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PHYSICS
G01
Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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Investigating the presence of flaws
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Patents Grants
last 30 patents
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
12,311,236
Issue date
May 27, 2025
Topgolf Callaway Brands Corp.
Julie Caterina
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Transmission image-based non-destructive inspecting method, method...
Patent number
12,315,135
Issue date
May 27, 2025
RAYDISOFT INC.
Seok Won Lee
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray inspection apparatus and X-ray inspection method
Patent number
12,313,572
Issue date
May 27, 2025
Anritsu Corporation
Masaru Ishida
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for defects detection and classification using...
Patent number
12,307,668
Issue date
May 20, 2025
Bruker Nano, Inc.
David Lewis Adler
G01 - MEASURING TESTING
Information
Patent Grant
Methods and apparatus for detecting defects in semiconductor systems
Patent number
12,306,112
Issue date
May 20, 2025
AXIOMATIQUE TECHNOLOGIES, INC.
Trevor A. Norman
G01 - MEASURING TESTING
Information
Patent Grant
Radiation inspection apparatus including a radiation detector compr...
Patent number
12,306,358
Issue date
May 20, 2025
DRTECH CORP
Beom Jin Moon
G01 - MEASURING TESTING
Information
Patent Grant
Customizable axes of rotation for industrial radiography systems
Patent number
12,298,260
Issue date
May 13, 2025
Illinois Tool Works Inc.
Joseph Schlecht
G01 - MEASURING TESTING
Information
Patent Grant
Inspection device, packaging sheet manufacturing device, and packag...
Patent number
12,291,368
Issue date
May 6, 2025
CKD Corporation
Takamasa Ohtani
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Article inspection verification system
Patent number
12,287,347
Issue date
Apr 29, 2025
Anritsu Corporation
Eiji Asai
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Grant
State change tracking device, X-ray imaging system, state change tr...
Patent number
12,276,622
Issue date
Apr 15, 2025
Konica Minolta, Inc.
Tadashi Arimoto
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Foreign matter inspection device
Patent number
12,276,623
Issue date
Apr 15, 2025
Hamamatsu Photonics K.K.
Kunihiko Tsuchiya
G01 - MEASURING TESTING
Information
Patent Grant
Systems and methods for monitoring feature sizes in digital X-ray i...
Patent number
12,270,770
Issue date
Apr 8, 2025
QSA GLOBAL INC.
Paul Benson
G01 - MEASURING TESTING
Information
Patent Grant
Material detection in X-ray security screening
Patent number
12,270,772
Issue date
Apr 8, 2025
Rapiscan Holdings, Inc.
Simon Archambault
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
X-ray inspection device and x-ray inspection system
Patent number
12,270,771
Issue date
Apr 8, 2025
SEC CO., LTD.
Jong Hui Kim
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Food product quality control system
Patent number
12,258,221
Issue date
Mar 25, 2025
Ishida Europe Limited
Graham Neale
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Jet blades optical inspection
Patent number
12,253,481
Issue date
Mar 18, 2025
AEROSPACE INDUSTRIAL SCAN LTD.
Lior Greenstein
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
12,241,848
Issue date
Mar 4, 2025
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
X-ray inspection apparatus
Patent number
12,222,301
Issue date
Feb 11, 2025
ISHIDA CO., LTD.
Ken Iwakawa
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting fused plastic pipes
Patent number
12,203,873
Issue date
Jan 21, 2025
WorldWide Nondestructive Testing, Inc.
Kevin P. Bohne
B29 - WORKING OF PLASTICS WORKING OF SUBSTANCES IN A PLASTIC STATE, IN GENERAL
Information
Patent Grant
Image processing and detection of discontinuities in battery cells
Patent number
12,203,880
Issue date
Jan 21, 2025
GM Global Technology Operations LLC
Sean Robert Wagner
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for monitoring and/or calibrating a device designed for the...
Patent number
12,203,878
Issue date
Jan 21, 2025
Fraunhofer-Gesellschaft zur Forderung der Angewandten Forschung E.V.
Felix Porsch
G01 - MEASURING TESTING
Information
Patent Grant
System and method for inspecting defects of structure by using X-ray
Patent number
12,181,426
Issue date
Dec 31, 2024
NEUF Inc.
Myoung Chan Na
G01 - MEASURING TESTING
Information
Patent Grant
Image pickup device and image generation method
Patent number
12,181,425
Issue date
Dec 31, 2024
Kioxia Corporation
Takeshi Yamane
G01 - MEASURING TESTING
Information
Patent Grant
Method for computed tomography examination of fragments in gel block
Patent number
12,174,213
Issue date
Dec 24, 2024
The United States of America, as represented by the Secretary of the Navy
Kyle D. Stoll
F42 - AMMUNITION BLASTING
Information
Patent Grant
X-ray weld inspection
Patent number
12,163,902
Issue date
Dec 10, 2024
Varex Imaging Sweden AB
Tuomas Pantsar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Computer-implemented method for determining defects of an object pr...
Patent number
12,153,409
Issue date
Nov 26, 2024
VOLUME GRAPHICS GMBH
Gerd Schwaderer
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Artificial intelligence training with multiple pulsed x-ray source-...
Patent number
12,144,670
Issue date
Nov 19, 2024
AIXSCAN INC.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing apparatus, radiography system, image processing me...
Patent number
12,140,553
Issue date
Nov 12, 2024
FUJIFILM Corporation
Kengo Nomura
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Automated circumferential pipe scanning system
Patent number
12,135,297
Issue date
Nov 5, 2024
Mistras Group, Inc.
John Musgrave
G01 - MEASURING TESTING
Information
Patent Grant
System for estimating the occurrence of defects, and computer-reada...
Patent number
12,111,272
Issue date
Oct 8, 2024
HITACHI HIGH-TECH CORPORATION
Hiroshi Fukuda
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
IMAGE GENERATION DEVICE, LEARNED MODEL GENERATION DEVICE, AND X-RAY...
Publication number
20250182258
Publication date
Jun 5, 2025
ISHIDA CO., LTD.
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION METHOD
Publication number
20250172509
Publication date
May 29, 2025
SK On Co., Ltd.
Hyung Joon KIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ELECTRIC WIRE FIXING JIG, CRIMPING DETERMINATION DEVICE, AND CRIMPI...
Publication number
20250164417
Publication date
May 22, 2025
Kabushiki Kaisha Toshiba
Akira TANAKA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SELF-CENTERING CLAMP ADAPTER FOR X-RAY AND GAMMARAY WELD INSPECTION
Publication number
20250164419
Publication date
May 22, 2025
VAREX IMAGING CORPORATION
Tibby Petrescu
G01 - MEASURING TESTING
Information
Patent Application
X-RAY WELD INSPECTION
Publication number
20250164420
Publication date
May 22, 2025
Varex Imaging Sweden AB
Tuomas Pantsar
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20250137944
Publication date
May 1, 2025
ISHIDA CO., LTD.
Futoshi YURUGI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20250137945
Publication date
May 1, 2025
ISHIDA CO., LTD.
Futoshi YURUGI
G01 - MEASURING TESTING
Information
Patent Application
X-RAY ANALYSIS APPARATUS
Publication number
20250137947
Publication date
May 1, 2025
HITACHI HIGH-TECH SCIENCE CORPORATION
Ken GOTO
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR MANUFACTURING TIRE MEMBER
Publication number
20250108548
Publication date
Apr 3, 2025
The Yokohama Rubber Co., LTD.
Mitsuo TSUJI
G01 - MEASURING TESTING
Information
Patent Application
METHOD AND SYSTEM FOR INSPECTING QUALITY OF TIRE MEMBER
Publication number
20250108576
Publication date
Apr 3, 2025
The Yokohama Rubber Co., LTD.
Mitsuo TSUJI
G01 - MEASURING TESTING
Information
Patent Application
Stack Cell for Easy Confirmation of Separator Folding, Separator In...
Publication number
20250105378
Publication date
Mar 27, 2025
LG ENERGY SOLUTION, LTD.
Joon Sup KANG
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
X-RAY COMPATIBILITY METRIC FOR DESIGN-FOR-INSPECTION OF INTEGRATED...
Publication number
20250085240
Publication date
Mar 13, 2025
University of Florida Research Foundation, Incorporated
Navid Asadi-Zanjani
G01 - MEASURING TESTING
Information
Patent Application
X-RAY IMAGING APPARATUS
Publication number
20250076220
Publication date
Mar 6, 2025
Adaptix Ltd.
Mark Evans
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
Publication number
20250060323
Publication date
Feb 20, 2025
Mistras Group, Inc.
John Musgrave
G01 - MEASURING TESTING
Information
Patent Application
X-RAY GENERATOR AND X-RAY INSPECTION APPARATUS INCLUDING THE SAME
Publication number
20250040021
Publication date
Jan 30, 2025
Anritsu Corporation
Jyunichi MORIYA
H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SELF CORRECTING OVEN TECHNOLOGY
Publication number
20250033131
Publication date
Jan 30, 2025
Jabil Inc.
Charles Santhakumar
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Application
SYSTEM AND METHOD FOR POWERLINE INSPECTION
Publication number
20250029224
Publication date
Jan 23, 2025
Abhinav Singh
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COATING QUALITY DETECTION METHOD, DETECTION APPARATUS, AND DETECTIO...
Publication number
20250012692
Publication date
Jan 9, 2025
Jiangsu Contemporary Amperex Technology Limited
Zhiyong He
G01 - MEASURING TESTING
Information
Patent Application
ENTRANCE MANAGEMENT SYSTEM AND ENTRANCE MANAGEMENT CONTROL DEVICE
Publication number
20250012741
Publication date
Jan 9, 2025
Kabushiki Kaisha Toshiba
Kentaro WADA
G01 - MEASURING TESTING
Information
Patent Application
POWDER BED FUSION ADDITIVE PRINTER FOR PARTS WITH HELICAL SLICES
Publication number
20250001678
Publication date
Jan 2, 2025
RTX Corporation
Lawrence Binek
B22 - CASTING POWDER METALLURGY
Information
Patent Application
METHOD FOR MONITORING INFLUENCE OF DEFECTS IN FEW-LAYER TWO-DIMENSI...
Publication number
20250003893
Publication date
Jan 2, 2025
Tsinghua University
Dameng Liu
G01 - MEASURING TESTING
Information
Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
Publication number
20240415482
Publication date
Dec 19, 2024
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETERMINATION OF THE SPATIAL DISTRIBUTION OF RADIATION DAMAGE IN HE...
Publication number
20240410840
Publication date
Dec 12, 2024
NewSouth Innovations Pty Limited
Patrick BURR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INDUSTRIAL TOMOGRAPHY APPARATUS AND METHOD FOR CHECKING THE COMPOSI...
Publication number
20240393265
Publication date
Nov 28, 2024
BIOMETIC S.R.L.
ARIANNA GIUDICEANDREA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ROENTGEN INTEGRATED METROLOGY FOR HYBRID BONDING PROCESS CONTROL IN...
Publication number
20240387448
Publication date
Nov 21, 2024
TOKYO ELECTRON LIMITED
Francisco MACHUCA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD, DEVICE AND COMPUTER PROGRAM FOR MONITORING A PART BY X-RAY
Publication number
20240377341
Publication date
Nov 14, 2024
SAFRAN
Cédric FRAGNAUD
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS, SYSTEM, AND METHOD OF DETERMINING FUSE STATE BASED ON DE...
Publication number
20240378862
Publication date
Nov 14, 2024
Republic of Korea (National Forensic Service Director Ministry of the Interio...
Kyu Young LIM
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CONTROLLING X-RAY MACHINE FOR FOREIGN MATERIAL DETECTION IN A GOOD
Publication number
20240377340
Publication date
Nov 14, 2024
Greyscale AI
Brian Green
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20240369502
Publication date
Nov 7, 2024
Canon ANELVA Corporation
Takeo TSUKAMOTO
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Application
INSPECTION SYSTEM
Publication number
20240361258
Publication date
Oct 31, 2024
VAREX IMAGING CORPORATION
Rajashekar Venkatachalam
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR