Jitter measurements; Jitter generators

Industry

CPC
G01R31/31709

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31709Jitter measurements; Jitter generators

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System testing using partitioned and controlled noise
- Patent number 12,174,251
- Issue date Dec 24, 2024
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Grant
Classifying comparators based on comparator offsets
- Patent number 12,134,713
- Issue date Nov 5, 2024
- Microchip Technology Incorporated
- Zhi-Yuan Zou
- C09 - DYES PAINTS POLISHES NATURAL RESINS ADHESIVES MISCELLANEOUS COMPOSITION...
Information Patent Grant
Jitter noise detector
- Patent number 12,072,365
- Issue date Aug 27, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Sub-sampled based instrument noise correction for jitter measurements
- Patent number 12,055,585
- Issue date Aug 6, 2024
- Skyworks Solutions, Inc.
- Daniel de Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Grant
Time and frequency domain signal conditioning device for switching...
- Patent number 12,044,731
- Issue date Jul 23, 2024
- TRANSSIP, INC.
- Chih Wei Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Hybrid solver for integrated circuit diagnostics and testing
- Patent number 12,038,478
- Issue date Jul 16, 2024
- Xerox Corporation
- Aleksandar B. Feldman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 12,032,018
- Issue date Jul 9, 2024
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
On-die clock period jitter and duty cycle analyzer
- Patent number 11,879,936
- Issue date Jan 23, 2024
- Ampere Computing LLC
- Yeshwant Kolla
- G01 - MEASURING TESTING
Information Patent Grant
Phase noise measurement method and measurement system
- Patent number 11,874,312
- Issue date Jan 16, 2024
- Rohde & Schwarz GmbH & Co. KG
- Andreas Lagler
- G01 - MEASURING TESTING
Information Patent Grant
Data recovery method and measurement instrument
- Patent number 11,846,671
- Issue date Dec 19, 2023
- Rohde & Schwarz GmbH & Co. KG
- Adrian Ispas
- G01 - MEASURING TESTING
Information Patent Grant
Jitter noise detector
- Patent number 11,808,798
- Issue date Nov 7, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Vehicle control device and control method thereof
- Patent number 11,799,598
- Issue date Oct 24, 2023
- Hitachi Astemo, Ltd.
- Tsunamichi Tsukidate
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Jitter self-test using timestamps
- Patent number 11,764,913
- Issue date Sep 19, 2023
- Skyworks Solutions, Inc.
- Raghunandan K. Ranganathan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Grant
On-chip spread spectrum characterization
- Patent number 11,714,127
- Issue date Aug 1, 2023
- International Business Machines Corporation
- Christopher W. Steffen
- G01 - MEASURING TESTING
Information Patent Grant
Instrument noise correction for jitter measurements
- Patent number 11,709,201
- Issue date Jul 25, 2023
- Skyworks Solutions, Inc.
- Daniel De Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Grant
Time measurement of a clock-based signal
- Patent number 11,705,917
- Issue date Jul 18, 2023
- Infineon Technologies AG
- Mihail Jefremow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,674,993
- Issue date Jun 13, 2023
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and methods to alter a phase speed of an output clock
- Patent number 11,646,740
- Issue date May 9, 2023
- ARM Limited
- Benoit Labbe
- G01 - MEASURING TESTING
Information Patent Grant
Method of updating firmware of chip stably and effectively, firmwar...
- Patent number 11,630,732
- Issue date Apr 18, 2023
- Fulian Precision Electronics (Tianjin) Co., LTD.
- Li-Yun Hao
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Noise-compensated jitter measurement instrument and methods
- Patent number 11,624,781
- Issue date Apr 11, 2023
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Grant
System and method for receiver equalization and stressed eye testin...
- Patent number 11,624,780
- Issue date Apr 11, 2023
- Huawei Technologies Co., Ltd.
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for analyzing phase noise in a signal from an...
- Patent number 11,592,480
- Issue date Feb 28, 2023
- JITTERLABS LLC
- Gary Giust
- G01 - MEASURING TESTING
Information Patent Grant
Temporal jitter analyzer and analyzing temporal jitter
- Patent number 11,567,127
- Issue date Jan 31, 2023
- GOVERNMENT OF THE UNITED STATES OF AMERICA, AS REPRESENTED BY THE SECRETARY O...
- Joshua Copeland Bienfang
- G01 - MEASURING TESTING
Information Patent Grant
Built-in self test circuit for measuring phase noise of a phase loc...
- Patent number 11,555,851
- Issue date Jan 17, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Mao-Hsuan Chou
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Measuring error in signal under test (SUT) using multiple channel m...
- Patent number 11,536,761
- Issue date Dec 27, 2022
- Keysight Technologies, Inc.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit having receiver jitter tolerance (“JTOL”) measur...
- Patent number 11,525,854
- Issue date Dec 13, 2022
- RAMBUS INC.
- Hae-Chang Lee
- G01 - MEASURING TESTING
Information Patent Grant
Jitter noise detector
- Patent number 11,513,147
- Issue date Nov 29, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Modulating jitter frequency as switching frequency approaches jitte...
- Patent number 11,487,311
- Issue date Nov 1, 2022
- Power Integrations, Inc.
- Giao Minh Pham
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information Patent Grant
Jitter monitoring circuit
- Patent number 11,366,160
- Issue date Jun 21, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Tien-Chien Huang
- G01 - MEASURING TESTING
Information Patent Grant
Signal analysis method and measurement instrument
- Patent number 11,346,884
- Issue date May 31, 2022
- Rohde & Schwarz GmbH & Co. KG
- Adrian Ispas
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR SEPARATING AND MODELING N-UI JITTER BASED ON SPECTRUM
- Publication number 20240369625
- Publication date Nov 7, 2024
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION
- Publication number 20240255572
- Publication date Aug 1, 2024
- Tektronix, Inc.
- Muhammad Saad Chughtai
- G01 - MEASURING TESTING
Information Patent Application
JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE...
- Publication number 20240201254
- Publication date Jun 20, 2024
- Samsung Electronics Co., Ltd.
- Hyeon Gwan Oh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
INSPECTION DEVICE
- Publication number 20240012047
- Publication date Jan 11, 2024
- Hamamatsu Photonics K.K.
- Tomonori NAKAMURA
- G01 - MEASURING TESTING
Information Patent Application
ON-DIE CLOCK PERIOD JITTER AND DUTY CYCLE ANALYZER
- Publication number 20240003969
- Publication date Jan 4, 2024
- Ampere Computing LLC
- Yeshwant KOLLA
- G01 - MEASURING TESTING
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230400494
- Publication date Dec 14, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
SYSTEMS AND METHODS FOR ON-CHIP NOISE MEASUREMENTS
- Publication number 20230400510
- Publication date Dec 14, 2023
- D-WAVE SYSTEMS INC.
- Jed D. Whittaker
- G01 - MEASURING TESTING
Information Patent Application
SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS
- Publication number 20230366928
- Publication date Nov 16, 2023
- Skyworks Solutions, Inc.
- Daniel de Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Receiver Equalization and Stressed Eye Testin...
- Publication number 20230324457
- Publication date Oct 12, 2023
- Huawei Technologies Co., Ltd
- Gang Zhao
- G11 - INFORMATION STORAGE
Information Patent Application
Apparatuses, Methods and Computer Programs for Executing an Executa...
- Publication number 20230258713
- Publication date Aug 17, 2023
- Intel Corporation
- Mateusz Bronk
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and Apparatus for Analyzing Phase Noise in a Signal from an...
- Publication number 20230184828
- Publication date Jun 15, 2023
- JitterLabs LLC
- Gary Giust
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM TESTING USING PARTITIONED AND CONTROLLED NOISE
- Publication number 20230094107
- Publication date Mar 30, 2023
- International Business Machines Corporation
- Mary P. Kusko
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR JITTER INJECTION WITH PRE- AND POST- EMPHAS...
- Publication number 20230099768
- Publication date Mar 30, 2023
- A.T.E. Solutions, Inc.
- Louis Yehuda UNGAR
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF UPDATING FIRMWARE OF CHIP STABLY AND EFFECTIVELY, FIRMWAR...
- Publication number 20230063485
- Publication date Mar 2, 2023
- Fulian Precision Electronics (Tianjin) Co., LTD.
- LI-YUN HAO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
NOVEL JITTER NOISE DETECTOR
- Publication number 20230040034
- Publication date Feb 9, 2023
- Taiwan Semiconductor Manufacturing Co., LTD
- Tien-Chien HUANG
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
JITTER DETERMINATION METHOD AND MEASUREMENT INSTRUMENT
- Publication number 20230008651
- Publication date Jan 12, 2023
- ROHDE & SCHWARZ GMBH & CO. KG
- Andreas Maier
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Circuits and Methods to Alter a Phase Speed of an Output Clock
- Publication number 20230006678
- Publication date Jan 5, 2023
- ARM Limited
- Benoit Labbe
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DATA RECOVERY METHOD AND MEASUREMENT INSTRUMENT
- Publication number 20220373596
- Publication date Nov 24, 2022
- ROHDE & SCHWARZ GMBH & CO. KG
- Adrian Ispas
- G01 - MEASURING TESTING
Information Patent Application
NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS
- Publication number 20220299566
- Publication date Sep 22, 2022
- Tektronix, Inc.
- Mark L. Guenther
- G01 - MEASURING TESTING
Information Patent Application
BUILT-IN SELF TEST CIRCUIT FOR MEASURING PHASE NOISE OF A PHASE LOC...
- Publication number 20220260634
- Publication date Aug 18, 2022
- Taiwan Semiconductor Manufacturing Co., LTD
- Mao-Hsuan Chou
- G01 - MEASURING TESTING
Information Patent Application
JITTER SELF-TEST USING TIMESTAMPS
- Publication number 20220123877
- Publication date Apr 21, 2022
- Skyworks Solutions, Inc.
- Raghunandan K. Ranganathan
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
Method and Apparatus for Analyzing Phase Noise in a Signal From an...
- Publication number 20220120810
- Publication date Apr 21, 2022
- JitterLabs LLC
- Gary Giust
- G01 - MEASURING TESTING
Information Patent Application
Time And Frequency Domain Signal Conditioning Device For Switching...
- Publication number 20220113352
- Publication date Apr 14, 2022
- TransSiP, Inc.
- Chih Wei Wong
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRONIC CIRCUIT FOR ONLINE MONITORING A CLOCK SIGNAL
- Publication number 20220099737
- Publication date Mar 31, 2022
- National Tsing-Hua University
- Shi-Yu Huang
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
TIME MEASUREMENT OF A CLOCK-BASED SIGNAL
- Publication number 20220085824
- Publication date Mar 17, 2022
- INFINEON TECHNOLOGIES AG
- Mihail Jefremow
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...
- Publication number 20220082603
- Publication date Mar 17, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...
- Publication number 20220082604
- Publication date Mar 17, 2022
- KEYSIGHT TECHNOLOGIES, INC.
- Steven D. Draving
- G01 - MEASURING TESTING
Information Patent Application
SYSTEMS AND METHODS FOR TESTING JITTER TOLERANCE
- Publication number 20220082618
- Publication date Mar 17, 2022
- CREDO TECHNOLOGY GROUP LIMITED
- Arshan AGA
- G01 - MEASURING TESTING
Information Patent Application
SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS
- Publication number 20220065927
- Publication date Mar 3, 2022
- Silicon Laboratories Inc.
- Daniel de Godoy Peixoto
- G01 - MEASURING TESTING
Information Patent Application
MODULATING JITTER FREQUENCY AS SWITCHING FREQUENCY APPROACHES JITTE...
- Publication number 20210333811
- Publication date Oct 28, 2021
- Power Integrations, Inc.
- Giao Minh Pham
- H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER

Jitter measurements; Jitter generators

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System testing using partitioned and controlled noise

Classifying comparators based on comparator offsets

Jitter noise detector

Sub-sampled based instrument noise correction for jitter measurements

Time and frequency domain signal conditioning device for switching...

Hybrid solver for integrated circuit diagnostics and testing

System and method for receiver equalization and stressed eye testin...

On-die clock period jitter and duty cycle analyzer

Phase noise measurement method and measurement system

Data recovery method and measurement instrument

Jitter noise detector

Vehicle control device and control method thereof

Jitter self-test using timestamps

On-chip spread spectrum characterization

Instrument noise correction for jitter measurements

Time measurement of a clock-based signal

Measuring error in signal under test (SUT) using multiple channel m...

Circuits and methods to alter a phase speed of an output clock

Method of updating firmware of chip stably and effectively, firmwar...

Noise-compensated jitter measurement instrument and methods

System and method for receiver equalization and stressed eye testin...

Method and apparatus for analyzing phase noise in a signal from an...

Temporal jitter analyzer and analyzing temporal jitter

Built-in self test circuit for measuring phase noise of a phase loc...

Measuring error in signal under test (SUT) using multiple channel m...

Integrated circuit having receiver jitter tolerance (“JTOL”) measur...

Jitter noise detector

Modulating jitter frequency as switching frequency approaches jitte...

Jitter monitoring circuit

Signal analysis method and measurement instrument

Patents Applicationslast 30 patents

METHOD FOR SEPARATING AND MODELING N-UI JITTER BASED ON SPECTRUM

TEST AND MEASUREMENT INSTRUMENT HAVING TAILORED JITTER COMPENSATION

JITTER MEASURING CIRCUIT, JITTER ANALYZING APPARATUS INCLUDING THE...

INSPECTION DEVICE

ON-DIE CLOCK PERIOD JITTER AND DUTY CYCLE ANALYZER

NOVEL JITTER NOISE DETECTOR

SYSTEMS AND METHODS FOR ON-CHIP NOISE MEASUREMENTS

SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS

System and Method for Receiver Equalization and Stressed Eye Testin...

Apparatuses, Methods and Computer Programs for Executing an Executa...

Method and Apparatus for Analyzing Phase Noise in a Signal from an...

SYSTEM TESTING USING PARTITIONED AND CONTROLLED NOISE

SYSTEMS AND METHODS FOR JITTER INJECTION WITH PRE- AND POST- EMPHAS...

METHOD OF UPDATING FIRMWARE OF CHIP STABLY AND EFFECTIVELY, FIRMWAR...

NOVEL JITTER NOISE DETECTOR

JITTER DETERMINATION METHOD AND MEASUREMENT INSTRUMENT

Circuits and Methods to Alter a Phase Speed of an Output Clock

DATA RECOVERY METHOD AND MEASUREMENT INSTRUMENT

NOISE-COMPENSATED JITTER MEASUREMENT INSTRUMENT AND METHODS

BUILT-IN SELF TEST CIRCUIT FOR MEASURING PHASE NOISE OF A PHASE LOC...

JITTER SELF-TEST USING TIMESTAMPS

Method and Apparatus for Analyzing Phase Noise in a Signal From an...

Time And Frequency Domain Signal Conditioning Device For Switching...

ELECTRONIC CIRCUIT FOR ONLINE MONITORING A CLOCK SIGNAL

TIME MEASUREMENT OF A CLOCK-BASED SIGNAL

MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...

MEASURING ERROR IN SIGNAL UNDER TEST (SUT) USING MULTIPLE CHANNEL M...

SYSTEMS AND METHODS FOR TESTING JITTER TOLERANCE

SUB-SAMPLED BASED INSTRUMENT NOISE CORRECTION FOR JITTER MEASUREMENTS

MODULATING JITTER FREQUENCY AS SWITCHING FREQUENCY APPROACHES JITTE...