involving a parasitic bipolar transistor triggered by the electrical biasing of the gate electrode of the field effect transistor

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H01L27/0274

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L27/00Devices consisting of a plurality of semiconductor or other solid state components formed in or on a common substrate

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H01L27/0274involving a parasitic bipolar transistor triggered by the electrical biasing of the gate electrode of the field effect transistor

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for fin-based voltage clamp
- Patent number 12,155,204
- Issue date Nov 26, 2024
- SEMICONDUCTOR COMPONENTS INDUSTRIES, LLC
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Nitride-based bidirectional switching device for battery management...
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- INNOSCIENCE (SUZHOU) SEMICONDUCTOR CO., LTD.
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Information Patent Grant
Integrated circuit with electrostatic discharge protection
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- Issue date Sep 17, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Po-Lin Peng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charging protection circuit, charging circuit, and electronic device
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- Huawei Technologies Co., Ltd.
- Huaifeng Wang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device including integrated electrostatic discharge protection comp...
- Patent number 11,935,885
- Issue date Mar 19, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Tzu-Heng Chang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection device
- Patent number 11,916,063
- Issue date Feb 27, 2024
- SK Hynix Inc.
- Joung Cheul Choi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electrostatic discharge protection element and semiconductor device...
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- Issue date Nov 14, 2023
- Samsung Electronics Co., Ltd.
- Sungjun Song
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Information Patent Grant
Silicon carbide MOSFET with optional asymmetric gate clamp
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- Issue date Sep 12, 2023
- SEMIQ INCORPORATED
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Information Patent Grant
Electrostatic discharge protection device
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- SK Hynix Inc.
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Information Patent Grant
Electrostatic protection structure comprising electrostatic protect...
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Information Patent Grant
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- Taiwan Semiconductor Manufacturing Company, Ltd
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Information Patent Grant
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
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Information Patent Grant
Device including integrated electrostatic discharge protection comp...
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device including integrated electrostatic discharge protection comp...
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Information Patent Grant
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Information Patent Grant
Memory device including alignment layer and semiconductor process m...
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Information Patent Grant
Method of designing mask layout based on error pattern and method o...
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Information Patent Grant
Latch-up immunization techniques for integrated circuits
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Information Patent Grant
Laterally-diffused metal-oxide-semiconductor devices for electrosta...
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- GLOBALFOUNDRIES Singapore Pte. Ltd.
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Silicon carbide MOSFET with optional asymmetric gate clamp
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- SEMIQ INCORPORATED
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Information Patent Grant
Method and system for manufacturing integrated circuit
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Information Patent Grant
Semiconductor integrated circuit
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Information Patent Grant
Transistor-injected silicon-controlled rectifier (SCR) with perpend...
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Information Patent Grant
Integrated circuit with electrostatic discharge protection
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- Issue date Mar 29, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
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Information Patent Grant
Logical detection of electronic circuit power sequence risks
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Information Patent Grant
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Information Patent Grant
Switch resistor networks
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- Issue date Oct 26, 2021
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Dual mode snap back circuit device
- Patent number 11,152,352
- Issue date Oct 19, 2021
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- Akm Ahsan
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Information Patent Grant
Field-effect transistors with dual thickness gate dielectrics
- Patent number 11,145,732
- Issue date Oct 12, 2021
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- Ayan Kar
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
INTEGRATED CIRCUIT WITH ELECTROSTATIC DISCHARGE PROTECTION
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Information Patent Application
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GGNMOS TRANSISTOR STRUCTURE, ESD PROTECTION DEVICE AND CIRCUIT
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MOS-BASED DESIGN SOLUTIONS FOR SOLVING WELL-PID
- Publication number 20240274597
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ELECTROSTATIC DISCHARGE PROTECTION DEVICE INCLUDING PARASITIC MOSFE...
- Publication number 20240170478
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- ALLEGRO MICROSYSTEMS, LLC
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ELECTROSTATIC DISCHARGE (ESD) PROTECTION CIRCUIT
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- TEXAS INSTRUMENTS INCORPORATED
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SEMICONDUCTOR STRUCTURE
- Publication number 20230387103
- Publication date Nov 30, 2023
- Vanguard International Semiconductor Corporation
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METHOD AND SYSTEM FOR FIN-BASED VOLTAGE CLAMP
- Publication number 20230378750
- Publication date Nov 23, 2023
- NEXGEN POWER SYSTEMS, INC.
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING SAME
- Publication number 20230353143
- Publication date Nov 2, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Lei PAN
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Information Patent Application
ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT
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- H01 - BASIC ELECTRIC ELEMENTS
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ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
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- Kaku IGARASHI
- H01 - BASIC ELECTRIC ELEMENTS
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ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20230299072
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PASSIVE SUBSTRATE VOLTAGE DISCHARGE CIRCUIT FOR BIDIRECTIONAL SWITCHES
- Publication number 20230282638
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ELECTROSTATIC DISCHARGE PROTECTION DEVICE
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- Publication date Aug 24, 2023
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SEMICONDUCTOR DEVICE
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NITRIDE-BASED BIDIRECTIONAL SWITCHING DEVICE FOR BATTERY MANAGEMENT...
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Fin Field-Effect Transistor, ESD Protection Circuit, Filter Circuit...
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ESD PROTECTION DEVICE
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Electro-Static Discharge Protection Structure and High-Voltage Inte...
- Publication number 20230128298
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SEMICONDUCTOR DEVICE
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DEVICE INCLUDING INTEGRATED ELECTROSTATIC DISCHARGE PROTECTION COMP...
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Information Patent Application
INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING SAME
- Publication number 20230089792
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- Taiwan Semiconductor Manufacturing Company, Ltd.
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- H01 - BASIC ELECTRIC ELEMENTS
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Silicon Carbide MOSFET With Optional Asymmetric Gate Clamp
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- Huawei Technologies Co., Ltd
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Information Patent Application
METHODS FOR REDUCTION OF PHOTORESIST DEFECT
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- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chun-Wei LIAO
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
INTEGRATED CIRCUIT WITH ELECTROSTATIC DISCHARGE PROTECTION
- Publication number 20220223582
- Publication date Jul 14, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Po-Lin PENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTROSTATIC PROTECTION ELEMENT AND SEMICONDUCTOR DEVICE
- Publication number 20220102338
- Publication date Mar 31, 2022
- LAPIS SEMICONDUCTOR CO., LTD.
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- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EPITAXIAL STRUCTURE OF GA-FACE GROUP III NITRIDE, ACTIVE DEVICE, AN...
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- Publication date Mar 24, 2022
- CHIH-SHU HUANG
- H01 - BASIC ELECTRIC ELEMENTS

involving a parasitic bipolar transistor triggered by the electrical biasing of the gate electrode of the field effect transistor

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for fin-based voltage clamp

Nitride-based bidirectional switching device for battery management...

Integrated circuit with electrostatic discharge protection

Charging protection circuit, charging circuit, and electronic device

Device including integrated electrostatic discharge protection comp...

Electrostatic discharge protection device

Electrostatic discharge protection element and semiconductor device...

Silicon carbide MOSFET with optional asymmetric gate clamp

Electrostatic discharge protection device

Electrostatic protection structure comprising electrostatic protect...

Integrated circuit and method of manufacturing same

Systems and methods for protecting a semiconductor device

Low-voltage electrostatic discharge (ESD) protection circuit, integ...

Device including integrated electrostatic discharge protection comp...

Device including integrated electrostatic discharge protection comp...

Electrostatic discharge circuit

Memory device including alignment layer and semiconductor process m...

Method of designing mask layout based on error pattern and method o...

Latch-up immunization techniques for integrated circuits

Laterally-diffused metal-oxide-semiconductor devices for electrosta...

Silicon carbide MOSFET with optional asymmetric gate clamp

Method and system for manufacturing integrated circuit

Semiconductor integrated circuit

Transistor-injected silicon-controlled rectifier (SCR) with perpend...

Integrated circuit with electrostatic discharge protection

Logical detection of electronic circuit power sequence risks

Semiconductor integrated circuit device including an electro-static...

Switch resistor networks

Dual mode snap back circuit device

Field-effect transistors with dual thickness gate dielectrics

Patents Applicationslast 30 patents

INTEGRATED CIRCUIT WITH ELECTROSTATIC DISCHARGE PROTECTION

SEMICONDUCTOR DEVICE

CHARGING PROTECTION CIRCUIT, CHARGING CIRCUIT, AND ELECTRONIC DEVICE

GGNMOS TRANSISTOR STRUCTURE, ESD PROTECTION DEVICE AND CIRCUIT

MOS-BASED DESIGN SOLUTIONS FOR SOLVING WELL-PID

ELECTROSTATIC DISCHARGE PROTECTION DEVICE INCLUDING PARASITIC MOSFE...

ELECTROSTATIC DISCHARGE (ESD) PROTECTION CIRCUIT

SEMICONDUCTOR STRUCTURE

METHOD AND SYSTEM FOR FIN-BASED VOLTAGE CLAMP

INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING SAME

ELECTROSTATIC DISCHARGE PROTECTION CIRCUIT

ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE

ESD PROTECTION CIRCUIT AND SEMICONDUCTOR DEVICE

PASSIVE SUBSTRATE VOLTAGE DISCHARGE CIRCUIT FOR BIDIRECTIONAL SWITCHES

ELECTROSTATIC DISCHARGE PROTECTION DEVICE

SEMICONDUCTOR DEVICE

ELECTRONIC DEVICE

NITRIDE-BASED BIDIRECTIONAL SWITCHING DEVICE FOR BATTERY MANAGEMENT...

Fin Field-Effect Transistor, ESD Protection Circuit, Filter Circuit...

ESD PROTECTION DEVICE

Electro-Static Discharge Protection Structure and High-Voltage Inte...

SEMICONDUCTOR DEVICE

DEVICE INCLUDING INTEGRATED ELECTROSTATIC DISCHARGE PROTECTION COMP...

INTEGRATED CIRCUIT AND METHOD OF MANUFACTURING SAME

Silicon Carbide MOSFET With Optional Asymmetric Gate Clamp

CHARGING PROTECTION CIRCUIT, CHARGING CIRCUIT, AND ELECTRONIC DEVICE

METHODS FOR REDUCTION OF PHOTORESIST DEFECT

INTEGRATED CIRCUIT WITH ELECTROSTATIC DISCHARGE PROTECTION

ELECTROSTATIC PROTECTION ELEMENT AND SEMICONDUCTOR DEVICE

EPITAXIAL STRUCTURE OF GA-FACE GROUP III NITRIDE, ACTIVE DEVICE, AN...