ion-sensitive field-effect transistor [ISFET]

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H01L2924/13073

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HELECTRICITY H01Electric elements H01LSEMICONDUCTOR DEVICES ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00

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H01L2924/13073ion-sensitive field-effect transistor [ISFET]

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Patents Grantslast 30 patents

Information Patent Grant
Dry etch process landing on metal oxide etch stop layer over metal...
- Patent number 11,195,725
- Issue date Dec 7, 2021
- Texas Instruments Incorporated
- Sebastian Meier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Ion sensor, ion concentration measurement method, and electronic co...
- Patent number 10,845,323
- Issue date Nov 24, 2020
- Waseda University
- Hiroshi Kawarada
- G01 - MEASURING TESTING
Information Patent Grant
Ion-sensitive field-effect transistor with micro-pillar well to enh...
- Patent number 10,788,446
- Issue date Sep 29, 2020
- International Business Machines Corporation
- Juntao Li
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Dry etch process landing on metal oxide etch stop layer over metal...
- Patent number 10,707,089
- Issue date Jul 7, 2020
- Texas Instruments Incorporated
- Sebastian Meier
- G01 - MEASURING TESTING
Information Patent Grant
pH or concentration measuring device and pH or concentration measur...
- Patent number 8,815,078
- Issue date Aug 26, 2014
- National University Corporation Okayama University
- Akira Yamada
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DRY ETCH PROCESS LANDING ON METAL OXIDE ETCH STOP LAYER OVER METAL...
- Publication number 20200303202
- Publication date Sep 24, 2020
- TEXAS INSTRUMENTS INCORPORATED
- Sebastian Meier
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DRY ETCH PROCESS LANDING ON METAL OXIDE ETCH STOP LAYER OVER METAL...
- Publication number 20190304796
- Publication date Oct 3, 2019
- TEXAS INSTRUMENTS INCORPORATED
- Sebastian Meier
- G01 - MEASURING TESTING
Information Patent Application
pH OR CONCENTRATION MEASURING DEVICE AND pH OR CONCENTRATION MEASUR...
- Publication number 20120145563
- Publication date Jun 14, 2012
- National University Corporation Okayama University
- Akira Yamada
- G01 - MEASURING TESTING