Investigating the presence of flaws or contamination

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G01N21/88

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N21/00Investigating or analysing materials by the use of optical means

Current Industry

G01N21/88Investigating the presence of flaws or contamination

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Aquatic environment monitoring and dosing systems and apparatuses,...
- Patent number 12,169,176
- Issue date Dec 17, 2024
- The LaMotte Chemical Products Company
- James E. Clark
- G01 - MEASURING TESTING
Information Patent Grant
Container visual inspection assembly and method
- Patent number 12,169,177
- Issue date Dec 17, 2024
- Amgen Inc.
- Graham F. Milne
- G01 - MEASURING TESTING
Information Patent Grant
Optical diagnostics of semiconductor process using hyperspectral im...
- Patent number 12,165,937
- Issue date Dec 10, 2024
- Tokyo Electron Limited
- Yan Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for optical inspection of a substrate using same or differen...
- Patent number 12,163,899
- Issue date Dec 10, 2024
- UNITY SEMICONDUCTOR
- Mayeul Durand de Gevigney
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor failure analysis device
- Patent number 12,163,900
- Issue date Dec 10, 2024
- Hamamatsu Photonics K.K.
- Masataka Ikesu
- G01 - MEASURING TESTING
Information Patent Grant
Device and method for transformer in-situ inspection
- Patent number 12,163,896
- Issue date Dec 10, 2024
- HITACHI ENERGY LTD
- Luiz V. Cheim
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
System and method for inspecting a component for anomalous regions
- Patent number 12,163,970
- Issue date Dec 10, 2024
- RTX Corporation
- Brigid A. Blakeslee
- G01 - MEASURING TESTING
Information Patent Grant
System, apparatus and method for improved location identification w...
- Patent number 12,162,160
- Issue date Dec 10, 2024
- Gecko Robotics, Inc.
- Alberto Pinero
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Method for multivariate testing, development, and validation of a m...
- Patent number 12,158,432
- Issue date Dec 3, 2024
- Stratasys, Inc.
- Joel Ong
- B33 - ADDITIVE MANUFACTURING TECHNOLOGY
Information Patent Grant
Device for optical inspection of preforms
- Patent number 12,158,433
- Issue date Dec 3, 2024
- Sacmi Cooperativa Meccanici Imola Societa Cooperativa
- Donato Laico
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Die inspection method and apparatus
- Patent number 12,152,995
- Issue date Nov 26, 2024
- ONTARIO DIE INTERNATIONAL INC.
- Wesley Elton Scott
- G01 - MEASURING TESTING
Information Patent Grant
Method for predicting reliability of semiconductor device
- Patent number 12,152,997
- Issue date Nov 26, 2024
- Renesas Electronics Corporation
- Takuo Funaya
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Vehicle inspection method and vehicle inspection system
- Patent number 12,151,754
- Issue date Nov 26, 2024
- Toyota Jidosha Kabushiki Kaisha
- Tatsuhiro Takahashi
- B62 - LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS
Information Patent Grant
Laser based inclusion detection system and methods
- Patent number 12,152,999
- Issue date Nov 26, 2024
- Corning Incorporated
- Souma Chaudhury
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system, inspection method, and inspection program
- Patent number 12,148,145
- Issue date Nov 19, 2024
- Mitsubishi Heavy Industries, Ltd.
- Takahiro Tachibana
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Portable inspection, collection, and delivery apparatus for fluid-b...
- Patent number 12,146,837
- Issue date Nov 19, 2024
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Deep learning-based crack segmentation through heterogeneous image...
- Patent number 12,146,838
- Issue date Nov 19, 2024
- The Board of Trustees of the University of Alabama
- Wei Song
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Sewing error management device, sewing error management system, and...
- Patent number 12,146,249
- Issue date Nov 19, 2024
- Brother Kogyo Kabushiki Kaisha
- Yuta Kamihira
- D05 - SEWING EMBROIDERING TUFTING
Information Patent Grant
Product-inspection apparatus, product-inspection method, and non-tr...
- Patent number 12,148,143
- Issue date Nov 19, 2024
- NEC Corporation
- Keiko Inoue
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Deep learning system applicable for quality inspection by learning...
- Patent number 12,146,839
- Issue date Nov 19, 2024
- INTER X Co., Ltd.
- Ha Il Jung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cutter analysis and mapping
- Patent number 12,141,960
- Issue date Nov 12, 2024
- Halliburton Energy Services, Inc.
- William Brian Atkins
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Single pass automated vehicle inspection system and method
- Patent number 12,140,501
- Issue date Nov 12, 2024
- UVEYE LTD.
- Ohad Hever
- G01 - MEASURING TESTING
Information Patent Grant
Imaging device, inspection apparatus and inspection method
- Patent number 12,135,294
- Issue date Nov 5, 2024
- Toyo Seikan Co., Ltd.
- Tatsuya Shirasaka
- G01 - MEASURING TESTING
Information Patent Grant
Method for checking compliance of a mechanical part of a vehicle
- Patent number 12,135,293
- Issue date Nov 5, 2024
- JTEKT Europe
- Sarah Tallet-Pinet
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Angle independent optical surface inspector
- Patent number 12,130,243
- Issue date Oct 29, 2024
- Lumina Instruments Inc.
- Steven W. Meeks
- G01 - MEASURING TESTING
Information Patent Grant
Method for evaluating the optical quality of a delineated region of...
- Patent number 12,130,244
- Issue date Oct 29, 2024
- Saint-Gobain Glass France
- Théo Rybarczyk
- G01 - MEASURING TESTING
Information Patent Grant
Monitoring copper corrosion in an integrated circuit device
- Patent number 12,130,241
- Issue date Oct 29, 2024
- Microchip Technology Incorporated
- Yaojian Leng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inspection system of semiconductor wafer and method of driving the...
- Patent number 12,130,242
- Issue date Oct 29, 2024
- Samsung Electronics Co., Ltd.
- Doyoung Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-functional precious stone testing apparatus and method thereof
- Patent number 12,130,238
- Issue date Oct 29, 2024
- Shenzhen Dikai Industrial Co., Ltd.
- Xiuling Zhu
- G01 - MEASURING TESTING
Information Patent Grant
Construction inspection robotic system and method thereof
- Patent number 12,130,239
- Issue date Oct 29, 2024
- Bingbing Li
- G08 - SIGNALLING

Patents Applicationslast 30 patents

Information Patent Application
FOREIGN MATERIAL INSPECTION SYSTEM
- Publication number 20240420314
- Publication date Dec 19, 2024
- Prospection Solutions, LLC
- Jeff YOUNGS
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Application
DETERMINING THE DEGREE OF FOULING OF A TRANSMISSIVE ELEMENT
- Publication number 20240416464
- Publication date Dec 19, 2024
- BYSTRONIC LASER AG
- Benjamin KALLEN
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
MONITORING SYSTEM AND OPERATING METHOD THEREOF
- Publication number 20240419144
- Publication date Dec 19, 2024
- LG ENERGY SOLUTION, LTD.
- Min Kyu SIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS
- Publication number 20240420309
- Publication date Dec 19, 2024
- Hendtech LLC
- Andrew Henderson
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD
- Publication number 20240410835
- Publication date Dec 12, 2024
- AUROS Technology, Inc.
- Seong Yun CHOI
- G01 - MEASURING TESTING
Information Patent Application
INFRARED DETECTION CAMERA
- Publication number 20240402090
- Publication date Dec 5, 2024
- Laser & Plasma Technologies, LLC
- Mool C. GUPTA
- G01 - MEASURING TESTING
Information Patent Application
AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...
- Publication number 20240402092
- Publication date Dec 5, 2024
- Hamamatsu Photonics K.K.
- Akira SHIMASE
- G02 - OPTICS
Information Patent Application
PROTECTIVE GLASS CONTAMINATION DETECTION DEVICE AND PROTECTIVE GLAS...
- Publication number 20240402095
- Publication date Dec 5, 2024
- AMADA CO., LTD.
- Tatsuya AMANO
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR IDENTIFYING AND CHARACTERIZING, BY MEANS OF ARTIFICIAL I...
- Publication number 20240404032
- Publication date Dec 5, 2024
- Brembo S.p.A.
- Stefano BELOTTI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION
- Publication number 20240402615
- Publication date Dec 5, 2024
- KLA Corporation
- Yaniv Weiss
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
MEASUREMENTS USING CAMERA IMAGING TISSUE COMPRISING SKIN OR THE HAND
- Publication number 20240398237
- Publication date Dec 5, 2024
- Mohammed N. ISLAM
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY
- Publication number 20240402083
- Publication date Dec 5, 2024
- Honeywell International Inc.
- Kuna Venkat Satya Rama KISHORE
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...
- Publication number 20240402093
- Publication date Dec 5, 2024
- ASML NETHERLANDS B.V.
- Xiaodong MENG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
System and Method for Inspecting Outer Appearance
- Publication number 20240405301
- Publication date Dec 5, 2024
- LG ENERGY SOLUTION, LTD.
- Geun Tae Kim
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD OF INSPECTING MOVING OBJECT
- Publication number 20240393256
- Publication date Nov 28, 2024
- Toyota Jidosha Kabushiki Kaisha
- Kento IWAHORI
- G01 - MEASURING TESTING
Information Patent Application
MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...
- Publication number 20240397185
- Publication date Nov 28, 2024
- ORBOTECH LTD.
- Yigal KATZIR
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
ACTIVE REMOTE SENSING OF ATMOSPHERIC GASES OR SMOKE USING A TIME-OF...
- Publication number 20240389858
- Publication date Nov 28, 2024
- Mohammed N. ISLAM
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Sensor Housing for a Sensor Module
- Publication number 20240393257
- Publication date Nov 28, 2024
- Aptiv Technologies AG
- Pawel Szuba
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
GEMSTONE ANALYSIS DEVICE, SYSTEM, AND METHOD USING NEURAL NETWORKS
- Publication number 20240393255
- Publication date Nov 28, 2024
- Parikh Holdings LLC
- Aniket Parikh
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240393258
- Publication date Nov 28, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING WAFERS
- Publication number 20240393261
- Publication date Nov 28, 2024
- PRECITEC OPTRONIK GMBH
- Tobias Beck
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...
- Publication number 20240385123
- Publication date Nov 21, 2024
- TIAMA
- Olivier COLLE
- G01 - MEASURING TESTING
Information Patent Application
SPUTTER MEASUREMENT SYSTEM
- Publication number 20240383077
- Publication date Nov 21, 2024
- Prime Planet Energy & Solutions, Inc.
- Takashi YOSHIDA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
ELECTRIFIED COMPONENT HAIRPIN INSPECTION DEVICE
- Publication number 20240385120
- Publication date Nov 21, 2024
- VIEWON CO., LTD.
- Young Wook YOON
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS
- Publication number 20240385125
- Publication date Nov 21, 2024
- WICKON HIGHTECH GMBH
- Roman WIESER
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...
- Publication number 20240385121
- Publication date Nov 21, 2024
- Musashi AI North America Inc.
- Saeed Bakhshmand
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION METHOD BASED ON EDGE FIELD AND DEEP LEARNING
- Publication number 20240385122
- Publication date Nov 21, 2024
- COGNEX CORPORATION
- Hunmin CHO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ESTIMATING A CONDITION OF A PHYSICAL STRUCTURE
- Publication number 20240378813
- Publication date Nov 14, 2024
- State Farm Mutual Automobile Insurance Company
- James M. Freeman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DEVICE FOR PREDICTING THE EVOLUTION OF A DEFECT OF A BEARING, ASSOC...
- Publication number 20240377283
- Publication date Nov 14, 2024
- Aktiebolaget SKF
- Mourad CHENNAOUI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS
- Publication number 20240377335
- Publication date Nov 14, 2024
- NuFlare Technology, Inc.
- Masaya TAKEDA
- G01 - MEASURING TESTING

Investigating the presence of flaws or contamination

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Aquatic environment monitoring and dosing systems and apparatuses,...

Container visual inspection assembly and method

Optical diagnostics of semiconductor process using hyperspectral im...

System for optical inspection of a substrate using same or differen...

Semiconductor failure analysis device

Device and method for transformer in-situ inspection

System and method for inspecting a component for anomalous regions

System, apparatus and method for improved location identification w...

Method for multivariate testing, development, and validation of a m...

Device for optical inspection of preforms

Die inspection method and apparatus

Method for predicting reliability of semiconductor device

Vehicle inspection method and vehicle inspection system

Laser based inclusion detection system and methods

Inspection system, inspection method, and inspection program

Portable inspection, collection, and delivery apparatus for fluid-b...

Deep learning-based crack segmentation through heterogeneous image...

Sewing error management device, sewing error management system, and...

Product-inspection apparatus, product-inspection method, and non-tr...

Deep learning system applicable for quality inspection by learning...

Cutter analysis and mapping

Single pass automated vehicle inspection system and method

Imaging device, inspection apparatus and inspection method

Method for checking compliance of a mechanical part of a vehicle

Angle independent optical surface inspector

Method for evaluating the optical quality of a delineated region of...

Monitoring copper corrosion in an integrated circuit device

Inspection system of semiconductor wafer and method of driving the...

Multi-functional precious stone testing apparatus and method thereof

Construction inspection robotic system and method thereof

Patents Applicationslast 30 patents

FOREIGN MATERIAL INSPECTION SYSTEM

DETERMINING THE DEGREE OF FOULING OF A TRANSMISSIVE ELEMENT

MONITORING SYSTEM AND OPERATING METHOD THEREOF

SYSTEM AND METHOD FOR GRADING, PROCESSING, AND LOADING LOGS

OVERLAY MEASUREMENT APPARATUS AND OVERLAY MEASUREMENT METHOD

INFRARED DETECTION CAMERA

AUTOFOCUS ASSISTANCE METHOD, AUTOFOCUS ASSISTANCE DEVICE, AND AUTOF...

PROTECTIVE GLASS CONTAMINATION DETECTION DEVICE AND PROTECTIVE GLAS...

METHOD FOR IDENTIFYING AND CHARACTERIZING, BY MEANS OF ARTIFICIAL I...

SINGLE GRAB PUPIL LANDSCAPE VIA BROADBAND ILLUMINATION

MEASUREMENTS USING CAMERA IMAGING TISSUE COMPRISING SKIN OR THE HAND

METHODS AND APPARATUSES FOR MEASURING FLUID COMPOSITION AND TURBIDITY

METHOD AND SYSTEM OF SAMPLE EDGE DETECTION AND SAMPLE POSITIONING F...

System and Method for Inspecting Outer Appearance

INSPECTION METHOD OF INSPECTING MOVING OBJECT

MULTIPLEXED PHOTON EMITTER AND CAMERA CONFIGURATION FOR AN IMAGE AC...

ACTIVE REMOTE SENSING OF ATMOSPHERIC GASES OR SMOKE USING A TIME-OF...

Sensor Housing for a Sensor Module

GEMSTONE ANALYSIS DEVICE, SYSTEM, AND METHOD USING NEURAL NETWORKS

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

APPARATUS AND METHOD FOR MEASURING WAFERS

OPTICAL COMPUTING METHODS AND SYSTEMS FOR INSPECTING A GLASS CONTAI...

SPUTTER MEASUREMENT SYSTEM

ELECTRIFIED COMPONENT HAIRPIN INSPECTION DEVICE

INSPECTION SYSTEM AND METHOD FOR ANALYZING FAULTS

SYSTEM, METHOD, AND COMPUTER DEVICE FOR AUTOMATED VISUAL INSPECTION...

INSPECTION METHOD BASED ON EDGE FIELD AND DEEP LEARNING

ESTIMATING A CONDITION OF A PHYSICAL STRUCTURE

DEVICE FOR PREDICTING THE EVOLUTION OF A DEFECT OF A BEARING, ASSOC...

PATTERN INSPECTION METHOD AND PATTERN INSPECTION APPARATUS