incident ion beam and measuring secondary ion beam [SIMS]

This industry / category may be too specific. Please go to a parent level for more data

Industries

Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing a sample combining an X-ray characterizat...
- Patent number 10,481,109
- Issue date Nov 19, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Agnieszka Priebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,024,280
- Issue date May 5, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed field sample neutralization
- Patent number 4,968,888
- Issue date Nov 6, 1990
- The United States of America as represented by the United States Department o...
- Anthony D. Appelhans
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle energy analyzer
- Patent number 4,546,254
- Issue date Oct 8, 1985
- Shimadzu Corporation
- Hiroshi Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
3757116
- Patent number 3,757,116
- Issue date Sep 4, 1973
- G01 - MEASURING TESTING