Investigating the presence of flaws or contamination

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G01N21/88

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/88Investigating the presence of flaws or contamination

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Automated analysis and sorting of milling drum tools
- Patent number 12,270,731
- Issue date Apr 8, 2025
- Jorge Campos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for assessing optical quality of gemstones
- Patent number 12,270,765
- Issue date Apr 8, 2025
- Gemological Institute of America, Inc.
- Hiroshi Takahashi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection support apparatus, inspection support method, and comput...
- Patent number 12,270,766
- Issue date Apr 8, 2025
- NEC Corporation
- Akira Tsuji
- G01 - MEASURING TESTING
Information Patent Grant
Wearable device for differential measurement on pulse rate and bloo...
- Patent number 12,268,475
- Issue date Apr 8, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for detecting defects of the horizontal mold seal for glass...
- Patent number 12,265,035
- Issue date Apr 1, 2025
- TIAMIA
- Lubin Fayolle
- G01 - MEASURING TESTING
Information Patent Grant
Cylindrical shell detection method and cylindrical shell detection...
- Patent number 12,265,037
- Issue date Apr 1, 2025
- Advanced ACEBIOTEK CO., LTD.
- Jyh-Chern Chen
- G01 - MEASURING TESTING
Information Patent Grant
Type of device(s) for automatically monitoring a coating and/or str...
- Patent number 12,264,909
- Issue date Apr 1, 2025
- QUISS QUALITAETS-INSPEKTIONSSYSTEME UND SERVICE GMBH
- Bernhard Gruber
- G01 - MEASURING TESTING
Information Patent Grant
Shearography and interferometry sensor with multidirectional dynami...
- Patent number 12,265,024
- Issue date Apr 1, 2025
- Petroleo Brasileiro S.A. Petrobras
- Sergio Damasceno Soares
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Substrate inspection system and a method of use thereof
- Patent number 12,258,665
- Issue date Mar 25, 2025
- JNK TECH
- Youngjin Choi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of using a sterilization wrap system
- Patent number 12,257,822
- Issue date Mar 25, 2025
- O&M Halyard, Inc.
- Jeffrey James Farmer
- B32 - LAYERED PRODUCTS
Information Patent Grant
Methods and apparatus for evaluating agricultural material with an...
- Patent number 12,259,376
- Issue date Mar 25, 2025
- Deer & Company
- Bret M. Culpepper
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Method and inspection device for optically inspecting a surface
- Patent number 12,259,232
- Issue date Mar 25, 2025
- ISRA VISION GMBH
- Stefan Leute
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus, injection molding system, and inspection method
- Patent number 12,259,335
- Issue date Mar 25, 2025
- Sumitomo Heavy Industries, Ltd.
- Itta Nozawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Time-of-flight sensors co-registered with camera systems
- Patent number 12,251,194
- Issue date Mar 18, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automated in-line object inspection
- Patent number 12,254,617
- Issue date Mar 18, 2025
- KODAK ALARIS LLC
- Bruce A. Link
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Surface defect monitoring system
- Patent number 12,253,471
- Issue date Mar 18, 2025
- TERRACON CONSULTANTS, INC.
- Scott Steffan
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection method and system for determining the location of a surfa...
- Patent number 12,253,474
- Issue date Mar 18, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Detecting damaged semiconductor wafers utilizing a semiconductor wa...
- Patent number 12,249,526
- Issue date Mar 11, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Chen Min Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System for detecting defect of electrode tab and method for detecti...
- Patent number 12,247,926
- Issue date Mar 11, 2025
- LG ENERGY SOLUTION, LTD.
- Jung Han Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of evaluating semiconductor wafer
- Patent number 12,247,927
- Issue date Mar 11, 2025
- Sumco Corporation
- Motoi Kurokami
- G01 - MEASURING TESTING
Information Patent Grant
Bead appearance inspection device, bead appearance inspection metho...
- Patent number 12,247,827
- Issue date Mar 11, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Katsuaki Okuma
- G01 - MEASURING TESTING
Information Patent Grant
Endoscope cleaning and inspection system and method
- Patent number 12,245,904
- Issue date Mar 11, 2025
- Medivators Inc.
- Mark Jackson
- B08 - CLEANING
Information Patent Grant
High intensity illumination systems and methods of use thereof
- Patent number 12,240,372
- Issue date Mar 4, 2025
- CARBON AUTONOMOUS ROBOTIC SYSTEMS INC.
- Alexander Igorevich Sergeev
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method and system for detecting a defect on a semi-reflective film...
- Patent number 12,241,844
- Issue date Mar 4, 2025
- HUA YANG Precision Machinery Co., Ltd
- Hsien-Te Hsiao
- G01 - MEASURING TESTING
Information Patent Grant
Electrode sheet defect detection system
- Patent number 12,241,843
- Issue date Mar 4, 2025
- LG ENERGY SOLUTION, LTD.
- Ee Beom Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology system utilizing annular optical configuration
- Patent number 12,242,047
- Issue date Mar 4, 2025
- Mitutoyo Corporation
- Paul Gerard Gladnick
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Wafer metrology technologies
- Patent number 12,241,924
- Issue date Mar 4, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System comprising a dishwasher and method for operating a dishwasher
- Patent number 12,239,274
- Issue date Mar 4, 2025
- BSH Hausgeräte GmbH
- Alfredo Calvimontes
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection system and appearance inspection method for t...
- Patent number 12,236,570
- Issue date Feb 25, 2025
- Kabushika Kaisha Toshiba
- Ikuo Motonaga
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining abnormality of display manufacturing facility
- Patent number 12,235,220
- Issue date Feb 25, 2025
- Samsung Display Co., Ltd.
- Jinwook Lee
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL SENSING SYSTEM AND OPTICAL SENSING METHOD
- Publication number 20250116608
- Publication date Apr 10, 2025
- PIXART IMAGING Inc.
- Guo-Zhen Wang
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND INSPECTIO...
- Publication number 20250116611
- Publication date Apr 10, 2025
- FUJIFILM CORPORATION
- Shuhei HORITA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM FOR OBJECTS
- Publication number 20250116610
- Publication date Apr 10, 2025
- ANTARES VISION S.P.A.
- Gianmarco MANIACI
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD
- Publication number 20250116614
- Publication date Apr 10, 2025
- Hydromax USA, LLC
- Guy Schiavone
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMIC...
- Publication number 20250116598
- Publication date Apr 10, 2025
- KLA Corporation
- Daniel Ivanov Kavaldjiev
- G01 - MEASURING TESTING
Information Patent Application
AQUATIC ENVIRONMENT MONITORING AND DOSING SYSTEMS AND APPARATUSES,...
- Publication number 20250116606
- Publication date Apr 10, 2025
- The LaMotte Chemical Products Company
- James E. Clark
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
SURFACE INSPECTION METHOD FOR METAL MATERIAL, SURFACE INSPECTION AP...
- Publication number 20250116609
- Publication date Apr 10, 2025
- JFE STEEL CORPORATION
- Yuya NIIZUMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...
- Publication number 20250111496
- Publication date Apr 3, 2025
- GEHRING TECHNOLOGIES GMBH + CO. KG
- Laurens Schmid
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
EVALUATING THE SEALING QUALITY OF A SEALING STRIP SEALED TO A PACKA...
- Publication number 20250108949
- Publication date Apr 3, 2025
- Tetra Laval Holdings & Finance S.A.
- Daniele BULGARELLI
- G01 - MEASURING TESTING
Information Patent Application
Passive Camera Lens Smudge Detection
- Publication number 20250110059
- Publication date Apr 3, 2025
- Apple Inc.
- Xiaochun Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL INSPECTION OF PULP BOTTLES
- Publication number 20250102432
- Publication date Mar 27, 2025
- KRONES AG
- Rainer KWIRANDT
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...
- Publication number 20250102446
- Publication date Mar 27, 2025
- APPLIED MATERIALS ISRAEL LTD.
- Menachem LAPID
- G01 - MEASURING TESTING
Information Patent Application
FIBER OPTIC PROFILER FOR EARLY DAMAGE WARNING
- Publication number 20250102444
- Publication date Mar 27, 2025
- Honeywell International Inc.
- Chen FENG
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE SUPPORT ASSEMBLY WITH MULTIPLE DISCS
- Publication number 20250100263
- Publication date Mar 27, 2025
- Applied Materials, Inc.
- Arvinder Manmohan Singh Chadha
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...
- Publication number 20250102445
- Publication date Mar 27, 2025
- Lasertec Corporation
- Ko GONDAIRA
- G01 - MEASURING TESTING
Information Patent Application
DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFEC...
- Publication number 20250093274
- Publication date Mar 20, 2025
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR INSPECTING PATTERN DEFECTS
- Publication number 20250093278
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ju-Ying CHEN
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR FAILURE ANALYSIS DEVICE
- Publication number 20250093279
- Publication date Mar 20, 2025
- HAMAMATSU PHOTONICS K. K.
- Masataka IKESU
- G01 - MEASURING TESTING
Information Patent Application
Illumination Apparatus for Illuminating a Microfluidic Device, Anal...
- Publication number 20250091045
- Publication date Mar 20, 2025
- ROBERT BOSCH GmbH
- Reinhold Fiess
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
MULTI-CAMERA SYNCHRONIZATION FOR INSPECTION SYSTEMS
- Publication number 20250093275
- Publication date Mar 20, 2025
- VIRTEK VISION INTERNATIONAL INC.
- Ahmed Elhossini
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...
- Publication number 20250093280
- Publication date Mar 20, 2025
- UnitX, Inc.
- Tommy Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION SYSTEM AND DETECTION METHOD FOR ELECTRONIC DEVICE
- Publication number 20250097563
- Publication date Mar 20, 2025
- InnoLux Corporation
- Kuang-Ming FAN
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for inspecting containers provided with fittings
- Publication number 20250085233
- Publication date Mar 13, 2025
- KRONES AG
- Andreas Kraus
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEFECT INSPECTION APPARATUS
- Publication number 20250085231
- Publication date Mar 13, 2025
- SAMSUNG DISPLAY CO., LTD.
- Youngil JUNG
- G01 - MEASURING TESTING
Information Patent Application
Testing Apparatus and Testing Method
- Publication number 20250076215
- Publication date Mar 6, 2025
- TOKYO ELECTRON LIMITED
- Hiroyuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250076204
- Publication date Mar 6, 2025
- Samsung Electronics Co., Ltd.
- Min Hwan SEO
- G01 - MEASURING TESTING
Information Patent Application
HOLE INSPECTION LENS UNIT
- Publication number 20250076206
- Publication date Mar 6, 2025
- AISIN CORPORATION
- Syotaro NAGATA
- G01 - MEASURING TESTING
Information Patent Application
DISPLAYING MULTI-STAGE NDT ANALYTIC INFORMATION
- Publication number 20250076210
- Publication date Mar 6, 2025
- Baker Hughes Holdings LLC
- Kevin Coombs
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION
- Publication number 20250076212
- Publication date Mar 6, 2025
- Applied Materials, Inc.
- Venkatakaushik VOLETI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SENSOR FUSION WITH EDDY CURRENT SENSING
- Publication number 20250073780
- Publication date Mar 6, 2025
- DIVERGENT TECHNOLOGIES, INC.
- Farzaneh KAJI
- B22 - CASTING POWDER METALLURGY

Investigating the presence of flaws or contamination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Automated analysis and sorting of milling drum tools

Apparatus and method for assessing optical quality of gemstones

Inspection support apparatus, inspection support method, and comput...

Wearable device for differential measurement on pulse rate and bloo...

Method for detecting defects of the horizontal mold seal for glass...

Cylindrical shell detection method and cylindrical shell detection...

Type of device(s) for automatically monitoring a coating and/or str...

Shearography and interferometry sensor with multidirectional dynami...

Substrate inspection system and a method of use thereof

Method of using a sterilization wrap system

Methods and apparatus for evaluating agricultural material with an...

Method and inspection device for optically inspecting a surface

Inspection apparatus, injection molding system, and inspection method

Time-of-flight sensors co-registered with camera systems

Automated in-line object inspection

Surface defect monitoring system

Detection method and system for determining the location of a surfa...

Detecting damaged semiconductor wafers utilizing a semiconductor wa...

System for detecting defect of electrode tab and method for detecti...

Method of evaluating semiconductor wafer

Bead appearance inspection device, bead appearance inspection metho...

Endoscope cleaning and inspection system and method

High intensity illumination systems and methods of use thereof

Method and system for detecting a defect on a semi-reflective film...

Electrode sheet defect detection system

Metrology system utilizing annular optical configuration

Wafer metrology technologies

System comprising a dishwasher and method for operating a dishwasher

Appearance inspection system and appearance inspection method for t...

Method of determining abnormality of display manufacturing facility

Patents Applicationslast 30 patents

OPTICAL SENSING SYSTEM AND OPTICAL SENSING METHOD

INSPECTION SUPPORT DEVICE, INSPECTION SUPPORT METHOD, AND INSPECTIO...

INSPECTION SYSTEM FOR OBJECTS

MULTI-SENSOR PIPE INSPECTION SYSTEM AND METHOD

ENHANCED MODES FOR SCANNING ACOUSTIC MICROSCOPE INSPECTION IN SEMIC...

AQUATIC ENVIRONMENT MONITORING AND DOSING SYSTEMS AND APPARATUSES,...

SURFACE INSPECTION METHOD FOR METAL MATERIAL, SURFACE INSPECTION AP...

METHOD AND DEVICE FOR EVALUATING A WELDING QUALITY OF A WELD SEAM B...

EVALUATING THE SEALING QUALITY OF A SEALING STRIP SEALED TO A PACKA...

Passive Camera Lens Smudge Detection

OPTICAL INSPECTION OF PULP BOTTLES

OPTICAL SYSTEMS AND METHODS OF PROVIDING A COUPLING MIRROR TO AN OP...

FIBER OPTIC PROFILER FOR EARLY DAMAGE WARNING

SUBSTRATE SUPPORT ASSEMBLY WITH MULTIPLE DISCS

LIGHT SOURCE APPARATUS, INSPECTION APPARATUS, EXPOSURE APPARATUS, L...

DUAL SCAN BEAM SEPARATION WITH INDEPENDENT ANGLE OF INCIDENCE DEFEC...

METHOD FOR INSPECTING PATTERN DEFECTS

SEMICONDUCTOR FAILURE ANALYSIS DEVICE

Illumination Apparatus for Illuminating a Microfluidic Device, Anal...

MULTI-CAMERA SYNCHRONIZATION FOR INSPECTION SYSTEMS

MULTICHANNEL LED LIGHT TO ENABLE PHOTOMETRIC STEREO FOR 3D RECONSUT...

DETECTION SYSTEM AND DETECTION METHOD FOR ELECTRONIC DEVICE

Method and apparatus for inspecting containers provided with fittings

DEFECT INSPECTION APPARATUS

Testing Apparatus and Testing Method

IMAGING SYSTEM AND IMAGING INSPECTION APPARATUS INCLUDING THE SAME

HOLE INSPECTION LENS UNIT

DISPLAYING MULTI-STAGE NDT ANALYTIC INFORMATION

MULTIDIRECTIONAL ILLUMINATION FOR HYBRID BONDING DEFECT DETECTION

SENSOR FUSION WITH EDDY CURRENT SENSING