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PHYSICS
G01
Measuring instruments
G01R
MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R27/00
Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
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G01R27/32
in circuits having distributed constants
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last 30 patents
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Patent Grant
Sampling circuit
Patent number
12,119,962
Issue date
Oct 15, 2024
Nippon Telegraph and Telephone Corporation
Naoki Terao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for accelerating the data acquisition throughput of electric...
Patent number
12,050,191
Issue date
Jul 30, 2024
Khalifa University of Science and Technology
Mahmoud Meribout
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multi-stage device and process for production of a low sulfur heavy...
Patent number
12,025,435
Issue date
Jul 2, 2024
Magemã Technology LLC
Michael Joseph Moore
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Parallel plate capacitor system for determining impedance character...
Patent number
11,965,873
Issue date
Apr 23, 2024
TransTech Systems, Inc.
Manfred Geier
G01 - MEASURING TESTING
Information
Patent Grant
Transducer built-in self-test
Patent number
11,913,988
Issue date
Feb 27, 2024
QUALCOMM Technologies, Inc.
Michael Carfore
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Enhanced impedance measurement using CTMU
Patent number
11,906,559
Issue date
Feb 20, 2024
Microchip Technology Incorporated
Bogdan Bolocan
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Multi-level RF pulse monitoring and RF pulsing parameter optimizati...
Patent number
11,874,234
Issue date
Jan 16, 2024
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Grant
Load pull system using waveguide tuner
Patent number
11,867,736
Issue date
Jan 9, 2024
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Load-pull tuner
Patent number
11,860,206
Issue date
Jan 2, 2024
C-Com Satellite Systems Inc.
Ardeshir Palizban
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High directivity signal coupler
Patent number
11,821,930
Issue date
Nov 21, 2023
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Pre-screening and tuning heterojunctions for topological quantum co...
Patent number
11,808,796
Issue date
Nov 7, 2023
Microsoft Technology Licensing, LLC
Dmitry Pikulin
G06 - COMPUTING CALCULATING COUNTING
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Patent Grant
Systems and methods for analyte sensing with reduced signal inaccuracy
Patent number
11,802,843
Issue date
Oct 31, 2023
KNOW LABS, INC.
Phillip Bosua
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for improving frequency response of a high-spee...
Patent number
11,758,308
Issue date
Sep 12, 2023
SCHNEIDER ELECTRIC USA, INC.
Erin C. McPhalen
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Measurement arrangement for load pull measurements comprising a mul...
Patent number
11,754,608
Issue date
Sep 12, 2023
Vertigo Technologies B.V.
Marco Spirito
G01 - MEASURING TESTING
Information
Patent Grant
Load pull system using two-probe waveguide tuner
Patent number
11,733,280
Issue date
Aug 22, 2023
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Very low frequency impedance tuner
Patent number
11,716,068
Issue date
Aug 1, 2023
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for detecting circuit defects
Patent number
11,709,196
Issue date
Jul 25, 2023
Samsung Electronics Co., Ltd.
Donggyu Minn
G01 - MEASURING TESTING
Information
Patent Grant
Frequency characteristic measurement device, controller and frequen...
Patent number
11,698,656
Issue date
Jul 11, 2023
FANUC CORPORATION
Wei Luo
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Low profile millimeterwave load pull tuner
Patent number
11,688,919
Issue date
Jun 27, 2023
Christos Tsironis
G01 - MEASURING TESTING
Information
Patent Grant
Self-calibrating transmission line resonator oscillating driver app...
Patent number
11,668,737
Issue date
Jun 6, 2023
Dell Products L.P.
Steven Jay Lash
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Radio field intensity measurement device, and radio field intensity...
Patent number
11,656,258
Issue date
May 23, 2023
Semiconductor Energy Laboratory Co., Ltd.
Hiroki Dembo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and system for sideband corrected noise-power measurement
Patent number
11,639,953
Issue date
May 2, 2023
Rohde & Schwarz GmbH & Co. KG
Daniel Müeller
G01 - MEASURING TESTING
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Patent Grant
Method of evaluating microwave characteristic
Patent number
11,639,902
Issue date
May 2, 2023
NATIONAL CHUNG SHAN INSTITUTE OF SCIENCE AND TECHNOLOGY
Chia-Ting Lin
G01 - MEASURING TESTING
Information
Patent Grant
Vector network analyzer with digital interface
Patent number
11,630,141
Issue date
Apr 18, 2023
Rohde & Schwarz GmbH & Co. KG
Steffen Heuel
G01 - MEASURING TESTING
Information
Patent Grant
Combination probes for load pull tuner
Patent number
11,621,468
Issue date
Apr 4, 2023
Christos Tsironis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Parallel plate capacitor system for determining impedance character...
Patent number
11,592,432
Issue date
Feb 28, 2023
TransTech Systems, Inc.
Manfred Geier
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Multi-level RF pulse monitoring and RF pulsing parameter optimizati...
Patent number
11,585,764
Issue date
Feb 21, 2023
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Grant
Bio-impedance analyzer
Patent number
11,559,219
Issue date
Jan 24, 2023
UTI Limited Partnership
Abdulwadood Abdullah Al-Ali
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Method and apparatus for monitoring secondary power device, and ele...
Patent number
11,506,741
Issue date
Nov 22, 2022
Samsung Electronics Co., Ltd.
Suck-Hyun Nam
G11 - INFORMATION STORAGE
Information
Patent Grant
Method for examining differential pair transmission lines
Patent number
11,474,136
Issue date
Oct 18, 2022
INVENTEC (PUDONG) TECHNOLOGY CORPORATION
Chun I Tseng
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
PROCESS AND SYSTEM FOR CHARACTERIZING A FIXTURE COMPONENT OF A TEST...
Publication number
20240385275
Publication date
Nov 21, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Mathias HELLWIG
G01 - MEASURING TESTING
Information
Patent Application
STANDARD RECTANGULAR WAVEGUIDE WITH RF PORT INPUT TRANSITION
Publication number
20240319244
Publication date
Sep 26, 2024
KOREA INSTITUTE OF FUSION ENERGY
Hyun Ho WI
G01 - MEASURING TESTING
Information
Patent Application
Multi-Stage Process and Device for Production of Low Sulfur Heavy M...
Publication number
20240210156
Publication date
Jun 27, 2024
Magëmä Technology LLC
Michael Joseph Moore
G01 - MEASURING TESTING
Information
Patent Application
CALIBRATION UNIT AND CALIBRATION SYSTEM
Publication number
20240192300
Publication date
Jun 13, 2024
ROHDE & SCHWARZ GMBH & CO. KG
Gerd BRESSER
G01 - MEASURING TESTING
Information
Patent Application
VECTOR NETWORK ANALYZER WITH DIGITAL INTERFACE
Publication number
20230213564
Publication date
Jul 6, 2023
ROHDE & SCHWARZ GMBH & CO. KG
Steffen HEUEL
G01 - MEASURING TESTING
Information
Patent Application
PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...
Publication number
20230194498
Publication date
Jun 22, 2023
TransTech Systems, Inc.
Manfred Geier
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
MULTI-LEVEL RF PULSE MONITORING AND RF PULSING PARAMETER OPTIMIZATI...
Publication number
20230184693
Publication date
Jun 15, 2023
Applied Materials, Inc.
Dermot Cantwell
G01 - MEASURING TESTING
Information
Patent Application
MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTER...
Publication number
20230027767
Publication date
Jan 26, 2023
EMZER TECHNOLOGICAL SOLUTIONS, S.L.
Albert Miquel SANCHEZ DELGADO
G01 - MEASURING TESTING
Information
Patent Application
Multi-Stage Device and Process for Production of a Low Sulfur Heavy...
Publication number
20220381547
Publication date
Dec 1, 2022
Magëmä Technology LLC
Michael Joseph Moore
G01 - MEASURING TESTING
Information
Patent Application
HIGH-FREQUENCY COMPONENT TEST DEVICE AND METHOD THEREOF
Publication number
20220341978
Publication date
Oct 27, 2022
Industrial Technology Research Institute
Sih-Han LI
G01 - MEASURING TESTING
Information
Patent Application
NOISE-INDEPENDENT LOSS CHARACTERIZATION OF NETWORKS
Publication number
20220317169
Publication date
Oct 6, 2022
Anchronix Semiconductor Corporation
Hansel Desmond Dsilva
G01 - MEASURING TESTING
Information
Patent Application
Sampling Circuit
Publication number
20220294671
Publication date
Sep 15, 2022
Naoki Terao
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SELF-CALIBRATING TRANSMISSION LINE RESONATOR OSCILLATING DRIVER APP...
Publication number
20220291265
Publication date
Sep 15, 2022
Dell Products L.P.
Steven Jay Lash
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR SIDEBAND CORRECTED NOISE-POWER MEASUREMENT
Publication number
20220252651
Publication date
Aug 11, 2022
ROHDE & SCHWARZ GMBH & CO. KG
Daniel MUELLER
G01 - MEASURING TESTING
Information
Patent Application
CORRECTION OF TRANSMISSION LINE INDUCED PHASE AND AMPLITUDE ERRORS...
Publication number
20220120798
Publication date
Apr 21, 2022
Compass Technology Group LLC
John Weber Schultz
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR EMULATING A REACTIVE SOURCE IMPEDANCE OF A...
Publication number
20220084790
Publication date
Mar 17, 2022
Advanced Energy Industries, Inc.
Gideon Johannes Jacobus van Zyl
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOAD-PULL TUNER
Publication number
20220082599
Publication date
Mar 17, 2022
C-COM SATELLITE SYSTEMS INC.
ARDESHIR PALIZBAN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Measurement arrangement for load pull measurements comprising a mul...
Publication number
20220057441
Publication date
Feb 24, 2022
Technische Universiteit Delft
Marco Spirito
G01 - MEASURING TESTING
Information
Patent Application
Motor Control System
Publication number
20220034969
Publication date
Feb 3, 2022
Rohm Co., Ltd.
Naoyuki Usagawa
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Application
METHOD AND APPARATUS FOR DETECTING CIRCUIT DEFECTS
Publication number
20220018892
Publication date
Jan 20, 2022
Samsung Electronics Co., Ltd.
Donggyu MINN
G01 - MEASURING TESTING
Information
Patent Application
RADIO FIELD INTENSITY MEASUREMENT DEVICE, AND RADIO FIELD INTENSITY...
Publication number
20220011357
Publication date
Jan 13, 2022
Semiconductor Energy Laboratory Co., Ltd.
Hiroki Dembo
G01 - MEASURING TESTING
Information
Patent Application
PARALLEL PLATE CAPACITOR SYSTEM FOR DETERMINING IMPEDANCE CHARACTER...
Publication number
20210255161
Publication date
Aug 19, 2021
TransTech Systems, Inc.
Manfred Geier
G01 - MEASURING TESTING
Information
Patent Application
VECTOR NETWORK ANALYZER WITH DIGITAL INTERFACE
Publication number
20210223301
Publication date
Jul 22, 2021
ROHDE & SCHWARZ GMBH & CO. KG
Steffen HEUEL
G01 - MEASURING TESTING
Information
Patent Application
NOISE-INDEPENDENT LOSS CHARACTERIZATION OF NETWORKS
Publication number
20210156897
Publication date
May 27, 2021
Achronix Semiconductor Corporation
Hansel Desmond Dsilva
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND APPARATUS FOR MONITORING SECONDARY POWER DEVICE, AND ELE...
Publication number
20210116529
Publication date
Apr 22, 2021
SUCK-HYUN NAM
G11 - INFORMATION STORAGE
Information
Patent Application
METHOD OF CALIBRATING A MEASUREMENT AND ANALYZING DEVICE AS WELL AS...
Publication number
20210018545
Publication date
Jan 21, 2021
ROHDE & SCHWARZ GMBH & CO. KG
Werner Held
G01 - MEASURING TESTING
Information
Patent Application
FREQUENCY CHARACTERISTIC MEASUREMENT DEVICE, CONTROLLER AND FREQUEN...
Publication number
20200310485
Publication date
Oct 1, 2020
FANUC CORPORATION
Wei LUO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIO FIELD INTENSITY MEASUREMENT DEVICE, AND RADIO FIELD INTENSITY...
Publication number
20200292604
Publication date
Sep 17, 2020
Semiconductor Energy Laboratory Co., Ltd.
Hiroki Dembo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Proximity Detection
Publication number
20200182602
Publication date
Jun 11, 2020
Neodrón Limited
Daniel Arthur Ujvari
G01 - MEASURING TESTING
Information
Patent Application
BROADBAND PROBES FOR IMPEDANCE TUNERS
Publication number
20200119707
Publication date
Apr 16, 2020
Maury Microwave, Inc.
M. Tekamül Büber
G01 - MEASURING TESTING