Inspecting patterns on the surface of objects

Industry

CPC
G01N21/956

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/956Inspecting patterns on the surface of objects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Image-based acceptance learning device, image-based acceptance dete...
- Patent number 12,182,986
- Issue date Dec 31, 2024
- Mitsubishi Electric Corporation
- Naoyuki Tokida
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Z-axis measurement fixture and method of determining the planarity...
- Patent number 12,181,420
- Issue date Dec 31, 2024
- IDEXX Laboratories, Inc.
- David C. Giroux
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring an effect of a wavelength-dependent measuring...
- Patent number 12,174,546
- Issue date Dec 24, 2024
- Carl Zeiss SMT GmbH
- Walter Pauls
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
System and method for monitoring health of low-cost sensors used in...
- Patent number 12,175,680
- Issue date Dec 24, 2024
- TATA Consultancy Services Limited
- Prachin Lalit Jain
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor substrate processing apparatus and semiconductor subs...
- Patent number 12,165,933
- Issue date Dec 10, 2024
- Samsung Electronics Co., Ltd.
- Inkeun Baek
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting abnormal growth of graphene
- Patent number 12,163,898
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Ryota Ifuku
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Surface abnormality detection device and system
- Patent number 12,154,258
- Issue date Nov 26, 2024
- NEC Corporation
- Yoshimasa Ono
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Passivation of nonlinear optical crystals
- Patent number 12,152,316
- Issue date Nov 26, 2024
- KLA Corporation
- Yung-Ho Alex Chuang
- C30 - CRYSTAL GROWTH
Information Patent Grant
Cutter analysis and mapping
- Patent number 12,141,960
- Issue date Nov 12, 2024
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for detecting surface type of object and artificial neural n...
- Patent number 12,111,267
- Issue date Oct 8, 2024
- Getac Holdings Corporation
- Kun-Yu Tsai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical metrology utilizing short-wave infrared wavelengths
- Patent number 12,111,580
- Issue date Oct 8, 2024
- KLA Corporation
- Amnon Manassen
- G01 - MEASURING TESTING
Information Patent Grant
Image acquisition method and image acquisition apparatus
- Patent number 12,105,026
- Issue date Oct 1, 2024
- NuFlare Technology, Inc.
- Yasuhiro Yamashita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Printing solder point quality identification and maintenance sugges...
- Patent number 12,100,129
- Issue date Sep 24, 2024
- INVENTEC (PUDONG) TECHNOLOGY CORPORATION
- Meng Sun
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for characterizing defects in silicon crystal
- Patent number 12,092,588
- Issue date Sep 17, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Grant
High throughput defect detection
- Patent number 12,092,584
- Issue date Sep 17, 2024
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
Universal metrology model
- Patent number 12,078,601
- Issue date Sep 3, 2024
- KLA Corporation
- Nireekshan K. Reddy
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Inspection system for inspecting a lighting device during an assemb...
- Patent number 12,072,301
- Issue date Aug 27, 2024
- SIGNIFY HOLDING B.V.
- Marc Andre De Samber
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for synthesizing a diamond using machine learning
- Patent number 12,072,299
- Issue date Aug 27, 2024
- Fraunhofer USA, Inc.
- Rohan Reddy Mekala
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system
- Patent number 12,066,388
- Issue date Aug 20, 2024
- WIT CO., LTD.
- Masato Utsumi
- G01 - MEASURING TESTING
Information Patent Grant
Vehicle lamp system, foreign substance determination device, and fo...
- Patent number 12,065,109
- Issue date Aug 20, 2024
- Koito Manufacturing Co., Ltd.
- Hiroki Sumitani
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for diagnosing a semiconductor wafer
- Patent number 12,062,166
- Issue date Aug 13, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing method and system for detection of deterioration of...
- Patent number 12,055,498
- Issue date Aug 6, 2024
- Top Technology Platform Co., Ltd.
- Chyuan-Ruey Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mask inspection method and mask inspection apparatus
- Patent number 12,050,184
- Issue date Jul 30, 2024
- Lasertec Corporation
- Keita Saito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting a display panel for defects
- Patent number 12,046,167
- Issue date Jul 23, 2024
- Samsung Display Co., Ltd.
- Hoon Sohn
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Mask inspection apparatus and mask inspection method using the same
- Patent number 12,045,975
- Issue date Jul 23, 2024
- Samsung Display Co., Ltd.
- Ilha Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for evaluating defect in monoclinic gallium oxide
- Patent number 12,038,388
- Issue date Jul 16, 2024
- The Industry & Academic Cooperation in Chungnam National University (IAC)
- Soon-Ku Hong
- C30 - CRYSTAL GROWTH
Information Patent Grant
Measurement tool and method for lithography masks
- Patent number 12,032,298
- Issue date Jul 9, 2024
- Intel Corporation
- Yoshihiro Tezuka
- G01 - MEASURING TESTING
Information Patent Grant
Optical inspection device for optical performance test of display d...
- Patent number 12,025,571
- Issue date Jul 2, 2024
- Samsung Display Co., Ltd.
- Gil Yeong Park
- G02 - OPTICS
Information Patent Grant
Semiconductor wafer evaluation method and manufacturing method and...
- Patent number 12,027,428
- Issue date Jul 2, 2024
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...
- Publication number 20240418504
- Publication date Dec 19, 2024
- Mitsui Mining and Smelting Co., Ltd.
- Hiroaki KURIHARA
- G01 - MEASURING TESTING
Information Patent Application
AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...
- Publication number 20240402092
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G02 - OPTICS
Information Patent Application
METHOD FOR MEASURING DEPTH OF DAMAGED LAYER AND CONCENTRATION OF DE...
- Publication number 20240402094
- Publication date Dec 5, 2024
- EHWA DIAMOND INDUSTRIAL COMPANY LIMITED
- Seong Kwon CHOI
- G01 - MEASURING TESTING
Information Patent Application
SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION
- Publication number 20240402615
- Publication date Dec 5, 2024
- KLA Corporation
- Yaniv Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240385125
- Publication date Nov 21, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20240377335
- Publication date Nov 14, 2024
- NuFlare Technology, Inc.
- Masaya TAKEDA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION METHOD FOR ELECTRONIC DEVICES
- Publication number 20240377338
- Publication date Nov 14, 2024
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...
- Publication number 20240378716
- Publication date Nov 14, 2024
- ORBOTECH LTD.
- Chay Goldenberg
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240369495
- Publication date Nov 7, 2024
- WIT CO., LTD.
- Masato UTSUMI
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM
- Publication number 20240361253
- Publication date Oct 31, 2024
- NOVA LTD
- Gilad BARAK
- G01 - MEASURING TESTING
Information Patent Application
LIGHT FILTERS FOR PORTABLE WELDING TECHNIQUE MONITORING SYSTEMS
- Publication number 20240359269
- Publication date Oct 31, 2024
- Illinois Tool Works Inc.
- William Joshua Becker
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHODS OF IMAGING PATH POLARIZATION CONTROL FOR DEFECT DETECTION S...
- Publication number 20240353318
- Publication date Oct 24, 2024
- KLA Corporation
- Yun Xie
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...
- Publication number 20240347495
- Publication date Oct 17, 2024
- STMicroelectronics S.r.l
- Fulvio Vittorio FONTANA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME
- Publication number 20240319103
- Publication date Sep 26, 2024
- Konica Minolta, Inc.
- RYUICHI YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...
- Publication number 20240319111
- Publication date Sep 26, 2024
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
METROLOGY SYSTEMS WITH PHASED ARRAYS FOR CONTAMINANT DETECTION AND...
- Publication number 20240319617
- Publication date Sep 26, 2024
- ASML Holding N.V.
- Mohamed SWILLAM
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...
- Publication number 20240319110
- Publication date Sep 26, 2024
- SAMSUNG DISPLAY CO., LTD.
- Gil Yeong PARK
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20240302292
- Publication date Sep 12, 2024
- HAMAMATSU PHOTONICS K. K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME
- Publication number 20240295490
- Publication date Sep 5, 2024
- Samsung Electronics Co., Ltd.
- Jaeho Kim
- G01 - MEASURING TESTING
Information Patent Application
ADJUSTMENT METHOD OF INSPECTION APPARATUS FOCUS POSITION, AND PATTE...
- Publication number 20240280500
- Publication date Aug 22, 2024
- NuFlare Technology, Inc.
- Ryoichi HIRANO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD
- Publication number 20240272089
- Publication date Aug 15, 2024
- Samsung Electronics Co., Ltd.
- Minsu Kim
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROCESSING DECORATIVE PAPER
- Publication number 20240269977
- Publication date Aug 15, 2024
- SWISS KRONO Tec AG
- Sabrina PFEIFFER
- B41 - PRINTING LINING MACHINES TYPEWRITERS STAMPS
Information Patent Application
MEASURING DEVICE AND MEASURING METHOD
- Publication number 20240231244
- Publication date Jul 11, 2024
- KIOXIA Corporation
- Hiroyuki TANIZAKI
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DARK FIELD MICROSCOPE
- Publication number 20240231065
- Publication date Jul 11, 2024
- ASML NETHERLANDS B.V.
- Sebastianus Adrianus GOORDEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20240230554
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Daehyun JUNG
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD
- Publication number 20240219315
- Publication date Jul 4, 2024
- Samsung Electronics Co., Ltd.
- Jangwoon Sung
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...
- Publication number 20240210329
- Publication date Jun 27, 2024
- Zhejiang University
- Haoji HU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Methods And Systems For Scatterometry Based Metrology Of Structures...
- Publication number 20240201073
- Publication date Jun 20, 2024
- KLA Corporation
- Shankar Krishnan
- G01 - MEASURING TESTING
Information Patent Application
BOARD TESTING APPARATUS AND BOARD TESTING METHOD
- Publication number 20240201106
- Publication date Jun 20, 2024
- CKD CORPORATION
- Kazuyoshi Kikuchi
- G06 - COMPUTING CALCULATING COUNTING

Inspecting patterns on the surface of objects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Image-based acceptance learning device, image-based acceptance dete...

Z-axis measurement fixture and method of determining the planarity...

Method for measuring an effect of a wavelength-dependent measuring...

System and method for monitoring health of low-cost sensors used in...

Semiconductor substrate processing apparatus and semiconductor subs...

Method and apparatus for detecting abnormal growth of graphene

Surface abnormality detection device and system

Passivation of nonlinear optical crystals

Cutter analysis and mapping

Inspection system of semiconductor wafer and method of driving the...

System for detecting surface type of object and artificial neural n...

Optical metrology utilizing short-wave infrared wavelengths

Image acquisition method and image acquisition apparatus

Printing solder point quality identification and maintenance sugges...

Method for characterizing defects in silicon crystal

High throughput defect detection

Universal metrology model

Inspection system for inspecting a lighting device during an assemb...

Systems and methods for synthesizing a diamond using machine learning

Inspection system

Vehicle lamp system, foreign substance determination device, and fo...

Method and system for diagnosing a semiconductor wafer

Data processing method and system for detection of deterioration of...

Mask inspection method and mask inspection apparatus

Apparatus for inspecting a display panel for defects

Mask inspection apparatus and mask inspection method using the same

Method for evaluating defect in monoclinic gallium oxide

Measurement tool and method for lithography masks

Optical inspection device for optical performance test of display d...

Semiconductor wafer evaluation method and manufacturing method and...

Patents Applicationslast 30 patents

METHOD FOR MEASURING SURFACE PARAMETER OF COPPER FOIL, AND METHOD F...

AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...

METHOD FOR MEASURING DEPTH OF DAMAGED LAYER AND CONCENTRATION OF DE...

SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS

INSPECTION METHOD FOR ELECTRONIC DEVICES

SYSTEM AND METHOD FOR THREE-DIMENSIONAL IMAGING OF SAMPLES USING A...

INSPECTION SYSTEM

OPTICAL PHASE MEASUREMENT METHOD AND SYSTEM

LIGHT FILTERS FOR PORTABLE WELDING TECHNIQUE MONITORING SYSTEMS

METHODS OF IMAGING PATH POLARIZATION CONTROL FOR DEFECT DETECTION S...

METHOD OF MANUFACTURING SEMICONDUCTOR PRODUCTS, SEMICONDUCTOR PRODU...

REFERENCE SAMPLE FOR COATING DEFECTS AND METHOD FOR PRODUCING SAME

OPTICAL INSPECTION METHOD AND STORAGE MEDIUM, AND OPTICAL INSPECTIO...

METROLOGY SYSTEMS WITH PHASED ARRAYS FOR CONTAMINANT DETECTION AND...

OPTICAL INSPECTION DEVICE FOR OPTICAL PERFORMANCE TEST OF DISPLAY D...

INSPECTION APPARATUS AND INSPECTION METHOD

MEASUREMENT APPARATUS AND MEASUREMENT METHOD USING THE SAME

ADJUSTMENT METHOD OF INSPECTION APPARATUS FOCUS POSITION, AND PATTE...

DEFECT INSPECTION DEVICE AND DEFECT INSPECTION METHOD

METHOD FOR PROCESSING DECORATIVE PAPER

MEASURING DEVICE AND MEASURING METHOD

DARK FIELD MICROSCOPE

METHOD OF INSPECTING SEMICONDUCTOR DEVICE

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE INSPECTION METHOD

METHOD FOR DETECTING ABNORMAL DEFECT ON STEEL SURFACE BASED ON SEMI...

Methods And Systems For Scatterometry Based Metrology Of Structures...

BOARD TESTING APPARATUS AND BOARD TESTING METHOD