Ion deflecting means

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CPC
H01J49/061

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/061Ion deflecting means

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Ion guide
- Patent number 12,205,810
- Issue date Jan 21, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Surface-induced dissociation devices and methods
- Patent number 12,176,196
- Issue date Dec 24, 2024
- OHIO STATE INNOVATION FOUNDATION
- Vicki Wysocki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometer using unitary insert between first and second ion...
- Patent number 12,154,780
- Issue date Nov 26, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Alexander A. Makarov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time of flight mass analyser with spatial focussing
- Patent number 12,131,895
- Issue date Oct 29, 2024
- Micromass UK Limited
- John Brian Hoyes
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 12,051,583
- Issue date Jul 30, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Gas analysis device and method for detecting sample gas
- Patent number 11,994,492
- Issue date May 28, 2024
- Nuctech Company Limited
- Yan Wang
- G01 - MEASURING TESTING
Information Patent Grant
Methods and apparatus for trapping and accumulation of ions
- Patent number 11,953,466
- Issue date Apr 9, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analyzer with 3D electrostatic field
- Patent number 11,942,318
- Issue date Mar 26, 2024
- Shimadzu Corporation
- Vyacheslav Shchepunov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
TOF MS detection system with improved dynamic range
- Patent number 11,881,387
- Issue date Jan 23, 2024
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and methods for ion manipulation having improved duty cycle
- Patent number 11,874,252
- Issue date Jan 16, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion injection to an electrostatic trap
- Patent number 11,842,892
- Issue date Dec 12, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,837,455
- Issue date Dec 5, 2023
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Stimulated or non-equilibrium energy-loss and energy-gain spectrosc...
- Patent number 11,830,718
- Issue date Nov 28, 2023
- Centre National de la Recherche Scientifique
- Mathieu Kociak
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Accelerator for multi-pass mass spectrometers
- Patent number 11,817,303
- Issue date Nov 14, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Device and method to manipulate ions in multi-level system
- Patent number 11,796,504
- Issue date Oct 24, 2023
- Battelle Memorial Institute
- Yehia M. Ibrahim
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion mobility spectrometer clear-down
- Patent number 11,788,987
- Issue date Oct 17, 2023
- SMITHS DETECTION MONTREAL INC.
- Qunzhou Bian
- B08 - CLEANING
Information Patent Grant
Spectrometric analysis of microbes
- Patent number 11,764,048
- Issue date Sep 19, 2023
- Micromass UK Limited
- Zoltan Takats
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Ion guide
- Patent number 11,749,516
- Issue date Sep 5, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic ion filtering for reducing highly abundant ions
- Patent number 11,742,195
- Issue date Aug 29, 2023
- Analytik Jena GmbH
- Roland Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cell population analysis
- Patent number 11,710,627
- Issue date Jul 25, 2023
- Micromass UK Limited
- Emrys Jones
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Mass spectrometric system with ion mobility analyzer at elevated pr...
- Patent number 11,598,749
- Issue date Mar 7, 2023
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Time-of-flight mass spectrometer
- Patent number 11,587,780
- Issue date Feb 21, 2023
- Shimadzu Corporation
- Yusuke Tateishi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometric analysis of microbes
- Patent number 11,574,803
- Issue date Feb 7, 2023
- Micromass UK Limited
- Zoltan Takats
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Multiple beam secondary ion mass spectrometry device
- Patent number 11,545,352
- Issue date Jan 3, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Marina Verruno
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion entry/exit device
- Patent number 11,527,395
- Issue date Dec 13, 2022
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Spectrometric analysis
- Patent number 11,515,136
- Issue date Nov 29, 2022
- Micromass UK Limited
- Keith Richardson
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Resonance ionization filter for secondary ion and accelerator mass...
- Patent number 11,501,960
- Issue date Nov 15, 2022
- The Government of the United States of America, as represented by the Secreta...
- Evan E. Groopman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dynamic ion filter for reducing highly abundant ions
- Patent number 11,488,818
- Issue date Nov 1, 2022
- Analytik Jena AG
- Roland Lehmann
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Sample analysis systems and methods of use thereof
- Patent number 11,380,534
- Issue date Jul 5, 2022
- Purdue Research Foundation
- Robert Graham Cooks
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion guide
- Patent number 11,373,850
- Issue date Jun 28, 2022
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Deflector Gates for Ion Beam Intensity Modulation
- Publication number 20240395528
- Publication date Nov 28, 2024
- DH Technologies Development Pte. Ltd.
- Robert HAUFLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...
- Publication number 20240371620
- Publication date Nov 7, 2024
- AUTOBIO LABTEC INSTRUMENTS CO., LTD.
- Keya CAI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION ENTRY/EXIT DEVICE
- Publication number 20240355606
- Publication date Oct 24, 2024
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Mass Spectrometer Components Including Programmable Elements and De...
- Publication number 20240347332
- Publication date Oct 17, 2024
- PERKINELMER SCIENTIFIC CANADA ULC
- Tak Shun Cheung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE
- Publication number 20240339314
- Publication date Oct 10, 2024
- Micromass UK Limited
- Jason Lee Wildgoose
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PRESSURE ION OPTICAL DEVICES
- Publication number 20240310330
- Publication date Sep 19, 2024
- Philip MARRIOTT
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER
- Publication number 20240312775
- Publication date Sep 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for Trapping and Accumulation of Ions
- Publication number 20240248062
- Publication date Jul 25, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Planar Ion Processing Station
- Publication number 20240203719
- Publication date Jun 20, 2024
- DH Technologies Development Pte. Ltd.
- Aaron Timothy BOOY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH PRESSURE ION OPTICAL DEVICES
- Publication number 20240186132
- Publication date Jun 6, 2024
- Philip MARRIOTT
- G01 - MEASURING TESTING
Information Patent Application
Mass Spectrometer
- Publication number 20240186134
- Publication date Jun 6, 2024
- Shimadzu Corporation
- Yoshihiro UENO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF
- Publication number 20240170273
- Publication date May 23, 2024
- Purdue Research Foundation
- Robert Graham Cooks
- G01 - MEASURING TESTING
Information Patent Application
ION GUIDE
- Publication number 20240162023
- Publication date May 16, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MULTIMODE ION DETECTOR WITH WIDE DYNAMIC RANGE AND AUTOMATIC MODE S...
- Publication number 20240128070
- Publication date Apr 18, 2024
- Kimia Analytics Inc.
- Sina ALAVI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...
- Publication number 20240128071
- Publication date Apr 18, 2024
- Micromass UK Limited
- Zoltán TAKÁTS
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
Apparatus and Methods for Ion Manipulation Having Improved Duty Cycle
- Publication number 20240110891
- Publication date Apr 4, 2024
- MOBILion Systems, Inc.
- John Daniel DeBord
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TUNING A MASS SPECTROMETER FILTER
- Publication number 20240087863
- Publication date Mar 14, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR ANALYZING SAMPLES
- Publication number 20240047189
- Publication date Feb 8, 2024
- CMP Scientific Corp.
- Paul Nurmi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TIME-OF-FLIGHT MASS SPECTROMETRIC ANALYSIS OF LABELLED ANALYTE IONS
- Publication number 20230411138
- Publication date Dec 21, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...
- Publication number 20230402272
- Publication date Dec 14, 2023
- DH Technologies Development Pte. Ltd.
- Eric Thomas Dziekonski
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ION GUIDE
- Publication number 20230377868
- Publication date Nov 23, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish STEWART
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NANOTIP ION SOURCES AND METHODS
- Publication number 20230298878
- Publication date Sep 21, 2023
- Brown University
- Derek M. Stein
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
High resolution multi-reflection time-of-flight mass analyser
- Publication number 20230290629
- Publication date Sep 14, 2023
- Thermo Fisher Scientific (Bremen) GmbH
- Hamish Stewart
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CURVED ION GUIDES AND RELATED SYSTEMS AND METHODS
- Publication number 20230215716
- Publication date Jul 6, 2023
- PerkinElmer Health Sciences, Inc.
- Shawn Johnson
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AN ION SHUTTER, A METHOD OF CONTROLLING ION SHUTTER, AND DETECTION...
- Publication number 20230194473
- Publication date Jun 22, 2023
- SMITHS DETECTION-WATFORD LIMITED
- Paul ARNOLD
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Entry/Exit Device
- Publication number 20230170203
- Publication date Jun 1, 2023
- Micromass UK Limited
- Kevin Giles
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS
- Publication number 20230170204
- Publication date Jun 1, 2023
- Micromass UK Limited
- Anatoly Verenchikov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR HIGH-PERFORMANCE CHARGED PARTICLE DETECTION
- Publication number 20230170205
- Publication date Jun 1, 2023
- LUXEMBOURG INSTITUTE OF SCIENCE AND TECHNOLOGY (LIST)
- Hung Quang Hoang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DEFLECTORS FOR ION BEAMS AND MASS SPECTROMETRY SYSTEMS COMPRISING T...
- Publication number 20230162962
- Publication date May 25, 2023
- PerkinElmer Health Sciences, Inc.
- Tsung-Chi Chen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
EFFICIENT AND STABLE SECONDARY ION EXTRACTION APPARATUS
- Publication number 20230162963
- Publication date May 25, 2023
- Institute of Geology, Chinese Academy of Geological Sciences
- Tao LONG
- H01 - BASIC ELECTRIC ELEMENTS

Ion deflecting means

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Ion guide

Surface-induced dissociation devices and methods

Mass spectrometer using unitary insert between first and second ion...

Time of flight mass analyser with spatial focussing

Ion entry/exit device

Gas analysis device and method for detecting sample gas

Methods and apparatus for trapping and accumulation of ions

Mass analyzer with 3D electrostatic field

TOF MS detection system with improved dynamic range

Apparatus and methods for ion manipulation having improved duty cycle

Ion injection to an electrostatic trap

Sample analysis systems and methods of use thereof

Stimulated or non-equilibrium energy-loss and energy-gain spectrosc...

Accelerator for multi-pass mass spectrometers

Device and method to manipulate ions in multi-level system

Ion mobility spectrometer clear-down

Spectrometric analysis of microbes

Ion guide

Dynamic ion filtering for reducing highly abundant ions

Cell population analysis

Mass spectrometric system with ion mobility analyzer at elevated pr...

Time-of-flight mass spectrometer

Spectrometric analysis of microbes

Multiple beam secondary ion mass spectrometry device

Ion entry/exit device

Spectrometric analysis

Resonance ionization filter for secondary ion and accelerator mass...

Dynamic ion filter for reducing highly abundant ions

Sample analysis systems and methods of use thereof

Ion guide

Patents Applicationslast 30 patents

Deflector Gates for Ion Beam Intensity Modulation

ION SCREENING METHOD AND SYSTEM FOR MASS SPECTROMETER, HIGH-VOLTAGE...

ION ENTRY/EXIT DEVICE

Mass Spectrometer Components Including Programmable Elements and De...

MASS SPECTROMETER HAVING HIGH SAMPLING DUTY CYCLE

HIGH PRESSURE ION OPTICAL DEVICES

COLLISION CROSS SECTION MEASUREMENT IN TIME-OF-FLIGHT MASS ANALYSER

Methods and Apparatus for Trapping and Accumulation of Ions

Planar Ion Processing Station

HIGH PRESSURE ION OPTICAL DEVICES

Mass Spectrometer

SAMPLE ANALYSIS SYSTEMS AND METHODS OF USE THEREOF

ION GUIDE

MULTIMODE ION DETECTOR WITH WIDE DYNAMIC RANGE AND AUTOMATIC MODE S...

INLET INSTRUMENTATION FOR ION ANALYSER COUPLED TO RAPID EVAPORATIVE...

Apparatus and Methods for Ion Manipulation Having Improved Duty Cycle

TUNING A MASS SPECTROMETER FILTER

SYSTEMS AND METHODS FOR ANALYZING SAMPLES

TIME-OF-FLIGHT MASS SPECTROMETRIC ANALYSIS OF LABELLED ANALYTE IONS

SYSTEMS AND METHODS FOR MULTISTAGE MASS SPECTROMETRY UTILIZING AN E...

ION GUIDE

NANOTIP ION SOURCES AND METHODS

High resolution multi-reflection time-of-flight mass analyser

CURVED ION GUIDES AND RELATED SYSTEMS AND METHODS

AN ION SHUTTER, A METHOD OF CONTROLLING ION SHUTTER, AND DETECTION...

Ion Entry/Exit Device

ACCELERATOR FOR MULTI-PASS MASS SPECTROMETERS

APPARATUS AND METHOD FOR HIGH-PERFORMANCE CHARGED PARTICLE DETECTION

DEFLECTORS FOR ION BEAMS AND MASS SPECTROMETRY SYSTEMS COMPRISING T...

EFFICIENT AND STABLE SECONDARY ION EXTRACTION APPARATUS