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Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
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CPC
G11C2216/00
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Parent Industries
G
PHYSICS
G11
Information storage
G11C
STATIC STORES
Current Industry
G11C2216/00
Indexing scheme relating to G11C16/00 and subgroups, for features not directly covered by these groups
Sub Industries
G11C2216/02
Structural aspects of erasable programmable read-only memories
G11C2216/04
Nonvolatile memory cell provided with a separate control gate for erasing the cells
G11C2216/06
Floating gate cells in which the floating gate consists of multiple isolated silicon islands
G11C2216/08
Nonvolatile memory wherein data storage is accomplished by storing relatively few electrons in the storage layer
G11C2216/10
Floating gate memory cells with a single polysilicon layer
G11C2216/12
Reading and writing aspects of erasable programmable read-only memories
G11C2216/14
Circuits or methods to write a page or sector of information simultaneously into a nonvolatile memory, typically a complete row or word line in flash memory
G11C2216/16
Flash programming of all the cells in an array, sector or block simultaneously
G11C2216/18
Flash erasure of all the cells in an array, sector or block simultaneously
G11C2216/20
Suspension of programming or erasing cells in an array in order to read other cells in it
G11C2216/22
Nonvolatile memory in which reading can be carried out from one memory bank or array whilst a word or sector in another bank or array is being erased or programmed simultaneously
G11C2216/24
Nonvolatile memory in which programming can be carried out in one memory bank or array whilst a word or sector in another bank or array is being erased simultaneously
G11C2216/26
Floating gate memory which is adapted to be one-time programmable [OTP]
G11C2216/28
Floating gate memory programmed by reverse programming
G11C2216/30
Reduction of number of input/output pins by using a serial interface to transmit or receive addresses or data
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