3408496

Information

• Patent Grant
• 3408496

• References
• Source

• Patent Number

  3,408,496

• Date Filed

  Not available

• Date Issued

  Tuesday, October 29, 1968
  56 years ago

• CPC

  • G01N23/22 - by measuring secondary emission
  • G01N23/223 - by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N2223/07 - secondary emission
  • G01N2223/076 - X-ray fluorescence
  • G01N2223/0813 - incident ion beam and measuring X-rays [PIXE]
  • G01N2223/1045 - alpha
  • G01N2223/202 - isotopes
  • G01N2223/501 - array
  • G01N2223/502 - ionisation chamber
  • G01N2223/5055 - scintillation crystal coupled to PMT
  • G01N2223/638 - gas

• US Classifications

  • 250 - Radiant energy
  • 850 - Scanning-probe techniques or apparatus