Investigating the presence of flaws or contamination

Industry

CPC
G01N21/88

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/88Investigating the presence of flaws or contamination

Industries

Patents Grantslast 30 patents

Information Patent Grant
Optical inspection device and inspecting method using the same
- Patent number 12,222,294
- Issue date Feb 11, 2025
- Samsung Display Co., Ltd.
- Jeong Moon Lee
- G01 - MEASURING TESTING
Information Patent Grant
Optical sorter
- Patent number 12,222,295
- Issue date Feb 11, 2025
- Satake Corporation
- Tomoyuki Miyamoto
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for quality analysis of a product to be inspected
- Patent number 12,222,296
- Issue date Feb 11, 2025
- Multiscan Technologies, S.L.
- Simon Hendrik E. Van Olmen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-sensor pipe inspection system and method
- Patent number 12,222,298
- Issue date Feb 11, 2025
- HYDROMAX USA, LLC
- Guy Schiavone
- G01 - MEASURING TESTING
Information Patent Grant
Detection device, label assignment method, and non-transitory compu...
- Patent number 12,222,293
- Issue date Feb 11, 2025
- NEC Corporation
- Akira Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Decay detection system
- Patent number 12,217,410
- Issue date Feb 4, 2025
- SUNKIST GROWERS, INC.
- Aaron Gorsky
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection system having human-machine interaction function
- Patent number 12,217,498
- Issue date Feb 4, 2025
- KAPITO INC.
- Feng-Tso Sun
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting cans
- Patent number 12,216,062
- Issue date Feb 4, 2025
- Krones AG
- Stefan Piana
- G01 - MEASURING TESTING
Information Patent Grant
Electronic device which can determine a dirtiness level
- Patent number 12,216,063
- Issue date Feb 4, 2025
- PixArt Imaging Inc.
- Tsung-Fa Wang
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopic measurement apparatus and method ba...
- Patent number 12,216,264
- Issue date Feb 4, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for optically inspecting containers
- Patent number 12,209,969
- Issue date Jan 28, 2025
- Krones AG
- Anton Niedermeier
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,209,971
- Issue date Jan 28, 2025
- VIENEX CORPORATION
- Osamu Iwasaki
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inspection support device, inspection support method, and inspectio...
- Patent number 12,209,972
- Issue date Jan 28, 2025
- FUJIFILM Corporation
- Shuhei Horita
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and device for optically inspecting containers
- Patent number 12,209,970
- Issue date Jan 28, 2025
- Krones AG
- Anton Niedermeier
- G01 - MEASURING TESTING
Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Spark spectrometry for inclusions content distribution on the surfa...
- Patent number 12,203,864
- Issue date Jan 21, 2025
- NCS TESTING TECHNOLOGY CO., LTD
- Yunhai Jia
- G01 - MEASURING TESTING
Information Patent Grant
Optical sensing device and optical sensing method thereof
- Patent number 12,203,866
- Issue date Jan 21, 2025
- EMINENT ELECTRONIC TECHNOLOGY CORP. LTD.
- Zhong-Hao Deng
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for real-time direct surface fouling and scale...
- Patent number 12,203,842
- Issue date Jan 21, 2025
- Noria Water Technologies, Inc.
- Anditya Rahardianto
- F28 - HEAT EXCHANGE IN GENERAL
Information Patent Grant
Multi-element super resolution optical inspection system
- Patent number 12,203,857
- Issue date Jan 21, 2025
- KLA Corporation
- Grace Hsiu-Ling Chen
- G01 - MEASURING TESTING
Information Patent Grant
Dark-field confocal microscopy measurement apparatus and method bas...
- Patent number 12,203,867
- Issue date Jan 21, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Wearable devices comprising semiconductor diode light sources with...
- Patent number 12,193,790
- Issue date Jan 14, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,196,673
- Issue date Jan 14, 2025
- HITACHI HIGH-TECH CORPORATION
- Takeru Utsugi
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for monitoring the drying/curing process of coatings
- Patent number 12,196,685
- Issue date Jan 14, 2025
- BASF Coatings GmbH
- Harry Libutzki
- G01 - MEASURING TESTING
Information Patent Grant
Syclops
- Patent number 12,198,319
- Issue date Jan 14, 2025
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Grant
Vortex dichroism dark-field confocal microscopy measurement apparat...
- Patent number 12,196,686
- Issue date Jan 14, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Image processing system, image processing device, image processing...
- Patent number 12,190,477
- Issue date Jan 7, 2025
- FUJIFILM Corporation
- Kenkichi Hayashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus comprising at least one THz device and method of operatin...
- Patent number 12,188,859
- Issue date Jan 7, 2025
- HELMUT FISCHER GMBH INSTITUT FÜR ELEKRONIK UND MESSTECHNIK
- Rüdiger Mästle
- G01 - MEASURING TESTING
Information Patent Grant
Automated optical double-sided inspection apparatus
- Patent number 12,188,877
- Issue date Jan 7, 2025
- Feng Chia University
- Yee Siang Gan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign object debris detection
- Patent number 12,188,878
- Issue date Jan 7, 2025
- The Government of the United States of America, as represented by the Secreta...
- Andrew Nicholas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250049326
- Publication date Feb 13, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER
- Publication number 20250052666
- Publication date Feb 13, 2025
- KLA Corporation
- Chao Chang
- G01 - MEASURING TESTING
Information Patent Application
ROBOTS FOR WATER TUNNEL INSPECTION AND SYSTEMS THEREOF
- Publication number 20250052356
- Publication date Feb 13, 2025
- Hong Kong Centre for Logistics Robotics Limited
- Jianshu ZHOU
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Application
DUAL LENS INSPECTION DEVICE
- Publication number 20250052690
- Publication date Feb 13, 2025
- SUN YANG OPTICS DEVELOPMENT CO., LTD.
- SHENG CHE WU
- G01 - MEASURING TESTING
Information Patent Application
SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...
- Publication number 20250045898
- Publication date Feb 6, 2025
- Konica Minolta, Inc.
- Yoshihito SOUMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Remotely Deployed and Operated Drone-based Sealed Tank Inspections
- Publication number 20250044809
- Publication date Feb 6, 2025
- OCEANEERING INTERNATIONAL, INC.
- Nikunj PATEL
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...
- Publication number 20250044235
- Publication date Feb 6, 2025
- Kabushiki Kaisha Toshiba
- Hiroshi OHNO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...
- Publication number 20250045905
- Publication date Feb 6, 2025
- AQC INDUSTRY
- Pierre MAGRANGEAS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD
- Publication number 20250044236
- Publication date Feb 6, 2025
- ASML NETHERLANDS B.V.
- Douglas C. CAPPELLI
- G01 - MEASURING TESTING
Information Patent Application
WAFER DEFECT INSPECTION SYSTEM
- Publication number 20250044241
- Publication date Feb 6, 2025
- SYNTEC RESOURCES CO., LTD.
- KANG-FENG FAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...
- Publication number 20250033212
- Publication date Jan 30, 2025
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Application
DEFLECTOMETRY MEASUREMENT METHOD
- Publication number 20250035432
- Publication date Jan 30, 2025
- WYSE LIGHT
- SURREL Yves
- G01 - MEASURING TESTING
Information Patent Application
MULTI-TASK DEVICE COMPRISING A CAMERA AND A SINGLE SPINDLE FOR PLAC...
- Publication number 20250039524
- Publication date Jan 30, 2025
- SETI-TEC
- Sébastien Pereira-Santo
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...
- Publication number 20250035559
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G01 - MEASURING TESTING
Information Patent Application
METHOD, APPARATUS, AND SYSTEM FOR INSPECTING CATHODE ELECTRODE PLAT...
- Publication number 20250035560
- Publication date Jan 30, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY (HONG KONG) LIMITED
- Baiquan ZHAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SEMICONDUCTOR MEASUREMENT DEVICE
- Publication number 20250035563
- Publication date Jan 30, 2025
- Samsung Electronics Co., Ltd.
- Ryuju Sato
- G01 - MEASURING TESTING
Information Patent Application
ELECTRONIC DEVICE AND METHOD FOR PROVIDING NOTIFICATION OF ABNORMAL...
- Publication number 20250027883
- Publication date Jan 23, 2025
- Samsung Electronics Co., Ltd.
- Moonsun KIM
- G08 - SIGNALLING
Information Patent Application
SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE
- Publication number 20250027887
- Publication date Jan 23, 2025
- Applied Materials, Inc.
- Srikanth V. Racherla
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...
- Publication number 20250026603
- Publication date Jan 23, 2025
- Konica Minolta, Inc.
- Hiromu Nagato
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED
- Publication number 20250027885
- Publication date Jan 23, 2025
- YAYATECH CO., LTD.
- Chien-Cheng CHEN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...
- Publication number 20250027884
- Publication date Jan 23, 2025
- COGNEX CORPORATION
- Eric Moore
- G01 - MEASURING TESTING
Information Patent Application
CUTTER ANALYSIS AND MAPPING
- Publication number 20250029236
- Publication date Jan 23, 2025
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM
- Publication number 20250027886
- Publication date Jan 23, 2025
- Taiwan Semiconductor Manufacturing company Ltd.
- SHAO-CHIEN CHIU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...
- Publication number 20250017473
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS OF IMAGE EXTRACTION FOR EFFECTIVE GLOBAL AND LO...
- Publication number 20250020597
- Publication date Jan 16, 2025
- Government of the United States, as represented by the Secretary of the Air F...
- Jie Wei
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROBE CARD TEST SYSTEM AND METHOD
- Publication number 20250020750
- Publication date Jan 16, 2025
- SEMES CO., LTD.
- Harkryong KIM
- G01 - MEASURING TESTING
Information Patent Application
MODULE AND SYSTEM FOR, AND METHOD OF DETECTING DEFECTS IN ULTRA-THI...
- Publication number 20250022120
- Publication date Jan 16, 2025
- SAMSUNG DISPLAY CO., LTD.
- YUNKU KANG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...
- Publication number 20250017472
- Publication date Jan 16, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- G01 - MEASURING TESTING
Information Patent Application
AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE
- Publication number 20250020627
- Publication date Jan 16, 2025
- HUSQVARNA AB
- Andreas Jonsson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR
- Publication number 20250009232
- Publication date Jan 9, 2025
- Omni MedSci, Inc.
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS

Investigating the presence of flaws or contamination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Optical inspection device and inspecting method using the same

Optical sorter

Inspection system for quality analysis of a product to be inspected

Multi-sensor pipe inspection system and method

Detection device, label assignment method, and non-transitory compu...

Decay detection system

Defect inspection system having human-machine interaction function

Apparatus and method for inspecting cans

Electronic device which can determine a dirtiness level

Dark-field confocal microscopic measurement apparatus and method ba...

Method and device for optically inspecting containers

Foreign substance/defect inspection device, image generation device...

Inspection support device, inspection support method, and inspectio...

Method and device for optically inspecting containers

Qualitative or quantitative characterization of a coating surface

Spark spectrometry for inclusions content distribution on the surfa...

Optical sensing device and optical sensing method thereof

Method and apparatus for real-time direct surface fouling and scale...

Multi-element super resolution optical inspection system

Dark-field confocal microscopy measurement apparatus and method bas...

Wearable devices comprising semiconductor diode light sources with...

Method for inspecting pattern defects

Defect inspection apparatus and defect inspection method

Device and method for monitoring the drying/curing process of coatings

Syclops

Vortex dichroism dark-field confocal microscopy measurement apparat...

Image processing system, image processing device, image processing...

Apparatus comprising at least one THz device and method of operatin...

Automated optical double-sided inspection apparatus

Foreign object debris detection

Patents Applicationslast 30 patents

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

DUAL FREQUENCY COMB IMAGING SPECTROSCOPIC ELLIPSOMETER

ROBOTS FOR WATER TUNNEL INSPECTION AND SYSTEMS THEREOF

DUAL LENS INSPECTION DEVICE

SURFACE INSPECTION DEVICE, SURFACE INSPECTION METHOD, AUTOMATIC DEF...

Remotely Deployed and Operated Drone-based Sealed Tank Inspections

OPTICAL APPARATUS, OPTICAL INSPECTION APPARATUS, OPTICAL INSPECTION...

METHOD FOR DETECTING AT LEAST ONE DEFECT ON A SUPPORT, DEVICE AND C...

INSPECTION APPARATUS, LINEARLY MOVABLE BEAM DISPLACER, AND METHOD

WAFER DEFECT INSPECTION SYSTEM

SYSTEM, APPARATUS AND METHOD FOR IMPROVED LOCATION IDENTIFICATION W...

DEFLECTOMETRY MEASUREMENT METHOD

MULTI-TASK DEVICE COMPRISING A CAMERA AND A SINGLE SPINDLE FOR PLAC...

METHOD, APPARATUS, AND SYSTEM FOR DEFECT DETECTION OF CATHODE ELECT...

METHOD, APPARATUS, AND SYSTEM FOR INSPECTING CATHODE ELECTRODE PLAT...

SEMICONDUCTOR MEASUREMENT DEVICE

ELECTRONIC DEVICE AND METHOD FOR PROVIDING NOTIFICATION OF ABNORMAL...

SYSTEMS AND METHODS FOR INSPECTING A SUBSTRATE

INSPECTION SYSTEM, INSPECTION METHOD, AND NON-TRANSITORY RECORDING...

DEVICE OF INSPECTING DEFECTS OF WAFER DICED OR ALIGNED

SYSTEMS AND METHODS FOR TRANSLATIONAL TRIGGERING FOR IMAGE-BASED IN...

CUTTER ANALYSIS AND MAPPING

DEFECT INSPECTION METHOD AND DEFECT INSPECTION SYSTEM

WEARABLE DEVICE FOR DIFFERENTIAL MEASUREMENT ON PULSE RATE AND BLOO...

SYSTEMS AND METHODS OF IMAGE EXTRACTION FOR EFFECTIVE GLOBAL AND LO...

PROBE CARD TEST SYSTEM AND METHOD

MODULE AND SYSTEM FOR, AND METHOD OF DETECTING DEFECTS IN ULTRA-THI...

MEASUREMENTS USING CAMERA SENSOR COUPLED TO A CHEMICAL DETECTION SY...

AN INSPECTION TOOL FOR INSPECTING A CONCRETE SURFACE

TIME-OF-FLIGHT MEASUREMENT ON USER WITH CAMERAS AND POSITION SENSOR