Investigating the presence of flaws or contamination

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G01N21/88

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/88Investigating the presence of flaws or contamination

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Method of inspecting joint portion of fluororesin member and fluoro...
- Patent number 12,366,536
- Issue date Jul 22, 2025
- Daikin Industries, Ltd.
- Masao Noumi
- G01 - MEASURING TESTING
Information Patent Grant
High intensity illumination systems and methods of use thereof
- Patent number 12,365,284
- Issue date Jul 22, 2025
- CARBON AUTONOMOUS ROBOTIC SYSTEMS INC.
- Alexander Igorevich Sergeev
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for detecting product for defects, electronic device, and st...
- Patent number 12,367,378
- Issue date Jul 22, 2025
- Hon Hai Precision Industry Co., Ltd.
- Chung-Yu Wu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image processing apparatus, image processing method, and program fo...
- Patent number 12,367,573
- Issue date Jul 22, 2025
- Canon Kabushiki Kaisha
- Kei Takayama
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,366,538
- Issue date Jul 22, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Measuring apparatus and method for roughness and/or defect measurem...
- Patent number 12,366,445
- Issue date Jul 22, 2025
- ASML Netherlands B.V.
- Alexander Von Finck
- G01 - MEASURING TESTING
Information Patent Grant
Image processing apparatus, image processing method, and storage me...
- Patent number 12,360,053
- Issue date Jul 15, 2025
- Canon Kabushiki Kaisha
- Kimitaka Arai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems, methods, and apparatus for providing interactive inspectio...
- Patent number 12,358,141
- Issue date Jul 15, 2025
- Gecko Robotics, Inc.
- Mark J. Loosararian
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Transmission apparatus, measurement system, and camera system
- Patent number 12,360,038
- Issue date Jul 15, 2025
- Canon Kabushiki Kaisha
- Takeaki Itsuji
- G01 - MEASURING TESTING
Information Patent Grant
Surface analysis of gemstones
- Patent number 12,360,049
- Issue date Jul 15, 2025
- Gemological Institute of America, Inc.
- Tsung-Han Tsai
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system and inspection method using the same
- Patent number 12,360,055
- Issue date Jul 15, 2025
- Samsung Display Co., Ltd.
- Sungwoo Jung
- G01 - MEASURING TESTING
Information Patent Grant
Reconstruction of a distorted image of an array of structural eleme...
- Patent number 12,361,526
- Issue date Jul 15, 2025
- Applied Materials Israel Ltd.
- Yehuda Cohen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,360,052
- Issue date Jul 15, 2025
- Shimadzu Corporation
- Takahide Hatahori
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Semiconductor apparatus examination method and semiconductor appara...
- Patent number 12,360,056
- Issue date Jul 15, 2025
- Hamamatsu Photonics K.K.
- Tomochika Takeshima
- G01 - MEASURING TESTING
Information Patent Grant
Protective sheet fixing jig and auto visual inspection system inclu...
- Patent number 12,352,699
- Issue date Jul 8, 2025
- Samsung Display Co., Ltd.
- Woongil Choi
- G01 - MEASURING TESTING
Information Patent Grant
Method of forming optical proximity correction model and method of...
- Patent number 12,354,920
- Issue date Jul 8, 2025
- Samsung Electronics Co., Ltd.
- Sang Chul Yeo
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Metrology system for measuring edge of circular workpiece
- Patent number 12,352,704
- Issue date Jul 8, 2025
- Mitutoyo Corporation
- Christopher Richard Hamner
- G01 - MEASURING TESTING
Information Patent Grant
Shape reconstruction method and image measurement device
- Patent number 12,352,558
- Issue date Jul 8, 2025
- Machine Vision Lighting Inc.
- Shigeki Masumura
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for inspection of a subject article
- Patent number 12,345,652
- Issue date Jul 1, 2025
- SENS-TECH LTD.
- Stephen Jaye
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus
- Patent number 12,345,653
- Issue date Jul 1, 2025
- Shimadzu Corporation
- Hiroshi Horikawa
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection device, defect inspection method, and adjustment...
- Patent number 12,345,654
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Yuta Urano
- G01 - MEASURING TESTING
Information Patent Grant
Subsurface defect detecting device for cylindrical components and m...
- Patent number 12,345,655
- Issue date Jul 1, 2025
- Taiyuan University of Technology
- Yanjie Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Large-particle monitoring with laser power control for defect inspe...
- Patent number 12,345,658
- Issue date Jul 1, 2025
- KLA Corporation
- Anatoly Romanovsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for detecting an amorphous and/or crystalline...
- Patent number 12,345,634
- Issue date Jul 1, 2025
- Omya International AG
- Roger Bollstrom
- G01 - MEASURING TESTING
Information Patent Grant
Blister-strip inspection device
- Patent number 12,347,097
- Issue date Jul 1, 2025
- BLISTER PARTNERS HOLDING BV
- Gijsbert Olivier Van Schelven
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Systems and methods for the in-line measurement of alkali metal-con...
- Patent number 12,345,640
- Issue date Jul 1, 2025
- Elevated Materials US LLC
- Subramanya P. Herle
- G01 - MEASURING TESTING
Information Patent Grant
Defect inspection apparatus and defect inspection method
- Patent number 12,345,661
- Issue date Jul 1, 2025
- HITACHI HIGH-TECH CORPORATION
- Toshifumi Honda
- G01 - MEASURING TESTING
Information Patent Grant
Simultaneous back and/or front and/or bulk defect detection
- Patent number 12,339,235
- Issue date Jun 24, 2025
- Onto Innovation Inc.
- Felix Moellmann
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determination of textile fiber composition
- Patent number 12,339,224
- Issue date Jun 24, 2025
- VALVAN NV
- Frank Vandeputte
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device and inspection method
- Patent number 12,339,238
- Issue date Jun 24, 2025
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Shozo Oshio
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR MEASURING DEFECT IN MOLDED PRODUCT SURFACE
- Publication number 20250237614
- Publication date Jul 24, 2025
- ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE
- Yong Kwi LEE
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and Method To Handle Lax Objects
- Publication number 20250239386
- Publication date Jul 24, 2025
- TE Connectivity Solutions GMBH
- Swapnilsinh Solanki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFECT ANALYZER, METHOD FOR ANALYZING DEFECT, AND PROGRAM
- Publication number 20250239050
- Publication date Jul 24, 2025
- Resonac Corporation
- Yu OKANO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Apparatus and method for treating plastics preforms
- Publication number 20250231118
- Publication date Jul 17, 2025
- KRONES AG
- Florian GELTINGER
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Application
SYSTEM AND METHOD OF OBJECT DETECTION USING AI DEEP LEARNING
- Publication number 20250232573
- Publication date Jul 17, 2025
- QC HERO, INC.
- Michael A. Walt
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION OF OPTICAL COMPONENTS IN OPTICAL SYSTEMS
- Publication number 20250231081
- Publication date Jul 17, 2025
- VIAVI SOLUTIONS INC.
- Eugene CHAN
- G01 - MEASURING TESTING
Information Patent Application
System for Measuring Microplastics in an Aquatic Environment
- Publication number 20250231115
- Publication date Jul 17, 2025
- Ely Oser
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR OBSERVING SURFACE
- Publication number 20250231116
- Publication date Jul 17, 2025
- TOKYO ELECTRON LIMITED
- Shin OOWADA
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF MEASURING AN ANGLE BETWEEN TWO SURFACES
- Publication number 20250231117
- Publication date Jul 17, 2025
- Baker Hughes Holdings LLC
- Clark A. Bendall
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION...
- Publication number 20250231119
- Publication date Jul 17, 2025
- NEC Corporation
- Michiaki INOUE
- G01 - MEASURING TESTING
Information Patent Application
VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFER...
- Publication number 20250231122
- Publication date Jul 17, 2025
- GM GLOBAL TECHNOLOGY OPERATIONS LLC
- Guangze LI
- G01 - MEASURING TESTING
Information Patent Application
LEATHER DEFECT DETECTION SYSTEM
- Publication number 20250232428
- Publication date Jul 17, 2025
- Feng Chia University
- Sze Teng LIONG
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE SENSOR WITH OXIDE FREE WAFER BONDED STRUCTURES AND METHODS FO...
- Publication number 20250231114
- Publication date Jul 17, 2025
- KLA Corporation
- Yajun Wei
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
OPTICAL DEVICE AND METHOD FOR TRAINING MACHINE LEARNING MODEL FOR W...
- Publication number 20250231102
- Publication date Jul 17, 2025
- Samsung SDI Co., Ltd.
- Joonkil Kim
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
INSPECTION ASSISTANCE SYSTEM, INSPECTION ASSISTANCE METHOD, AND INS...
- Publication number 20250225643
- Publication date Jul 10, 2025
- Mitsubishi Heavy Industries, Ltd.
- Shota ISHII
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR MEASURING SEMICONDUCTORS
- Publication number 20250224328
- Publication date Jul 10, 2025
- Samsung Electronics Co., Ltd.
- Sangwoo BAE
- G01 - MEASURING TESTING
Information Patent Application
Electrode Sheet Defect Inspection Device
- Publication number 20250224341
- Publication date Jul 10, 2025
- LG ENERGY SOLUTION, LTD.
- Jong Hwa Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...
- Publication number 20250225641
- Publication date Jul 10, 2025
- HEFEI GENERAL MACHINERY RESEARCH INSTITUTE CO., LTD
- Tao CHEN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS AND METHOD WITH DEFECT DETECTION
- Publication number 20250225647
- Publication date Jul 10, 2025
- Samsung Electro-Mechanics Co., Ltd.
- Dongjin PARK
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
HIGH INTENSITY ILLUMINATION SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20250214506
- Publication date Jul 3, 2025
- Carbon Autonomous Robotic Systems Inc.
- Alexander Igorevich SERGEEV
- B60 - VEHICLES IN GENERAL
Information Patent Application
METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE
- Publication number 20250216343
- Publication date Jul 3, 2025
- CHENG MEI INSTRUMENT TECHNOLOGY CO., LTD.
- CHIH-YUAN LIN
- G01 - MEASURING TESTING
Information Patent Application
SUBSTRATE PROCESSING APPARATUS, PHOTOGRAPHING UNIT AND LIQUID PROCE...
- Publication number 20250218812
- Publication date Jul 3, 2025
- SEMES CO., LTD.
- Oh Yeol KWON
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT DETECTION AND CLASSIFICATION (FDC) FOR ENDPOINT DETECTION (EP...
- Publication number 20250216336
- Publication date Jul 3, 2025
- TOKYO ELECTRON LIMITED
- Colin PILCHER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CA...
- Publication number 20250216255
- Publication date Jul 3, 2025
- NANJING INSTITUTE OF ASTRONOMICAL OPTICS & TECHNOLOGY, CHINESE ACADEMY OF SCI...
- Jinping HE
- G01 - MEASURING TESTING
Information Patent Application
Device And Method For Determining Defects In A Part Or Presence Of...
- Publication number 20250217955
- Publication date Jul 3, 2025
- INSTITUTO TECNOLOGICO DE INFORMATICA
- Javier Pérez Soler
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE
- Publication number 20250209607
- Publication date Jun 26, 2025
- Pratt & Whitney Canada Corp.
- Michael Morash
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
BIOLOGICAL SAMPLE ANALYZER CALIBRATION AND CONTROL
- Publication number 20250208058
- Publication date Jun 26, 2025
- Beckman Coulter, Inc.
- Jose Chacon
- G01 - MEASURING TESTING
Information Patent Application
ARTIFICIAL LYOPHILIZED PRODUCT SAMPLES FOR AUTOMATED VISUAL INSPECT...
- Publication number 20250208054
- Publication date Jun 26, 2025
- Amgen Inc.
- Thomas Clark Pearson
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Laser scanning of cable and cable accessory components subjected to...
- Publication number 20250208062
- Publication date Jun 26, 2025
- NEXANS
- Espen DOEDENS
- G01 - MEASURING TESTING
Information Patent Application
Method of Using a Sterilization Wrap System
- Publication number 20250205994
- Publication date Jun 26, 2025
- O&M Halyard, Inc.
- Jeffrey James Farmer
- B32 - LAYERED PRODUCTS

Investigating the presence of flaws or contamination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method of inspecting joint portion of fluororesin member and fluoro...

High intensity illumination systems and methods of use thereof

Method for detecting product for defects, electronic device, and st...

Image processing apparatus, image processing method, and program fo...

Defect inspection apparatus and defect inspection method

Measuring apparatus and method for roughness and/or defect measurem...

Image processing apparatus, image processing method, and storage me...

Systems, methods, and apparatus for providing interactive inspectio...

Transmission apparatus, measurement system, and camera system

Surface analysis of gemstones

Inspection system and inspection method using the same

Reconstruction of a distorted image of an array of structural eleme...

Defect inspection apparatus and defect inspection method

Semiconductor apparatus examination method and semiconductor appara...

Protective sheet fixing jig and auto visual inspection system inclu...

Method of forming optical proximity correction model and method of...

Metrology system for measuring edge of circular workpiece

Shape reconstruction method and image measurement device

Method and apparatus for inspection of a subject article

Defect inspection apparatus

Defect inspection device, defect inspection method, and adjustment...

Subsurface defect detecting device for cylindrical components and m...

Large-particle monitoring with laser power control for defect inspe...

Method and apparatus for detecting an amorphous and/or crystalline...

Blister-strip inspection device

Systems and methods for the in-line measurement of alkali metal-con...

Defect inspection apparatus and defect inspection method

Simultaneous back and/or front and/or bulk defect detection

Method and apparatus for determination of textile fiber composition

Inspection device and inspection method

Patents Applicationslast 30 patents

APPARATUS AND METHOD FOR MEASURING DEFECT IN MOLDED PRODUCT SURFACE

System and Method To Handle Lax Objects

DEFECT ANALYZER, METHOD FOR ANALYZING DEFECT, AND PROGRAM

Apparatus and method for treating plastics preforms

SYSTEM AND METHOD OF OBJECT DETECTION USING AI DEEP LEARNING

INSPECTION OF OPTICAL COMPONENTS IN OPTICAL SYSTEMS

System for Measuring Microplastics in an Aquatic Environment

METHOD FOR OBSERVING SURFACE

SYSTEM AND METHOD OF MEASURING AN ANGLE BETWEEN TWO SURFACES

INSPECTION APPARATUS, INSPECTION SYSTEM, CONTROL DEVICE, INSPECTION...

VISION INSPECTION SYSTEMS AND METHODS USING LIGHT SOURCES OF DIFFER...

LEATHER DEFECT DETECTION SYSTEM

IMAGE SENSOR WITH OXIDE FREE WAFER BONDED STRUCTURES AND METHODS FO...

OPTICAL DEVICE AND METHOD FOR TRAINING MACHINE LEARNING MODEL FOR W...

INSPECTION ASSISTANCE SYSTEM, INSPECTION ASSISTANCE METHOD, AND INS...

DEVICE FOR MEASURING SEMICONDUCTORS

Electrode Sheet Defect Inspection Device

CREEPAGE STAGE DETERMINATION SYSTEMS AND METHODS FOR ALUMINUM-CONTA...

APPARATUS AND METHOD WITH DEFECT DETECTION

HIGH INTENSITY ILLUMINATION SYSTEMS AND METHODS OF USE THEREOF

METHOD AND DEVICE OF INSPECTING SURFACE OF INTERCONNECT STRUCTURE

SUBSTRATE PROCESSING APPARATUS, PHOTOGRAPHING UNIT AND LIQUID PROCE...

FAULT DETECTION AND CLASSIFICATION (FDC) FOR ENDPOINT DETECTION (EP...

APPARATUS AND METHOD FOR SPECTRUM DETECTION BY DEFECT SCATTERING CA...

Device And Method For Determining Defects In A Part Or Presence Of...

METHOD TO QUALIFY ADDITIONAL DIES AFTER MASTER DIE

BIOLOGICAL SAMPLE ANALYZER CALIBRATION AND CONTROL

ARTIFICIAL LYOPHILIZED PRODUCT SAMPLES FOR AUTOMATED VISUAL INSPECT...

Laser scanning of cable and cable accessory components subjected to...

Method of Using a Sterilization Wrap System