incident ion beam

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CPC
G01N2223/081

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/081incident ion beam

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Patents Grantslast 30 patents

Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for characterizing a sample combining an X-ray characterizat...
- Patent number 10,481,109
- Issue date Nov 19, 2019
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Agnieszka Priebe
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite charged particle beam apparatus
- Patent number 9,024,280
- Issue date May 5, 2015
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Electrical measurements in samples
- Patent number 7,148,478
- Issue date Dec 12, 2006
- Yeda Research and Development Company Ltd.
- Hagai Cohen
- G01 - MEASURING TESTING
Information Patent Grant
Mass spectrometer having means for observing the radiation emitted...
- Patent number 5,347,125
- Issue date Sep 13, 1994
- Fisons plc
- John L. Holmes
- G01 - MEASURING TESTING
Information Patent Grant
Pulsed field sample neutralization
- Patent number 4,968,888
- Issue date Nov 6, 1990
- The United States of America as represented by the United States Department o...
- Anthony D. Appelhans
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle energy analyzer
- Patent number 4,546,254
- Issue date Oct 8, 1985
- Shimadzu Corporation
- Hiroshi Yamauchi
- G01 - MEASURING TESTING
Information Patent Grant
3757116
- Patent number 3,757,116
- Issue date Sep 4, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3408496
- Patent number 3,408,496
- Issue date Oct 29, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3351760
- Patent number 3,351,760
- Issue date Nov 7, 1967
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
- Publication number 20240369505
- Publication date Nov 7, 2024
- FEI Company
- Garrett Budnik
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS
- Publication number 20230243767
- Publication date Aug 3, 2023
- FEI Company
- Garrett Budnik
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE
- Publication number 20230229827
- Publication date Jul 20, 2023
- Saudi Arabian Oil Company
- Abrar Alabbad
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20220349848
- Publication date Nov 3, 2022
- KEYENCE CORPORATION
- Hayato OHBA
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
- Publication number 20210090855
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- G01 - MEASURING TESTING
Information Patent Application
ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...
- Publication number 20140374585
- Publication date Dec 25, 2014
- Yohei Murayama
- G01 - MEASURING TESTING
Information Patent Application
COMPOSITE CHARGED PARTICLE BEAM APPARATUS
- Publication number 20130075606
- Publication date Mar 28, 2013
- Atsushi UEMOTO
- G01 - MEASURING TESTING
Information Patent Application
Electrical measurements in samples
- Publication number 20060103395
- Publication date May 18, 2006
- Hagai Cohen
- G01 - MEASURING TESTING

incident ion beam

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Charged particle beam irradiation apparatus and control method

Method for characterizing a sample combining an X-ray characterizat...

Composite charged particle beam apparatus

Electrical measurements in samples

Mass spectrometer having means for observing the radiation emitted...

Pulsed field sample neutralization

Charged particle energy analyzer

3757116

3408496

3351760

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS

METHOD AND SYSTEM FOR SPECTROSCOPIC ANALYSIS

SYSTEM AND METHOD FOR MODELING A ROCK SAMPLE

ANALYSIS DEVICE AND ANALYSIS METHOD

CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD

ION GROUP IRRADIATION DEVICE, SECONDARY ION MASS SPECTROMETER, AND...

COMPOSITE CHARGED PARTICLE BEAM APPARATUS

Electrical measurements in samples