involving differential digital signals

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CPC
G01R31/31706

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/31706involving differential digital signals

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Patents Grantslast 30 patents

Information Patent Grant
Signal processing apparatus
- Patent number 12,158,503
- Issue date Dec 3, 2024
- Hyundai Autoever Corp.
- Bong-Gu Lee
- G01 - MEASURING TESTING
Information Patent Grant
System for testing an electronic circuit comprising a digital to an...
- Patent number 12,105,143
- Issue date Oct 1, 2024
- STMicroelectronics S.r.l.
- Leonardo Pedone
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Method and measurement instrument for testing a device under test
- Patent number 11,906,583
- Issue date Feb 20, 2024
- Rohde & Schwarz GmbH & Co. KG
- Kevin Guo
- G01 - MEASURING TESTING
Information Patent Grant
Systems and/or methods for anomaly detection and characterization i...
- Patent number 11,686,770
- Issue date Jun 27, 2023
- GRAMMATECH INC.
- Jason Alvin Dickens
- G01 - MEASURING TESTING
Information Patent Grant
Differential clock cross point detection circuit and detection method
- Patent number 11,353,505
- Issue date Jun 7, 2022
- NO. 24 RESEARCH INSTITUTE OF CHINA ELECTRONICS TECHNOLOGY GROUP CORPORATION
- Mingyuan Xu
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Detection of leakage of a qubit without directly measuring the qubit
- Patent number 11,221,364
- Issue date Jan 11, 2022
- International Business Machines Corporation
- Aaron Finck
- G01 - MEASURING TESTING
Information Patent Grant
Reduction of skew between positive and negative conductors carrying...
- Patent number 11,163,001
- Issue date Nov 2, 2021
- Intel Corporation
- Tarakesava Reddy Koki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Comparator
- Patent number 11,125,819
- Issue date Sep 21, 2021
- Micron Technology, Inc.
- Shigekazu Yamada
- G11 - INFORMATION STORAGE
Information Patent Grant
Systems and/or methods for anomaly detection and characterization i...
- Patent number 11,092,648
- Issue date Aug 17, 2021
- GrammaTech, Inc.
- Jason Alvin Dickens
- G01 - MEASURING TESTING
Information Patent Grant
Programming and testing of wire RFID tags
- Patent number 11,017,185
- Issue date May 25, 2021
- AVERY DENNISON RETAIL INFORMATION SERVICES LLC
- Ian J. Forster
- G01 - MEASURING TESTING
Information Patent Grant
Differential signal measurement system and method
- Patent number 10,877,092
- Issue date Dec 29, 2020
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Differential voltage measuring device
- Patent number 10,838,005
- Issue date Nov 17, 2020
- Yazaki Corporation
- Jian Wang
- G01 - MEASURING TESTING
Information Patent Grant
Communication circuitry integrity assessment
- Patent number 10,768,228
- Issue date Sep 8, 2020
- NXP B.V.
- Bernd Uwe Gerhard Elend
- G01 - MEASURING TESTING
Information Patent Grant
Method and device for detecting low voltage differential signal
- Patent number 10,705,140
- Issue date Jul 7, 2020
- BOE Technology Group Co., Ltd.
- Qin Tan
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Signal correction method, system for correcting a measured signal,...
- Patent number 10,649,008
- Issue date May 12, 2020
- Rohde & Schwarz GmbH & Co. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Grant
Comparator
- Patent number 10,591,541
- Issue date Mar 17, 2020
- Micron Technology, Inc.
- Shigekazu Yamada
- G01 - MEASURING TESTING
Information Patent Grant
Low voltage differential signaling fault detector
- Patent number 10,530,366
- Issue date Jan 7, 2020
- STMicroelectronics International N.V.
- Atul Dwivedi
- G01 - MEASURING TESTING
Information Patent Grant
Signal isolation circuit
- Patent number 10,320,589
- Issue date Jun 11, 2019
- Texas Instruments Incorporated
- Swaminathan Sankaran
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Tri-mode probe with automatic skew adjustment
- Patent number 10,145,822
- Issue date Dec 4, 2018
- Tektronix, Inc.
- Daniel G. Knierim
- G01 - MEASURING TESTING
Information Patent Grant
Error detection device
- Patent number 10,114,064
- Issue date Oct 30, 2018
- PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
- Daichi Hashimoto
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Boundary scan receiver
- Patent number 9,964,593
- Issue date May 8, 2018
- Cadence Design Systems, Inc.
- Guillaume Fortin
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Systems and methods for differential pair in-pair skew determinatio...
- Patent number 9,537,618
- Issue date Jan 3, 2017
- Dell Products L.P.
- Timothy M. Lambert
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
Test circuit and test method for testing differential input circuit
- Patent number 8,446,163
- Issue date May 21, 2013
- Renesas Electronics Corporation
- Hiroyuki Kobatake
- G01 - MEASURING TESTING
Information Patent Grant
Low voltage differential signaling timing test system and method
- Patent number 8,290,729
- Issue date Oct 16, 2012
- Hon Hai Precision Industry Co., Ltd.
- Jui-Hsiung Ho
- G01 - MEASURING TESTING
Information Patent Grant
Differential driver circuit
- Patent number 8,220,947
- Issue date Jul 17, 2012
- Advantest Corporation
- Yasuyuki Arai
- G01 - MEASURING TESTING
Information Patent Grant
Differential voltage defectivity monitoring method
- Patent number 8,112,736
- Issue date Feb 7, 2012
- Synopsys, Inc.
- John D. Garcia, II
- G01 - MEASURING TESTING
Information Patent Grant
Fault injection
- Patent number 8,051,346
- Issue date Nov 1, 2011
- Cisco Technology, Inc.
- Senthil Somasundaram
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for testing high-speed serial transmitters and...
- Patent number 8,037,371
- Issue date Oct 11, 2011
- National Semiconductor Corporation
- Simon Bikulcius
- G01 - MEASURING TESTING
Information Patent Grant
Test apparatus having bidirectional differential interface
- Patent number 7,952,359
- Issue date May 31, 2011
- Advantest Corporation
- Shoji Kojima
- G01 - MEASURING TESTING
Information Patent Grant
Circuit testing apparatus
- Patent number 7,908,108
- Issue date Mar 15, 2011
- Princeton Technology Corporation
- Cheng-Yung Teng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING
- Publication number 20230213579
- Publication date Jul 6, 2023
- MEDIATEK INC.
- Pin-Wen CHEN
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL PROCESSING APPARATUS
- Publication number 20230194611
- Publication date Jun 22, 2023
- Hyundai AutoEver Corp.
- Bong-Gu Lee
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND MEASUREMENT INSTRUMENT FOR TESTING A DEVICE UNDER TEST
- Publication number 20230176122
- Publication date Jun 8, 2023
- Rohde& Schwarz GmbH & Co. KG
- Kevin Guo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TESTING AN ELECTRONIC CIRCUIT COMPRISING A DIGITAL TO AN...
- Publication number 20230140765
- Publication date May 4, 2023
- STMicroelectronics S.r.l.
- Leonardo PEDONE
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIFFERENTIAL CLOCK CROSS POINT DETECTION CIRCUIT AND DETECTION METHOD
- Publication number 20220091184
- Publication date Mar 24, 2022
- No. 24 Research Institute of China Electronics Technology Group Corporation
- MINGYUAN XU
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...
- Publication number 20220050140
- Publication date Feb 17, 2022
- GrammaTech, Inc.
- Jason Alvin DICKENS
- G01 - MEASURING TESTING
Information Patent Application
SKEW DETECTION AND COMPENSATION FOR HIGH SPEED I/O LINKS
- Publication number 20210311120
- Publication date Oct 7, 2021
- Intel Corporation
- Jong-Ru Guo
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...
- Publication number 20200326373
- Publication date Oct 15, 2020
- GrammaTech, Inc.
- Jason Alvin DICKENS
- G01 - MEASURING TESTING
Information Patent Application
COMPARATOR
- Publication number 20200191866
- Publication date Jun 18, 2020
- Micron Technology, Inc.
- Shigekazu Yamada
- G01 - MEASURING TESTING
Information Patent Application
DEVICE INSPECTION METHOD
- Publication number 20200174073
- Publication date Jun 4, 2020
- Tetsuya KAGAMI
- G01 - MEASURING TESTING
Information Patent Application
COMPARATOR
- Publication number 20200049763
- Publication date Feb 13, 2020
- Micron Technology, Inc.
- Shigekazu Yamada
- G01 - MEASURING TESTING
Information Patent Application
LOW VOLTAGE DIFFERENTIAL SIGNALING FAULT DETECTOR
- Publication number 20200014387
- Publication date Jan 9, 2020
- STMicroelectronics International N.V.
- Atul DWIVEDI
- G01 - MEASURING TESTING
Information Patent Application
COMMUNICATION CIRCUITRY INTEGRITY ASSESSMENT
- Publication number 20190310317
- Publication date Oct 10, 2019
- NXP B.V.
- Bernd Uwe Gerhard Elend
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL SIGNAL MEASUREMENT SYSTEM AND METHOD
- Publication number 20190271741
- Publication date Sep 5, 2019
- ROHDE & SCHWARZ GMBH & CO. KG
- Martin Peschke
- G01 - MEASURING TESTING
Information Patent Application
SIGNAL ISOLATION CIRCUIT
- Publication number 20190207786
- Publication date Jul 4, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Swaminathan Sankaran
- G01 - MEASURING TESTING
Information Patent Application
REDUCTION OF SKEW BETWEEN POSITIVE AND NEGATIVE CONDUCTORS CARRYING...
- Publication number 20190041458
- Publication date Feb 7, 2019
- Intel Corporation
- Tarakesava Reddy Koki
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIFFERENTIAL VOLTAGE MEASURING DEVICE
- Publication number 20180164373
- Publication date Jun 14, 2018
- YAZAKI CORPORATION
- Jian WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PROGRAMMING AND TESTING OF WIRE RFID TAGS
- Publication number 20180137313
- Publication date May 17, 2018
- Avery Dennison Retail Information Services, LLC
- Ian J. FORSTER
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND DEVICE FOR DETECTING LOW VOLTAGE DIFFERENTIAL SIGNAL
- Publication number 20180088175
- Publication date Mar 29, 2018
- BOE TECHNOLOGY GROUP CO., LTD.
- Qin Tan
- G01 - MEASURING TESTING
Information Patent Application
ERROR DETECTION DEVICE
- Publication number 20170299648
- Publication date Oct 19, 2017
- Panasonic Intellectual Property Management Co., Ltd.
- DAICHI HASHIMOTO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR DIFFERENTIAL PAIR IN-PAIR SKEW DETERMINATIO...
- Publication number 20140173367
- Publication date Jun 19, 2014
- Dell Products L.P.
- Timothy M. Lambert
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM
- Publication number 20130238262
- Publication date Sep 12, 2013
- Advantest Corporation
- Koji ASAMI
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL DRIVER CIRCUIT
- Publication number 20110234317
- Publication date Sep 29, 2011
- Advantest Corporation
- Yasuyuki Arai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
LOW VOLTAGE DIFFERENTIAL SIGNALING TIMING TEST SYSTEM AND METHOD
- Publication number 20110130990
- Publication date Jun 2, 2011
- HON HAI Precision Industry CO., LTD.
- JUI-HSIUNG HO
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS AND METHOD FOR MODULATED SIGNAL
- Publication number 20110054827
- Publication date Mar 3, 2011
- Advantest Corporation, a Japanese Corporation
- Masahiro Ishida
- G01 - MEASURING TESTING
Information Patent Application
DIFFERENTIAL VOLTAGE DEFECTIVITY MONITORING METHOD
- Publication number 20110047523
- Publication date Feb 24, 2011
- John D. Garcia, II
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
FAULT INJECTION
- Publication number 20100218058
- Publication date Aug 26, 2010
- Cisco Technology, Inc.
- Senthil SOMASUNDARAM
- G01 - MEASURING TESTING
Information Patent Application
TEST CIRCUIT AND TEST METHOD FOR TESTING DIFFERENTIAL INPUT CIRCUIT
- Publication number 20100201394
- Publication date Aug 12, 2010
- NEC Electronics Corporation
- Hiroyuki Kobatake
- G01 - MEASURING TESTING
Information Patent Application
CIRCUIT TESTING APPARATUS
- Publication number 20090254296
- Publication date Oct 8, 2009
- Princeton Technology Corporation
- Cheng-Yung TENG
- G01 - MEASURING TESTING
Information Patent Application
TEST APPARATUS HAVING BIDIRECTIONAL DIFFERENTIAL INTERFACE
- Publication number 20090206843
- Publication date Aug 20, 2009
- Advantest Corporation
- Shoji Kojima
- G01 - MEASURING TESTING

involving differential digital signals

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Signal processing apparatus

System for testing an electronic circuit comprising a digital to an...

Method and measurement instrument for testing a device under test

Systems and/or methods for anomaly detection and characterization i...

Differential clock cross point detection circuit and detection method

Detection of leakage of a qubit without directly measuring the qubit

Reduction of skew between positive and negative conductors carrying...

Comparator

Systems and/or methods for anomaly detection and characterization i...

Programming and testing of wire RFID tags

Differential signal measurement system and method

Differential voltage measuring device

Communication circuitry integrity assessment

Method and device for detecting low voltage differential signal

Signal correction method, system for correcting a measured signal,...

Comparator

Low voltage differential signaling fault detector

Signal isolation circuit

Tri-mode probe with automatic skew adjustment

Error detection device

Boundary scan receiver

Systems and methods for differential pair in-pair skew determinatio...

Test circuit and test method for testing differential input circuit

Low voltage differential signaling timing test system and method

Differential driver circuit

Differential voltage defectivity monitoring method

Fault injection

Apparatus and method for testing high-speed serial transmitters and...

Test apparatus having bidirectional differential interface

Circuit testing apparatus

Patents Applicationslast 30 patents

CHIP WITH POWER-GLITCH DETECTION AND POWER-GLITCH SELF-TESTING

SIGNAL PROCESSING APPARATUS

METHOD AND MEASUREMENT INSTRUMENT FOR TESTING A DEVICE UNDER TEST

SYSTEM FOR TESTING AN ELECTRONIC CIRCUIT COMPRISING A DIGITAL TO AN...

DIFFERENTIAL CLOCK CROSS POINT DETECTION CIRCUIT AND DETECTION METHOD

SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...

SKEW DETECTION AND COMPENSATION FOR HIGH SPEED I/O LINKS

SYSTEMS AND/OR METHODS FOR ANOMALY DETECTION AND CHARACTERIZATION I...

COMPARATOR

DEVICE INSPECTION METHOD

COMPARATOR

LOW VOLTAGE DIFFERENTIAL SIGNALING FAULT DETECTOR

COMMUNICATION CIRCUITRY INTEGRITY ASSESSMENT

DIFFERENTIAL SIGNAL MEASUREMENT SYSTEM AND METHOD

SIGNAL ISOLATION CIRCUIT

REDUCTION OF SKEW BETWEEN POSITIVE AND NEGATIVE CONDUCTORS CARRYING...

DIFFERENTIAL VOLTAGE MEASURING DEVICE

PROGRAMMING AND TESTING OF WIRE RFID TAGS

METHOD AND DEVICE FOR DETECTING LOW VOLTAGE DIFFERENTIAL SIGNAL

ERROR DETECTION DEVICE

SYSTEMS AND METHODS FOR DIFFERENTIAL PAIR IN-PAIR SKEW DETERMINATIO...

MEASUREMENT APPARATUS, MEASUREMENT METHOD, AND PROGRAM

DIFFERENTIAL DRIVER CIRCUIT

LOW VOLTAGE DIFFERENTIAL SIGNALING TIMING TEST SYSTEM AND METHOD

TEST APPARATUS AND METHOD FOR MODULATED SIGNAL

DIFFERENTIAL VOLTAGE DEFECTIVITY MONITORING METHOD

FAULT INJECTION

TEST CIRCUIT AND TEST METHOD FOR TESTING DIFFERENTIAL INPUT CIRCUIT

CIRCUIT TESTING APPARATUS

TEST APPARATUS HAVING BIDIRECTIONAL DIFFERENTIAL INTERFACE