Investigating the presence of flaws or contamination

Industry

CPC
G01N21/88

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/88Investigating the presence of flaws or contamination

Industries

Patents Grantslast 30 patents

Information Patent Grant
Image processing apparatus and image processing method
- Patent number 11,972,550
- Issue date Apr 30, 2024
- FUJIFILM Corporation
- Shuhei Horita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of using a sterilization wrap system
- Patent number 11,969,985
- Issue date Apr 30, 2024
- O&M Halyard, Inc.
- Jeffrey James Farmer
- B32 - LAYERED PRODUCTS
Information Patent Grant
Semiconductor device inspection method and semiconductor device ins...
- Patent number 11,971,364
- Issue date Apr 30, 2024
- Hamamatsu Photonics K.K.
- Shinsuke Suzuki
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 11,971,367
- Issue date Apr 30, 2024
- JUKI CORPORATION
- Yasuyuki Nuriya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection device
- Patent number 11,965,833
- Issue date Apr 23, 2024
- HONGFUJIN PRECISION ELECTRONICS (ZHENGZHOU) CO., LTD.
- Jing-Zhi Hou
- G01 - MEASURING TESTING
Information Patent Grant
Optical etendue matching methods for extreme ultraviolet metrology
- Patent number 11,968,772
- Issue date Apr 23, 2024
- KLA Corporation
- Zefram Marks
- G01 - MEASURING TESTING
Information Patent Grant
Pseudo defective product data generation method
- Patent number 11,966,219
- Issue date Apr 23, 2024
- Honda Motor Co., Ltd.
- Toshikazu Karube
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field optical inspection device
- Patent number 11,965,834
- Issue date Apr 23, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand De Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for gray field imaging
- Patent number 11,965,835
- Issue date Apr 23, 2024
- KLA Corporation
- Xiumei Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Assembly for detecting defects on a motor vehicle bodywork
- Patent number 11,965,836
- Issue date Apr 23, 2024
- PROOV STATION
- Gabriel Tissandier
- G01 - MEASURING TESTING
Information Patent Grant
Damage figure creation supporting apparatus, damage figure creation...
- Patent number 11,959,862
- Issue date Apr 16, 2024
- FUJIFILM Corporation
- Shuhei Horita
- G01 - MEASURING TESTING
Information Patent Grant
Systems, methods and apparatus for in-service tank inspections
- Patent number 11,959,833
- Issue date Apr 16, 2024
- Square Robot, Inc.
- Jerome Vaganay
- G05 - CONTROLLING REGULATING
Information Patent Grant
Detection device, mechanical device, and work vehicle
- Patent number 11,953,807
- Issue date Apr 9, 2024
- Komatsu Ltd.
- Hiroyuki Chikugo
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method for defect inspection
- Patent number 11,953,448
- Issue date Apr 9, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Tsun-Cheng Tang
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer evaluation method and semiconductor wafer manuf...
- Patent number 11,955,390
- Issue date Apr 9, 2024
- Sumco Corporation
- Takahiro Nagasawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Defective part recognition device and defective part recognition me...
- Patent number 11,953,447
- Issue date Apr 9, 2024
- V Technology Co., Ltd.
- Michinobu Mizumura
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Visual inspection device
- Patent number 11,953,449
- Issue date Apr 9, 2024
- OPTO ENGINEERING S.P.A.
- Claudio Sedazzari
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating defective region of wafer
- Patent number 11,955,386
- Issue date Apr 9, 2024
- SK SILTRON CO., LTD.
- Jae Hyeong Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Image view angle conversion/fault determination method and device,...
- Patent number 11,956,407
- Issue date Apr 9, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Ruirui Zhao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multiple camera imager for inspection of large diameter pipes, cham...
- Patent number 11,949,989
- Issue date Apr 2, 2024
- RedZone Robotics, Inc.
- Justin Starr
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Method and arrangement for determining a position of an object
- Patent number 11,948,293
- Issue date Apr 2, 2024
- Carl Zeiss Industrielle Messtechnik GmbH
- Wolfgang Hoegele
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus, method for inspecting defect, and meth...
- Patent number 11,940,391
- Issue date Mar 26, 2024
- Shin-Etsu Chemical Co., Ltd.
- Ryusei Terashima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Selecting a representative subset of potential defects to improve d...
- Patent number 11,940,390
- Issue date Mar 26, 2024
- Applied Materials Israel Ltd.
- Yotam Sofer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Optical test platform
- Patent number 11,938,483
- Issue date Mar 26, 2024
- bioMerieux, Inc.
- Jack R. Hoffmann
- G01 - MEASURING TESTING
Information Patent Grant
Device for recognizing defects in finished surface of product
- Patent number 11,940,389
- Issue date Mar 26, 2024
- Fu Tai Hua Industry (Shenzhen) Co., Ltd.
- Liu-Bin Hu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Vision inspection system and method of inspecting parts
- Patent number 11,935,216
- Issue date Mar 19, 2024
- Tyco Electronics (Shanghai) Co., Ltd.
- Roberto Francisco-Yi Lu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Object inspection system and method for inspecting an object
- Patent number 11,937,020
- Issue date Mar 19, 2024
- INOVISION SOFTWARE SOLUTIONS, INC.
- Jacob Nathaniel Allen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods and apparatus for in-service tank inspections
- Patent number 11,933,692
- Issue date Mar 19, 2024
- Square Robot, Inc.
- Jerome Vaganay
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Detection device and method for detecting workpiece
- Patent number 11,933,737
- Issue date Mar 19, 2024
- Tyco Electronics AMP Guangdong Ltd.
- Lei (Alex) Zhou
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Measurement apparatus, information processing apparatus, and non-tr...
- Patent number 11,933,603
- Issue date Mar 19, 2024
- FUJIFILM Business Innovation Corp.
- Takashi Hiramatsu
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM
- Publication number 20240144467
- Publication date May 2, 2024
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING DEVICE, INSPECTION APPARATUS AND SYSTEM FOR OPTICAL INSP...
- Publication number 20240142386
- Publication date May 2, 2024
- LEICA MICROSYSTEMS (SUZHOU) TECHNOLOGY CO., LTD.
- Linqi JIAO
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...
- Publication number 20240142389
- Publication date May 2, 2024
- SEMES CO., LTD.
- Jeong Hoon HAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CLASSIFICATION OF DEFECT PATTERNS OF SUBSTRATES
- Publication number 20240144464
- Publication date May 2, 2024
- Applied Materials, Inc.
- Chandrani Roy Chowdhury
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR ROAD INSPECTION
- Publication number 20240141601
- Publication date May 2, 2024
- Telefonaktiebolaget LM Ericsson (publ)
- Ning ZHANG
- E01 - CONSTRUCTION OF ROADS, RAILWAYS, OR BRIDGES
Information Patent Application
Surface Energy Measurement Instrument For Metal Foil And Measuremen...
- Publication number 20240142358
- Publication date May 2, 2024
- LG ENERGY SOLUTION, LTD.
- Ki Hoon Paeng
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING...
- Publication number 20240134010
- Publication date Apr 25, 2024
- NEC Corporation
- Katsuhiro YUTANI
- G01 - MEASURING TESTING
Information Patent Application
Methods for Analyzing an Electrode Layer of a Battery Cell Using a...
- Publication number 20240133819
- Publication date Apr 25, 2024
- SIEMENS AKTIENGESELLSCHAFT
- Sascha Schulte
- G01 - MEASURING TESTING
Information Patent Application
Identifying 3D Objects
- Publication number 20240133821
- Publication date Apr 25, 2024
- FUNDACIÓ INSTITUT DE CIÈNCIES FOTÒNIQUES
- Valerio PRUNERI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and System for Determining the Location of Artefacts and/or...
- Publication number 20240133822
- Publication date Apr 25, 2024
- The Australian National University
- Roland Fleddermann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING DEVICE AND INSPECTION APPARATUS FOR OPTICAL INSPECTION A...
- Publication number 20240133823
- Publication date Apr 25, 2024
- LEICA MICROSYSTEMS (SUZHOU) TECHNOLOGY CO., LTD.
- Linqi JIAO
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...
- Publication number 20240133824
- Publication date Apr 25, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuta URANO
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM
- Publication number 20240131559
- Publication date Apr 25, 2024
- Ackley Machine Corporation
- E. Michael ACKLEY
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE F...
- Publication number 20240130621
- Publication date Apr 25, 2024
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES
- Publication number 20240133772
- Publication date Apr 25, 2024
- SPINFRAME TECHNOLOGIES LTD
- Ori Yakov DANGUR
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR IDENTIFYING WAVEGUIDE DEFECTS
- Publication number 20240125708
- Publication date Apr 18, 2024
- ViaSat, Inc.
- Matthew COVER
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT APPARATUS
- Publication number 20240125709
- Publication date Apr 18, 2024
- Samsung Electronics Co., Ltd.
- Donggun Lee
- G01 - MEASURING TESTING
Information Patent Application
PROTECTIVE SHEET FIXING JIG AND AUTO VISUAL INSPECTION SYSTEM INCLU...
- Publication number 20240118217
- Publication date Apr 11, 2024
- SAMSUNG DISPLAY CO., LTD.
- WOONGIL CHOI
- G01 - MEASURING TESTING
Information Patent Application
STROBOSCOPIC STEPPED ILLUMINATION DEFECT DETECTION SYSTEM
- Publication number 20240118218
- Publication date Apr 11, 2024
- Casi Vision Technology (Luoyang) Co., Ltd.
- Xiaosong Hu
- G01 - MEASURING TESTING
Information Patent Application
Colorimetric Detection of Actinides
- Publication number 20240118214
- Publication date Apr 11, 2024
- UNITED STATES DEPARTMENT OF ENERGY
- Catherine Riddle
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20240118220
- Publication date Apr 11, 2024
- Panasonic Intellectual Property Management Co., Ltd.
- Shozo OSHIO
- G01 - MEASURING TESTING
Information Patent Application
ULTRA-MICRO DEFECT DETECTION APPARATUS AND DETECTION METHOD THEREOF
- Publication number 20240119577
- Publication date Apr 11, 2024
- Casi Vision Technology (Luoyang) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT DETECTION AND REMOVAL APPARATUS AND METHOD
- Publication number 20240118222
- Publication date Apr 11, 2024
- PlayNitride Display Co., Ltd.
- Chang-Rong Lin
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING
- Publication number 20240112935
- Publication date Apr 4, 2024
- Photon Dynamics, Inc.
- Neil Dang Nguyen
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS
- Publication number 20240110878
- Publication date Apr 4, 2024
- Chevron U.S.A. Inc.
- Nikolaos Ioannis Salmatanis
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...
- Publication number 20240112328
- Publication date Apr 4, 2024
- Baker Hughes Holdings LLC
- Clark A. Bendall
- G01 - MEASURING TESTING
Information Patent Application
TRANSMISSION BELT
- Publication number 20240110617
- Publication date Apr 4, 2024
- Aktiebolaget SKF
- Lakdar SADI-HADDAD
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
SUBSTRATE INSPECTION SYSTEM AND A METHOD OF USE THEREOF
- Publication number 20240102169
- Publication date Mar 28, 2024
- JNK TECH
- Youngjin Choi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Apparatus for detecting defects of reflective element
- Publication number 20240103026
- Publication date Mar 28, 2024
- Hong-I Tsai
- G01 - MEASURING TESTING
Information Patent Application
CAMERA-ALIGNMENT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS
- Publication number 20240104777
- Publication date Mar 28, 2024
- Apple Inc.
- Mikael B. MANNBERG
- G06 - COMPUTING CALCULATING COUNTING

Investigating the presence of flaws or contamination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Image processing apparatus and image processing method

Method of using a sterilization wrap system

Semiconductor device inspection method and semiconductor device ins...

Inspection device and inspection method

Detection device

Optical etendue matching methods for extreme ultraviolet metrology

Pseudo defective product data generation method

Dark-field optical inspection device

Apparatus and method for gray field imaging

Assembly for detecting defects on a motor vehicle bodywork

Damage figure creation supporting apparatus, damage figure creation...

Systems, methods and apparatus for in-service tank inspections

Detection device, mechanical device, and work vehicle

Method for defect inspection

Semiconductor wafer evaluation method and semiconductor wafer manuf...

Defective part recognition device and defective part recognition me...

Visual inspection device

Method for evaluating defective region of wafer

Image view angle conversion/fault determination method and device,...

Multiple camera imager for inspection of large diameter pipes, cham...

Method and arrangement for determining a position of an object

Defect inspection apparatus, method for inspecting defect, and meth...

Selecting a representative subset of potential defects to improve d...

Optical test platform

Device for recognizing defects in finished surface of product

Vision inspection system and method of inspecting parts

Object inspection system and method for inspecting an object

Systems, methods and apparatus for in-service tank inspections

Detection device and method for detecting workpiece

Measurement apparatus, information processing apparatus, and non-tr...

Patents Applicationslast 30 patents

HOT SPOT DEFECT DETECTING METHOD AND HOT SPOT DEFECT DETECTING SYSTEM

PROCESSING DEVICE, INSPECTION APPARATUS AND SYSTEM FOR OPTICAL INSP...

SUBSTRATE INSPECTION APPARATUS AND SUBSTRATE TREATMENT SYSTEM INCLU...

CLASSIFICATION OF DEFECT PATTERNS OF SUBSTRATES

METHOD AND APPARATUS FOR ROAD INSPECTION

Surface Energy Measurement Instrument For Metal Foil And Measuremen...

OPTICAL SENSING DEVICE, OPTICAL SENSING SYSTEM, ANDOPTICAL SENSING...

Methods for Analyzing an Electrode Layer of a Battery Cell Using a...

Identifying 3D Objects

Method and System for Determining the Location of Artefacts and/or...

PROCESSING DEVICE AND INSPECTION APPARATUS FOR OPTICAL INSPECTION A...

DEFECT INSPECTION DEVICE, DEFECT INSPECTION METHOD, AND ADJUSTMENT...

INSPECTION SYSTEM

CAMERA BASED SYSTEM WITH PROCESSING USING ARTIFICIAL INTELLIGENCE F...

SYSTEM AND METHOD FOR AUTOMATIC INSPECTION OF VEHICLES

SYSTEMS AND METHODS FOR IDENTIFYING WAVEGUIDE DEFECTS

SEMICONDUCTOR MEASUREMENT APPARATUS

PROTECTIVE SHEET FIXING JIG AND AUTO VISUAL INSPECTION SYSTEM INCLU...

STROBOSCOPIC STEPPED ILLUMINATION DEFECT DETECTION SYSTEM

Colorimetric Detection of Actinides

INSPECTION DEVICE AND INSPECTION METHOD

ULTRA-MICRO DEFECT DETECTION APPARATUS AND DETECTION METHOD THEREOF

DEFECT DETECTION AND REMOVAL APPARATUS AND METHOD

SYNCHRONOUS SUBSTRATE TRANSPORT AND ELECTRICAL PROBING

INTEGRATED FLUID LEAK DETECTION USING MULTIPLE SENSORS

INSPECTION DEVICE ARTICULATION TRANSFORMATION BASED ON IMAGE TRANSF...

TRANSMISSION BELT

SUBSTRATE INSPECTION SYSTEM AND A METHOD OF USE THEREOF

Apparatus for detecting defects of reflective element

CAMERA-ALIGNMENT-BASED FAULT DETECTION FOR PHYSICAL COMPONENTS