Inspecting patterns on the surface of objects

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G01N21/956

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

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G01N21/956Inspecting patterns on the surface of objects

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Process window qualification modulation layouts
- Patent number 12,235,224
- Issue date Feb 25, 2025
- KLA Corporation
- Andrew Cross
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor measurement apparatus
- Patent number 12,222,282
- Issue date Feb 11, 2025
- Samsung Electronics Co., Ltd.
- Seoyeon Jeong
- G01 - MEASURING TESTING
Information Patent Grant
Method for assessing contrasts on surfaces
- Patent number 12,222,299
- Issue date Feb 11, 2025
- 4Art Holding AG
- Kai Zeh
- G01 - MEASURING TESTING
Information Patent Grant
EUV microscope
- Patent number 12,203,874
- Issue date Jan 21, 2025
- EUV TECH, INC.
- Chami N Perera
- G01 - MEASURING TESTING
Information Patent Grant
Pattern inspection device and pattern inspection method
- Patent number 12,205,272
- Issue date Jan 21, 2025
- NuFlare Technology, Inc.
- Hiromu Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
Valuable document system
- Patent number 12,194,772
- Issue date Jan 14, 2025
- GIESECKE+DEVRIENT CURRENCY TECHNOLOGY GMBH
- Johann Kecht
- G01 - MEASURING TESTING
Information Patent Grant
Method of calibrating coordinate position identification accuracy o...
- Patent number 12,188,880
- Issue date Jan 7, 2025
- Sumco Corporation
- Keiichiro Mori
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image-based acceptance learning device, image-based acceptance dete...
- Patent number 12,182,986
- Issue date Dec 31, 2024
- Mitsubishi Electric Corporation
- Naoyuki Tokida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Z-axis measurement fixture and method of determining the planarity...
- Patent number 12,181,420
- Issue date Dec 31, 2024
- IDEXX Laboratories, Inc.
- David C. Giroux
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring an effect of a wavelength-dependent measuring...
- Patent number 12,174,546
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Walter Pauls
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for monitoring health of low-cost sensors used in...
- Patent number 12,175,680
- Issue date Dec 24, 2024
- TATA Consultancy Services Limited
- Prachin Lalit Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor substrate processing apparatus and semiconductor subs...
- Patent number 12,165,933
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Inkeun Baek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting abnormal growth of graphene
- Patent number 12,163,898
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Ryota Ifuku
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Surface abnormality detection device and system
- Patent number 12,154,258
- Issue date Nov 26, 2024
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 12,152,316
- Issue date Nov 26, 2024
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Cutter analysis and mapping
- Patent number 12,141,960
- Issue date Nov 12, 2024
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical metrology utilizing short-wave infrared wavelengths
- Patent number 12,111,580
- Issue date Oct 8, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition method and image acquisition apparatus
- Patent number 12,105,026
- Issue date Oct 1, 2024
- NuFlare Technology, Inc.
- Yasuhiro Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Printing solder point quality identification and maintenance sugges...
- Patent number 12,100,129
- Issue date Sep 24, 2024
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Meng Sun
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for characterizing defects in silicon crystal
- Patent number 12,092,588
- Issue date Sep 17, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Grant
High throughput defect detection
- Patent number 12,092,584
- Issue date Sep 17, 2024
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
Universal metrology model
- Patent number 12,078,601
- Issue date Sep 3, 2024
- KLA Corporation
- Nireekshan K. Reddy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection system for inspecting a lighting device during an assemb...
- Patent number 12,072,301
- Issue date Aug 27, 2024
- SIGNIFY HOLDING B.V.
- Marc Andre De Samber
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 12,072,299
- Issue date Aug 27, 2024
- Fraunhofer USA, Inc.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system
- Patent number 12,066,388
- Issue date Aug 20, 2024
- WIT CO., LTD.
- Masato Utsumi
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle lamp system, foreign substance determination device, and fo...
- Patent number 12,065,109
- Issue date Aug 20, 2024
- Koito Manufacturing Co., Ltd.
- Hiroki Sumitani
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for diagnosing a semiconductor wafer
- Patent number 12,062,166
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DETERIORATION ESTIMATION SYSTEM, DETERIORATION ESTIMATION METHOD, A...
- Publication number 20250067681
- Publication date Feb 27, 2025
- NEC Corporation
- Yusuke Mizukoshi
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DETERMINING PARAMETERS OF PATTERNED STRUCTURE...
- Publication number 20250067683
- Publication date Feb 27, 2025
- NOVA LTD
- Amir Shayari
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...
- Publication number 20250060316
- Publication date Feb 20, 2025
- SCUOLA UNIVERSITARIA PROFESSIONALE DELLA SVIZZERA ITALIANA (SUPSI)
- Daniele Guido ALLEGRI
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR MEASURING AN EFFECT OF A WAVELENGTH-DEPENDENT MEASURING...
- Publication number 20250060677
- Publication date Feb 20, 2025
- Carl Zeiss SMT GMBH
- Walter Pauls
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...
- Publication number 20250052691
- Publication date Feb 13, 2025
- Samsung Electronics Co., Ltd.
- Youngsun CHOI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD
- Publication number 20250052667
- Publication date Feb 13, 2025
- SAMSUNG ELECTRONICS CO., LTD.
- Jooyoun KANG
- G01 - MEASURING TESTING
Information Patent Application
PUPIL FILTER WITH SPATIALLY-VARYING TRANSMISSION
- Publication number 20250044679
- Publication date Feb 6, 2025
- KLA Corporation
- Alexander Pokrovskiy
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD
- Publication number 20250044236
- Publication date Feb 6, 2025
- ASML NETHERLANDS B.V.
- Douglas C. CAPPELLI
- G01 - MEASURING TESTING
Information Patent Application
SELF CORRECTING OVEN TECHNOLOGY
- Publication number 20250033131
- Publication date Jan 30, 2025
- Jabil Inc.
- Charles Santhakumar
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
CUTTER ANALYSIS AND MAPPING
- Publication number 20250029236
- Publication date Jan 23, 2025
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...
- Publication number 20250012736
- Publication date Jan 9, 2025
- Samsung Electronics Co., Ltd.
- Dohun Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...
- Publication number 20250014164
- Publication date Jan 9, 2025
- ASML NETHERLANDS B.V.
- Vasco Tomas TENNER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SURFACE INSPECTION APPARATUS
- Publication number 20250012732
- Publication date Jan 9, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi HONDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION
- Publication number 20250012737
- Publication date Jan 9, 2025
- ONTO INNOVATION INC.
- Yiliang LIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...
- Publication number 20240418504
- Publication date Dec 19, 2024
- Mitsui Mining and Smelting Co., Ltd.
- Hiroaki KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...
- Publication number 20240402092
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G02 - OPTICS
Information Patent Application
METHOD FOR MEASURING DEPTH OF DAMAGED LAYER AND CONCENTRATION OF DE...
- Publication number 20240402094
- Publication date Dec 5, 2024
- EHWA DIAMOND INDUSTRIAL COMPANY LIMITED
- Seong Kwon CHOI
- G01 - MEASURING TESTING
Information Patent Application
SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION
- Publication number 20240402615
- Publication date Dec 5, 2024
- KLA Corporation
- Yaniv Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240385125
- Publication date Nov 21, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20240377335
- Publication date Nov 14, 2024
- NuFlare Technology, Inc.
- Masaya TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR ELECTRONIC DEVICES
- Publication number 20240377338
- Publication date Nov 14, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...
- Publication number 20240378716
- Publication date Nov 14, 2024
- ORBOTECH LTD.
- Chay Goldenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240369495
- Publication date Nov 7, 2024
- WIT CO., LTD.
- Masato UTSUMI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
LIGHT FILTERS FOR PORTABLE WELDING TECHNIQUE MONITORING SYSTEMS
- Publication number 20240359269
- Publication date Oct 31, 2024
- Illinois Tool Works Inc.
- William Joshua Becker
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS OF IMAGING PATH POLARIZATION CONTROL FOR DEFECT DETECTION S...
- Publication number 20240353318
- Publication date Oct 24, 2024
- KLA Corporation
- Yun Xie
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...
- Publication number 20240347495
- Publication date Oct 17, 2024
- STMicroelectronics S.r.l
- Fulvio Vittorio FONTANA
- H01 - BASIC ELECTRIC ELEMENTS

Inspecting patterns on the surface of objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Process window qualification modulation layouts

Semiconductor measurement apparatus

Method for assessing contrasts on surfaces

EUV microscope

Pattern inspection device and pattern inspection method

Defect inspection apparatus and defect inspection method

Valuable document system

Method of calibrating coordinate position identification accuracy o...

Image-based acceptance learning device, image-based acceptance dete...

Z-axis measurement fixture and method of determining the planarity...

Method for measuring an effect of a wavelength-dependent measuring...

System and method for monitoring health of low-cost sensors used in...

Semiconductor substrate processing apparatus and semiconductor subs...

Method and apparatus for detecting abnormal growth of graphene

Surface abnormality detection device and system

Passivation of nonlinear optical crystals

Cutter analysis and mapping

Inspection system of semiconductor wafer and method of driving the...

System for detecting surface type of object and artificial neural n...

Optical metrology utilizing short-wave infrared wavelengths

Image acquisition method and image acquisition apparatus

Printing solder point quality identification and maintenance sugges...

Method for characterizing defects in silicon crystal

High throughput defect detection

Universal metrology model

Inspection system for inspecting a lighting device during an assemb...

Systems and methods for synthesizing a diamond using machine learning

Inspection system

Vehicle lamp system, foreign substance determination device, and fo...

Method and system for diagnosing a semiconductor wafer

Patents Applicationslast 30 patents

DETERIORATION ESTIMATION SYSTEM, DETERIORATION ESTIMATION METHOD, A...

SYSTEM AND METHOD FOR DETERMINING PARAMETERS OF PATTERNED STRUCTURE...

APPARATUS FOR ACQUIRING THREE-DIMENSIONAL INFORMATION OF OBJECTS AN...

METHOD FOR MEASURING AN EFFECT OF A WAVELENGTH-DEPENDENT MEASURING...

SEMICONDUCTOR MEASUREMENT APPARATUS AND METHOD OF MANUFACTURING SEM...

OPTICAL MEASUREMENT APPARATUS AND OPTICAL MEASUREMENT METHOD

PUPIL FILTER WITH SPATIALLY-VARYING TRANSMISSION

INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD

SELF CORRECTING OVEN TECHNOLOGY

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

CUTTER ANALYSIS AND MAPPING

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

METHOD OF OPTIMIZING OVERLAY MEASUREMENT CONDITION AND OVERLAY MEAS...

METROLOGY METHOD AND METHOD FOR TRAINING A DATA STRUCTURE FOR USE I...

SURFACE INSPECTION APPARATUS

OPTICAL METROLOGY WITH INFLUENCE MAP OF UNKNOWN SECTION

METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...

AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...

METHOD FOR MEASURING DEPTH OF DAMAGED LAYER AND CONCENTRATION OF DE...

SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

INSPECTION METHOD FOR ELECTRONIC DEVICES

SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...

INSPECTION SYSTEM

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

LIGHT FILTERS FOR PORTABLE WELDING TECHNIQUE MONITORING SYSTEMS

METHODS OF IMAGING PATH POLARIZATION CONTROL FOR DEFECT DETECTION S...

METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...