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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

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G01Q30/14Liquid environment

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Patents Grantslast 30 patents

Information Patent Grant
Coated active cantilever probes for use in topography imaging in op...
- Patent number 11,906,546
- Issue date Feb 20, 2024
- Massachusetts Institute of Technology
- Fangzhou Xia
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope
- Patent number 11,668,729
- Issue date Jun 6, 2023
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Grant
Atomic force microscope probes and methods of manufacturing probes
- Patent number 11,499,990
- Issue date Nov 15, 2022
- Nanosurf AG
- Dominik Ziegler
- G01 - MEASURING TESTING
Information Patent Grant
Treatment of living organisms based on gravitational resonances and...
- Patent number 11,262,379
- Issue date Mar 1, 2022
- Vadim Kukharev
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Method and apparatus for chemical mapping by selective dissolution
- Patent number 11,143,581
- Issue date Oct 12, 2021
- University of Huddersfield
- Michael Reading
- G01 - MEASURING TESTING
Information Patent Grant
Method of performing atomic force microscopy with an ultrasound tra...
- Patent number 11,067,597
- Issue date Jul 20, 2021
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST-NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Martinus Cornelius Johannes Maria Van Riel
- G01 - MEASURING TESTING
Information Patent Grant
In situ tribometer and methods of use
- Patent number 10,908,069
- Issue date Feb 2, 2021
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- G01 - MEASURING TESTING
Information Patent Grant
System and method for preparing cryo-em grids
- Patent number 10,866,172
- Issue date Dec 15, 2020
- Neptune Fluid Flow Systems LLC
- Trevor Allen McQueen
- G01 - MEASURING TESTING
Information Patent Grant
Integrated measurement and micromechanical positioning apparatus fo...
- Patent number 10,828,785
- Issue date Nov 10, 2020
- Sensapex Oy
- Mikko Vähäsöyrinki
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Grant
Scanning probe microscope and cantilever moving method
- Patent number 10,794,931
- Issue date Oct 6, 2020
- SHIMADZU CORPORATION
- Eiji Iida
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for nano-tribological manufacturing of nanostru...
- Patent number 10,768,202
- Issue date Sep 8, 2020
- The Trustees of the University of Pennsylvania
- Robert W. Carpick
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Microfluidic cell for atomic force microscopy
- Patent number 10,712,365
- Issue date Jul 14, 2020
- New Jersey Institute of Technology
- Wen Zhang
- G01 - MEASURING TESTING
Information Patent Grant
Top-cover for a controlled environmental system, top-cover-set and...
- Patent number 10,545,169
- Issue date Jan 28, 2020
- ETH Zurich
- David Martinez-Martin
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Grant
Compact probe for atomic-force microscopy and atomic-force microsco...
- Patent number 10,527,645
- Issue date Jan 7, 2020
- VMICRO
- Benjamin Walter
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder, fixing member and method for fixing sample
- Patent number 10,354,833
- Issue date Jul 16, 2019
- Shimadzu Corporation
- Hiroshi Arai
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for chemical mapping by selective dissolution
- Patent number 10,234,369
- Issue date Mar 19, 2019
- University of Hudderfield
- Michael Reading
- G02 - OPTICS
Information Patent Grant
Metal corrosion resistance evaluation method and evaluation device...
- Patent number 10,215,686
- Issue date Feb 26, 2019
- Hitachi, Ltd.
- Kyoko Hombo
- G01 - MEASURING TESTING
Information Patent Grant
Sample vessel retention structure for scanning probe microscope
- Patent number 10,175,263
- Issue date Jan 8, 2019
- Bruker Nano, Inc.
- Charles Meyer
- G02 - OPTICS
Information Patent Grant
Cantilevered probes having piezoelectric layer, treated section, an...
- Patent number 10,156,585
- Issue date Dec 18, 2018
- Board of Regents of the Nevada System of Higher Education, on Behalf of the U...
- Jesse D. Adams
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope and its sample holder
- Patent number 10,073,116
- Issue date Sep 11, 2018
- Hitachi, Ltd.
- Sanato Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Specimen support and scanning probe microscope
- Patent number 9,746,494
- Issue date Aug 29, 2017
- The Foundation for the Promotion of Industrial Science
- Shuhei Nishida
- G01 - MEASURING TESTING
Information Patent Grant
Analysis of ex vivo cells for disease state detection and therapeut...
- Patent number 9,678,105
- Issue date Jun 13, 2017
- The Regents of the University of California
- James K. Gimzewski
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning probe microscope
- Patent number 9,482,690
- Issue date Nov 1, 2016
- Olympus Corporation
- Nobuaki Sakai
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and measuring method using same
- Patent number 9,423,416
- Issue date Aug 23, 2016
- Hitachi, Ltd.
- Akira Nambu
- G01 - MEASURING TESTING
Information Patent Grant
Scanning probe microscope and sample observation method using same
- Patent number 9,417,262
- Issue date Aug 16, 2016
- Hitachi, Ltd.
- Toshihiko Nakata
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sensor for low force-noise detection in liquids
- Patent number 9,229,028
- Issue date Jan 5, 2016
- The Regents of the University of California
- Dominik Ziegler
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Feedback controller in probe microscope utilizing a switch and a in...
- Patent number 9,140,720
- Issue date Sep 22, 2015
- Boise State University
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Sealed AFM cell
- Patent number 9,110,093
- Issue date Aug 18, 2015
- National University Corporation Kanazawa University
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
System and method for high-speed atomic force microscopy with switc...
- Patent number 9,091,705
- Issue date Jul 28, 2015
- Boise State University
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Fluid delivery for scanning probe microscopy
- Patent number 9,075,082
- Issue date Jul 7, 2015
- Victor B. Kley
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE
- Publication number 20240118310
- Publication date Apr 11, 2024
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...
- Publication number 20220244288
- Publication date Aug 4, 2022
- Massachusetts Institute of Technology
- Fangzhou XIA
- G01 - MEASURING TESTING
Information Patent Application
Atomic Force Microscope
- Publication number 20220236301
- Publication date Jul 28, 2022
- Paris Sciences et Lettres
- Antoine Niguès
- G01 - MEASURING TESTING
Information Patent Application
TREATMENT OF LIVING ORGANISMS BASED ON GRAVITATIONAL RESONANCES AND...
- Publication number 20220026463
- Publication date Jan 27, 2022
- Vadim KUKHAREV
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR PREPARING CRYO-EM GRIDS
- Publication number 20200363301
- Publication date Nov 19, 2020
- Neptune Fluid Flow Systems LLC
- Trevor Allen McQueen
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF PERFORMING ATOMIC FORCE MICROSCOPY
- Publication number 20200348334
- Publication date Nov 5, 2020
- NEDERLANDSE ORGANISATIE VOOR TOEGEPAST- NATUURWETENSCHAPPELIJK ONDERZOEK TNO
- Martinus Cornelius Johannes Maria VAN RIEL
- G01 - MEASURING TESTING
Information Patent Application
ATOMIC FORCE MICROSCOPE PROBES AND METHODS OF MANUFACTURING PROBES
- Publication number 20200124636
- Publication date Apr 23, 2020
- SCUBA PROBE TECHNOLOGIES LLC
- Dominik ZIEGLER
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Chemical Mapping by Selective Dissolution
- Publication number 20190368992
- Publication date Dec 5, 2019
- University of Huddersfield
- Michael Reading
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND CANTILEVER MOVING METHOD
- Publication number 20190317124
- Publication date Oct 17, 2019
- Shimadzu Corporation
- Eiji IIDA
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE
- Publication number 20190212361
- Publication date Jul 11, 2019
- BRUKER NANO, INC.
- Charles MEYER
- G01 - MEASURING TESTING
Information Patent Application
Integrated measurement and micromechanical positioning apparatus fo...
- Publication number 20190077024
- Publication date Mar 14, 2019
- SENSAPEX OY
- Mikko VÄHÄSÖYRINKI
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
MICROFLUIDIC CELL FOR ATOMIC FORCE MICROSCOPY
- Publication number 20190072582
- Publication date Mar 7, 2019
- NEW JERSEY INSTITUTE OF TECHNOLOGY
- Wen Zhang
- G01 - MEASURING TESTING
Information Patent Application
SAMPLE HOLDER, FIXING MEMBER AND METHOD FOR FIXING SAMPLE
- Publication number 20180330914
- Publication date Nov 15, 2018
- Shimadzu Corporation
- Hiroshi ARAI
- G01 - MEASURING TESTING
Information Patent Application
TOP-COVER FOR A CONTROLLED ENVIRONMENTAL SYSTEM, TOP-COVER-SET AND...
- Publication number 20180224479
- Publication date Aug 9, 2018
- UNIVERSITAT BASEL
- David Martinez-Martin
- C12 - BIOCHEMISTRY BEER SPIRITS WINE VINEGAR MICROBIOLOGY ENZYMOLOGY MUTATION...
Information Patent Application
COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...
- Publication number 20180203037
- Publication date Jul 19, 2018
- CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Benjamin WALTER
- G01 - MEASURING TESTING
Information Patent Application
SCANNING PROBE MICROSCOPE AND SAMPLE HOLDER THEREFOR
- Publication number 20170343580
- Publication date Nov 30, 2017
- Hitachi, Ltd
- Sanato NAGATA
- G01 - MEASURING TESTING
Information Patent Application
Method and Apparatus for Chemical Mapping by Selective Dissolution
- Publication number 20170059465
- Publication date Mar 2, 2017
- University of Huddersfield
- Michael Reading
- G02 - OPTICS
Information Patent Application
CANTILEVERED PROBES HAVING PIEZOELECTRIC LAYER, TREATED SECTION, AN...
- Publication number 20160341765
- Publication date Nov 24, 2016
- Board of Regents of the Nevada System of Higher Education, on behalf of the U...
- Jesse D. Adams
- G01 - MEASURING TESTING
Information Patent Application
AFM FLUID DELIVERY/LIQUID EXTRACTION SURFACE SAMPLING/ELECTROSTATIC...
- Publication number 20140326872
- Publication date Nov 6, 2014
- Gary J. VAN BERKEL
- G01 - MEASURING TESTING
Information Patent Application
CANTILEVERED PROBES HAVING PIEZOELECTRIC LAYER, TREATED SECTION, AN...
- Publication number 20140287958
- Publication date Sep 25, 2014
- Jesse D. Adams
- B82 - NANO-TECHNOLOGY
Information Patent Application
SEALED AFM CELL
- Publication number 20140289910
- Publication date Sep 25, 2014
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
SENSOR FOR LOW FORCE-NOISE DETECTION IN LIQUIDS
- Publication number 20140250553
- Publication date Sep 4, 2014
- The Regents of the University of California
- Dominik Ziegler
- B82 - NANO-TECHNOLOGY
Information Patent Application
POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE
- Publication number 20140223614
- Publication date Aug 7, 2014
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...
- Publication number 20140123347
- Publication date May 1, 2014
- The Regents of the University of California
- James K. Gimzewski
- B82 - NANO-TECHNOLOGY
Information Patent Application
Fluid Delivery for Scanning Probe Microscopy
- Publication number 20140082776
- Publication date Mar 20, 2014
- Victor B. Kley
- B82 - NANO-TECHNOLOGY
Information Patent Application
Method and Apparatus for Nanomechanical Measurement Using an Atomic...
- Publication number 20130347147
- Publication date Dec 26, 2013
- Qingze Zou
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR HIGH-SPEED ATOMIC FORCE MICROSCOPY
- Publication number 20130312142
- Publication date Nov 21, 2013
- BOISE STATE UNIVERSITY
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Application
SYSTEM AND METHOD FOR IMAGING SOFT MATERIALS
- Publication number 20130298294
- Publication date Nov 7, 2013
- Byung I. Kim
- B82 - NANO-TECHNOLOGY
Information Patent Application
IN-LIQUID POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE
- Publication number 20130232648
- Publication date Sep 5, 2013
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy...
- Publication number 20120278958
- Publication date Nov 1, 2012
- Min-Feng YU
- G01 - MEASURING TESTING

Liquid environment

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Coated active cantilever probes for use in topography imaging in op...

Atomic force microscope

Atomic force microscope probes and methods of manufacturing probes

Treatment of living organisms based on gravitational resonances and...

Method and apparatus for chemical mapping by selective dissolution

Method of performing atomic force microscopy with an ultrasound tra...

In situ tribometer and methods of use

System and method for preparing cryo-em grids

Integrated measurement and micromechanical positioning apparatus fo...

Scanning probe microscope and cantilever moving method

Systems and methods for nano-tribological manufacturing of nanostru...

Microfluidic cell for atomic force microscopy

Top-cover for a controlled environmental system, top-cover-set and...

Compact probe for atomic-force microscopy and atomic-force microsco...

Sample holder, fixing member and method for fixing sample

Method and apparatus for chemical mapping by selective dissolution

Metal corrosion resistance evaluation method and evaluation device...

Sample vessel retention structure for scanning probe microscope

Cantilevered probes having piezoelectric layer, treated section, an...

Scanning probe microscope and its sample holder

Specimen support and scanning probe microscope

Analysis of ex vivo cells for disease state detection and therapeut...

Scanning probe microscope

Scanning probe microscope and measuring method using same

Scanning probe microscope and sample observation method using same

Sensor for low force-noise detection in liquids

Feedback controller in probe microscope utilizing a switch and a in...

Sealed AFM cell

System and method for high-speed atomic force microscopy with switc...

Fluid delivery for scanning probe microscopy

Patents Applicationslast 30 patents

DEVICE FOR MEASURING AND/OR MODIFYING A SURFACE

COATED ACTIVE CANTILEVER PROBES FOR USE IN TOPOGRAPHY IMAGING IN OP...

Atomic Force Microscope

TREATMENT OF LIVING ORGANISMS BASED ON GRAVITATIONAL RESONANCES AND...

SYSTEM AND METHOD FOR PREPARING CRYO-EM GRIDS

METHOD OF PERFORMING ATOMIC FORCE MICROSCOPY

ATOMIC FORCE MICROSCOPE PROBES AND METHODS OF MANUFACTURING PROBES

Method and Apparatus for Chemical Mapping by Selective Dissolution

SCANNING PROBE MICROSCOPE AND CANTILEVER MOVING METHOD

SAMPLE VESSEL RETENTION STRUCTURE FOR SCANNING PROBE MICROSCOPE

Integrated measurement and micromechanical positioning apparatus fo...

MICROFLUIDIC CELL FOR ATOMIC FORCE MICROSCOPY

SAMPLE HOLDER, FIXING MEMBER AND METHOD FOR FIXING SAMPLE

TOP-COVER FOR A CONTROLLED ENVIRONMENTAL SYSTEM, TOP-COVER-SET AND...

COMPACT PROBE FOR ATOMIC-FORCE MICROSCOPY AND ATOMIC-FORCE MICROSCO...

SCANNING PROBE MICROSCOPE AND SAMPLE HOLDER THEREFOR

Method and Apparatus for Chemical Mapping by Selective Dissolution

CANTILEVERED PROBES HAVING PIEZOELECTRIC LAYER, TREATED SECTION, AN...

AFM FLUID DELIVERY/LIQUID EXTRACTION SURFACE SAMPLING/ELECTROSTATIC...

CANTILEVERED PROBES HAVING PIEZOELECTRIC LAYER, TREATED SECTION, AN...

SEALED AFM CELL

SENSOR FOR LOW FORCE-NOISE DETECTION IN LIQUIDS

POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE

ANALYSIS OF EX VIVO CELLS FOR DISEASE STATE DETECTION AND THERAPEUT...

Fluid Delivery for Scanning Probe Microscopy

Method and Apparatus for Nanomechanical Measurement Using an Atomic...

SYSTEM AND METHOD FOR HIGH-SPEED ATOMIC FORCE MICROSCOPY

SYSTEM AND METHOD FOR IMAGING SOFT MATERIALS

IN-LIQUID POTENTIAL MEASUREMENT DEVICE AND ATOMIC FORCE MICROSCOPE

Ultra-Low Damping Imaging Mode Related to Scanning Probe Microscopy...