Internal storage of test result, quality data, chip identification, repair information

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CPC
G11C2029/4402

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GPHYSICS G11Information storage G11CSTATIC STORES

Current Industry

G11C2029/4402Internal storage of test result, quality data, chip identification, repair information

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and apparatus for enabling multiple return material authoriz...
- Patent number 12,183,412
- Issue date Dec 31, 2024
- Altera Corporation
- Sankaran M. Menon
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatuses and methods for identifying memory devices of a semicon...
- Patent number 12,184,280
- Issue date Dec 31, 2024
- Dean Gans
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Storing memory array operational information in non-volatile subarrays
- Patent number 12,158,826
- Issue date Dec 3, 2024
- Micron Technology, Inc.
- Christopher John Kawamura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
RAM test with parity error detection and handling
- Patent number 12,130,700
- Issue date Oct 29, 2024
- Hamilton Sundstrand Corporation
- Qiuming Leng
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory repair method and apparatus based on error code tracking
- Patent number 12,111,723
- Issue date Oct 8, 2024
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Two-stage voltage calibration upon power-up of memory device
- Patent number 12,073,866
- Issue date Aug 27, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system and data processing system including the same
- Patent number 12,056,027
- Issue date Aug 6, 2024
- SK Hynix Inc.
- Eung-Bo Shim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory system and method for controlling nonvolatile memory during...
- Patent number 12,038,834
- Issue date Jul 16, 2024
- Kioxia Corporation
- Shinichi Kanno
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Buffer circuit with adaptive repair capability
- Patent number 12,040,035
- Issue date Jul 16, 2024
- RAMBUS INC.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Grant
Authenticity and yield by reading defective cells
- Patent number 12,027,224
- Issue date Jul 2, 2024
- International Business Machines Corporation
- Julien Frougier
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory device with dynamic processing level calibration
- Patent number 12,001,286
- Issue date Jun 4, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Indicating a blocked repair operation
- Patent number 11,948,655
- Issue date Apr 2, 2024
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G11 - INFORMATION STORAGE
Information Patent Grant
Signal timing alignment based on a common data strobe in memory dev...
- Patent number 11,935,578
- Issue date Mar 19, 2024
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory module having open-drain output for error reporting and for...
- Patent number 11,880,319
- Issue date Jan 23, 2024
- Netlist, Inc.
- Hyun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Centrally logging and aggregating miscompares on chip during memory...
- Patent number 11,869,616
- Issue date Jan 9, 2024
- Cypress Semiconductor Corporation
- Senwen Kan
- G11 - INFORMATION STORAGE
Information Patent Grant
Selectable trim settings on a memory device
- Patent number 11,854,634
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Reclaimable semiconductor device package and associated systems and...
- Patent number 11,854,635
- Issue date Dec 26, 2023
- Micron Technology, Inc.
- Yueping Li
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Undo and redo of soft post package repair
- Patent number 11,837,314
- Issue date Dec 5, 2023
- SK Hynix NAND Product Solutions Corp.
- Bill Nale
- G11 - INFORMATION STORAGE
Information Patent Grant
Trim setting determination on a memory device
- Patent number 11,836,078
- Issue date Dec 5, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Trim setting determination for a memory device
- Patent number 11,817,164
- Issue date Nov 14, 2023
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory systems including simplified BISR logic circuit
- Patent number 11,804,278
- Issue date Oct 31, 2023
- SK hynix Inc.
- Bo Ra Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
End of life performance throttling to prevent data loss
- Patent number 11,756,638
- Issue date Sep 12, 2023
- Micron Technology, Inc.
- Sebastien Andre Jean
- G01 - MEASURING TESTING
Information Patent Grant
Memory module with reduced ECC overhead and memory system
- Patent number 11,756,646
- Issue date Sep 12, 2023
- Samsung Electronics Co., Ltd.
- Taekwoon Kim
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and methods for correcting data errors in memory
- Patent number 11,755,410
- Issue date Sep 12, 2023
- Taiwan Semiconductor Manufacturing Company Limited
- Yu-Der Chih
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Circuit and method for capturing and transporting data errors
- Patent number 11,749,367
- Issue date Sep 5, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Vivek Mohan Sharma
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Memory management device, system and method
- Patent number 11,749,343
- Issue date Sep 5, 2023
- STMICROELECTRONICS INTERNATIONAL N.V.
- Nitin Chawla
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Error detection
- Patent number 11,742,050
- Issue date Aug 29, 2023
- STMicroelectronics (Rousset) SAS
- Fabrice Romain
- G11 - INFORMATION STORAGE
Information Patent Grant
Buffer circuit with adaptive repair capability
- Patent number 11,735,287
- Issue date Aug 22, 2023
- RAMBUS INC.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Grant
Memory repair method and apparatus based on error code tracking
- Patent number 11,734,106
- Issue date Aug 22, 2023
- RAMBUS INC.
- Frederick A. Ware
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatuses and methods for identifying memory devices of a semicon...
- Patent number 11,728,812
- Issue date Aug 15, 2023
- Dean Gans
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
Balancing throughput and response time quality of service
- Publication number 20240430323
- Publication date Dec 26, 2024
- PURE STORAGE, INC.
- Ahmad Alnafoosi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY
- Publication number 20240420793
- Publication date Dec 19, 2024
- Rambus Inc.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Application
TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE
- Publication number 20240386936
- Publication date Nov 21, 2024
- Micron Technology, Inc.
- Steven Michael Kientz
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
- Publication number 20240354210
- Publication date Oct 24, 2024
- SK HYNIX INC.
- Eung-Bo SHIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION
- Publication number 20240289226
- Publication date Aug 29, 2024
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...
- Publication number 20240265961
- Publication date Aug 8, 2024
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE PROVIDING DISTINCT SIGNALING INTERFACES VIA AN OPEN-D...
- Publication number 20240232105
- Publication date Jul 11, 2024
- Netlist, Inc.
- Hyun Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION ON A MEMORY DEVICE
- Publication number 20240211395
- Publication date Jun 27, 2024
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE
- Publication number 20240203516
- Publication date Jun 20, 2024
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TRIM SETTING DETERMINATION FOR A MEMORY DEVICE
- Publication number 20240161846
- Publication date May 16, 2024
- Micron Technology, Inc.
- Aswin Thiruvengadam
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TEMPERATURE-BASED ERROR MASKING DURING MBIST OPERATION
- Publication number 20240127901
- Publication date Apr 18, 2024
- Micron Technology, Inc.
- Daniel S. Miller
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR CORRECTION CODE CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING...
- Publication number 20240079076
- Publication date Mar 7, 2024
- SK HYNIX INC.
- Hong Ki MOON
- G11 - INFORMATION STORAGE
Information Patent Application
BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY
- Publication number 20240079079
- Publication date Mar 7, 2024
- Rambus Inc.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY MODULE WITH REDUCED ECC OVERHEAD AND MEMORY SYSTEM
- Publication number 20230386597
- Publication date Nov 30, 2023
- Samsung Electronics Co., LTD
- TAEKWOON KIM
- G11 - INFORMATION STORAGE
Information Patent Application
DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION
- Publication number 20230377668
- Publication date Nov 23, 2023
- Rambus Inc.
- Ely Tsern
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INDICATING A BLOCKED REPAIR OPERATION
- Publication number 20230343409
- Publication date Oct 26, 2023
- Micron Technology, Inc.
- Seth A. Eichmeyer
- G11 - INFORMATION STORAGE
Information Patent Application
AUTHENTICITY AND YIELD BY READING DEFECTIVE CELLS
- Publication number 20230298683
- Publication date Sep 21, 2023
- International Business Machines Corporation
- Julien Frougier
- G11 - INFORMATION STORAGE
Information Patent Application
BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY
- Publication number 20230170039
- Publication date Jun 1, 2023
- Rambus Inc.
- Scott C. Best
- G11 - INFORMATION STORAGE
Information Patent Application
CENTRALLY LOGGING AND AGGREGATING MISCOMPARES ON CHIP DURING MEMORY...
- Publication number 20230142759
- Publication date May 11, 2023
- CYPRESS SEMICONDUCTOR CORPORATION
- Senwen Kan
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME
- Publication number 20230015404
- Publication date Jan 19, 2023
- SK HYNIX INC.
- Eung-Bo SHIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AUTOMATICALLY SKIP BAD BLOCK IN CONTINUOUS READ OR SEQUENTIAL CACHE...
- Publication number 20220392562
- Publication date Dec 8, 2022
- Macronix International Co., Ltd.
- Shuo-Nan HUNG
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DUTY-CYCLE SKEW MANAGEMENT
- Publication number 20220366995
- Publication date Nov 17, 2022
- Micron Technology, Inc.
- Yang Lu
- G11 - INFORMATION STORAGE
Information Patent Application
DEBUGGING MEMORY DEVICES
- Publication number 20220351799
- Publication date Nov 3, 2022
- Micron Technology, Inc.
- Junam Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEMORY SYSTEMS INCLUDING SIMPLIFIED BISR LOGIC CIRCUIT
- Publication number 20220351801
- Publication date Nov 3, 2022
- SK HYNIX INC.
- Bo Ra KIM
- G11 - INFORMATION STORAGE
Information Patent Application
STATIC RANDOM-ACCESS MEMORY (SRAM) FAULT HANDLING APPARATUS AND SRA...
- Publication number 20220336038
- Publication date Oct 20, 2022
- Magnachip Semiconductor, Ltd.
- Sangsu PARK
- G11 - INFORMATION STORAGE
Information Patent Application
SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...
- Publication number 20220328091
- Publication date Oct 13, 2022
- III Holdings 2, LLC
- Michael C. Stephens
- G11 - INFORMATION STORAGE
Information Patent Application
ERROR DETECTION
- Publication number 20220310192
- Publication date Sep 29, 2022
- STMicroelectronics (Rousset) SAS
- Fabrice ROMAIN
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION
- Publication number 20220276930
- Publication date Sep 1, 2022
- Micron Technology, Inc.
- Larry J. Koudele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POST PACKAGE REPAIRING METHOD AND APPARATUS FOR MEMORY, STORAGE MED...
- Publication number 20220223222
- Publication date Jul 14, 2022
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Zhenlin QU
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY DEVICE, MEMORY SYSTEM AND METHOD OF CONTROLLING MEMORY DEVIC...
- Publication number 20220208295
- Publication date Jun 30, 2022
- AP MEMORY TECHNOLOGY CORPORATION
- HSIN-NAN CHUEH
- G06 - COMPUTING CALCULATING COUNTING

Internal storage of test result, quality data, chip identification, repair information

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and apparatus for enabling multiple return material authoriz...

Apparatuses and methods for identifying memory devices of a semicon...

Storing memory array operational information in non-volatile subarrays

RAM test with parity error detection and handling

Memory repair method and apparatus based on error code tracking

Two-stage voltage calibration upon power-up of memory device

Memory system and data processing system including the same

Memory system and method for controlling nonvolatile memory during...

Buffer circuit with adaptive repair capability

Authenticity and yield by reading defective cells

Memory device with dynamic processing level calibration

Indicating a blocked repair operation

Signal timing alignment based on a common data strobe in memory dev...

Memory module having open-drain output for error reporting and for...

Centrally logging and aggregating miscompares on chip during memory...

Selectable trim settings on a memory device

Reclaimable semiconductor device package and associated systems and...

Undo and redo of soft post package repair

Trim setting determination on a memory device

Trim setting determination for a memory device

Memory systems including simplified BISR logic circuit

End of life performance throttling to prevent data loss

Memory module with reduced ECC overhead and memory system

Systems and methods for correcting data errors in memory

Circuit and method for capturing and transporting data errors

Memory management device, system and method

Error detection

Buffer circuit with adaptive repair capability

Memory repair method and apparatus based on error code tracking

Apparatuses and methods for identifying memory devices of a semicon...

Patents Applicationslast 30 patents

Balancing throughput and response time quality of service

BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY

TWO-STAGE VOLTAGE CALIBRATION UPON POWER-UP OF MEMORY DEVICE

MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME

MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION

SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...

MEMORY MODULE PROVIDING DISTINCT SIGNALING INTERFACES VIA AN OPEN-D...

TRIM SETTING DETERMINATION ON A MEMORY DEVICE

SELECTABLE TRIM SETTINGS ON A MEMORY DEVICE

TRIM SETTING DETERMINATION FOR A MEMORY DEVICE

TEMPERATURE-BASED ERROR MASKING DURING MBIST OPERATION

ERROR CORRECTION CODE CIRCUIT AND SEMICONDUCTOR APPARATUS INCLUDING...

BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY

MEMORY MODULE WITH REDUCED ECC OVERHEAD AND MEMORY SYSTEM

DRAM RETENTION TEST METHOD FOR DYNAMIC ERROR CORRECTION

INDICATING A BLOCKED REPAIR OPERATION

AUTHENTICITY AND YIELD BY READING DEFECTIVE CELLS

BUFFER CIRCUIT WITH ADAPTIVE REPAIR CAPABILITY

CENTRALLY LOGGING AND AGGREGATING MISCOMPARES ON CHIP DURING MEMORY...

MEMORY SYSTEM AND DATA PROCESSING SYSTEM INCLUDING THE SAME

AUTOMATICALLY SKIP BAD BLOCK IN CONTINUOUS READ OR SEQUENTIAL CACHE...

MEMORY DUTY-CYCLE SKEW MANAGEMENT

DEBUGGING MEMORY DEVICES

MEMORY SYSTEMS INCLUDING SIMPLIFIED BISR LOGIC CIRCUIT

STATIC RANDOM-ACCESS MEMORY (SRAM) FAULT HANDLING APPARATUS AND SRA...

SIGNAL TIMING ALIGNMENT BASED ON A COMMON DATA STROBE IN MEMORY DEV...

ERROR DETECTION

MEMORY DEVICE WITH DYNAMIC PROCESSING LEVEL CALIBRATION

POST PACKAGE REPAIRING METHOD AND APPARATUS FOR MEMORY, STORAGE MED...

MEMORY DEVICE, MEMORY SYSTEM AND METHOD OF CONTROLLING MEMORY DEVIC...