Ion sources Ion guns

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H01J49/10

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Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J49/00Particle spectrometer or separator tubes

Current Industry

H01J49/10Ion sources Ion guns

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and methods for detection and quantification of elements...
- Patent number 12,322,584
- Issue date Jun 3, 2025
- Georgetown University
- Kaveh Jorabchi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tissue analysis by mass spectrometry or ion mobility spectrometry
- Patent number 12,315,714
- Issue date May 27, 2025
- Micromass UK Limited
- Steven Derek Pringle
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Shaped-channel scanning nozzle for scanning of a material surface
- Patent number 12,300,480
- Issue date May 13, 2025
- Elemental Scientific, Inc.
- Beau A. Marth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Flow analysis device and flow analysis method
- Patent number 12,298,250
- Issue date May 13, 2025
- BL TEC K.K.
- Yorihiro Kumazawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Non-radioactive plasma ion source device
- Patent number 12,283,473
- Issue date Apr 22, 2025
- MICROPLASMA SYSTEMS, LLC
- James Joseph Alberti
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High resolution imaging apparatus and method
- Patent number 12,278,098
- Issue date Apr 15, 2025
- STANDARD BIOTOOLS CANADA INC.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Quantitation of tamoxifen and metabolites thereof by mass spectrometry
- Patent number 12,270,803
- Issue date Apr 8, 2025
- Quest Diagnostics Investments LLC
- Nigel Clarke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit applicable to performing system protection throu...
- Patent number 12,254,125
- Issue date Mar 18, 2025
- Realtek Semiconductor Corp.
- Chang-Hsien Tai
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for determining direction and distance of metallogenic pluto...
- Patent number 12,255,058
- Issue date Mar 18, 2025
- Tibet Julong Copper Co., Ltd.
- Youye Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass spectrometric determination of fatty acids
- Patent number 12,243,732
- Issue date Mar 4, 2025
- Quest Diagnostics Investments LLC
- Scott Goldman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle mass spectrometry
- Patent number 12,243,736
- Issue date Mar 4, 2025
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Switchable ion guide
- Patent number 12,243,734
- Issue date Mar 4, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Henning Wehrs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Inductively coupled plasma torch structure with flared outlet
- Patent number 12,219,687
- Issue date Feb 4, 2025
- Elemental Scientific, Inc.
- Daniel R. Wiederin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system to align the firing of a laser ablation apparatus...
- Patent number 12,211,683
- Issue date Jan 28, 2025
- Nicholas Russell West
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for determining ore-forming environment of porphyry deposit...
- Patent number 12,203,917
- Issue date Jan 21, 2025
- China University of Geosciences (Beijing)
- Youye Zheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for identifying a reagent during a process in an analysis sy...
- Patent number 12,203,905
- Issue date Jan 21, 2025
- Roche Diagnostics Operations, Inc.
- Dieter Heindl
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Grant
Mass spectrometer
- Patent number 12,198,918
- Issue date Jan 14, 2025
- YOUNG IN ACE Co., Ltd.
- Sung Won Kang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
High-voltage power supply device
- Patent number 12,191,849
- Issue date Jan 7, 2025
- Shimadzu Corporation
- Haruki Osa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Laterally-extended trapped ion mobility spectrometer
- Patent number 12,163,919
- Issue date Dec 10, 2024
- Melvin Andrew Park
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus and method for agricultural contaminant detection
- Patent number 12,159,774
- Issue date Dec 3, 2024
- Arrowhead Center, Inc.
- Gary A. Eiceman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems and methods for single particle analysis
- Patent number 12,154,777
- Issue date Nov 26, 2024
- SHANGHAI POLARIS BIOLOGY CO., LTD.
- Yupeng Cheng
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 12,152,966
- Issue date Nov 26, 2024
- Elemental Scientific, Inc.
- Beau A. Marth
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Interference suppression in mass spectrometer
- Patent number 12,148,605
- Issue date Nov 19, 2024
- Thermo Fisher Scientific (Bremen) GmbH
- Mikhail Belov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Autofocus sample imaging apparatus and method
- Patent number 12,124,020
- Issue date Oct 22, 2024
- STANDARD BIOTOOLS CANADA INC.
- Daaf Sandkuijl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for producing a magnetic powder
- Patent number 12,119,170
- Issue date Oct 15, 2024
- ABB Schweiz AG
- Reinhard Simon
- B22 - CASTING POWDER METALLURGY
Information Patent Grant
Method for mass spectrometry
- Patent number 12,112,934
- Issue date Oct 8, 2024
- Yves Le Blanc
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Magnetically coupled valve
- Patent number 12,104,710
- Issue date Oct 1, 2024
- Elemental Scientific, Inc.
- Caleb Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Mass analysis system, and method for determining performance of mas...
- Patent number 12,106,951
- Issue date Oct 1, 2024
- HITACHI HIGH-TECH CORPORATION
- Yuka Sumigama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Detection method of metal impurity in wafer
- Patent number 12,107,016
- Issue date Oct 1, 2024
- ZING SEMICONDUCTOR CORPORATION
- Lanlin Wen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Systems for integrated decomposition and scanning of a semiconducti...
- Patent number 12,094,738
- Issue date Sep 17, 2024
- Elemental Scientific, Inc.
- Tyler Yost
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
MASS SPECTROMETRIC DETERMINATION OF FATTY ACIDS
- Publication number 20250174445
- Publication date May 29, 2025
- Quest Diagnostics Investments LLC
- Scott Goldman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, METHOD, AND PROGRAM THAT PROVIDE TOTAL HEALTHCARE SOLUTI...
- Publication number 20250166833
- Publication date May 22, 2025
- PRECISION AND PERSONALIZED MEDICINE INCORPORATION (PPMI)
- Tai Gyu LEE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM AND METHOD FOR SPECTROMETRY OF A SAMPLE IN A PLASMA
- Publication number 20250159789
- Publication date May 15, 2025
- FEI Company
- Sean KELLOGG
- G01 - MEASURING TESTING
Information Patent Application
ABLATION DEVICE
- Publication number 20250157807
- Publication date May 15, 2025
- GEOMAR Helmholtz Centre for Ocean Research Kiel
- Jan Fietzke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SKIMMERS FOR PLASMA INTERFACES
- Publication number 20250149322
- Publication date May 8, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Joachim Hinrichs
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MAGNETICALLY COUPLED VALVE
- Publication number 20250129862
- Publication date Apr 24, 2025
- ELEMENTAL SCIENTIFIC, INC.
- Caleb Gilmore
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH FLARED OUTLET
- Publication number 20250126700
- Publication date Apr 17, 2025
- ELEMENTAL SCIENTIFIC, INC.
- Daniel R. Wiederin
- G01 - MEASURING TESTING
Information Patent Application
FLOW ANALYSIS DEVICE AND FLOW ANALYSIS METHOD
- Publication number 20250110056
- Publication date Apr 3, 2025
- BL TEC K.K.
- Yorihiro KUMAZAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER
- Publication number 20250093297
- Publication date Mar 20, 2025
- Bruker Scientific LLC
- Melvin Andrew PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
STRETCHABLE COUPLING TUBE
- Publication number 20250093252
- Publication date Mar 20, 2025
- Standard BioTools Canada Inc.
- Alexander Loboda
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER
- Publication number 20250093298
- Publication date Mar 20, 2025
- Bruker Scientific LLC
- Melvin Andrew PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER
- Publication number 20250076250
- Publication date Mar 6, 2025
- Bruker Scientific LLC
- Melvin Andrew PARK
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEMS AND METHODS FOR RECOVERING ORGANIC CONTAMINANTS FROM SEMICO...
- Publication number 20250079145
- Publication date Mar 6, 2025
- ELEMENTAL SCIENTIFIC, INC.
- Jacob Unnerstall
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR AGRICULTURAL CONTAMINANT DETECTION
- Publication number 20250069874
- Publication date Feb 27, 2025
- Arrowhead Center, Inc.
- Gary A. Eiceman
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FAILURE DETECTION OF SAMPLE INTRODUCTION SYSTEMS
- Publication number 20250069876
- Publication date Feb 27, 2025
- Thermo Fisher Scientific (Bremen) GmbH
- Antonella Guzzonato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD
- Publication number 20250044571
- Publication date Feb 6, 2025
- Standard BioTools Canada Inc.
- Daaf Sandkuijl
- G01 - MEASURING TESTING
Information Patent Application
MASS SPECTROMETER AND CONTROL METHOD THEREFOR
- Publication number 20250037984
- Publication date Jan 30, 2025
- Shimadzu Corporation
- Ryo FUJITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SINGLE-PARTICLE INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY PARTIC...
- Publication number 20250020567
- Publication date Jan 16, 2025
- ECOLE POLYTECHNIQUE FEDERALE DE LAUSANNE (EPFL)
- Cedric David KOOLEN
- G01 - MEASURING TESTING
Information Patent Application
GAS ANALYZING APPARATUS AND CONTROL METHOD
- Publication number 20250020613
- Publication date Jan 16, 2025
- ATONARP INC.
- Naoki TAKAHASHI
- G01 - MEASURING TESTING
Information Patent Application
INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER
- Publication number 20250014884
- Publication date Jan 9, 2025
- Shimadzu Corporation
- Tomoyoshi MATSUSHITA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Techniques for Determining Active Ingredient (AI) Volatility for Ag...
- Publication number 20240426795
- Publication date Dec 26, 2024
- Battelle Memorial Institute
- Timothy E. Lane
- A01 - AGRICULTURE FORESTRY ANIMAL HUSBANDRY HUNTING TRAPPING FISHING
Information Patent Application
AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...
- Publication number 20240426796
- Publication date Dec 26, 2024
- ELEMENTAL SCIENTIFIC, INC.
- Alexander Lang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING ORE-FORMING ENVIRONMENT OF PORPHYRY DEPOSIT...
- Publication number 20240426802
- Publication date Dec 26, 2024
- China University of Geosciences (Beijing)
- Youye ZHENG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE
- Publication number 20240429037
- Publication date Dec 26, 2024
- Analytik Jena GmbH+Co. KG
- Iouri Kalinitchenko
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING MAGNETIC MATERIALS IN LITHIUM HYDROXIDE MONOHY...
- Publication number 20240426719
- Publication date Dec 26, 2024
- ENERGYSOURCE MINERALS, LLC
- Carlos Maria Valerio
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION TIME-OF-FLIGHT MASS SPECTROMETER AND METHODS OF PRO...
- Publication number 20240420944
- Publication date Dec 19, 2024
- Academia Sinica
- Yi-Sheng WANG
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...
- Publication number 20240420941
- Publication date Dec 19, 2024
- GEOMAR Helmholtz Centre for Ocean Research Kiel
- Jan Fietzke
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
MASS SPECTROMETER
- Publication number 20240412965
- Publication date Dec 12, 2024
- Shimadzu Corporation
- Yusuke SAKAGOSHI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NON-CERULOPLASMIN BOUND COPPER LEVEL MONITORING
- Publication number 20240382435
- Publication date Nov 21, 2024
- ORPHALAN S.A.
- Naseem Amin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH RESOLUTION IMAGING APPARATUS AND METHOD
- Publication number 20240371622
- Publication date Nov 7, 2024
- Standard BioTools Canada Inc.
- Paul Corkum
- H01 - BASIC ELECTRIC ELEMENTS

Ion sources Ion guns

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Apparatus and methods for detection and quantification of elements...

Tissue analysis by mass spectrometry or ion mobility spectrometry

Shaped-channel scanning nozzle for scanning of a material surface

Flow analysis device and flow analysis method

Non-radioactive plasma ion source device

High resolution imaging apparatus and method

Quantitation of tamoxifen and metabolites thereof by mass spectrometry

Integrated circuit applicable to performing system protection throu...

Method for determining direction and distance of metallogenic pluto...

Mass spectrometric determination of fatty acids

Particle mass spectrometry

Switchable ion guide

Inductively coupled plasma torch structure with flared outlet

Method and system to align the firing of a laser ablation apparatus...

Method for determining ore-forming environment of porphyry deposit...

Method for identifying a reagent during a process in an analysis sy...

Mass spectrometer

High-voltage power supply device

Laterally-extended trapped ion mobility spectrometer

Apparatus and method for agricultural contaminant detection

Systems and methods for single particle analysis

Systems for integrated decomposition and scanning of a semiconducti...

Interference suppression in mass spectrometer

Autofocus sample imaging apparatus and method

Method for producing a magnetic powder

Method for mass spectrometry

Magnetically coupled valve

Mass analysis system, and method for determining performance of mas...

Detection method of metal impurity in wafer

Systems for integrated decomposition and scanning of a semiconducti...

Patents Applicationslast 30 patents

MASS SPECTROMETRIC DETERMINATION OF FATTY ACIDS

APPARATUS, METHOD, AND PROGRAM THAT PROVIDE TOTAL HEALTHCARE SOLUTI...

SYSTEM AND METHOD FOR SPECTROMETRY OF A SAMPLE IN A PLASMA

ABLATION DEVICE

SKIMMERS FOR PLASMA INTERFACES

MAGNETICALLY COUPLED VALVE

INDUCTIVELY COUPLED PLASMA TORCH STRUCTURE WITH FLARED OUTLET

FLOW ANALYSIS DEVICE AND FLOW ANALYSIS METHOD

LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER

STRETCHABLE COUPLING TUBE

LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER

LATERALLY-EXTENDED TRAPPED ION MOBILITY SPECTROMETER

SYSTEMS AND METHODS FOR RECOVERING ORGANIC CONTAMINANTS FROM SEMICO...

APPARATUS AND METHOD FOR AGRICULTURAL CONTAMINANT DETECTION

FAILURE DETECTION OF SAMPLE INTRODUCTION SYSTEMS

AUTOFOCUS SAMPLE IMAGING APPARATUS AND METHOD

MASS SPECTROMETER AND CONTROL METHOD THEREFOR

SINGLE-PARTICLE INDUCTIVELY-COUPLED PLASMA MASS SPECTROMETRY PARTIC...

GAS ANALYZING APPARATUS AND CONTROL METHOD

INDUCTIVELY COUPLED PLASMA MASS SPECTROMETER

Techniques for Determining Active Ingredient (AI) Volatility for Ag...

AUTOMATED SYSTEM FOR ONLINE DETECTION OF ORGANIC MOLECULAR IMPURITI...

METHOD FOR DETERMINING ORE-FORMING ENVIRONMENT OF PORPHYRY DEPOSIT...

MASS SPECTROMETER FOR ANALYZING AN ANALYTE SAMPLE

METHOD FOR ANALYZING MAGNETIC MATERIALS IN LITHIUM HYDROXIDE MONOHY...

HIGH RESOLUTION TIME-OF-FLIGHT MASS SPECTROMETER AND METHODS OF PRO...

TEMPERATURE CONTROL PLASMA SOURCE ANALYZER ARRANGEMENT AND TEMPERAT...

MASS SPECTROMETER

NON-CERULOPLASMIN BOUND COPPER LEVEL MONITORING

HIGH RESOLUTION IMAGING APPARATUS AND METHOD