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Investigating the presence of flaws
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G01N23/18
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PHYSICS
G01
Measuring instruments
G01N
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
G01N23/00
Investigating or analysing materials by the use of wave or particle radiation not covered by G01N21/00 or G01N22/00
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G01N23/18
Investigating the presence of flaws
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection device
Patent number
11,977,036
Issue date
May 7, 2024
ISHIDA CO., LTD.
Makoto Nakatani
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,977,038
Issue date
May 7, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,971,370
Issue date
Apr 30, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Assisted corrosion and erosion recognition
Patent number
11,959,739
Issue date
Apr 16, 2024
Baker Hughes Oilfield Operations LLC
George Sheri
F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information
Patent Grant
Measurement system and method for operating a measurement system
Patent number
11,959,865
Issue date
Apr 16, 2024
RAYSCAN TECHNOLOGIES GMBH
Christoph Sauerwein
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Grant
Live flaw detection system for multi-bundled conductor splicing sle...
Patent number
11,959,866
Issue date
Apr 16, 2024
STATE GRID HUNAN ELECTRIC COMPANY LIMITED
Dehua Zou
G05 - CONTROLLING REGULATING
Information
Patent Grant
X-ray detector device, glass body for shielding optical detector me...
Patent number
11,953,453
Issue date
Apr 9, 2024
Intom GmbH
Severin Ebner
G01 - MEASURING TESTING
Information
Patent Grant
X-ray detector component, X-ray detection module, imaging device an...
Patent number
11,953,632
Issue date
Apr 9, 2024
ams International AG
Jens Hofrichter
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for crack detection
Patent number
11,946,883
Issue date
Apr 2, 2024
United States as represented by the Administrator of NASA
Ajay M Koshti
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,940,394
Issue date
Mar 26, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,927,554
Issue date
Mar 12, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G01 - MEASURING TESTING
Information
Patent Grant
Static CT detection device
Patent number
11,925,183
Issue date
Mar 12, 2024
Tsinghua University
Zhiqiang Chen
A22 - BUTCHERING MEAT TREATMENT PROCESSING POULTRY OR FISH
Information
Patent Grant
Mechanical components with radiographic markers
Patent number
11,927,548
Issue date
Mar 12, 2024
Science Applications International Corporation
Theodore W. Eastes
G01 - MEASURING TESTING
Information
Patent Grant
Progressive scans with multiple pulsed X-ray source-in-motion tomos...
Patent number
11,918,403
Issue date
Mar 5, 2024
AlxSCAN, Inc.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
11,921,059
Issue date
Mar 5, 2024
Canon Anelva Corporation
Takeo Tsukamoto
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
11,911,666
Issue date
Feb 27, 2024
Topgolf Callaway Brands Cor.
Megan Ilnicky
G01 - MEASURING TESTING
Information
Patent Grant
Method for exploiting pressure and temperature measurements of a ve...
Patent number
11,912,074
Issue date
Feb 27, 2024
Compagnie Generale des Etablissements Michelin
Olivier Muhlhoff
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Method and system utilizing imaging analysis for golf balls
Patent number
11,904,214
Issue date
Feb 20, 2024
Topgolf Callaway Brands Corp.
Julie Caterina
A63 - SPORTS GAMES AMUSEMENTS
Information
Patent Grant
Method of inspecting surface and surface inspection apparatus
Patent number
11,906,446
Issue date
Feb 20, 2024
Honda Motor Co., Ltd.
Sanshiro Sakamoto
G01 - MEASURING TESTING
Information
Patent Grant
Positioning of x-ray imaging system using an optical camera
Patent number
11,879,854
Issue date
Jan 23, 2024
Baker Hughes Oilfield Operations LLC
Jing Xu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Tube weld x-ray inspection device
Patent number
11,874,236
Issue date
Jan 16, 2024
DIGIRAY CORP.
Sang Sub Kong
G01 - MEASURING TESTING
Information
Patent Grant
Inspection system and inspection method
Patent number
11,860,112
Issue date
Jan 2, 2024
NEC Corporation
Naoya Nakayama
G01 - MEASURING TESTING
Information
Patent Grant
Tube weld X-ray inspection device comprising an X-ray source, an X-...
Patent number
11,860,113
Issue date
Jan 2, 2024
DIGIRAY CORP.
Sang Sub Kong
G01 - MEASURING TESTING
Information
Patent Grant
Adjustable collimators and x-ray imaging systems including adjustab...
Patent number
11,862,357
Issue date
Jan 2, 2024
Illinois Tool Works Inc.
Svetlana Zigelman
G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information
Patent Grant
Fast 3D radiography with multiple pulsed x-ray sources by deflectin...
Patent number
11,857,359
Issue date
Jan 2, 2024
AlxScan Inc.
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus, method, computer-readable storage medium for non-destruc...
Patent number
11,846,591
Issue date
Dec 19, 2023
WRIGHTBROTHERS CO., LTD.
Hee Soo Kim
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Inspection method and manufacturing method for structure and inspec...
Patent number
11,841,332
Issue date
Dec 12, 2023
Toray Industries, Inc.
Hiroki Sugihara
B60 - VEHICLES IN GENERAL
Information
Patent Grant
System and method for crack detection
Patent number
11,841,333
Issue date
Dec 12, 2023
Ajay M Koshti
G01 - MEASURING TESTING
Information
Patent Grant
Inspection position identification method, three-dimensional image...
Patent number
11,835,475
Issue date
Dec 5, 2023
Saki Corporation
Takuma Hirayama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
System and method for inspecting defects of structure by using X-ray
Patent number
11,821,854
Issue date
Nov 21, 2023
NEUF Inc.
Myoung Chan Na
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
RADIATION DETECTOR AND RADIATION INSPECTION APPARATUS INCLUDING SAME
Publication number
20240134072
Publication date
Apr 25, 2024
DRTECH CORP
Beom Jin MOON
G01 - MEASURING TESTING
Information
Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
Publication number
20240122568
Publication date
Apr 18, 2024
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SYSTEM AND METHOD FOR INSPECTING DEFECTS OF STRUCTURE BY USING X-RAY
Publication number
20240102949
Publication date
Mar 28, 2024
NEUF Inc.
Myoung Chan NA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY RADIOGRAPHS BASED FAULT DETECTION AND PREDICTION FOR BATTERY...
Publication number
20240097215
Publication date
Mar 21, 2024
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Diana M. WEGNER
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Rapid High-Resolution Computerized Tomography
Publication number
20240044811
Publication date
Feb 8, 2024
Baker Hughes Holdings LLC
Eberhard Neuser
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS AND METHODS FOR NON-DESTRUCTIVE INSPECTION OF SEMICONDUCTOR...
Publication number
20230417687
Publication date
Dec 28, 2023
SANDISK TECHNOLOGIES LLC
Shogo TOMITA
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
NON-DESTRUCTIVE ASSESSMENT OF CORN ROOTWORM DAMAGE
Publication number
20230408426
Publication date
Dec 21, 2023
PIONEER HI-BRED INTERNATIONAL, INC.
DENNY JOSEPH BRUCK
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SPECIMEN RADIOGRAPHY SYSTEM COMPRISING CABINET AND A SPECIMEN DRAWE...
Publication number
20230404499
Publication date
Dec 21, 2023
HOLOGIC, INC.
Kenneth DEFREITAS
A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information
Patent Application
X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS
Publication number
20230384247
Publication date
Nov 30, 2023
HITACHI HIGH-TECH SCIENCE CORPORATION
Toshiyuki TAKAHARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND METHOD OF INSPECTION WITH X-RAYS
Publication number
20230384246
Publication date
Nov 30, 2023
HITACHI HIGH-TECH SCIENCE CORPORATION
Toshiyuki TAKAHARA
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS AND X-RAY INSPECTION METHOD
Publication number
20230366838
Publication date
Nov 16, 2023
Anritsu Corporation
Masaru ISHIDA
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHY INSPECTION AND FAIL-SAFE MECHANISM FOR PIPE TRAVERSING...
Publication number
20230366837
Publication date
Nov 16, 2023
ARIX TECHNOLOGIES, INC.
Bryan R. Duerfeldt
G01 - MEASURING TESTING
Information
Patent Application
Electron Microscope and Aberration Measurement Method
Publication number
20230349839
Publication date
Nov 2, 2023
JEOL Ltd.
Hidetaka Sawada
G01 - MEASURING TESTING
Information
Patent Application
X-RAY WELD INSPECTION
Publication number
20230349840
Publication date
Nov 2, 2023
Direct Conversion AB
Tuomas Pantsar
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349843
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349845
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
INSPECTION APPARATUS AND INSPECTION METHOD
Publication number
20230349844
Publication date
Nov 2, 2023
Canon ANELVA Corporation
Takeo TSUKAMOTO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR ESTIMATING THE OCCURRENCE OF DEFECTS, AND COMPUTER-READA...
Publication number
20230333033
Publication date
Oct 19, 2023
HITACHI HIGH-TECH CORPORATION
Hiroshi FUKUDA
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CHARACTERIZING A PART THROUGH NON-DESTRUCTIVE INSPECTION
Publication number
20230314386
Publication date
Oct 5, 2023
Commissariat A L'Energie Atomique et Aux Energies Alternatives
Clement FISHER
G01 - MEASURING TESTING
Information
Patent Application
A DEVICE FOR TESTING A FLAT PLATE-SHAPED MATERIAL
Publication number
20230314346
Publication date
Oct 5, 2023
FORCE TECHNOLOGY
Finn Falentin Olesen
G01 - MEASURING TESTING
Information
Patent Application
ARTICLE INSPECTION VERIFICATION SYSTEM
Publication number
20230305029
Publication date
Sep 28, 2023
Anritsu Corporation
Eiji ASAI
B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information
Patent Application
X-RAY INSPECTION DEVICE AND X-RAY INSPECTION SYSTEM
Publication number
20230304947
Publication date
Sep 28, 2023
SEC CO., LTD.
Jong Hui KIM
G01 - MEASURING TESTING
Information
Patent Application
IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD
Publication number
20230296535
Publication date
Sep 21, 2023
HAMAMATSU PHOTONICS K. K.
Mototsugu SUGIYAMA
G01 - MEASURING TESTING
Information
Patent Application
FOREIGN MATTER INSPECTION DEVICE
Publication number
20230288349
Publication date
Sep 14, 2023
Hamamatsu Photonics K.K.
Kunihiko TSUCHIYA
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATED CIRCUMFERENTIAL PIPE SCANNING SYSTEM
Publication number
20230280289
Publication date
Sep 7, 2023
Mistras Group, Inc.
John Musgrave
G01 - MEASURING TESTING
Information
Patent Application
FLEXIBLE DIGITAL DETECTOR ARRAY
Publication number
20230280288
Publication date
Sep 7, 2023
Baker Hughes Holdings LLC
Kwang Hyup An
G01 - MEASURING TESTING
Information
Patent Application
X-RAY INSPECTION APPARATUS
Publication number
20230258581
Publication date
Aug 17, 2023
ISHIDA CO., LTD.
Ken IWAKAWA
G01 - MEASURING TESTING
Information
Patent Application
Fast 3D Radiography with Multiple Pulsed X-ray Sources by Deflectin...
Publication number
20230255584
Publication date
Aug 17, 2023
Jianqiang Liu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INSPECTION DEVICE, LEARNED MODEL GENERATION METHOD, AND INSPECTION...
Publication number
20230252620
Publication date
Aug 10, 2023
Anritsu Corporation
Koetsu TSUNODA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING AND DETECTION OF DISCONTINUITIES IN BATTERY CELLS
Publication number
20230251212
Publication date
Aug 10, 2023
GM GLOBAL TECHNOLOGY OPERATIONS LLC
Sean Robert Wagner
G06 - COMPUTING CALCULATING COUNTING