS FOR INSPECTING HONEYCOMB CERAMIC STRUCTURES USI...
Publication number
20240386540
Publication date
Nov 21, 2024
Corning Incorporated
Patrick Garret Cigno
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Analysis Device and Analysis Method
Publication number
20240385131
Publication date
Nov 21, 2024
JEOL Ltd.
Takeshi Otsuka
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM AND METHOD FOR CABINET X-RAY IRRADIATOR SYSTEMS WITH CAMERA
Publication number
20240377339
Publication date
Nov 14, 2024
KUB TECHNOLOGIES, INC. DBA KUBTEC
Vikram Butani
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CONVERTING METROLOGY DATA
Publication number
20240377343
Publication date
Nov 14, 2024
ASML NETHERLANDS B.V.
Yunbo GUO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
Publication number
20240377340
Publication date
Nov 14, 2024
Greyscale AI
Brian Green
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RAY SCANNING APPARATUS
Publication number
20240369499
Publication date
Nov 7, 2024
Nuctech Company Limited
Zhiqiang CHEN
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR USING RADIATION IMAGING DATA TO ANALYZE CO...
Publication number
20240369500
Publication date
Nov 7, 2024
Robert Koch
G01 - MEASURING TESTING
Information
Patent Application
X-RAY MEASURING METHOD AND X-RAY MEASURING DEVICE FOR MEASURING A S...
Publication number
20240353355
Publication date
Oct 24, 2024
CiTEX Holding GmbH
Arno NEUMEISTER
G01 - MEASURING TESTING
Information
Patent Application
TERMINAL AND ELECTRODE DEFECT DETECTION METHOD
Publication number
20240354932
Publication date
Oct 24, 2024
LG ELECTRONICS INC.
Duho LEE
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
3D MASKING IN A COMPUTED TOMOGRAPHY IMAGE
Publication number
20240345003
Publication date
Oct 17, 2024
Faxitron Bioptics, LLC
Ciaran PURDY
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION SYSTEM AND METHOD
Publication number
20240345005
Publication date
Oct 17, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
METHOD OF 3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREAS...
Publication number
20240328970
Publication date
Oct 3, 2024
Carl Zeiss SMT GMBH
Dmitry Klochkov
G01 - MEASURING TESTING
Information
Patent Application
3D VOLUME INSPECTION OF SEMICONDUCTOR WAFERS WITH INCREASED ACCURACY
Publication number
20240331179
Publication date
Oct 3, 2024
Carl Zeiss SMT GMBH
Dmitry Klochkov
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION SYSTEM
Publication number
20240328967
Publication date
Oct 3, 2024
Anritsu Corporation
Itaru MIYAZAKI
G01 - MEASURING TESTING
Information
Patent Application
DIGITAL RADIOGRAPHY SYSTEM AND DIGITAL RADIOGRAPHY METHOD
Publication number
20240319113
Publication date
Sep 26, 2024
Nuctech Company Limited
Li ZHANG
G01 - MEASURING TESTING
Information
Patent Application
TRAINING SCANNING ELECTRON MICROSCOPY IMAGE SELECTION METHOD AND SE...
Publication number
20240320816
Publication date
Sep 26, 2024
Samsung Electronics Co., Ltd.
Nohong Kwak
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTION BY FAILURE MECHANISM CLASSIFICATIO...
Publication number
20240319123
Publication date
Sep 26, 2024
ASML NETHERLANDS B.V.
Achim WOESSNER
G01 - MEASURING TESTING
Information
Patent Application
MEASUREMENT METHOD AND APPARATUS FOR SEMICONDUCTOR FEATURES WITH IN...
Publication number
20240311698
Publication date
Sep 19, 2024
Carl Zeiss SMT GMBH
Alexander Freytag
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY INSPECTION SYSTEM AND CONTROL ARCHITECTURE FOR AN X-RAY INSPE...
Publication number
20240302296
Publication date
Sep 12, 2024
Smiths Detection France S.A.S.
Jean-Michel FAUGIER
G01 - MEASURING TESTING
Information
Patent Application
Material Detection in X-Ray Security Screening
Publication number
20240302300
Publication date
Sep 12, 2024
Rapiscan Holdings, Inc.
Simon Archambault
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY BAGGAGE AND PARCEL INSPECTION SYSTEM WITH EFFICIENT THIRD-PAR...
Publication number
20240280514
Publication date
Aug 22, 2024
Battelle Memorial Institute
Rodney Arthur Hallgren
G06 - COMPUTING CALCULATING COUNTING