Logistic aspects

Industry

CPC
G01R31/31718

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

Current Industry

G01R31/31718Logistic aspects

Industries

Patents Grantslast 30 patents

Information Patent Grant
Secure testing mode
- Patent number 12,105,139
- Issue date Oct 1, 2024
- Advanced Micro Devices, Inc.
- Vidyashankar Viswanathan
- G01 - MEASURING TESTING
Information Patent Grant
Method, product, and system for protocol state graph neural network...
- Patent number 12,038,477
- Issue date Jul 16, 2024
- Cadence Design Systems, Inc.
- Shadi Saba
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pattern generation system with pin function mapping
- Patent number 11,977,115
- Issue date May 7, 2024
- Yangtze Memory Technologies Co., Ltd.
- Feng Ru
- G01 - MEASURING TESTING
Information Patent Grant
Interleaved testing of digital and analog subsystems with on-chip t...
- Patent number 11,940,490
- Issue date Mar 26, 2024
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Grant
Path based controls for ATE mode testing of multicell memory circuit
- Patent number 11,933,844
- Issue date Mar 19, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for binning at final test
- Patent number 11,919,046
- Issue date Mar 5, 2024
- Optimal Plus Ltd.
- Reed Linde
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
System and method for distributed execution of a sequence processin...
- Patent number 11,907,755
- Issue date Feb 20, 2024
- Rohde & Schwarz GmbH & Co. KG
- Sebastian Roeglinger
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Dynamic generation of ATPG mode signals for testing multipath memor...
- Patent number 11,879,940
- Issue date Jan 23, 2024
- Texas Instruments Incorporated
- Wilson Pradeep
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,852,684
- Issue date Dec 26, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for real time outlier detection and product re-bi...
- Patent number 11,852,668
- Issue date Dec 26, 2023
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Integrated circuit profiling and anomaly detection
- Patent number 11,762,013
- Issue date Sep 19, 2023
- PROTEANTECS LTD.
- Evelyn Landman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for determining jitter, storage medium and ele...
- Patent number 11,733,293
- Issue date Aug 22, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Tianchen Lu
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for saving and restoring of initialization action...
- Patent number 11,719,749
- Issue date Aug 8, 2023
- Cadence Design Systems, Inc.
- Tirumala Surya Prasad Annepu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Measurement uncertainty and measurement decision risk analysis tool...
- Patent number 11,719,750
- Issue date Aug 8, 2023
- The United States of America, as represented by the Secretary of the Navy
- Dennis H Jackson
- G01 - MEASURING TESTING
Information Patent Grant
Methods and systems for detecting defects on an electronic assembly
- Patent number 11,650,250
- Issue date May 16, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit spike check apparatus and method
- Patent number 11,639,960
- Issue date May 2, 2023
- Texas Instruments Incorporated
- Robert Gabriel Almendarez
- G01 - MEASURING TESTING
Information Patent Grant
Maximization of side-channel sensitivity for trojan detection
- Patent number 11,579,185
- Issue date Feb 14, 2023
- University of Florida Research Foundation, Inc.
- Prabhat Kumar Mishra
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Interleaved testing of digital and analog subsystems with on-chip t...
- Patent number 11,531,061
- Issue date Dec 20, 2022
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Grant
Glitch power analysis and optimization engine
- Patent number 11,509,303
- Issue date Nov 22, 2022
- SIEMENS INDUSTRY SOFTWARE INC.
- Geng Bai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Grant
Test and measurement system for parallel waveform analysis
- Patent number 11,442,102
- Issue date Sep 13, 2022
- Tektronix, Inc.
- Sriram Mandyam Krishnakumar
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for real time outlier detection and product re-bi...
- Patent number 11,402,419
- Issue date Aug 2, 2022
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Grant
Method for characterization of standard cells with adaptive body bi...
- Patent number 11,361,800
- Issue date Jun 14, 2022
- RACYICS GMBH
- Dennis Walter
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system
- Patent number 11,360,115
- Issue date Jun 14, 2022
- Tokyo Electron Limited
- Takanori Hyakudomi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus, method, and storage medium
- Patent number 11,280,830
- Issue date Mar 22, 2022
- Advantest Corporation
- Shunichi Kanamaki
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a system for a requirement
- Patent number 11,280,828
- Issue date Mar 22, 2022
- Robert Bosch GmbH
- Andreas Grimm
- G01 - MEASURING TESTING
Information Patent Grant
Testing an array of integrated circuits formed on a substrate sheet
- Patent number 11,243,250
- Issue date Feb 8, 2022
- ARM Limited
- James Edward Myers
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for binning at final test
- Patent number 11,235,355
- Issue date Feb 1, 2022
- Optimal Plus Ltd.
- Reed Linde
- G01 - MEASURING TESTING
Information Patent Grant
Portable chip tester with integrated field programmable gate array
- Patent number 11,226,372
- Issue date Jan 18, 2022
- International Business Machines Corporation
- Noah Singer
- G01 - MEASURING TESTING
Information Patent Grant
Method and an apparatus for reducing the effect of local process va...
- Patent number 11,183,224
- Issue date Nov 23, 2021
- RACYICS GMBH
- Sebastian Höppner
- G05 - CONTROLLING REGULATING
Information Patent Grant
Optimization and scheduling of the handling of devices in the autom...
- Patent number 11,156,659
- Issue date Oct 26, 2021
- Advantest Corporation
- Leon Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
VERIFICATION METHOD AND VERIFICATION DEVICE
- Publication number 20240385240
- Publication date Nov 21, 2024
- REALTEK SEMICONDUCTOR CORPORATION
- Xianghua SHEN
- G01 - MEASURING TESTING
Information Patent Application
HIGH THROUGHPUT SORT
- Publication number 20240302431
- Publication date Sep 12, 2024
- INFINEON TECHNOLOGIES AG
- David Addison
- G01 - MEASURING TESTING
Information Patent Application
PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING
- Publication number 20240230756
- Publication date Jul 11, 2024
- Yangtze Memory Technologies Co., Ltd.
- Feng Ru
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR DEVICE, DEBUG SYSTEM, AND DEBUG METHOD
- Publication number 20240168089
- Publication date May 23, 2024
- RENESAS ELECTRONICS CORPORATION
- Masahide MATSUMOTO
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...
- Publication number 20240159813
- Publication date May 16, 2024
- Optimal Plus
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRI...
- Publication number 20240159827
- Publication date May 16, 2024
- Samsung Electronics Co., Ltd.
- Jaecheol Lee
- G01 - MEASURING TESTING
Information Patent Application
Method for performing multiple circuit tests with multiple instrume...
- Publication number 20240159826
- Publication date May 16, 2024
- REALTEK SEMICONDUCTOR CORPORATION
- CHUNG-YI WANG
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20240003968
- Publication date Jan 4, 2024
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TECHNIQUES TO PERFORM SEMICONDUCTOR TESTING
- Publication number 20230258716
- Publication date Aug 17, 2023
- Intel Corporation
- Swadesh Choudhary
- G01 - MEASURING TESTING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20230236245
- Publication date Jul 27, 2023
- Optimal Plus Ltd.
- Leonid Gurov
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD OF MONITORING PERFORMANCE OF AN ELECTRONIC DEVICE
- Publication number 20230184830
- Publication date Jun 15, 2023
- Samsung Electronics Co., Ltd.
- Sunwook KIM
- G01 - MEASURING TESTING
Information Patent Application
SECURE TESTING MODE
- Publication number 20230146154
- Publication date May 11, 2023
- ADVANCED MICRO DEVICES, INC.
- Vidyashankar Viswanathan
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...
- Publication number 20230078568
- Publication date Mar 16, 2023
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...
- Publication number 20220349930
- Publication date Nov 3, 2022
- Optimal Plus Ltd.
- Shaul Teplinsky
- B07 - SEPARATING SOLIDS FROM SOLIDS SORTING
Information Patent Application
PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING
- Publication number 20220317185
- Publication date Oct 6, 2022
- YANGTZE MEMORY TECHNOLOGIES CO., LTD.
- Feng Ru
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR BINNING AT FINAL TEST
- Publication number 20220184665
- Publication date Jun 16, 2022
- Optimal Plus Ltd.
- Reed Linde
- G01 - MEASURING TESTING
Information Patent Application
INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...
- Publication number 20220034965
- Publication date Feb 3, 2022
- QUALCOMM Incorporated
- Praveen Raghuraman
- G01 - MEASURING TESTING
Information Patent Application
GLITCH POWER ANALYSIS AND OPTIMIZATION ENGINE
- Publication number 20210384901
- Publication date Dec 9, 2021
- Siemens Industry Software Inc.
- Geng Bai
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DYNAMIC GENERATION OF ATPG MODE SIGNALS FOR TESTING MULTIPATH MEMOR...
- Publication number 20210318378
- Publication date Oct 14, 2021
- TEXAS INSTRUMENTS INCORPORATED
- WILSON PRADEEP
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING JITTER, STORAGE MEDIUM AND ELE...
- Publication number 20210293878
- Publication date Sep 23, 2021
- Changxin Memory Technologies, Inc.
- Tianchen LU
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM FOR TEST AND MEASUREMENT INSTRUMENTATION DATA COLLECTION AND...
- Publication number 20210286004
- Publication date Sep 16, 2021
- Tektronix, Inc.
- Frederick B. Kuhlman
- G01 - MEASURING TESTING
Information Patent Application
INTEGRATED CIRCUIT SPIKE CHECK APPARATUS AND METHOD
- Publication number 20210286003
- Publication date Sep 16, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Robert Gabriel Almendarez
- G01 - MEASURING TESTING
Information Patent Application
PATH BASED CONTROLS FOR ATE MODE TESTING OF MULTICELL MEMORY CIRCUIT
- Publication number 20210278459
- Publication date Sep 9, 2021
- TEXAS INSTRUMENTS INCORPORATED
- WILSON PRADEEP
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MEASUREMENT UNCERTAINTY AND MEASUREMENT DECISION RISK ANALYSIS TOOL...
- Publication number 20210215758
- Publication date Jul 15, 2021
- The United States of America, as represented by the Secretary of the Navy
- Dennis H Jackson
- G01 - MEASURING TESTING
Information Patent Application
Fail Density-Based Clustering for Yield Loss Detection
- Publication number 20210181253
- Publication date Jun 17, 2021
- TEXAS INSTRUMENTS INCORPORATED
- Istvan Bauer
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION
- Publication number 20210173007
- Publication date Jun 10, 2021
- PROTEANTECS LTD.
- Evelyn LANDMAN
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR DISTRIBUTED EXECUTION OF A SEQUENCE PROCESSIN...
- Publication number 20210157637
- Publication date May 27, 2021
- ROHDE & SCHWARZ GMBH & CO. KG
- Sebastian ROEGLINGER
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PORTABLE CHIP TESTER WITH INTEGRATED FIELD PROGRAMMABLE GATE ARRAY
- Publication number 20210109154
- Publication date Apr 15, 2021
- International Business Machines Corporation
- Noah Singer
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING A SYSTEM FOR A REQUIREMENT
- Publication number 20210055346
- Publication date Feb 25, 2021
- ROBERT BOSCH GmbH
- Andreas Grimm
- G05 - CONTROLLING REGULATING
Information Patent Application
METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY
- Publication number 20210041501
- Publication date Feb 11, 2021
- Optimal Plus Ltd.
- Leonid GUROV
- G01 - MEASURING TESTING

Logistic aspects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Secure testing mode

Method, product, and system for protocol state graph neural network...

Pattern generation system with pin function mapping

Interleaved testing of digital and analog subsystems with on-chip t...

Path based controls for ATE mode testing of multicell memory circuit

System and method for binning at final test

System and method for distributed execution of a sequence processin...

Dynamic generation of ATPG mode signals for testing multipath memor...

Methods and systems for detecting defects on an electronic assembly

Method and system for real time outlier detection and product re-bi...

Integrated circuit profiling and anomaly detection

Method and apparatus for determining jitter, storage medium and ele...

Method and system for saving and restoring of initialization action...

Measurement uncertainty and measurement decision risk analysis tool...

Methods and systems for detecting defects on an electronic assembly

Integrated circuit spike check apparatus and method

Maximization of side-channel sensitivity for trojan detection

Interleaved testing of digital and analog subsystems with on-chip t...

Glitch power analysis and optimization engine

Test and measurement system for parallel waveform analysis

Method and system for real time outlier detection and product re-bi...

Method for characterization of standard cells with adaptive body bi...

Inspection system

Apparatus, method, and storage medium

Method for testing a system for a requirement

Testing an array of integrated circuits formed on a substrate sheet

System and method for binning at final test

Portable chip tester with integrated field programmable gate array

Method and an apparatus for reducing the effect of local process va...

Optimization and scheduling of the handling of devices in the autom...

Patents Applicationslast 30 patents

VERIFICATION METHOD AND VERIFICATION DEVICE

HIGH THROUGHPUT SORT

PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING

SEMICONDUCTOR DEVICE, DEBUG SYSTEM, AND DEBUG METHOD

METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...

METHOD, DEVICE, AND SYSTEM FOR DETECTING FUSE CONFIGURATION FOR TRI...

Method for performing multiple circuit tests with multiple instrume...

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

TECHNIQUES TO PERFORM SEMICONDUCTOR TESTING

METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY

SYSTEM AND METHOD OF MONITORING PERFORMANCE OF AN ELECTRONIC DEVICE

SECURE TESTING MODE

INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...

METHOD AND SYSTEM FOR REAL TIME OUTLIER DETECTION AND PRODUCT RE-BI...

PATTERN GENERATION SYSTEM WITH PIN FUNCTION MAPPING

SYSTEM AND METHOD FOR BINNING AT FINAL TEST

INTERLEAVED TESTING OF DIGITAL AND ANALOG SUBSYSTEMS WITH ON-CHIP T...

GLITCH POWER ANALYSIS AND OPTIMIZATION ENGINE

DYNAMIC GENERATION OF ATPG MODE SIGNALS FOR TESTING MULTIPATH MEMOR...

METHOD AND APPARATUS FOR DETERMINING JITTER, STORAGE MEDIUM AND ELE...

SYSTEM FOR TEST AND MEASUREMENT INSTRUMENTATION DATA COLLECTION AND...

INTEGRATED CIRCUIT SPIKE CHECK APPARATUS AND METHOD

PATH BASED CONTROLS FOR ATE MODE TESTING OF MULTICELL MEMORY CIRCUIT

MEASUREMENT UNCERTAINTY AND MEASUREMENT DECISION RISK ANALYSIS TOOL...

Fail Density-Based Clustering for Yield Loss Detection

INTEGRATED CIRCUIT PROFILING AND ANOMALY DETECTION

SYSTEM AND METHOD FOR DISTRIBUTED EXECUTION OF A SEQUENCE PROCESSIN...

PORTABLE CHIP TESTER WITH INTEGRATED FIELD PROGRAMMABLE GATE ARRAY

METHOD FOR TESTING A SYSTEM FOR A REQUIREMENT

METHODS AND SYSTEMS FOR DETECTING DEFECTS ON AN ELECTRONIC ASSEMBLY