Investigating the presence of flaws or contamination

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G01N21/88

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/88Investigating the presence of flaws or contamination

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Surface-defect detecting method, surface-defect detecting apparatus...
- Patent number 12,320,756
- Issue date Jun 3, 2025
- JFE Steel Corporation
- Hiroaki Ono
- G01 - MEASURING TESTING
Information Patent Grant
Reflective waveplates for pupil polarization filtering
- Patent number 12,322,620
- Issue date Jun 3, 2025
- KLA Corporation
- Chong Shen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Semiconductor inspection tool system and method for wafer edge insp...
- Patent number 12,320,757
- Issue date Jun 3, 2025
- Camtek Ltd.
- Carmel Yehuda Drillman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stroboscopic stepped illumination defect detection system
- Patent number 12,313,561
- Issue date May 27, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Xiaosong Hu
- G01 - MEASURING TESTING
Information Patent Grant
Detection method of crease degree of screen and visual detection ap...
- Patent number 12,313,567
- Issue date May 27, 2025
- WUHAN CHINA STAR OPTOELECTRONICS SEMICONDUCTOR DISPLAY TECHNOLOGY CO., LTD.
- Yali Liu
- G01 - MEASURING TESTING
Information Patent Grant
System and method for detecting the presence of spores in fields
- Patent number 12,313,559
- Issue date May 27, 2025
- Universite de Geneve
- Jean-Pierre Wolf
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Grant
Light reflection support and through hole inspection system
- Patent number 12,313,568
- Issue date May 27, 2025
- JOONGWOO M-TECH CO., LTD.
- Sung Soo Park
- G01 - MEASURING TESTING
Information Patent Grant
Visual turbidity detection device and detection method thereof
- Patent number 12,313,560
- Issue date May 27, 2025
- BEIJING TECHNOLOGY AND BUSINESS UNIVERSITY
- Xiaotao Sun
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 12,313,564
- Issue date May 27, 2025
- Toyota Jidosha Kabushiki Kaisha
- Tomohiro Matsuda
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dark-field confocal microscopy measurement apparatus based on vorte...
- Patent number 12,313,563
- Issue date May 27, 2025
- Harbin Institute of Technology
- Jian Liu
- G01 - MEASURING TESTING
Information Patent Grant
Foreign object debris discrimination with modulated laser light
- Patent number 12,313,562
- Issue date May 27, 2025
- RTX Corporation
- Jose-Rodrigo Castillo-Garza
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for detecting defects in semiconductor systems
- Patent number 12,306,112
- Issue date May 20, 2025
- AXIOMATIQUE TECHNOLOGIES, INC.
- Trevor A. Norman
- G01 - MEASURING TESTING
Information Patent Grant
3D image acquisition system for optical inspection and method for o...
- Patent number 12,306,110
- Issue date May 20, 2025
- Scuola universitaria professionale della Svizzera italiana (SUPSI)
- Daniele Guido Allegri
- G01 - MEASURING TESTING
Information Patent Grant
Integrated management of sensitive controlled environments and item...
- Patent number 12,307,615
- Issue date May 20, 2025
- CURRENT LIGHTING SOLUTIONS, LLC
- Kenneth Craig Nemeth
- G01 - MEASURING TESTING
Information Patent Grant
Container leakage detection using thermal imaging
- Patent number 12,306,065
- Issue date May 20, 2025
- Institut National D'Optique
- Timothy Pope
- G01 - MEASURING TESTING
Information Patent Grant
Inspection condition presentation apparatus, surface inspection app...
- Patent number 12,306,109
- Issue date May 20, 2025
- Resonac Corporation
- Katsuhisa Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Continuous dust accumulation monitoring system with impaired optics...
- Patent number 12,298,255
- Issue date May 13, 2025
- Industrial Intelligence Inc.
- George T. Armbruster
- B08 - CLEANING
Information Patent Grant
Part control device and method
- Patent number 12,296,520
- Issue date May 13, 2025
- UNIVERSITE DE CHAMBERY-UNIVERSITE SAVOIE MONT BLANC
- Pierre Nagorny
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Windshield with optical windows for seal application
- Patent number 12,296,655
- Issue date May 13, 2025
- Ford Motor Company
- Steven Angus
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Visual inspection systems and methods
- Patent number 12,298,253
- Issue date May 13, 2025
- ESSEX SOLUTIONS USA LLC
- Russell Glenn Post
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Apparatus and method for inspecting laser defect inside of transpar...
- Patent number 12,292,387
- Issue date May 6, 2025
- Corning Incorporated
- Chong Pyung An
- G01 - MEASURING TESTING
Information Patent Grant
Foreign substance/defect inspection device, image generation device...
- Patent number 12,292,386
- Issue date May 6, 2025
- VIENEX CORPORATION
- Yukihiro Kagawa
- G01 - MEASURING TESTING
Information Patent Grant
Crystallographic defect inspection
- Patent number 12,292,374
- Issue date May 6, 2025
- Camtek Ltd.
- Yuval Weissler
- G01 - MEASURING TESTING
Information Patent Grant
Deterioration diagnosis device, deterioration diagnosis method, and...
- Patent number 12,292,388
- Issue date May 6, 2025
- NEC Corporation
- Chisato Sugawara
- G01 - MEASURING TESTING
Information Patent Grant
Lamp with double-walled housing, for hyperspectral imaging
- Patent number 12,287,296
- Issue date Apr 29, 2025
- Parata Systems, LLC
- Dries Johannes Pruimboom
- F21 - LIGHTING
Information Patent Grant
Vehicle cleaning subsystem and method of cleaning a vehicle
- Patent number 12,285,536
- Issue date Apr 29, 2025
- Toyota Motor Engineering & Manufacturing North America, Inc.
- Paul D. Schmalenberg
- G01 - MEASURING TESTING
Information Patent Grant
Experimental set up for studying temperature gradient driven cracking
- Patent number 12,288,320
- Issue date Apr 29, 2025
- University of South Carolina
- Travis Knight
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pore measurement device
- Patent number 12,287,287
- Issue date Apr 29, 2025
- The Regents of the University of California
- Niall O'Dowd
- G01 - MEASURING TESTING
Information Patent Grant
System and method of object detection using AI deep learning models
- Patent number 12,288,390
- Issue date Apr 29, 2025
- QC Hero, Inc.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Ultra-micro defect detection apparatus and detection method thereof
- Patent number 12,288,318
- Issue date Apr 29, 2025
- Casi Vision Technology (Beijing) Co., Ltd.
- Feng Lei
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE
- Publication number 20250189458
- Publication date Jun 12, 2025
- GUDENG EQUIPMENT CO., LTD.
- Che-Wei Chan
- G01 - MEASURING TESTING
Information Patent Application
IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS
- Publication number 20250189459
- Publication date Jun 12, 2025
- Corning Incorporated
- Davide Giassi
- G01 - MEASURING TESTING
Information Patent Application
DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD
- Publication number 20250191173
- Publication date Jun 12, 2025
- Hitachi Astemo, Ltd.
- Yoshihiko KOBAYASHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD
- Publication number 20250189460
- Publication date Jun 12, 2025
- INGENTEC CORPORATION
- Chia-Liang LIN
- G01 - MEASURING TESTING
Information Patent Application
IMAGING
- Publication number 20250189457
- Publication date Jun 12, 2025
- Rolls-Royce plc
- Benjamin J MOORE
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Application
HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM
- Publication number 20250180488
- Publication date Jun 5, 2025
- Xerox Corporation
- Jeng PING LU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...
- Publication number 20250180489
- Publication date Jun 5, 2025
- TIAMA
- Olivier COLLE
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
HIGH INTENSITY ILLUMINATION SYSTEM AND METHODS OF USE THEREOF
- Publication number 20250178522
- Publication date Jun 5, 2025
- Carbon Autonomous Robotic Systems Inc.
- Alexander Igorevich SERGEEV
- B60 - VEHICLES IN GENERAL
Information Patent Application
DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...
- Publication number 20250183073
- Publication date Jun 5, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chen Min LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD
- Publication number 20250182720
- Publication date Jun 5, 2025
- Canon Kabushiki Kaisha
- Kenji SUGIYAMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...
- Publication number 20250172493
- Publication date May 29, 2025
- JEDEX INC.
- Jin Ho KIM
- G01 - MEASURING TESTING
Information Patent Application
3D CAMERAS OR SENSORS INPUTTING TO MULTI-MODAL GENERATIVE ARTIFICIA...
- Publication number 20250169698
- Publication date May 29, 2025
- Omni MedSci, Inc.
- Mohammed N. Islam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN
- Publication number 20250172503
- Publication date May 29, 2025
- Infineon Technologies Canada Inc.
- Iman ABDALI MASHHADI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR COMPLEX NON-INVASIVE MONITORING OF PHOTONS CAUSED BY THE...
- Publication number 20250166171
- Publication date May 22, 2025
- Volodymyr Pavlovich Rombakh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...
- Publication number 20250164407
- Publication date May 22, 2025
- NATIONAL UNIVERSITY CORPORATION TOKAI NATIONAL HIGHER EDUCATION AND RESEARCH...
- Shunta HARADA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...
- Publication number 20250164871
- Publication date May 22, 2025
- Intel Corporation
- Yoshihiro Tezuka
- G01 - MEASURING TESTING
Information Patent Application
DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM
- Publication number 20250167021
- Publication date May 22, 2025
- Axcelis Technologies, Inc.
- Phillip Geissbuhler
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...
- Publication number 20250162086
- Publication date May 22, 2025
- ATOP S.p.A.
- Massimiliano GIACHI
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
VISUAL TURBIDITY DETECTION DEVICE AND DETECTION METHOD THEREOF
- Publication number 20250164406
- Publication date May 22, 2025
- BEIJING TECHNOLOGY AND BUSINESS UNIVERSITY
- Xiaotao Sun
- G01 - MEASURING TESTING
Information Patent Application
POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS
- Publication number 20250164408
- Publication date May 22, 2025
- KLA Corporation
- Florian Melsheimer
- G05 - CONTROLLING REGULATING
Information Patent Application
SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION
- Publication number 20250164238
- Publication date May 22, 2025
- Applied Materials, Inc.
- Eric Chin Hong Ng
- G01 - MEASURING TESTING
Information Patent Application
Systems and Methods for Detection of Defects in Machine Surfaces
- Publication number 20250164409
- Publication date May 22, 2025
- MATTHEWS INTERNATIONAL CORPORATION
- Thomas HACKFORT
- G01 - MEASURING TESTING
Information Patent Application
Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...
- Publication number 20250164412
- Publication date May 22, 2025
- NUTECH VENTURES
- Zhigang Shen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Lock-in Averaging for Semiconductor Diagnostics
- Publication number 20250155381
- Publication date May 15, 2025
- IMEC vzw
- Kristof J.P. Jacobs
- G01 - MEASURING TESTING
Information Patent Application
WAFER METROLOGY TECHNOLOGIES
- Publication number 20250155486
- Publication date May 15, 2025
- FemtoMetrix, Inc.
- Viktor Koldiaev
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
- Publication number 20250155377
- Publication date May 15, 2025
- TOYOTA JIDOSHA KABUSHIKI KAISHA
- Shuta NEGORO
- G01 - MEASURING TESTING
Information Patent Application
COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...
- Publication number 20250155378
- Publication date May 15, 2025
- Carl Zeiss SMT GMBH
- Alexander Freytag
- G01 - MEASURING TESTING
Information Patent Application
MACHINE VISION SYSTEM UTILIZING AUTOFOCUS AND INSPECTION PROCESSES
- Publication number 20250146949
- Publication date May 8, 2025
- MITUTOYO CORPORATION
- Paul Gerard GLADNICK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
VISUAL INSPECTION SYSTEM AND METHOD
- Publication number 20250146951
- Publication date May 8, 2025
- CONTEMPORARY AMPEREX TECHNOLOGY CO., LIMITED
- Wushu LI
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR DETECTION OF ALKALI-SILICA REACTIVITY ON CONC...
- Publication number 20250146946
- Publication date May 8, 2025
- Board of Trustees of Western Michigan University
- Upul Attanayake
- G01 - MEASURING TESTING

Investigating the presence of flaws or contamination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Surface-defect detecting method, surface-defect detecting apparatus...

Reflective waveplates for pupil polarization filtering

Semiconductor inspection tool system and method for wafer edge insp...

Stroboscopic stepped illumination defect detection system

Detection method of crease degree of screen and visual detection ap...

System and method for detecting the presence of spores in fields

Light reflection support and through hole inspection system

Visual turbidity detection device and detection method thereof

Inspection device and inspection method

Dark-field confocal microscopy measurement apparatus based on vorte...

Foreign object debris discrimination with modulated laser light

Methods and apparatus for detecting defects in semiconductor systems

3D image acquisition system for optical inspection and method for o...

Integrated management of sensitive controlled environments and item...

Container leakage detection using thermal imaging

Inspection condition presentation apparatus, surface inspection app...

Continuous dust accumulation monitoring system with impaired optics...

Part control device and method

Windshield with optical windows for seal application

Visual inspection systems and methods

Apparatus and method for inspecting laser defect inside of transpar...

Foreign substance/defect inspection device, image generation device...

Crystallographic defect inspection

Deterioration diagnosis device, deterioration diagnosis method, and...

Lamp with double-walled housing, for hyperspectral imaging

Vehicle cleaning subsystem and method of cleaning a vehicle

Experimental set up for studying temperature gradient driven cracking

Pore measurement device

System and method of object detection using AI deep learning models

Ultra-micro defect detection apparatus and detection method thereof

Patents Applicationslast 30 patents

OPTICAL INSPECTION SYSTEM OF ELIMINATING IMAGE NOISE

IMAGING AND ANALYZING CRACK PROPAGATION IN GLASS

DEFECT INSPECTION APPARATUS AND DEFECT INSPECTION METHOD

WAFER DEFECT ANALYZING DEVICE AND WAFER DEFECT ANALYZING METHOD

IMAGING

HETEROGENEOUS CHIPLET ID USING PHOTOLUMINESCENCE IN uASSEMBLER SYSTEM

METHOD AND DEVICE FOR INSPECTING HOT GLASS CONTAINERS WITH A VIEW T...

HIGH INTENSITY ILLUMINATION SYSTEM AND METHODS OF USE THEREOF

DETECTING DAMAGED SEMICONDUCTOR WAFERS UTILIZING A SEMICONDUCTOR WA...

INFORMATION PROCESSING APPARATUS AND INFORMATION PROCESSING METHOD

OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING A...

3D CAMERAS OR SENSORS INPUTTING TO MULTI-MODAL GENERATIVE ARTIFICIA...

AUTOMATIC MAVERICK WAFER SCREENING USING DIE PASS PATTERN

METHOD FOR COMPLEX NON-INVASIVE MONITORING OF PHOTONS CAUSED BY THE...

POLARIZING MICROSCOPE, CRYSTAL DEFECT EVALUATION DEVICE, AND CRYSTA...

METHODS AND APPARATUS TO IMPROVE DETECTION OF DEFECTS IN PHOTOMASK...

DEPOSITION MONITOR FOR SEMICONDUCTOR MANUFACTURING SYSTEM

METHOD FOR QUALITY CONTROL OF A WELDING JOINT BETWEEN A PAIR OF END...

VISUAL TURBIDITY DETECTION DEVICE AND DETECTION METHOD THEREOF

POSITION FEEDBACK SENSOR USING OUT-OF-BAND WAVELENGTHS

SURFACE ROUGHNESS AND EMISSIVITY DETERMINATION

Systems and Methods for Detection of Defects in Machine Surfaces

Single-Pass 3D Reconstruction of Internal Surface of Pipelines Usin...

Lock-in Averaging for Semiconductor Diagnostics

WAFER METROLOGY TECHNOLOGIES

INSPECTION APPARATUS AND INSPECTION METHOD

COMPUTER IMPLEMENTED METHOD FOR DEFECT DETECTION IN AN IMAGING DATA...

MACHINE VISION SYSTEM UTILIZING AUTOFOCUS AND INSPECTION PROCESSES

VISUAL INSPECTION SYSTEM AND METHOD

DEVICE AND METHOD FOR DETECTION OF ALKALI-SILICA REACTIVITY ON CONC...