3404275

Information

• Patent Grant
• 3404275

• References
• Source

• Patent Number

  3,404,275

• Date Filed

  Not available

• Date Issued

  Tuesday, October 1, 1968
  56 years ago

• CPC

  • G01N23/22 - by measuring secondary emission
  • G01N23/203 - by measuring back scattering
  • G01N23/223 - by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
  • G01N2223/063 - inelastic scatter
  • G01N2223/071 - combination of measurements, at least 1 secondary emission
  • G01N2223/076 - X-ray fluorescence
  • G01N2223/1013 - gamma
  • G01N2223/202 - isotopes
  • G01N2223/61 - thin films, coatings
  • G01N2223/625 - nuclear fuels, laser imploded targets
  • G01N2223/633 - thickness, density, surface weight (unit area)

• US Classifications

  • 378 - X-ray or gamma ray systems or devices
  • 250 - Radiant energy