Investigating the presence of flaws

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G01N23/18

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N23/00Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00

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G01N23/18Investigating the presence of flaws

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Specimen radiography system comprising a cabinet and a specimen dra...
- Patent number 12,364,443
- Issue date Jul 22, 2025
- Hologic, Inc.
- Kenneth Defreitas
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Detection method for the radiation-induced defects of oxide layer i...
- Patent number 12,352,708
- Issue date Jul 8, 2025
- Harbin Institute of Technology
- Xingji Li
- G01 - MEASURING TESTING
Information Patent Grant
Flexible digital detector array
- Patent number 12,352,709
- Issue date Jul 8, 2025
- Baker Hughes Holdings LLC
- Kwang Hyup An
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Inline scanning and cutting assembly and method of operation
- Patent number 12,350,747
- Issue date Jul 8, 2025
- Eagle Machinery & Supply, Inc.
- Andrew D. Timmer
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,337,216
- Issue date Jun 24, 2025
- Topgolf Callaway Brands Corp.
- Megan Ilnicky
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Method and system for inspecting quality of tire member
- Patent number 12,325,202
- Issue date Jun 10, 2025
- The Yokohama Rubber Co., Ltd.
- Mitsuo Tsuji
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Method and system utilizing imaging analysis for golf balls
- Patent number 12,311,236
- Issue date May 27, 2025
- Topgolf Callaway Brands Corp.
- Julie Caterina
- A63 - SPORTS GAMES AMUSEMENTS
Information Patent Grant
Transmission image-based non-destructive inspecting method, method...
- Patent number 12,315,135
- Issue date May 27, 2025
- RAYDISOFT INC.
- Seok Won Lee
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection apparatus and X-ray inspection method
- Patent number 12,313,572
- Issue date May 27, 2025
- Anritsu Corporation
- Masaru Ishida
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for defects detection and classification using...
- Patent number 12,307,668
- Issue date May 20, 2025
- Bruker Nano, Inc.
- David Lewis Adler
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for detecting defects in semiconductor systems
- Patent number 12,306,112
- Issue date May 20, 2025
- AXIOMATIQUE TECHNOLOGIES, INC.
- Trevor A. Norman
- G01 - MEASURING TESTING
Information Patent Grant
Radiation inspection apparatus including a radiation detector compr...
- Patent number 12,306,358
- Issue date May 20, 2025
- DRTECH CORP
- Beom Jin Moon
- G01 - MEASURING TESTING
Information Patent Grant
Customizable axes of rotation for industrial radiography systems
- Patent number 12,298,260
- Issue date May 13, 2025
- Illinois Tool Works Inc.
- Joseph Schlecht
- G01 - MEASURING TESTING
Information Patent Grant
Inspection device, packaging sheet manufacturing device, and packag...
- Patent number 12,291,368
- Issue date May 6, 2025
- CKD Corporation
- Takamasa Ohtani
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Article inspection verification system
- Patent number 12,287,347
- Issue date Apr 29, 2025
- Anritsu Corporation
- Eiji Asai
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
State change tracking device, X-ray imaging system, state change tr...
- Patent number 12,276,622
- Issue date Apr 15, 2025
- Konica Minolta, Inc.
- Tadashi Arimoto
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Foreign matter inspection device
- Patent number 12,276,623
- Issue date Apr 15, 2025
- Hamamatsu Photonics K.K.
- Kunihiko Tsuchiya
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for monitoring feature sizes in digital X-ray i...
- Patent number 12,270,770
- Issue date Apr 8, 2025
- QSA GLOBAL INC.
- Paul Benson
- G01 - MEASURING TESTING
Information Patent Grant
Material detection in X-ray security screening
- Patent number 12,270,772
- Issue date Apr 8, 2025
- Rapiscan Holdings, Inc.
- Simon Archambault
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray inspection device and x-ray inspection system
- Patent number 12,270,771
- Issue date Apr 8, 2025
- SEC CO., LTD.
- Jong Hui Kim
- B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information Patent Grant
Food product quality control system
- Patent number 12,258,221
- Issue date Mar 25, 2025
- Ishida Europe Limited
- Graham Neale
- A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information Patent Grant
Jet blades optical inspection
- Patent number 12,253,481
- Issue date Mar 18, 2025
- AEROSPACE INDUSTRIAL SCAN LTD.
- Lior Greenstein
- G01 - MEASURING TESTING
Information Patent Grant
Inspection apparatus and inspection method
- Patent number 12,241,848
- Issue date Mar 4, 2025
- Canon Anelva Corporation
- Takeo Tsukamoto
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
X-ray inspection apparatus
- Patent number 12,222,301
- Issue date Feb 11, 2025
- ISHIDA CO., LTD.
- Ken Iwakawa
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting fused plastic pipes
- Patent number 12,203,873
- Issue date Jan 21, 2025
- WorldWide Nondestructive Testing, Inc.
- Kevin P. Bohne
- B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information Patent Grant
Image processing and detection of discontinuities in battery cells
- Patent number 12,203,880
- Issue date Jan 21, 2025
- GM Global Technology Operations LLC
- Sean Robert Wagner
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for monitoring and/or calibrating a device designed for the...
- Patent number 12,203,878
- Issue date Jan 21, 2025
- Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
- Felix Porsch
- G01 - MEASURING TESTING
Information Patent Grant
System and method for inspecting defects of structure by using X-ray
- Patent number 12,181,426
- Issue date Dec 31, 2024
- NEUF Inc.
- Myoung Chan Na
- G01 - MEASURING TESTING
Information Patent Grant
Image pickup device and image generation method
- Patent number 12,181,425
- Issue date Dec 31, 2024
- Kioxia Corporation
- Takeshi Yamane
- G01 - MEASURING TESTING
Information Patent Grant
Method for computed tomography examination of fragments in gel block
- Patent number 12,174,213
- Issue date Dec 24, 2024
- The United States of America, as represented by the Secretary of the Navy
- Kyle D. Stoll
- F42 - AMMUNITION BLASTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD TO OBTAIN INFORMATION TO CONTROL A MANUFACTURING PROCESS FOR...
- Publication number 20250239494
- Publication date Jul 24, 2025
- Carl Zeiss SMT GMBH
- Christian Lutzweiler
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD
- Publication number 20250231124
- Publication date Jul 17, 2025
- Hitachi High-Tech Corporation
- Yoshihiro ANAN
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD
- Publication number 20250224348
- Publication date Jul 10, 2025
- TORAY INDUSTRIES, INC.
- Takahiro MURAI
- G01 - MEASURING TESTING
Information Patent Application
Inspection Method and Inspection Device
- Publication number 20250224349
- Publication date Jul 10, 2025
- Shimadzu Corporation
- Koichi TANABE
- G01 - MEASURING TESTING
Information Patent Application
RADIO/MICROWAVE FREQUENCY SENSOR FOR ANALYZING AGRICULTURAL EQUIPMENT
- Publication number 20250208069
- Publication date Jun 26, 2025
- Know Labs, Inc.
- Dominic KLYVE
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
IDENTIFICATION DEVICE, IDENTIFICATION METHOD, AND IDENTIFICATION PR...
- Publication number 20250208070
- Publication date Jun 26, 2025
- IHI Corporation
- Takanori KAMAGATA
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
- Publication number 20250189465
- Publication date Jun 12, 2025
- SK On Co., Ltd.
- Hyung Joon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE GENERATION DEVICE, LEARNED MODEL GENERATION DEVICE, AND X-RAY...
- Publication number 20250182258
- Publication date Jun 5, 2025
- ISHIDA CO., LTD.
- Shinya IKEDA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
- Publication number 20250172509
- Publication date May 29, 2025
- SK On Co., Ltd.
- Hyung Joon KIM
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPI...
- Publication number 20250164417
- Publication date May 22, 2025
- Kabushiki Kaisha Toshiba
- Akira TANAKA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SELF-CENTERING CLAMP ADAPTER FOR X-RAY AND GAMMARAY WELD INSPECTION
- Publication number 20250164419
- Publication date May 22, 2025
- VAREX IMAGING CORPORATION
- Tibby Petrescu
- G01 - MEASURING TESTING
Information Patent Application
X-RAY WELD INSPECTION
- Publication number 20250164420
- Publication date May 22, 2025
- Varex Imaging Sweden AB
- Tuomas Pantsar
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137944
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY INSPECTION APPARATUS
- Publication number 20250137945
- Publication date May 1, 2025
- ISHIDA CO., LTD.
- Futoshi YURUGI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS APPARATUS
- Publication number 20250137947
- Publication date May 1, 2025
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ken GOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER
- Publication number 20250108548
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
- Publication number 20250108576
- Publication date Apr 3, 2025
- The Yokohama Rubber Co., LTD.
- Mitsuo TSUJI
- G01 - MEASURING TESTING
Information Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
- Publication number 20250105378
- Publication date Mar 27, 2025
- LG ENERGY SOLUTION, LTD.
- Joon Sup KANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...
- Publication number 20250085240
- Publication date Mar 13, 2025
- University of Florida Research Foundation, Incorporated
- Navid Asadi-Zanjani
- G01 - MEASURING TESTING
Information Patent Application
X-RAY IMAGING APPARATUS
- Publication number 20250076220
- Publication date Mar 6, 2025
- Adaptix Ltd.
- Mark Evans
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
- Publication number 20250060323
- Publication date Feb 20, 2025
- Mistras Group, Inc.
- John Musgrave
- G01 - MEASURING TESTING
Information Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
- Publication number 20250040021
- Publication date Jan 30, 2025
- Anritsu Corporation
- Jyunichi MORIYA
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
SELF CORRECTING OVEN TECHNOLOGY
- Publication number 20250033131
- Publication date Jan 30, 2025
- Jabil Inc.
- Charles Santhakumar
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
SYSTEM AND METHOD FOR POWERLINE INSPECTION
- Publication number 20250029224
- Publication date Jan 23, 2025
- Abhinav Singh
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
COATING QUALITY DETECTION METHOD, DETECTION APPARATUS, AND DETECTIO...
- Publication number 20250012692
- Publication date Jan 9, 2025
- Jiangsu Contemporary Amperex Technology Limited
- Zhiyong He
- G01 - MEASURING TESTING
Information Patent Application
ENTRANCE MANAGEMENT SYSTEM AND ENTRANCE MANAGEMENT CONTROL DEVICE
- Publication number 20250012741
- Publication date Jan 9, 2025
- Kabushiki Kaisha Toshiba
- Kentaro WADA
- G01 - MEASURING TESTING
Information Patent Application
POWDER BED FUSION ADDITIVE PRINTER FOR PARTS WITH HELICAL SLICES
- Publication number 20250001678
- Publication date Jan 2, 2025
- RTX Corporation
- Lawrence Binek
- B22 - CASTING POWDER METALLURGY
Information Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
- Publication number 20250003893
- Publication date Jan 2, 2025
- Tsinghua University
- Dameng Liu
- G01 - MEASURING TESTING
Information Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
- Publication number 20240415482
- Publication date Dec 19, 2024
- Jianqiang Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...
- Publication number 20240410840
- Publication date Dec 12, 2024
- NewSouth Innovations Pty Limited
- Patrick BURR
- G06 - COMPUTING CALCULATING COUNTING

Investigating the presence of flaws

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Specimen radiography system comprising a cabinet and a specimen dra...

Detection method for the radiation-induced defects of oxide layer i...

Flexible digital detector array

Inline scanning and cutting assembly and method of operation

Method and system utilizing imaging analysis for golf balls

Method and system for inspecting quality of tire member

Method and system utilizing imaging analysis for golf balls

Transmission image-based non-destructive inspecting method, method...

X-ray inspection apparatus and X-ray inspection method

Methods and systems for defects detection and classification using...

Methods and apparatus for detecting defects in semiconductor systems

Radiation inspection apparatus including a radiation detector compr...

Customizable axes of rotation for industrial radiography systems

Inspection device, packaging sheet manufacturing device, and packag...

Article inspection verification system

State change tracking device, X-ray imaging system, state change tr...

Foreign matter inspection device

Systems and methods for monitoring feature sizes in digital X-ray i...

Material detection in X-ray security screening

X-ray inspection device and x-ray inspection system

Food product quality control system

Jet blades optical inspection

Inspection apparatus and inspection method

X-ray inspection apparatus

System and method for inspecting fused plastic pipes

Image processing and detection of discontinuities in battery cells

Method for monitoring and/or calibrating a device designed for the...

System and method for inspecting defects of structure by using X-ray

Image pickup device and image generation method

Method for computed tomography examination of fragments in gel block

Patents Applicationslast 30 patents

METHOD TO OBTAIN INFORMATION TO CONTROL A MANUFACTURING PROCESS FOR...

INSPECTION DEVICE, INSPECTION ELEMENT, AND INSPECTION METHOD

INSPECTION DEVICE AND INSPECTION METHOD

Inspection Method and Inspection Device

RADIO/MICROWAVE FREQUENCY SENSOR FOR ANALYZING AGRICULTURAL EQUIPMENT

IDENTIFICATION DEVICE, IDENTIFICATION METHOD, AND IDENTIFICATION PR...

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

IMAGE GENERATION DEVICE, LEARNED MODEL GENERATION DEVICE, AND X-RAY...

X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD

ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPI...

SELF-CENTERING CLAMP ADAPTER FOR X-RAY AND GAMMARAY WELD INSPECTION

X-RAY WELD INSPECTION

X-RAY INSPECTION APPARATUS

X-RAY INSPECTION APPARATUS

X-RAY ANALYSIS APPARATUS

METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER

METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER

Stack Cell for Easy Confirmation of Separator Folding, Separator In...

X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...

X-RAY IMAGING APPARATUS

AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM

X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME

SELF CORRECTING OVEN TECHNOLOGY

SYSTEM AND METHOD FOR POWERLINE INSPECTION

COATING QUALITY DETECTION METHOD, DETECTION APPARATUS, AND DETECTIO...

ENTRANCE MANAGEMENT SYSTEM AND ENTRANCE MANAGEMENT CONTROL DEVICE

POWDER BED FUSION ADDITIVE PRINTER FOR PARTS WITH HELICAL SLICES

METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...

Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...

DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...