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G01N2223/104

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GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

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G01N2223/104ions

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Patents Grantslast 30 patents

Information Patent Grant
Method for detecting fluorinated chemicals in liquid
- Patent number 11,002,691
- Issue date May 11, 2021
- Graham F. Peaslee
- G01 - MEASURING TESTING
Information Patent Grant
Bulk deposition for tilted mill protection
- Patent number 9,412,560
- Issue date Aug 9, 2016
- FEI Company
- Stacey Stone
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus and sample section forming and thin-piec...
- Patent number 7,531,796
- Issue date May 12, 2009
- SII NanoTechnology Inc.
- Junichi Tashiro
- G01 - MEASURING TESTING
Information Patent Grant
Ion scattering spectroscope
- Patent number 5,371,366
- Issue date Dec 6, 1994
- Shimadzu Corporation
- Takao Marui
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for surface characterization and process contr...
- Patent number 4,393,311
- Issue date Jul 12, 1983
- Bell Telephone Laboratories, Incorporated
- Leonard C. Feldman
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Ion scattering spectrometer with modified bias
- Patent number 4,107,526
- Issue date Aug 15, 1978
- Minnesota Mining and Manufacturing Company
- James T. McKinney
- G01 - MEASURING TESTING
Information Patent Grant
3721825
- Patent number 3,721,825
- Issue date Mar 20, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3408496
- Patent number 3,408,496
- Issue date Oct 29, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3247380
- Patent number 3,247,380
- Issue date Apr 19, 1966
- G01 - MEASURING TESTING
Information Patent Grant
2952776
- Patent number 2,952,776
- Issue date Sep 13, 1960
- G01 - MEASURING TESTING
Information Patent Grant
2872583
- Patent number 2,872,583
- Issue date Feb 3, 1959
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES
- Publication number 20250044476
- Publication date Feb 6, 2025
- SCHLUMBERGER TECHNOLOGY CORPORATION
- Shikha Prasad
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED PROCESS AND SYSTEM FOR MEASUREMENT AND TREATMENT OF TOXI...
- Publication number 20230407199
- Publication date Dec 21, 2023
- Petrochina Company Limited
- Guangyou ZHU
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Method of Characterizing a Crystalline Specimen by Ion or Atom Scat...
- Publication number 20130105688
- Publication date May 2, 2013
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Denis Jalabert
- G01 - MEASURING TESTING
Information Patent Application
DEVICE AND METHOD FOR CRYSTAL ORIENTATION MEASUREMENT BY MEANS OF A...
- Publication number 20100237242
- Publication date Sep 23, 2010
- Robert Schwarzer
- G01 - MEASURING TESTING
Information Patent Application
FOCUSED ION BEAM APPARATUS AND SAMPLE SECTION FORMING AND THIN-PIEC...
- Publication number 20080042059
- Publication date Feb 21, 2008
- Junichi Tashiro
- G01 - MEASURING TESTING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method for detecting fluorinated chemicals in liquid

Bulk deposition for tilted mill protection

Focused ion beam apparatus and sample section forming and thin-piec...

Ion scattering spectroscope

Method and apparatus for surface characterization and process contr...

Ion scattering spectrometer with modified bias

3721825

3408496

3247380

2952776

2872583

Patents Applicationslast 30 patents

LITHIUM DETECTION TECHNIQUES USING NEUTRONS AND/OR ALPHA PARTICLES

INTEGRATED PROCESS AND SYSTEM FOR MEASUREMENT AND TREATMENT OF TOXI...

Method of Characterizing a Crystalline Specimen by Ion or Atom Scat...

DEVICE AND METHOD FOR CRYSTAL ORIENTATION MEASUREMENT BY MEANS OF A...

FOCUSED ION BEAM APPARATUS AND SAMPLE SECTION FORMING AND THIN-PIEC...