inelastic scatter

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CPC
G01N2223/063

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/063inelastic scatter

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Multi-modal Compton and single photon emission computed tomography...
- Patent number 11,998,374
- Issue date Jun 4, 2024
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for cosmogenic neutron sensing moisture detecti...
- Patent number 11,927,552
- Issue date Mar 12, 2024
- QUAESTA INSTRUMENTS, LLC
- Peter Shifflett
- G01 - MEASURING TESTING
Information Patent Grant
Compton scattering correction methods for pixellated radiation dete...
- Patent number 11,701,065
- Issue date Jul 18, 2023
- Redlen Technologies, Inc.
- Krzysztof Iniewski
- G01 - MEASURING TESTING
Information Patent Grant
Beam alignment systems and method
- Patent number 11,665,806
- Issue date May 30, 2023
- Schlumberger Technology Corporation
- Jani Reijonen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-modal Compton and single photon emission computed tomography...
- Patent number 11,426,135
- Issue date Aug 30, 2022
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Grant
System-independent characterization of materials using dual-energy...
- Patent number 10,466,183
- Issue date Nov 5, 2019
- Lawrence Livermore National Security, LLC
- Isaac Seetho
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of inspecting a degraded area of a metal structure covered b...
- Patent number 10,408,615
- Issue date Sep 10, 2019
- Inversa Systems LTD.
- John T. Bowles
- G01 - MEASURING TESTING
Information Patent Grant
High efficiency photon detection
- Patent number 10,126,255
- Issue date Nov 13, 2018
- Elwha LLC
- Rachel Cannara
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance analysis system
- Patent number 10,126,250
- Issue date Nov 13, 2018
- Shimadzu Corporation
- Sachio Murakami
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for measuring thin film thickness using x-ray
- Patent number 9,644,956
- Issue date May 9, 2017
- Nano CMS Co., Ltd
- Shi Surk Kim
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for characterising a material by scattering of...
- Patent number 9,535,017
- Issue date Jan 3, 2017
- Commissariat a l'Energie Atomique et Aux Energies Alternatives
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Grant
3D backscatter imaging system
- Patent number 9,442,083
- Issue date Sep 13, 2016
- Aribex, Inc.
- D. Clark Turner
- G01 - MEASURING TESTING
Information Patent Grant
Single beam backscatter x-ray system
- Patent number 9,123,450
- Issue date Sep 1, 2015
- The Boeing Company
- Michael Liesenfelt
- G01 - MEASURING TESTING
Information Patent Grant
Device for examining a test object by means of gamma or X-rays
- Patent number 5,150,395
- Issue date Sep 22, 1992
- U.S. Philips Corporation
- Josef Kosanetzky
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for analyzing ore by means of gamma radiation
- Patent number 4,520,267
- Issue date May 28, 1985
- Outokumpu Oy
- Heikki Sipila
- G01 - MEASURING TESTING
Information Patent Grant
Annihilation radiation analysis
- Patent number 4,415,804
- Issue date Nov 15, 1983
- Australian Atomic Energy Commission
- Brian D. Sowerby
- G01 - MEASURING TESTING
Information Patent Grant
Method of determining whether radioactive contaminants are inside o...
- Patent number 4,031,387
- Issue date Jun 21, 1977
- The United States of America as represented by the United States Energy Resea...
- Kenneth R. Lattin
- G01 - MEASURING TESTING
Information Patent Grant
3404275
- Patent number 3,404,275
- Issue date Oct 1, 1968
- G01 - MEASURING TESTING
Information Patent Grant
2998527
- Patent number 2,998,527
- Issue date Aug 29, 1961
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...
- Publication number 20240293095
- Publication date Sep 5, 2024
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...
- Publication number 20220330909
- Publication date Oct 20, 2022
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...
- Publication number 20210282728
- Publication date Sep 16, 2021
- Siemens Medical Solutions USA, Inc.
- Alexander Hans Vija
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...
- Publication number 20200367839
- Publication date Nov 26, 2020
- REDLEN TECHNOLOGIES, INC.
- Krzysztof INIEWSKI
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT DEVICE USING X-RAY REFLECTION
- Publication number 20190285559
- Publication date Sep 19, 2019
- Earthnix-M, Inc.
- Hiroshi UCHIDA
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING A DEGRADED AREA OF A METAL STRUCTURE COVERED B...
- Publication number 20170248417
- Publication date Aug 31, 2017
- INVERSA SYSTEMS LTD.
- John T. BOWLES
- G01 - MEASURING TESTING
Information Patent Application
HIGH EFFICIENCY PHOTON DETECTION
- Publication number 20170205361
- Publication date Jul 20, 2017
- Elwha LLC
- Rachel Cannara
- G01 - MEASURING TESTING
Information Patent Application
Method And Apparatus For Characterising A Material By Scattering Of...
- Publication number 20140369473
- Publication date Dec 18, 2014
- Caroline Paulus
- G01 - MEASURING TESTING
Information Patent Application
Single Beam Backscatter X-Ray System
- Publication number 20130287169
- Publication date Oct 31, 2013
- The Boeing Company
- Michael Liesenfelt
- G01 - MEASURING TESTING
Information Patent Application
3D BACKSCATTER IMAGING SYSTEM
- Publication number 20130206985
- Publication date Aug 15, 2013
- D. Clark Turner
- G01 - MEASURING TESTING

inelastic scatter

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Multi-modal Compton and single photon emission computed tomography...

Systems and methods for cosmogenic neutron sensing moisture detecti...

Compton scattering correction methods for pixellated radiation dete...

Beam alignment systems and method

Multi-modal Compton and single photon emission computed tomography...

System-independent characterization of materials using dual-energy...

Method of inspecting a degraded area of a metal structure covered b...

High efficiency photon detection

Foreign substance analysis system

Method and apparatus for measuring thin film thickness using x-ray

Method and apparatus for characterising a material by scattering of...

3D backscatter imaging system

Single beam backscatter x-ray system

Device for examining a test object by means of gamma or X-rays

Method and apparatus for analyzing ore by means of gamma radiation

Annihilation radiation analysis

Method of determining whether radioactive contaminants are inside o...

3404275

2998527

Patents Applicationslast 30 patents

MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...

MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...

MULTI-MODAL COMPTON AND SINGLE PHOTON EMISSION COMPUTED TOMOGRAPHY...

COMPTON SCATTERING CORRECTION METHODS FOR PIXELLATED RADIATION DETE...

MEASUREMENT DEVICE USING X-RAY REFLECTION

METHOD OF INSPECTING A DEGRADED AREA OF A METAL STRUCTURE COVERED B...

HIGH EFFICIENCY PHOTON DETECTION

Method And Apparatus For Characterising A Material By Scattering Of...

Single Beam Backscatter X-Ray System

3D BACKSCATTER IMAGING SYSTEM