Input circuits therefor

Industry

CPC
G01R1/06766

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/06766Input circuits therefor

Industries

Patents Grantslast 30 patents

Information Patent Grant
Proximity detection for assessing sensing probe attachment state
- Patent number 12,135,337
- Issue date Nov 5, 2024
- The General Hospital Corporation
- Maria A. Franceschini
- G01 - MEASURING TESTING
Information Patent Grant
Measurement input circuit and measurement device
- Patent number 11,852,658
- Issue date Dec 26, 2023
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Wafer inspection method and inspection apparatus
- Patent number 11,841,381
- Issue date Dec 12, 2023
- CHROMA ATE INC.
- Tsun-I Wang
- G01 - MEASURING TESTING
Information Patent Grant
Test circuit
- Patent number 11,815,547
- Issue date Nov 14, 2023
- STMicroelectronics (Rousset) SAS
- Francois Tailliet
- G01 - MEASURING TESTING
Information Patent Grant
Methods and assemblies for tuning electronic modules
- Patent number 11,693,029
- Issue date Jul 4, 2023
- NXP USA, INC.
- Joshua Bennett English
- G01 - MEASURING TESTING
Information Patent Grant
Probe device, test device, and test method for semiconductor device
- Patent number 11,693,030
- Issue date Jul 4, 2023
- Samsung Electronics Co., Ltd.
- Hyungmin Jin
- G01 - MEASURING TESTING
Information Patent Grant
Leakage voltage detection system and leakage voltage detection method
- Patent number 11,598,822
- Issue date Mar 7, 2023
- Hitachi, Ltd.
- Tomohiko Yano
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Probe apparatus
- Patent number 11,579,170
- Issue date Feb 14, 2023
- CHROMA ATE INC.
- Chin-Yuan Chang
- G01 - MEASURING TESTING
Information Patent Grant
High speed signal transmitting and receiving detection device
- Patent number 11,567,104
- Issue date Jan 31, 2023
- TECAT TECHNOLOGIES (SUZHOU) LIMITED
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
Interface unit for coupling a probe to a measuring system
- Patent number 11,549,966
- Issue date Jan 10, 2023
- Mettler-Toledo GmbH
- Daniel Jungo
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,454,651
- Issue date Sep 27, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Configurable integrated logic analyzer
- Patent number 11,442,104
- Issue date Sep 13, 2022
- Marvell Asia Pte, Ltd.
- Avi Haimzon
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic connection indication
- Patent number 11,415,604
- Issue date Aug 16, 2022
- Baker Hughes Oilfield Operations LLC
- Brian Rhodes
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency measurement line structure
- Patent number 11,300,587
- Issue date Apr 12, 2022
- WANSHIH ELECTRONIC CO., LTD.
- Hung-Hsuan Lin
- G01 - MEASURING TESTING
Information Patent Grant
Adapter for a current probe and testing system
- Patent number 11,300,588
- Issue date Apr 12, 2022
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Oscilloscope probe identification
- Patent number 11,287,445
- Issue date Mar 29, 2022
- Keysight Technologies, Inc.
- Paul Doyle
- G01 - MEASURING TESTING
Information Patent Grant
Measurement input circuit and measurement device
- Patent number 11,287,447
- Issue date Mar 29, 2022
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Automatic probe ground connection checking techniques
- Patent number 11,249,111
- Issue date Feb 15, 2022
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Drain monitor, system and method of its use
- Patent number 11,243,103
- Issue date Feb 8, 2022
- Kevin W. Tillman
- G01 - MEASURING TESTING
Information Patent Grant
Common mode rejection ratio test system and method
- Patent number 11,209,459
- Issue date Dec 28, 2021
- Texas Instruments Incorporated
- Scott Matthew Gulas
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive voltage clamps and related methods
- Patent number 11,184,000
- Issue date Nov 23, 2021
- Texas Instruments Incorporated
- Eung Jung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Contactors with signal pins, ground pins, and short ground pins
- Patent number 11,156,638
- Issue date Oct 26, 2021
- Texas Instruments Incorporated
- Kay Chan Tong
- G01 - MEASURING TESTING
Information Patent Grant
Power probe including sensor for detecting current and voltage signals
- Patent number 11,119,120
- Issue date Sep 14, 2021
- Keysight Technologies, Inc.
- Jason Swaim
- G01 - MEASURING TESTING
Information Patent Grant
Active harmonic load pull impedance tuner
- Patent number 11,092,619
- Issue date Aug 17, 2021
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Probe attenuator for reduced input capacitance
- Patent number 11,079,407
- Issue date Aug 3, 2021
- Tektronix, Inc.
- Jonathan S. Dandy
- G01 - MEASURING TESTING
Information Patent Grant
Probe device
- Patent number 11,067,599
- Issue date Jul 20, 2021
- HKC CORPORATION LIMITED
- Jianfeng Shan
- G01 - MEASURING TESTING
Information Patent Grant
Dynamic probe, dynamic measurement system and method for probing a...
- Patent number 11,054,467
- Issue date Jul 6, 2021
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Active harmonic load pull impedance tuner
- Patent number 11,041,882
- Issue date Jun 22, 2021
- Christos Tsironis
- G01 - MEASURING TESTING
Information Patent Grant
Position sensing in a probe to modify transfer characteristics in a...
- Patent number 10,962,566
- Issue date Mar 30, 2021
- Tektronix, Inc.
- Julie A. Campbell
- G01 - MEASURING TESTING
Information Patent Grant
Isolated voltage probe
- Patent number 10,962,572
- Issue date Mar 30, 2021
- Yokogawa Electric Corporation
- Katsuki Mitsunaga
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
ISOLATED TEST AND MEASUREMENT PROBE
- Publication number 20240369665
- Publication date Nov 7, 2024
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION
- Publication number 20240310411
- Publication date Sep 19, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Rajavelu Thinakaran
- G01 - MEASURING TESTING
Information Patent Application
Sample Inspection Apparatus
- Publication number 20240255556
- Publication date Aug 1, 2024
- Hitachi High-Tech Corporation
- Tomoko SHIMAMORI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COAXIAL PAD PROBE TOOLING
- Publication number 20240241154
- Publication date Jul 18, 2024
- BAE SYSTEMS INFORMATION AND ELECTRONIC SYSTEMS INTEGRATION INC
- Jeffrey Fitzgerald
- G01 - MEASURING TESTING
Information Patent Application
MEMS DEVICE MEASUREMENTS USING PULSE MEASURE UNIT
- Publication number 20240168082
- Publication date May 23, 2024
- KEITHLEY INSTRUMENTS, LLC
- Jin Kwang Yu
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE
- Publication number 20240142522
- Publication date May 2, 2024
- Innolux Corporation
- Chih-Yung Hsieh
- G01 - MEASURING TESTING
Information Patent Application
Probe Head
- Publication number 20240125816
- Publication date Apr 18, 2024
- PMK Mess- und Kommunikationstechnik, GmbH
- Michael J Mende
- G01 - MEASURING TESTING
Information Patent Application
INGESTIBLE IMPLANTABLE DEVICE TO MEASURE INTERNAL TTFIELD INTENSITY
- Publication number 20240103041
- Publication date Mar 28, 2024
- Novocure GmbH
- Yoram Wasserman
- G01 - MEASURING TESTING
Information Patent Application
TEST DEVICE
- Publication number 20240069067
- Publication date Feb 29, 2024
- QUANTA COMPUTER INC.
- Wei-Chih HUNG
- G01 - MEASURING TESTING
Information Patent Application
SENSING ELECTRONIC DEVICE
- Publication number 20230305037
- Publication date Sep 28, 2023
- InnoLux Corporation
- Chao-Yin KUO
- G01 - MEASURING TESTING
Information Patent Application
HIGH CURRENT EXTENSION FOR A DUAL-STAGE SOURCE MEASURE UNIT
- Publication number 20230288448
- Publication date Sep 14, 2023
- KEITHLEY INSTRUMENTS, LLC
- Wayne C. Goeke
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION METHOD AND INSPECTION APPARATUS
- Publication number 20230105201
- Publication date Apr 6, 2023
- CHROMA ATE INC.
- TSUN-I WANG
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND ASSEMBLIES FOR TUNING ELECTRONIC MODULES
- Publication number 20230014716
- Publication date Jan 19, 2023
- NXP USA, Inc.
- Joshua Bennett English
- G01 - MEASURING TESTING
Information Patent Application
MULTI-MODE MEASUREMENT PROBE
- Publication number 20220334144
- Publication date Oct 20, 2022
- Tektronix, Inc.
- Joshua J. O'Brien
- G01 - MEASURING TESTING
Information Patent Application
HIGH SPEED SIGNAL TRANSMITTING AND RECEIVING DETECTION DEVICE
- Publication number 20220221488
- Publication date Jul 14, 2022
- teCat Technologies (Suzhou) Limited
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
PROBE APPARATUS
- Publication number 20220178967
- Publication date Jun 9, 2022
- CHROMA ATE INC.
- CHIN-YUAN CHANG
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE PROBE
- Publication number 20220128601
- Publication date Apr 28, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Paul Doyle
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE
- Publication number 20220120786
- Publication date Apr 21, 2022
- Rohde& Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT
- Publication number 20220107356
- Publication date Apr 7, 2022
- STMicroelectronics (Rousset) SAS
- Francois Tailliet
- G01 - MEASURING TESTING
Information Patent Application
DYNAMIC CONNECTION INDICATION
- Publication number 20220099705
- Publication date Mar 31, 2022
- Baker Hughes Oilfield Operations LLC
- Brian Rhodes
- G01 - MEASURING TESTING
Information Patent Application
Leakage Voltage Detection System and Leakage Voltage Detection Method
- Publication number 20220099755
- Publication date Mar 31, 2022
- Hitachi, Ltd
- Tomohiko YANO
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Application
PROBE DEVICE, TEST DEVICE, AND TEST METHOD FOR SEMICONDUCTOR DEVICE
- Publication number 20220091158
- Publication date Mar 24, 2022
- Samsung Electronics Co., Ltd.
- Hyungmin Jin
- G01 - MEASURING TESTING
Information Patent Application
PROXIMITY DETECTION FOR ASSESSING SENSING PROBE ATTACHMENT STATE
- Publication number 20210333308
- Publication date Oct 28, 2021
- The General Hospital Corporation
- Maria A. Franceschini
- G01 - MEASURING TESTING
Information Patent Application
Automatic Probe Ground Connection Checking Techniques
- Publication number 20210088553
- Publication date Mar 25, 2021
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Application
INTERFACE UNIT FOR COUPLING A PROBE TO A MEASURING SYSTEM
- Publication number 20210072285
- Publication date Mar 11, 2021
- Mettler-Toledo GmbH
- Daniel Jungo
- G01 - MEASURING TESTING
Information Patent Application
POWER PROBE
- Publication number 20210063440
- Publication date Mar 4, 2021
- KEYSIGHT TECHNOLOGIES, INC.
- Jason Swaim
- G01 - MEASURING TESTING
Information Patent Application
PROBE DEVICE
- Publication number 20200271691
- Publication date Aug 27, 2020
- HKC Corporation Limited
- Jianfeng SHAN
- G01 - MEASURING TESTING
Information Patent Application
COMMON MODE REJECTION RATIO TEST SYSTEM AND METHOD
- Publication number 20200264212
- Publication date Aug 20, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Scott Matthew Gulas
- G01 - MEASURING TESTING
Information Patent Application
OSCILLOSCOPE PROBE
- Publication number 20200132722
- Publication date Apr 30, 2020
- KEYSIGHT TECHNOLOGIES, INC.
- Paul Doyle
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION
- Publication number 20200116759
- Publication date Apr 16, 2020
- XCERRA CORPORATION
- Jason Mroczkowski
- G01 - MEASURING TESTING

Input circuits therefor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Proximity detection for assessing sensing probe attachment state

Measurement input circuit and measurement device

Wafer inspection method and inspection apparatus

Test circuit

Methods and assemblies for tuning electronic modules

Probe device, test device, and test method for semiconductor device

Leakage voltage detection system and leakage voltage detection method

Probe apparatus

High speed signal transmitting and receiving detection device

Interface unit for coupling a probe to a measuring system

Automatic probe ground connection checking techniques

Configurable integrated logic analyzer

Dynamic connection indication

High-frequency measurement line structure

Adapter for a current probe and testing system

Oscilloscope probe identification

Measurement input circuit and measurement device

Automatic probe ground connection checking techniques

Drain monitor, system and method of its use

Common mode rejection ratio test system and method

Adaptive voltage clamps and related methods

Contactors with signal pins, ground pins, and short ground pins

Power probe including sensor for detecting current and voltage signals

Active harmonic load pull impedance tuner

Probe attenuator for reduced input capacitance

Probe device

Dynamic probe, dynamic measurement system and method for probing a...

Active harmonic load pull impedance tuner

Position sensing in a probe to modify transfer characteristics in a...

Isolated voltage probe

Patents Applicationslast 30 patents

ISOLATED TEST AND MEASUREMENT PROBE

METHODS AND APPARATUS FOR SOURCE MEASUREMENT UNIT (SMU) OPERATION

Sample Inspection Apparatus

COAXIAL PAD PROBE TOOLING

MEMS DEVICE MEASUREMENTS USING PULSE MEASURE UNIT

ELECTRONIC DEVICE

Probe Head

INGESTIBLE IMPLANTABLE DEVICE TO MEASURE INTERNAL TTFIELD INTENSITY

TEST DEVICE

SENSING ELECTRONIC DEVICE

HIGH CURRENT EXTENSION FOR A DUAL-STAGE SOURCE MEASURE UNIT

WAFER INSPECTION METHOD AND INSPECTION APPARATUS

METHODS AND ASSEMBLIES FOR TUNING ELECTRONIC MODULES

MULTI-MODE MEASUREMENT PROBE

HIGH SPEED SIGNAL TRANSMITTING AND RECEIVING DETECTION DEVICE

PROBE APPARATUS

OSCILLOSCOPE PROBE

MEASUREMENT INPUT CIRCUIT AND MEASUREMENT DEVICE

TEST CIRCUIT

DYNAMIC CONNECTION INDICATION

Leakage Voltage Detection System and Leakage Voltage Detection Method

PROBE DEVICE, TEST DEVICE, AND TEST METHOD FOR SEMICONDUCTOR DEVICE

PROXIMITY DETECTION FOR ASSESSING SENSING PROBE ATTACHMENT STATE

Automatic Probe Ground Connection Checking Techniques

INTERFACE UNIT FOR COUPLING A PROBE TO A MEASURING SYSTEM

POWER PROBE

PROBE DEVICE

COMMON MODE REJECTION RATIO TEST SYSTEM AND METHOD

OSCILLOSCOPE PROBE

TEST PROBE ASSEMBLY FOR HIGH FREQUENCY DEVICE CHARACTERIZATION