Machining

Industry

CPC
H01J2237/3114

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

HELECTRICITY H01Electric elements H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS H01J2237/00Discharge tubes exposing object to beam

Current Industry

H01J2237/3114Machining

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Milling a multi-layered object
- Patent number 11,440,151
- Issue date Sep 13, 2022
- Yehuda Zur
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Method for removal of matter
- Patent number 10,832,918
- Issue date Nov 10, 2020
- TESCAN Brno, s.r.o.
- Andrey Denisyuk
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,658,154
- Issue date May 19, 2020
- International Business Machines Corporation
- Marc Adam Bergendahl
- G01 - MEASURING TESTING
Information Patent Grant
Assessment and calibration of a high energy beam
- Patent number 10,388,486
- Issue date Aug 20, 2019
- Howmedica Osteonics Corp.
- Lewis Mullen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Tomography sample preparation systems and methods with improved spe...
- Patent number 10,190,953
- Issue date Jan 29, 2019
- Guillaume Delpy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 10,109,455
- Issue date Oct 23, 2018
- International Business Machines Corporation
- Marc Adam Bergendahl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Assessment and calibration of a high energy beam
- Patent number 10,049,852
- Issue date Aug 14, 2018
- Howmedica Osteonics Corp.
- Lewis Mullen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for performing nano beam diffraction analysis
- Patent number 9,978,560
- Issue date May 22, 2018
- International Business Machines Corporation
- Marc Adam Bergendahl
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for preparing cross-sections by ion beam milling
- Patent number 9,947,507
- Issue date Apr 17, 2018
- Carl Zeiss Microscopy GmbH
- Lorenz Lechner
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of producing a freestanding thin film of nano-crystalline gr...
- Patent number 9,908,778
- Issue date Mar 6, 2018
- FEI Company
- Bart Buijsse
- C01 - INORGANIC CHEMISTRY
Information Patent Grant
Method and apparatus for controlling topographical variation on a m...
- Patent number 9,852,750
- Issue date Dec 26, 2017
- FEI Company
- James P. Nadeau
- G11 - INFORMATION STORAGE
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 9,349,570
- Issue date May 24, 2016
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 8,993,962
- Issue date Mar 31, 2015
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 8,796,651
- Issue date Aug 5, 2014
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
Apparatus and method for forming a solid immersion lens using a bin...
- Patent number 8,618,518
- Issue date Dec 31, 2013
- Avago Technologies General IP (Singapore) Pte. Ltd.
- David Winslow Niles
- G02 - OPTICS
Information Patent Grant
Charged particle beam processing method
- Patent number 8,431,913
- Issue date Apr 30, 2013
- Canon Kabushiki Kaisha
- Katsuhiro Funabashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for sample extraction and handling
- Patent number 8,357,913
- Issue date Jan 22, 2013
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for controlling topographical variation on a m...
- Patent number 8,163,145
- Issue date Apr 24, 2012
- FEI Company
- James P. Nadeau
- G11 - INFORMATION STORAGE
Information Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
- Patent number 7,993,504
- Issue date Aug 9, 2011
- International Business Machines Corporation
- Terence L Kane
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,897,936
- Issue date Mar 1, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Grant
FIB milling of copper over organic dielectrics
- Patent number 7,883,630
- Issue date Feb 8, 2011
- DCG Systems, Inc.
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Atomically sharp iridium tip
- Patent number 7,737,414
- Issue date Jun 15, 2010
- Academia Sinica
- Hong-Shi Kuo
- C21 - METALLURGY OF IRON
Information Patent Grant
Method and apparatus for controlling topographical variation on a m...
- Patent number 7,611,610
- Issue date Nov 3, 2009
- FEI Company
- James P. Nadeau
- G11 - INFORMATION STORAGE
Information Patent Grant
Apparatus and method for polishing gemstones and the like
- Patent number 7,459,702
- Issue date Dec 2, 2008
- Jayant Neogi
- B24 - GRINDING POLISHING
Information Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
- Patent number 7,371,689
- Issue date May 13, 2008
- International Business Machines Corporation
- Terence L Kane
- G01 - MEASURING TESTING
Information Patent Grant
Sample holder and ion-beam processing system
- Patent number 7,345,288
- Issue date Mar 18, 2008
- Jeol Ltd.
- Takushi Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Dual angle milling for current perpendicular to plane (CPP) magneto...
- Patent number 7,329,362
- Issue date Feb 12, 2008
- Hitachi Global Storage Technologies Netherlands B.V.
- Marie-Claire Cyrille
- G11 - INFORMATION STORAGE
Information Patent Grant
Method of fabricating electronic component using resist structure w...
- Patent number 7,323,112
- Issue date Jan 29, 2008
- Hitachi Global Storage Technologies Netherlands B.V.
- Amanda Baer
- G11 - INFORMATION STORAGE
Information Patent Grant
Slotted antenna waveguide plasma source
- Patent number 7,305,935
- Issue date Dec 11, 2007
- The United States of America as represented by the Administration of NASA
- John Foster
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Method and apparatus for specimen fabrication
- Patent number 7,268,356
- Issue date Sep 11, 2007
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR

Patents Applicationslast 30 patents

Information Patent Application
MILLING A MULTI-LAYERED OBJECT
- Publication number 20200384592
- Publication date Dec 10, 2020
- APPLIED MATERIALS ISRAEL LTD.
- Yehuda Zur
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
System and Method for Performing Nano Beam Diffraction Analysis
- Publication number 20190035599
- Publication date Jan 31, 2019
- International Business Machines Corporation
- Marc Adam BERGENDAHL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ASSESSMENT AND CALIBRATION OF A HIGH ENERGY BEAM
- Publication number 20180308657
- Publication date Oct 25, 2018
- Howmedica Osteonics Corp.
- Lewis Mullen
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
System and Method for Performing Nano Beam Diffraction Analysis
- Publication number 20180190470
- Publication date Jul 5, 2018
- International Business Machines Corporation
- Marc Adam BERGENDAHL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPE...
- Publication number 20180143110
- Publication date May 24, 2018
- FEI Company
- Guillaume Delpy
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PERFORMING NANO BEAM DIFFRACTION ANALYSIS
- Publication number 20180005798
- Publication date Jan 4, 2018
- International Business Machines Corporation
- Marc Adam BERGENDAHL
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method of Producing a Freestanding Thin Film of Nano-Crystalline Ca...
- Publication number 20160096734
- Publication date Apr 7, 2016
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD OF PRODUCING A FREESTANDING THIN FILM OF NANO-CRYSTALLINE GR...
- Publication number 20150151972
- Publication date Jun 4, 2015
- FEI Company
- Bart Buijsse
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIRECTED MULTI-DEFLECTED ION BEAM MILLING OF A WORK PIECE AND DETER...
- Publication number 20130180843
- Publication date Jul 18, 2013
- CAMTEK LTD
- Dimitri BOGUSLAVSKY
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
- Publication number 20130153785
- Publication date Jun 20, 2013
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF MANUFACTURING WORKPIECE
- Publication number 20120301242
- Publication date Nov 29, 2012
- Canon Kabushiki Kaisha
- Yoshihiro Uehara
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Ion Milling Device, Sample Processing Method, Processing Device, an...
- Publication number 20120298884
- Publication date Nov 29, 2012
- Hitachi High-Technologies Corporation
- Rie Nakajima
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS AND METHOD FOR FORMING A SOLID IMMERSION LENS USING A BIN...
- Publication number 20120235057
- Publication date Sep 20, 2012
- Avago Technologies Enterprise IP (Singapore) Pte. Ltd.
- David Winslow Niles
- G02 - OPTICS
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...
- Publication number 20120199923
- Publication date Aug 9, 2012
- FEI Company
- JAMES P. NADEAU
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR PRODUCING THREE DIMENSIONAL NANO AND MICRO...
- Publication number 20120067718
- Publication date Mar 22, 2012
- The University of Surrey
- David Cox
- G01 - MEASURING TESTING
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20110114476
- Publication date May 19, 2011
- Hitachi, Ltd.
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING
- Publication number 20100305747
- Publication date Dec 2, 2010
- FEI Company
- Enrique Agorio
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM PROCESSING METHOD
- Publication number 20100213393
- Publication date Aug 26, 2010
- Canon Kabushiki Kaisha
- Katsuhiro Funabashi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...
- Publication number 20100108506
- Publication date May 6, 2010
- FEI Company
- JAMES P. NADEAU
- G11 - INFORMATION STORAGE
Information Patent Application
FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS
- Publication number 20090114851
- Publication date May 7, 2009
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Atomically Sharp Iridium Tip
- Publication number 20090110951
- Publication date Apr 30, 2009
- ACADEMIA SINICA
- Hong-Shi Kuo
- C21 - METALLURGY OF IRON
Information Patent Application
Semiconductor device surface roughness reduction
- Publication number 20080311762
- Publication date Dec 18, 2008
- Mark Doczy
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and apparatus for specimen fabrication
- Publication number 20080191151
- Publication date Aug 14, 2008
- Hiroyasu Shichi
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
BACKSIDE UNLAYERING OF MOSFET DEVICES FOR ELECTRICAL AND PHYSICAL C...
- Publication number 20080128086
- Publication date Jun 5, 2008
- International Business Machines Corporation
- Terence L. Kane
- G01 - MEASURING TESTING
Information Patent Application
Directed Multi-Deflected Ion Beam Milling of a Work Piece and Deter...
- Publication number 20080078750
- Publication date Apr 3, 2008
- SELA SEMICONDUCTOR ENGINEERING LABORATORIES LTD.
- Dimitri Boguslavsky
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Atomically sharp edged cutting blades and methods for making same
- Publication number 20070283578
- Publication date Dec 13, 2007
- Martin H. Newman
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS
- Publication number 20060219949
- Publication date Oct 5, 2006
- Credence Systems Corporation
- Vladimir V. Makarov
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
Sample holder and ion-beam processing system
- Publication number 20060169923
- Publication date Aug 3, 2006
- JEOL Ltd.
- Takushi Yamashita
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Object-moving method, object-moving apparatus and production proces...
- Publication number 20060131269
- Publication date Jun 22, 2006
- Canon Kabushiki Kaisha
- Toshiaki Aiba
- B81 - MICRO-STRUCTURAL TECHNOLOGY
Information Patent Application
Apparatus and method for polishing gemstones and the like
- Publication number 20060102854
- Publication date May 18, 2006
- Jayant Neogi
- B24 - GRINDING POLISHING

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Milling a multi-layered object

Method for removal of matter

System and method for performing nano beam diffraction analysis

Assessment and calibration of a high energy beam

Tomography sample preparation systems and methods with improved spe...

System and method for performing nano beam diffraction analysis

Assessment and calibration of a high energy beam

System and method for performing nano beam diffraction analysis

Method for preparing cross-sections by ion beam milling

Method of producing a freestanding thin film of nano-crystalline gr...

Method and apparatus for controlling topographical variation on a m...

Method and apparatus for sample extraction and handling

Method and apparatus for sample extraction and handling

Method and apparatus for specimen fabrication

Apparatus and method for forming a solid immersion lens using a bin...

Charged particle beam processing method

Method and apparatus for sample extraction and handling

Method and apparatus for controlling topographical variation on a m...

Backside unlayering of MOSFET devices for electrical and physical c...

Method and apparatus for specimen fabrication

FIB milling of copper over organic dielectrics

Atomically sharp iridium tip

Method and apparatus for controlling topographical variation on a m...

Apparatus and method for polishing gemstones and the like

Backside unlayering of MOSFET devices for electrical and physical c...

Sample holder and ion-beam processing system

Dual angle milling for current perpendicular to plane (CPP) magneto...

Method of fabricating electronic component using resist structure w...

Slotted antenna waveguide plasma source

Method and apparatus for specimen fabrication

Patents Applicationslast 30 patents

MILLING A MULTI-LAYERED OBJECT

System and Method for Performing Nano Beam Diffraction Analysis

ASSESSMENT AND CALIBRATION OF A HIGH ENERGY BEAM

System and Method for Performing Nano Beam Diffraction Analysis

TOMOGRAPHY SAMPLE PREPARATION SYSTEMS AND METHODS WITH IMPROVED SPE...

SYSTEM AND METHOD FOR PERFORMING NANO BEAM DIFFRACTION ANALYSIS

Method of Producing a Freestanding Thin Film of Nano-Crystalline Ca...

METHOD OF PRODUCING A FREESTANDING THIN FILM OF NANO-CRYSTALLINE GR...

DIRECTED MULTI-DEFLECTED ION BEAM MILLING OF A WORK PIECE AND DETER...

METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

METHOD OF MANUFACTURING WORKPIECE

Ion Milling Device, Sample Processing Method, Processing Device, an...

APPARATUS AND METHOD FOR FORMING A SOLID IMMERSION LENS USING A BIN...

METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...

METHOD AND APPARATUS FOR PRODUCING THREE DIMENSIONAL NANO AND MICRO...

Method and apparatus for specimen fabrication

METHOD AND APPARATUS FOR SAMPLE EXTRACTION AND HANDLING

CHARGED PARTICLE BEAM PROCESSING METHOD

METHOD AND APPARATUS FOR CONTROLLING TOPOGRAPHICAL VARIATION ON A M...

FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS

Atomically Sharp Iridium Tip

Semiconductor device surface roughness reduction

Method and apparatus for specimen fabrication

BACKSIDE UNLAYERING OF MOSFET DEVICES FOR ELECTRICAL AND PHYSICAL C...

Directed Multi-Deflected Ion Beam Milling of a Work Piece and Deter...

Atomically sharp edged cutting blades and methods for making same

FIB MILLING OF COPPER OVER ORGANIC DIELECTRICS

Sample holder and ion-beam processing system

Object-moving method, object-moving apparatus and production proces...

Apparatus and method for polishing gemstones and the like