TREA

incident ion beam and measuring secondary ion beam [SIMS]

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Industry

  • CPC
  • G01N2223/0816
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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0816incident ion beam and measuring secondary ion beam [SIMS]
Industries