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PHYSICS
G01
Measuring instruments
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MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRA-RED, VISIBLE OR ULTRA-VIOLET LIGHT COLORIMETRY RADIATION PYROMETRY
G01J3/00
Spectrometry Spectrophotometry Monochromators Measuring colour
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G01J3/45
Interferometric spectrometry
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Patents Grants
last 30 patents
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Patent Grant
Quadrilateral common-path time-modulated interferometric spectral i...
Patent number
11,971,303
Issue date
Apr 30, 2024
WUHAN UNIVERSITY
Ruyi Wei
G01 - MEASURING TESTING
Information
Patent Grant
Wavelength monitoring circuit
Patent number
11,973,535
Issue date
Apr 30, 2024
Nippon Telegraph and Telephone Corporation
Osamu Moriwaki
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and methods for calibrating optical measurements
Patent number
11,965,777
Issue date
Apr 23, 2024
ADOM, ADVANCED OPTICAL TECHNOLOGIES LTD.
Yoel Cohen
G01 - MEASURING TESTING
Information
Patent Grant
Reconstruction of frequency registration for quantitative spectroscopy
Patent number
11,953,427
Issue date
Apr 9, 2024
Endress+Hauser Optical Analysis, Inc.
Alfred Feitisch
G01 - MEASURING TESTING
Information
Patent Grant
Integrated evanescent wave spectral sensing device
Patent number
11,953,377
Issue date
Apr 9, 2024
Si-Ware Systems
Yasser M. Sabry
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for screening asymptomatic virus emitters
Patent number
11,937,912
Issue date
Mar 26, 2024
Hyperspectral Corp.
David M. Palacios
G01 - MEASURING TESTING
Information
Patent Grant
Interferometric sensor based on slab waveguide
Patent number
11,933,732
Issue date
Mar 19, 2024
UNM Rainforest Innovations
Mani Hossein-Zadeh
G02 - OPTICS
Information
Patent Grant
Systems and methods for screening asymptomatic virus emitters
Patent number
11,925,456
Issue date
Mar 12, 2024
Hyperspectral Corp.
David M. Palacios
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Fourier spectrophotometer with polarization multiplexing optical sy...
Patent number
11,927,483
Issue date
Mar 12, 2024
Yokogawa Electric Corporation
Yasuyuki Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
On-chip signal processing method and pixel-array signal
Patent number
11,921,285
Issue date
Mar 5, 2024
Arizona Board of Regents on behalf of the University of Arizona
John Koshel
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Optical module and mobile device having same
Patent number
11,913,837
Issue date
Feb 27, 2024
TRIPLE WIN TECHNOLOGY(SHENZHEN) CO. LTD.
Hsin-Yen Hsu
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for light-weight, non-invasive, point of care...
Patent number
11,903,699
Issue date
Feb 20, 2024
Rijul Gupta
G01 - MEASURING TESTING
Information
Patent Grant
Optical module, signal processing system, and signal processing method
Patent number
11,898,841
Issue date
Feb 13, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
G01 - MEASURING TESTING
Information
Patent Grant
Short-wave infrared sensor for identifying based on water content
Patent number
11,896,346
Issue date
Feb 13, 2024
OMNI MEDSCI, LLC
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
High-speed Fourier-transform spectroscopy apparatus and spectroscop...
Patent number
11,892,354
Issue date
Feb 6, 2024
The University of Tokyo
Takuro Ideguchi
G01 - MEASURING TESTING
Information
Patent Grant
High-performance on-chip spectrometers and spectrum analyzers
Patent number
11,885,677
Issue date
Jan 30, 2024
Massachusetts Institute of Technology
Derek Kita
G01 - MEASURING TESTING
Information
Patent Grant
Wireless sensor device and system thereof for light bulb diagnostic...
Patent number
11,879,624
Issue date
Jan 23, 2024
Hendrik J Volkerink
F21 - LIGHTING
Information
Patent Grant
Mirror unit and optical module
Patent number
11,879,731
Issue date
Jan 23, 2024
Hamamatsu Photonics K.K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Tuneable Fabry-Perot cavity self-calibration method and spectrum ac...
Patent number
11,879,781
Issue date
Jan 23, 2024
SHENZHEN HYPERNANO OPTICS TECHNOLOGY CO., LTD.
Bin Guo
G01 - MEASURING TESTING
Information
Patent Grant
Device for measuring transmittance curve of Fabry-Perot using frequ...
Patent number
11,874,169
Issue date
Jan 16, 2024
HEFEI INSTITUTE OF PHYSICAL SCIENCE, CHINESE ACADEMY OF SCIENCES
Yingjian Wang
G01 - MEASURING TESTING
Information
Patent Grant
Fourier transform infrared spectrophotometer
Patent number
11,874,172
Issue date
Jan 16, 2024
Shimadzu Corporation
Hideaki Katsu
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods using active FTIR spectroscopy for detection of...
Patent number
11,867,618
Issue date
Jan 9, 2024
Heriot-Watt University
Derryck Telford Reid
G01 - MEASURING TESTING
Information
Patent Grant
Interferometer movable mirror position measurement apparatus and fo...
Patent number
11,860,037
Issue date
Jan 2, 2024
Shimadzu Corporation
Takashi Muramatsu
G01 - MEASURING TESTING
Information
Patent Grant
Enhanced full range optical coherence tomography
Patent number
11,846,546
Issue date
Dec 19, 2023
Topcon Corporation
Xiang Wei
G01 - MEASURING TESTING
Information
Patent Grant
Interferometry assembly having optical paths through different mate...
Patent number
11,835,337
Issue date
Dec 5, 2023
Lumentum Technology UK Limited
Adrian Perrin Janssen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Light filter and spectrometer including the same
Patent number
11,828,650
Issue date
Nov 28, 2023
Samsung Electronics Co., Ltd.
Jineun Kim
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Optical coherence tomography device and system
Patent number
11,828,593
Issue date
Nov 28, 2023
Duke University
Adam Wax
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Dispersion measuring device, pulse light source, dispersion measuri...
Patent number
11,821,793
Issue date
Nov 21, 2023
Hamamatsu Photonics K.K.
Koyo Watanabe
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Spectrum measurement method and spectrum measurement device
Patent number
11,815,399
Issue date
Nov 14, 2023
Topcon Corporation
Akira Takada
G01 - MEASURING TESTING
Information
Patent Grant
Monolithic assembly of miniature reflective cyclical spatial hetero...
Patent number
11,802,796
Issue date
Oct 31, 2023
California Institute of Technology
Seyedeh Sona Hosseini
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
ENHANCED FULL RANGE OPTICAL COHERENCE TOMOGRAPHY
Publication number
20240142307
Publication date
May 2, 2024
TOPCON CORPORATION
Xiang WEI
G01 - MEASURING TESTING
Information
Patent Application
THREE PHASE SPECTRAL INTERFEROMETRY
Publication number
20240133743
Publication date
Apr 25, 2024
LAWRENCE LIVERMORE NATIONAL SECURITY, LLC
Ryan Douglas Muir
G01 - MEASURING TESTING
Information
Patent Application
CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE F...
Publication number
20240130621
Publication date
Apr 25, 2024
Omni MedSci, Inc.
Mohammed N. Islam
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
OPTICAL LOCKER
Publication number
20240110778
Publication date
Apr 4, 2024
Lumentum Technology UK Limited
Adrian Perrin JANSSEN
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
MIRROR UNIT AND OPTICAL MODULE
Publication number
20240110779
Publication date
Apr 4, 2024
HAMAMATSU PHOTONICS K. K.
Tomofumi Suzuki
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
COMPACT HOLOGRAPHIC SLM SPECTROMETER
Publication number
20240077356
Publication date
Mar 7, 2024
ORTA DOGU TEKNIK UNIVERSITESI
Emre YUCE
G01 - MEASURING TESTING
Information
Patent Application
QUANTUM-ENHANCED ALL-OPTICAL PHOTOACOUSTIC SIGNAL DETECTION DEVICE...
Publication number
20240077457
Publication date
Mar 7, 2024
SHANXI UNIVERSITY
Kuanshou ZHANG
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC STATE SPLITTER FOR ATOMS, ATOM INTERFEROMETER ATOMIC TRA...
Publication number
20240068872
Publication date
Feb 29, 2024
THE UNIVERSITY OF TOKYO
Hidetoshi KATORI
G01 - MEASURING TESTING
Information
Patent Application
SPECTROMETRY SYSTEM WITH DECREASED LIGHT PATH
Publication number
20240060820
Publication date
Feb 22, 2024
VERIFOOD, LTD.
Damian GOLDRING
G01 - MEASURING TESTING
Information
Patent Application
OPTICAL DEVICE, SYSTEM AND METHOD FOR DISPERSION INTERFEROMETRY
Publication number
20240060821
Publication date
Feb 22, 2024
DEUTSCHES ZENTRUM FÜR LUFT-UND RAUMFAHRT E.V.
Oliver Kliebisch
G02 - OPTICS
Information
Patent Application
ASYMMETRIC INTERFEROMETRIC OPTICAL PHOTOTHERMAL INFRARED SPECTROSCOPY
Publication number
20240044782
Publication date
Feb 8, 2024
Photothermal Spectroscopy Corp.
Craig Prater
G01 - MEASURING TESTING
Information
Patent Application
DETERIORATION EVALUATION METHOD OF LINE SENSOR, SPECTRUM MEASUREMEN...
Publication number
20240044710
Publication date
Feb 8, 2024
Gigaphoton Inc.
Natsuhiko KOUNO
G01 - MEASURING TESTING
Information
Patent Application
Optical Device And Spectrometer
Publication number
20240045199
Publication date
Feb 8, 2024
SEIKO EPSON CORPORATION
Kohei YAMADA
G01 - MEASURING TESTING
Information
Patent Application
LINEAR ARRAY SCANNING BRILLOUIN SCATTERING ELASTIC IMAGING DEVICE
Publication number
20240044709
Publication date
Feb 8, 2024
NANCHANG HANGKONG UNIVERSITY
Jiulin SHI
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH MEASUREMENT APPARATUS, NARROWED-LINE LASER APPARATUS, AN...
Publication number
20240044711
Publication date
Feb 8, 2024
Gigaphoton Inc.
Takuma YAMANAKA
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRIC DETECTION AND QUANTIFICATION SYSTEM AND METHODS OF...
Publication number
20240027341
Publication date
Jan 25, 2024
Salvus, LLC
Ron LEVIN
G01 - MEASURING TESTING
Information
Patent Application
Single-Photon Emitter using Frequency Comb
Publication number
20240011834
Publication date
Jan 11, 2024
ORCA Computing Limited
Niall Moroney
G01 - MEASURING TESTING
Information
Patent Application
LASER DEVICE, EVALUATION METHOD FOR LASER LIGHT SPECTRUM, AND ELECT...
Publication number
20240003743
Publication date
Jan 4, 2024
Gigaphoton Inc.
Takamitsu KOMAKI
G01 - MEASURING TESTING
Information
Patent Application
DISPERSION MEASURING DEVICE, PULSE LIGHT SOURCE, DISPERSION MEASURI...
Publication number
20240003744
Publication date
Jan 4, 2024
HAMAMATSU PHOTONICS K. K.
Koyo WATANABE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
IDENTIFYING OBJECTS USING NEAR-INFRARED SENSORS, CAMERAS OR TIME-OF...
Publication number
20240000317
Publication date
Jan 4, 2024
Omni MedSci, Inc.
Mohammed N. Islam
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
QUADRILATERAL COMMON-PATH TIME-MODULATED INTERFEROMETRIC SPECTRAL I...
Publication number
20230408337
Publication date
Dec 21, 2023
WUHAN UNIVERSITY
Ruyi WEI
G01 - MEASURING TESTING
Information
Patent Application
PHOTONIC INTEGRATED CIRCUIT
Publication number
20230400354
Publication date
Dec 14, 2023
ROCKLEY PHOTONICS LIMITED
Richard GROTE
G01 - MEASURING TESTING
Information
Patent Application
REFRACTIVE SCANNING INTERFEROMETER
Publication number
20230375409
Publication date
Nov 23, 2023
Rapid Phenotyping Pty Limited
Selene Rodd-Routley
G01 - MEASURING TESTING
Information
Patent Application
MEMS DEVICE FOR INTERFEROMETRIC SPECTROSCOPY
Publication number
20230375408
Publication date
Nov 23, 2023
Spectrove Inc.
Kasra Khazeni
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS FOR INSPECTING DISPLAY PANEL AND METHOD FOR INSPECTING DI...
Publication number
20230358612
Publication date
Nov 9, 2023
SAMSUNG DISPLAY CO., LTD.
JOOYOUNG YOON
G01 - MEASURING TESTING
Information
Patent Application
INTERFEROMETRIC DETECTION AND QUANTIFICATION SYSTEM AND METHODS OF...
Publication number
20230358674
Publication date
Nov 9, 2023
Salvus, LLC
Ron LEVIN
G01 - MEASURING TESTING
Information
Patent Application
LIGHT DETECTION DEVICE
Publication number
20230358610
Publication date
Nov 9, 2023
HAMAMATSU PHOTONICS K. K.
Takashi KASAHARA
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR DUAL COMB SPECTROSCOPY
Publication number
20230349761
Publication date
Nov 2, 2023
Government of the United States of America, as Represented by the Secretary o...
Ian Robert Coddington
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR DUAL COMB SPECTROSCOPY
Publication number
20230349764
Publication date
Nov 2, 2023
The Regents of the University of Colorado, a Body Corporate
Gregory B. Rieker
G01 - MEASURING TESTING
Information
Patent Application
WAVELENGTH MEASUREMENT CHIP AND WAVELENGTH MEASUREMENT SYSTEM
Publication number
20230341266
Publication date
Oct 26, 2023
Huawei Technologies Co., Ltd
Cheewei LEE
G01 - MEASURING TESTING