Magnets

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CPC
G01R1/16

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/16Magnets

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Fault detection device and method for superconducting electrodynami...
- Patent number 12,128,936
- Issue date Oct 29, 2024
- Southwest Jiaotong University
- Jun Zheng
- B61 - RAILWAYS
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,719,742
- Issue date Aug 8, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Conductive particle and testing socket comprising the same
- Patent number 11,693,027
- Issue date Jul 4, 2023
- SNOW CO., LTD.
- Gyu Sun Kim
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 11,506,706
- Issue date Nov 22, 2022
- Taiwan Semiconductor Manufacturing Company, Ltd
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Grant
Magnetic field transducer mounting methods for MTJ device testers
- Patent number 11,162,981
- Issue date Nov 2, 2021
- Integrated Silicon Solution, (Cayman) Inc.
- Danny Yam
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Current sensor
- Patent number 11,105,831
- Issue date Aug 31, 2021
- Denso Corporation
- Takuma Esaka
- G01 - MEASURING TESTING
Information Patent Grant
Jig
- Patent number 10,962,568
- Issue date Mar 30, 2021
- Kabushiki Kaisha Nihon Micronics
- Akihiro Shuto
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor wafer testing system and related method for improving...
- Patent number 10,877,089
- Issue date Dec 29, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field transducer mounting apparatus for MTJ device testers
- Patent number 10,684,310
- Issue date Jun 16, 2020
- Spin Memory, Inc.
- Danny Yam
- G11 - INFORMATION STORAGE
Information Patent Grant
System and method to determine the state of charge of a battery usi...
- Patent number 9,914,366
- Issue date Mar 13, 2018
- GM Global Technology Operations LLC
- Gregory P. Meisner
- B60 - VEHICLES IN GENERAL
Information Patent Grant
System and method to determine the state of charge of a battery usi...
- Patent number 8,872,519
- Issue date Oct 28, 2014
- GM Global Technology Operations LLC
- Gregory P. Meisner
- B60 - VEHICLES IN GENERAL
Information Patent Grant
Magnetically coupled electrical test lead
- Patent number 7,298,136
- Issue date Nov 20, 2007
- Kevin Mark Curtis
- G01 - MEASURING TESTING
Information Patent Grant
Process of manufacturing an instrumentation apparatus with curable...
- Patent number 5,243,752
- Issue date Sep 14, 1993
- Delco Electronics Corporation
- Stephen M. Moore
- G01 - MEASURING TESTING
Information Patent Grant
Magnetic field concentration means and method for an implanted device
- Patent number 4,340,038
- Issue date Jul 20, 1982
- Pacesetter Systems, Inc.
- Brian D. McKean
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method of preparing and installing cobalt-rare earth permanent magnets
- Patent number 4,092,184
- Issue date May 30, 1978
- General Electric Company
- Harold Lloyd Stucker
- G01 - MEASURING TESTING
Information Patent Grant
Panel mounting for electrical device
- Patent number 4,080,570
- Issue date Mar 21, 1978
- Sangamo Weston, Inc.
- David B. Pearson
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for providing a displacement representative of the magnit...
- Patent number 4,044,305
- Issue date Aug 23, 1977
- The Charles Stark Draper Laboratory, Inc.
- George A. Oberbeck
- G01 - MEASURING TESTING
Information Patent Grant
Panel meter with adapter cover
- Patent number 3,997,840
- Issue date Dec 14, 1976
- Weston Instruments, Inc.
- David B. Pearson
- G01 - MEASURING TESTING
Information Patent Grant
Moving coil instrument having electrically conductive coil form par...
- Patent number 3,983,478
- Issue date Sep 28, 1976
- Weston Instruments, Inc.
- David B. Pearson
- G01 - MEASURING TESTING
Information Patent Grant
3882389
- Patent number 3,882,389
- Issue date May 6, 1975
- G01 - MEASURING TESTING
Information Patent Grant
3787766
- Patent number 3,787,766
- Issue date Jan 22, 1974
- G01 - MEASURING TESTING
Information Patent Grant
3784945
- Patent number 3,784,945
- Issue date Jan 8, 1974
- F16 - ENGINEERING ELEMENTS AND UNITS GENERAL MEASURES FOR PRODUCING AND MAINT...
Information Patent Grant
3764909
- Patent number 3,764,909
- Issue date Oct 9, 1973
- G01 - MEASURING TESTING
Information Patent Grant
3684959
- Patent number 3,684,959
- Issue date Aug 15, 1972
- G01 - MEASURING TESTING
Information Patent Grant
3609376
- Patent number 3,609,376
- Issue date Sep 28, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3559060
- Patent number 3,559,060
- Issue date Jan 26, 1971
- G01 - MEASURING TESTING
Information Patent Grant
3500203
- Patent number 3,500,203
- Issue date Mar 10, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3490043
- Patent number 3,490,043
- Issue date Jan 13, 1970
- G01 - MEASURING TESTING
Information Patent Grant
3399316
- Patent number 3,399,316
- Issue date Aug 27, 1968
- G01 - MEASURING TESTING
Information Patent Grant
3111623
- Patent number 3,111,623
- Issue date Nov 19, 1963
- C22 - METALLURGY FERROUS OR NON-FERROUS ALLOYS TREATMENT OF ALLOYS OR NON-FER...

Patents Applicationslast 30 patents

Information Patent Application
FAULT DETECTION DEVICE AND METHOD FOR SUPERCONDUCTING ELECTRODYNAMI...
- Publication number 20240367700
- Publication date Nov 7, 2024
- Southwest Jiaotong University
- Jun ZHENG
- B61 - RAILWAYS
Information Patent Application
PROBE UNIT AND HOLDER FOR A PROBE UNIT
- Publication number 20230333140
- Publication date Oct 19, 2023
- CARL MAHR HOLDING GMBH
- Matthias RUDKOWSKI
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20230333157
- Publication date Oct 19, 2023
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
CONDUCTIVE PARTICLE AND TESTING SOCKET COMPRISING THE SAME
- Publication number 20220057434
- Publication date Feb 24, 2022
- SNOW CO., LTD.
- Gyu Sun KIM
- G01 - MEASURING TESTING
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20210109152
- Publication date Apr 15, 2021
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G11 - INFORMATION STORAGE
Information Patent Application
SYSTEMS AND METHODS FOR MEASURING STRUCTURAL ELEMENT DEFLECTIONS
- Publication number 20200408633
- Publication date Dec 31, 2020
- MachineSense, LLC
- Biplab Pal
- G01 - MEASURING TESTING
Information Patent Application
SUPPLEMENTARY BUSHING, TEST PROBE, AND SUPPLEMENTARY TESTING DEVICE
- Publication number 20200348339
- Publication date Nov 5, 2020
- APEX PROBES TECHNOLOGY CO., LTD.
- MING-DAO WU
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Field Transducer Mounting Methods for MTJ Device Testers
- Publication number 20200166544
- Publication date May 28, 2020
- Spin Memory, Inc.
- Danny YAM
- G11 - INFORMATION STORAGE
Information Patent Application
SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...
- Publication number 20200096559
- Publication date Mar 26, 2020
- Taiwan Semiconductor Manufacturing Co., LTD
- Harry-Hak-Lay Chuang
- G01 - MEASURING TESTING
Information Patent Application
JIG
- Publication number 20200025800
- Publication date Jan 23, 2020
- Kabushiki Kaisha Nihon Micronics
- Akihiro SHUTO
- G01 - MEASURING TESTING
Information Patent Application
CURRENT SENSOR
- Publication number 20200025803
- Publication date Jan 23, 2020
- DENSO CORPORATION
- Takuma ESAKA
- G01 - MEASURING TESTING
Information Patent Application
Magnetic Field Transducer Mounting Apparatus for MTJ Device Testers
- Publication number 20190195914
- Publication date Jun 27, 2019
- Spin Transfer Technologies, Inc.
- Danny YAM
- G01 - MEASURING TESTING
Information Patent Application
TESTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE
- Publication number 20190137543
- Publication date May 9, 2019
- Samsung Electronics Co., Ltd.
- Kyoung Hun Eo
- G01 - MEASURING TESTING
Information Patent Application
MAGNETIC ASSEMBLY AND MAGNETIC CORE SET THEREOF
- Publication number 20180172733
- Publication date Jun 21, 2018
- Delta Electronics, Inc.
- Yi-Fan Wu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CIRCUIT PROBING SYSTEM AND ITS CIRCUIT PROBING DEVICE
- Publication number 20170045554
- Publication date Feb 16, 2017
- Global Unichip Corporation
- Chih-Chieh LIAO
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD TO DETERMINE THE STATE OF CHARGE OF A BATTERY USI...
- Publication number 20140297084
- Publication date Oct 2, 2014
- Gregory P. Meisner
- B60 - VEHICLES IN GENERAL
Information Patent Application
SYSTEM AND METHOD TO DETERMINE THE STATE OF CHARGE OF A BATTERY USI...
- Publication number 20100079145
- Publication date Apr 1, 2010
- GM Global Technology Operations, Inc.
- Gregory P. Meisner
- B60 - VEHICLES IN GENERAL

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Fault detection device and method for superconducting electrodynami...

Semiconductor wafer testing system and related method for improving...

Conductive particle and testing socket comprising the same

Semiconductor wafer testing system and related method for improving...

Magnetic field transducer mounting methods for MTJ device testers

Current sensor

Jig

Semiconductor wafer testing system and related method for improving...

Magnetic field transducer mounting apparatus for MTJ device testers

System and method to determine the state of charge of a battery usi...

System and method to determine the state of charge of a battery usi...

Magnetically coupled electrical test lead

Process of manufacturing an instrumentation apparatus with curable...

Magnetic field concentration means and method for an implanted device

Method of preparing and installing cobalt-rare earth permanent magnets

Panel mounting for electrical device

Apparatus for providing a displacement representative of the magnit...

Panel meter with adapter cover

Moving coil instrument having electrically conductive coil form par...

3882389

3787766

3784945

3764909

3684959

3609376

3559060

3500203

3490043

3399316

3111623

Patents Applicationslast 30 patents

FAULT DETECTION DEVICE AND METHOD FOR SUPERCONDUCTING ELECTRODYNAMI...

PROBE UNIT AND HOLDER FOR A PROBE UNIT

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

CONDUCTIVE PARTICLE AND TESTING SOCKET COMPRISING THE SAME

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

SYSTEMS AND METHODS FOR MEASURING STRUCTURAL ELEMENT DEFLECTIONS

SUPPLEMENTARY BUSHING, TEST PROBE, AND SUPPLEMENTARY TESTING DEVICE

Magnetic Field Transducer Mounting Methods for MTJ Device Testers

SEMICONDUCTOR WAFER TESTING SYSTEM AND RELATED METHOD FOR IMPROVING...

JIG

CURRENT SENSOR

Magnetic Field Transducer Mounting Apparatus for MTJ Device Testers

TESTING APPARATUS FOR TESTING A SEMICONDUCTOR DEVICE

MAGNETIC ASSEMBLY AND MAGNETIC CORE SET THEREOF

CIRCUIT PROBING SYSTEM AND ITS CIRCUIT PROBING DEVICE

SYSTEM AND METHOD TO DETERMINE THE STATE OF CHARGE OF A BATTERY USI...

SYSTEM AND METHOD TO DETERMINE THE STATE OF CHARGE OF A BATTERY USI...