Input or output interfaces for test

Industry

CPC
G01R31/31713

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31713Input or output interfaces for test

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method, a device and a computer program for operating a modular tes...
- Patent number 12,153,091
- Issue date Nov 26, 2024
- Volkswagen Aktiengesellschaft
- Andreas Aal
- G01 - MEASURING TESTING
Information Patent Grant
Test system, test method, and non-transitory computer readable medium
- Patent number 12,146,910
- Issue date Nov 19, 2024
- Kioxia Corporation
- Kazuhiko Nakahara
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for avoiding collision between data
- Patent number 12,140,627
- Issue date Nov 12, 2024
- Hyundai Mobis Co., Ltd.
- Sung Hoon Bang
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Interface to full and reduced pin JTAG devices
- Patent number 12,130,328
- Issue date Oct 29, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Reconfigurable JTAG architecture for implementation of programmable...
- Patent number 12,123,912
- Issue date Oct 22, 2024
- University of Florida Research Foundation, Incorporated
- Swarup Bhunia
- G01 - MEASURING TESTING
Information Patent Grant
Scan frame based test access mechanisms
- Patent number 12,117,490
- Issue date Oct 15, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan test in a single-wire bus circuit
- Patent number 12,092,689
- Issue date Sep 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for electrically coupling a unit under test wi...
- Patent number 12,092,686
- Issue date Sep 17, 2024
- Western Digital Technologies, Inc.
- Aleksandr Dean Schwerdt
- G01 - MEASURING TESTING
Information Patent Grant
Flip flop standard cell
- Patent number 12,063,041
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Nick Samra
- G11 - INFORMATION STORAGE
Information Patent Grant
Margin test data tagging and predictive expected margins
- Patent number 12,061,232
- Issue date Aug 13, 2024
- Tektronix, Inc.
- Sam J. Strickling
- G01 - MEASURING TESTING
Information Patent Grant
Decompression circuit, circuit generation method, and IC chip
- Patent number 12,050,248
- Issue date Jul 30, 2024
- Huawei Technologies Co., Ltd.
- Yu Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Wireless electronic-control system
- Patent number 12,000,887
- Issue date Jun 4, 2024
- Lam Research Corporation
- Christopher-James Parker
- G01 - MEASURING TESTING
Information Patent Grant
System capable of detecting failure of component of system and meth...
- Patent number 11,988,709
- Issue date May 21, 2024
- DEEPX CO., LTD.
- Lok Won Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test methods, tester, load board and test system
- Patent number 11,988,710
- Issue date May 21, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chia-Chi Hsu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display device
- Patent number 11,966,132
- Issue date Apr 23, 2024
- Japan Display Inc.
- Keita Sasanuma
- G01 - MEASURING TESTING
Information Patent Grant
Server JTAG component adaptive interconnection system and method
- Patent number 11,953,550
- Issue date Apr 9, 2024
- INSPUR SUZHOU INTELLIGENT TECHNOLOGY CO., LTD
- Yanpo Huang
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self-test for die-to-die physical interfaces
- Patent number 11,940,491
- Issue date Mar 26, 2024
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Grant
Single pin DFT architecture for USBPD ICs
- Patent number 11,933,841
- Issue date Mar 19, 2024
- SILICONCH SYSTEMS PVT LTD
- Munnangi Sirisha
- G01 - MEASURING TESTING
Information Patent Grant
Secured scan access for a device including a scan chain
- Patent number 11,927,633
- Issue date Mar 12, 2024
- Texas Instruments Incorporated
- Mudasir Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for database scan acceleration
- Patent number 11,927,634
- Issue date Mar 12, 2024
- Samsung Electronics Co., Ltd.
- Andrew Chang
- G01 - MEASURING TESTING
Information Patent Grant
System and method for schedule-based I/O multiplexing for integrate...
- Patent number 11,927,630
- Issue date Mar 12, 2024
- MARVELL ASIA PTE. LTD.
- Sounil Biswas
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Fan-out buffer with skew control function, operating method thereof...
- Patent number 11,921,158
- Issue date Mar 5, 2024
- Samsung Electronics Co., Ltd.
- Byung-Sung Kim
- G01 - MEASURING TESTING
Information Patent Grant
Automated test equipment for testing one or more devices under test...
- Patent number 11,913,990
- Issue date Feb 27, 2024
- Advantest Corporation
- Olaf Pöppe
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Baseboard management controller (BMC) test system and method
- Patent number 11,907,384
- Issue date Feb 20, 2024
- Dell Products, L.P.
- Timothy M. Lambert
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and measurement instrument for testing a device under test
- Patent number 11,906,583
- Issue date Feb 20, 2024
- Rohde & Schwarz GmbH & Co. KG
- Kevin Guo
- G01 - MEASURING TESTING
Information Patent Grant
Generating multiple pseudo static control signals using on-chip JTA...
- Patent number 11,899,063
- Issue date Feb 13, 2024
- Texas Instruments Incorporated
- Mudasir Shafat Kawoosa
- G01 - MEASURING TESTING
Information Patent Grant
Voltage monitoring circuit for interface
- Patent number 11,899,061
- Issue date Feb 13, 2024
- Apple Inc.
- Fabien S. Faure
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device test method, apparatus, and system, medium, and elect...
- Patent number 11,867,755
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Yu
- G01 - MEASURING TESTING
Information Patent Grant
Reduced signaling interface method and apparatus
- Patent number 11,867,756
- Issue date Jan 9, 2024
- Texas Instruments Incorporated
- Lee D. Whetsel
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Test method for control chip and related device
- Patent number 11,867,758
- Issue date Jan 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Chuanqi Shi
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT
- Publication number 20240345162
- Publication date Oct 17, 2024
- Qorvo US, Inc.
- Alexander Wayne Hietala
- G11 - INFORMATION STORAGE
Information Patent Application
System and Method for Utilizing Idle Computing Capacity
- Publication number 20240329133
- Publication date Oct 3, 2024
- Tapster Robotics, Inc.
- Jason Randolph Huggins
- G01 - MEASURING TESTING
Information Patent Application
MEMORY TIMING CHARACTERIZATION CIRCUITRY
- Publication number 20240319269
- Publication date Sep 26, 2024
- Intel Corporation
- Amit Agarwal
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS
- Publication number 20240288497
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Michael Richard Spica
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR AVOIDING COLLISION BETWEEN DATA
- Publication number 20240264228
- Publication date Aug 8, 2024
- HYUNDAI MOBIS CO., LTD.
- Sung Hoon BANG
- B60 - VEHICLES IN GENERAL
Information Patent Application
NPU CAPABLE OF BEING TESTED DURING RUNTIME
- Publication number 20240264226
- Publication date Aug 8, 2024
- DEEPX CO., LTD.
- Lok Won KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES
- Publication number 20240241173
- Publication date Jul 18, 2024
- Teradyne, Inc.
- Richard W. FANNING
- G01 - MEASURING TESTING
Information Patent Application
SECURED SCAN ACCESS FOR A DEVICE INCLUDING A SCAN CHAIN
- Publication number 20240241174
- Publication date Jul 18, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir KAWOOSA
- G01 - MEASURING TESTING
Information Patent Application
CAN TRANSCEIVER AND METHOD FOR THE CAN TRANSCEIVER
- Publication number 20240168090
- Publication date May 23, 2024
- NXP B.V.
- Lucas Pieter Lodewijk van Dijk
- G01 - MEASURING TESTING
Information Patent Application
METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRI...
- Publication number 20240159827
- Publication date May 16, 2024
- Samsung Electronics Co., Ltd.
- Jaecheol Lee
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...
- Publication number 20240133943
- Publication date Apr 25, 2024
- ADVANTEST TEST SOLUTIONS, INC.
- Karthik RANGANATHAN
- G01 - MEASURING TESTING
Information Patent Application
SECURED SCAN ACCESS FOR A DEVICE INCLUDING A SCAN CHAIN
- Publication number 20240103078
- Publication date Mar 28, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Mudasir KAWOOSA
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER CIRCUIT
- Publication number 20240094289
- Publication date Mar 21, 2024
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FLIP FLOP STANDARD CELL
- Publication number 20240072777
- Publication date Feb 29, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Nick Samra
- G11 - INFORMATION STORAGE
Information Patent Application
CONTAINERIZED ORCHESTRATION OF SECURE SOCKET LAYER VIRTUAL PRIVATE...
- Publication number 20240036112
- Publication date Feb 1, 2024
- AT&T INTELLECTUAL PROPERTY I, L.P.
- Elmer Cruz
- G01 - MEASURING TESTING
Information Patent Application
Pin Testing System for Multi-Pin Chip and Method Thereof
- Publication number 20230400511
- Publication date Dec 14, 2023
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Jin-Dong Zhao
- G01 - MEASURING TESTING
Information Patent Application
TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM
- Publication number 20230400514
- Publication date Dec 14, 2023
- KIOXIA Corporation
- Kazuhiko NAKAHARA
- G01 - MEASURING TESTING
Information Patent Application
Built-in Self-Test for Die-to-Die Physical Interfaces
- Publication number 20230384377
- Publication date Nov 30, 2023
- Apple Inc.
- Fabien S. Faure
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC INSTRUMENT FOR ANALYZING A DUT
- Publication number 20230333164
- Publication date Oct 19, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mathias HELLWIG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DATABASE SCAN ACCELERATION
- Publication number 20230314511
- Publication date Oct 5, 2023
- Samsung Electronics Co., Ltd.
- Andrew CHANG
- G01 - MEASURING TESTING
Information Patent Application
CONFIGURABLE BOUNDARY SCAN
- Publication number 20230314509
- Publication date Oct 5, 2023
- Intel Corporation
- Rohini Krishnan
- G01 - MEASURING TESTING
Information Patent Application
IN-CIRCUIT EMULATOR DEVICE
- Publication number 20230314513
- Publication date Oct 5, 2023
- LAPIS Technology Co., Ltd.
- Hiroshi YAMASAKI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST
- Publication number 20230305056
- Publication date Sep 28, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Mert Celik
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...
- Publication number 20230288479
- Publication date Sep 14, 2023
- Intel Corporation
- Kalyana KANTIPUDI
- G01 - MEASURING TESTING
Information Patent Application
Test Abstraction Data Model
- Publication number 20230266390
- Publication date Aug 24, 2023
- National Instruments Corporation
- Andrew Philip Dove
- G01 - MEASURING TESTING
Information Patent Application
SCAN FRAME BASED TEST ACCESS MECHANISMS
- Publication number 20230258715
- Publication date Aug 17, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
DECOMPRESSION CIRCUIT, CIRCUIT GENERATION METHOD, AND IC CHIP
- Publication number 20230258717
- Publication date Aug 17, 2023
- Huawei Technologies Co., Ltd
- Yu HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES
- Publication number 20230251309
- Publication date Aug 10, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING
- Publication number 20230213579
- Publication date Jul 6, 2023
- MEDIATEK INC.
- Pin-Wen CHEN
- G01 - MEASURING TESTING
Information Patent Application
INTERPOSER CIRCUIT
- Publication number 20230204663
- Publication date Jun 29, 2023
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- H01 - BASIC ELECTRIC ELEMENTS

Input or output interfaces for test

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method, a device and a computer program for operating a modular tes...

Test system, test method, and non-transitory computer readable medium

Apparatus and method for avoiding collision between data

Interface to full and reduced pin JTAG devices

Reconfigurable JTAG architecture for implementation of programmable...

Scan frame based test access mechanisms

Scan test in a single-wire bus circuit

Apparatus and method for electrically coupling a unit under test wi...

Flip flop standard cell

Margin test data tagging and predictive expected margins

Decompression circuit, circuit generation method, and IC chip

Wireless electronic-control system

System capable of detecting failure of component of system and meth...

Test methods, tester, load board and test system

Display device

Server JTAG component adaptive interconnection system and method

Built-in self-test for die-to-die physical interfaces

Single pin DFT architecture for USBPD ICs

Secured scan access for a device including a scan chain

Systems and methods for database scan acceleration

System and method for schedule-based I/O multiplexing for integrate...

Fan-out buffer with skew control function, operating method thereof...

Automated test equipment for testing one or more devices under test...

Baseboard management controller (BMC) test system and method

Method and measurement instrument for testing a device under test

Generating multiple pseudo static control signals using on-chip JTA...

Voltage monitoring circuit for interface

Memory device test method, apparatus, and system, medium, and elect...

Reduced signaling interface method and apparatus

Test method for control chip and related device

Patents Applicationslast 30 patents

SCAN TEST IN A SINGLE-WIRE BUS CIRCUIT

System and Method for Utilizing Idle Computing Capacity

MEMORY TIMING CHARACTERIZATION CIRCUITRY

SYSTEM ACCESS BOUNDARY SCAN VIA SYSTEM SIDEBAND SIGNAL CONNECTIONS

APPARATUS AND METHOD FOR AVOIDING COLLISION BETWEEN DATA

NPU CAPABLE OF BEING TESTED DURING RUNTIME

TEST SYSTEM THAT CONVERTS COMMAND SYNTAXES

SECURED SCAN ACCESS FOR A DEVICE INCLUDING A SCAN CHAIN

CAN TRANSCEIVER AND METHOD FOR THE CAN TRANSCEIVER

METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRI...

INTEGRATED TEST CELL USING ACTIVE THERMAL INTERPOSER (ATI) WITH PAR...

SECURED SCAN ACCESS FOR A DEVICE INCLUDING A SCAN CHAIN

INTERPOSER CIRCUIT

FLIP FLOP STANDARD CELL

CONTAINERIZED ORCHESTRATION OF SECURE SOCKET LAYER VIRTUAL PRIVATE...

Pin Testing System for Multi-Pin Chip and Method Thereof

TEST SYSTEM, TEST METHOD, AND NON-TRANSITORY COMPUTER READABLE MEDIUM

Built-in Self-Test for Die-to-Die Physical Interfaces

ELECTRONIC INSTRUMENT FOR ANALYZING A DUT

SYSTEMS AND METHODS FOR DATABASE SCAN ACCELERATION

CONFIGURABLE BOUNDARY SCAN

IN-CIRCUIT EMULATOR DEVICE

SYSTEM AND METHOD OF OVER-THE-AIR TESTING OF A DEVICE UNDER TEST

APPARATUS AND METHOD FOR REUSING MANUFACTURING CONTENT ACROSS MULTI...

Test Abstraction Data Model

SCAN FRAME BASED TEST ACCESS MECHANISMS

DECOMPRESSION CIRCUIT, CIRCUIT GENERATION METHOD, AND IC CHIP

INTERFACE TO FULL AND REDUCED PIN JTAG DEVICES

CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING

INTERPOSER CIRCUIT