manipulating each probe element or tip individually

Industry

CPC
G01R1/07392

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R1/00Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00

Current Industry

G01R1/07392manipulating each probe element or tip individually

Industries

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Patents Grantslast 30 patents

Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,971,449
- Issue date Apr 30, 2024
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency data differential testing probe
- Patent number 11,698,390
- Issue date Jul 11, 2023
- Signal Microwave, LLC
- William Rosas
- G01 - MEASURING TESTING
Information Patent Grant
Multi-angle sample holder with integrated micromanipulator
- Patent number 11,604,212
- Issue date Mar 14, 2023
- Meta Platforms, Inc.
- Pradip Sairam Pichumani
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency data differential testing probe
- Patent number 11,543,434
- Issue date Jan 3, 2023
- Signal Microwave, LLC
- William Rosas
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure
- Patent number 11,226,380
- Issue date Jan 18, 2022
- Murata Manufacturing Co., Ltd.
- Shinichi Kenzaki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Robot-assisted hardware testing
- Patent number 11,221,349
- Issue date Jan 11, 2022
- POSIT SYSTEMS LTD.
- David Arlinsky
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Probe head for a testing apparatus of electronic devices with enhan...
- Patent number 11,163,004
- Issue date Nov 2, 2021
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Grant
Device test pad probe card structure with individual probe manipula...
- Patent number 11,137,418
- Issue date Oct 5, 2021
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency data differential testing probe
- Patent number 10,852,322
- Issue date Dec 1, 2020
- Signal Microwave, LLC
- William Rosas
- G01 - MEASURING TESTING
Information Patent Grant
Method for retesting wafer
- Patent number 10,753,970
- Issue date Aug 25, 2020
- Yen-Kai Hwang
- G01 - MEASURING TESTING
Information Patent Grant
Probe structure
- Patent number 10,641,814
- Issue date May 5, 2020
- Murata Manufacturing Co., Ltd.
- Shinichi Kenzaki
- G01 - MEASURING TESTING
Information Patent Grant
Tool for automatically replacing defective pogo pins
- Patent number 10,605,831
- Issue date Mar 31, 2020
- International Business Machines Corporation
- Vincent Beauregard
- G01 - MEASURING TESTING
Information Patent Grant
Tool for automatically replacing defective pogo pins
- Patent number 10,598,698
- Issue date Mar 24, 2020
- International Business Machines Corporation
- Vincent Beauregard
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe systems with controlled testing environments
- Patent number 10,281,492
- Issue date May 7, 2019
- FormFactor Beaverton, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Adaptive thermal actuator array for wafer-level applications
- Patent number 10,120,018
- Issue date Nov 6, 2018
- Intel Corporation
- Eric J. M. Moret
- G01 - MEASURING TESTING
Information Patent Grant
Shielded probe systems with controlled testing environments
- Patent number 9,784,763
- Issue date Oct 10, 2017
- Cascade Microtech, Inc.
- Michael Teich
- G01 - MEASURING TESTING
Information Patent Grant
Testing system and method for testing of electrical connections
- Patent number 9,759,743
- Issue date Sep 12, 2017
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing device
- Patent number 9,523,708
- Issue date Dec 20, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Electrical testing machine
- Patent number 9,459,279
- Issue date Oct 4, 2016
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
Dual probing tip system
- Patent number 8,860,449
- Issue date Oct 14, 2014
- Tektronix, Inc.
- James E. Spinar
- G01 - MEASURING TESTING
Information Patent Grant
Switching apparatus and test apparatus
- Patent number 8,841,918
- Issue date Sep 23, 2014
- Advantest Corporation
- Hisao Hori
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing alignment of a probe
- Patent number 8,378,697
- Issue date Feb 19, 2013
- Capres A/S
- Peter Folmer Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing electronic components of a repetitive pattern un...
- Patent number 8,368,413
- Issue date Feb 5, 2013
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Grant
Enclosed probe station
- Patent number 8,188,758
- Issue date May 29, 2012
- Star Technologies, Inc.
- Choon Leong Lou
- G01 - MEASURING TESTING
Information Patent Grant
High speed probing apparatus for semiconductor devices and probe st...
- Patent number 7,986,157
- Issue date Jul 26, 2011
- Star Technologies Inc.
- Yong Yu Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for providing alignment of a probe
- Patent number 7,936,176
- Issue date May 3, 2011
- Capres A/S
- Peter Folmer Nielsen
- G01 - MEASURING TESTING
Information Patent Grant
Finger tester for testing unpopulated printed circuit boards and me...
- Patent number 7,859,281
- Issue date Dec 28, 2010
- ATG Luther & Maelzer GmbH
- Victor Romanov
- G01 - MEASURING TESTING
Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,589,518
- Issue date Sep 15, 2009
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Wafer probe station having a skirting component
- Patent number 7,492,147
- Issue date Feb 17, 2009
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Grant
Test probe for finger tester and corresponding finger tester
- Patent number 7,355,424
- Issue date Apr 8, 2008
- atg test systems GmbH & Co. KG
- Victor Romanov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD
- Publication number 20250116685
- Publication date Apr 10, 2025
- Kabushiki Kaisha Nihon Micronics
- Toshinaga TAKEYA
- G01 - MEASURING TESTING
Information Patent Application
POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...
- Publication number 20240219427
- Publication date Jul 4, 2024
- MPI CORPORATION
- STOJAN KANEV
- G01 - MEASURING TESTING
Information Patent Application
VOICE COIL LEAF SPRING PROBER
- Publication number 20240125847
- Publication date Apr 18, 2024
- MACOM Technology Solutions Holdings, Inc.
- Timothy James VANDERWERF
- G01 - MEASURING TESTING
Information Patent Application
WAFER INSPECTION SYSTEM
- Publication number 20220299564
- Publication date Sep 22, 2022
- MPI Corporation
- YI-HSUAN CHENG
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...
- Publication number 20220034966
- Publication date Feb 3, 2022
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
CUSTOMIZABLE PROBE CARDS, PROBE SYSTEMS INCLUDING THE SAME, AND REL...
- Publication number 20210172978
- Publication date Jun 10, 2021
- FormFactor Beaverton, Inc.
- Yoichi Funatoko
- G01 - MEASURING TESTING
Information Patent Application
TEST FIXTURE AND TESTING MACHINE HAVING THE SAME
- Publication number 20200379011
- Publication date Dec 3, 2020
- TRIPLE WIN TECHNOLOGY(SHENZHEN) CO.LTD.
- YANG-GANG LIU
- G01 - MEASURING TESTING
Information Patent Application
DEVICE TEST PAD PROBE CARD STRUCTURE WITH INDIVIDUAL PROBE MANIPULA...
- Publication number 20200284823
- Publication date Sep 10, 2020
- International Business Machines Corporation
- Kushagra Sinha
- G01 - MEASURING TESTING
Information Patent Application
PROBE STRUCTURE
- Publication number 20200233041
- Publication date Jul 23, 2020
- Murata Manufacturing Co., Ltd.
- Shinichi KENZAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ROBOT-ASSISTED HARDWARE TESTING
- Publication number 20200064372
- Publication date Feb 27, 2020
- POSIT SYSTEMS LTD.
- David ARLINSKY
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Application
PROBE STRUCTURE
- Publication number 20190310301
- Publication date Oct 10, 2019
- Murata Manufacturing Co., Ltd.
- Shinichi KENZAKI
- G01 - MEASURING TESTING
Information Patent Application
PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...
- Publication number 20190302185
- Publication date Oct 3, 2019
- Technoprobe S.p.A.
- Flavio Maggioni
- G01 - MEASURING TESTING
Information Patent Application
Test and Measurement Management
- Publication number 20190285666
- Publication date Sep 19, 2019
- Tektronix, Inc.
- Jan P. Peeters Weem
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR RETESTING WAFER
- Publication number 20190250207
- Publication date Aug 15, 2019
- YEN-KAI HWANG
- G01 - MEASURING TESTING
Information Patent Application
ADAPTIVE THERMAL ACTUATOR ARRAY FOR WAFER-LEVEL APPLICATIONS
- Publication number 20180067160
- Publication date Mar 8, 2018
- Intel Corporation
- Eric J.M. Moret
- G01 - MEASURING TESTING
Information Patent Application
SWITCHING APPARATUS AND TEST APPARATUS
- Publication number 20130038335
- Publication date Feb 14, 2013
- Advantest Corporation
- Hisao HORI
- G01 - MEASURING TESTING
Information Patent Application
Dual Probing Tip System
- Publication number 20120313658
- Publication date Dec 13, 2012
- Tektronix, Inc.
- JAMES E. SPINAR
- G01 - MEASURING TESTING
Information Patent Application
VERTICAL PROBE TIP ROTATIONAL SCRUB AND METHOD
- Publication number 20120139574
- Publication date Jun 7, 2012
- International Business Machines Corporation
- John J. Cassels
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...
- Publication number 20110221461
- Publication date Sep 15, 2011
- Stojan Kanev
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROVIDING ALIGNMENT OF A PROBE
- Publication number 20110169515
- Publication date Jul 14, 2011
- Peter Folmer NIELSEN
- G01 - MEASURING TESTING
Information Patent Application
ENCLOSED PROBE STATION
- Publication number 20100052716
- Publication date Mar 4, 2010
- STAR TECHNOLOGIES INC.
- CHOON LEONG LOU
- G01 - MEASURING TESTING
Information Patent Application
Method for Providing Alignment of a Probe
- Publication number 20090009200
- Publication date Jan 8, 2009
- Capres A/S
- Peter Folmer Nielsen
- G01 - MEASURING TESTING
Information Patent Application
Finger Tester for Testing Unpopulated Printed Circuit Boards and Me...
- Publication number 20080272793
- Publication date Nov 6, 2008
- ATG LUTHER & MAELZER GMBH
- Victor Romanov
- G01 - MEASURING TESTING
Information Patent Application
Wafer probe station having a skirting component
- Publication number 20070290700
- Publication date Dec 20, 2007
- Cascade Microtech, Inc.
- Randy J. Schwindt
- A46 - BRUSHWARE
Information Patent Application
High Resolution Analytical Probe Station
- Publication number 20070290703
- Publication date Dec 20, 2007
- THE MICROMANIPULATOR COMPANY, INC.
- Kenneth F. Hollman
- G01 - MEASURING TESTING
Information Patent Application
Test probe for finger tester and corresponding finger tester
- Publication number 20070001693
- Publication date Jan 4, 2007
- atg test systems GmbH & Co. KG
- Victor Romanov
- G01 - MEASURING TESTING
Information Patent Application
Circuit board test device comprising contact needles which are driv...
- Publication number 20060290368
- Publication date Dec 28, 2006
- SCORPION TECHNOLOGIES AG
- Torsten Korting
- G01 - MEASURING TESTING
Information Patent Application
Selectively configurable probe strucutres, e.g., for testing microe...
- Publication number 20050258848
- Publication date Nov 24, 2005
- Ralph Schaeffer
- G01 - MEASURING TESTING
Information Patent Application
Device for testing printed circuit boards
- Publication number 20050237072
- Publication date Oct 27, 2005
- Gunther Roska
- G01 - MEASURING TESTING
Information Patent Application
Selectively configurable probe structures, e.g., for testing microe...
- Publication number 20050206399
- Publication date Sep 22, 2005
- Micron Technology, Inc.
- Ralph Schaeffer
- G01 - MEASURING TESTING

manipulating each probe element or tip individually

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Probe head for a testing apparatus of electronic devices with enhan...

High-frequency data differential testing probe

Multi-angle sample holder with integrated micromanipulator

High-frequency data differential testing probe

Probe structure

Robot-assisted hardware testing

Probe head for a testing apparatus of electronic devices with enhan...

Device test pad probe card structure with individual probe manipula...

High-frequency data differential testing probe

Method for retesting wafer

Probe structure

Tool for automatically replacing defective pogo pins

Tool for automatically replacing defective pogo pins

Shielded probe systems with controlled testing environments

Adaptive thermal actuator array for wafer-level applications

Shielded probe systems with controlled testing environments

Testing system and method for testing of electrical connections

Electrical testing device

Electrical testing machine

Dual probing tip system

Switching apparatus and test apparatus

Method for providing alignment of a probe

Method for testing electronic components of a repetitive pattern un...

Enclosed probe station

High speed probing apparatus for semiconductor devices and probe st...

Method for providing alignment of a probe

Finger tester for testing unpopulated printed circuit boards and me...

Wafer probe station having a skirting component

Wafer probe station having a skirting component

Test probe for finger tester and corresponding finger tester

Patents Applicationslast 30 patents

PROBE STORAGE JIG, PROBE STORAGE SYSTEM, AND PROBE STORAGE METHOD

POSITIONING METHOD AND PROBE SYSTEM FOR PERFORMING THE SAME, METHOD...

VOICE COIL LEAF SPRING PROBER

WAFER INSPECTION SYSTEM

PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...

CUSTOMIZABLE PROBE CARDS, PROBE SYSTEMS INCLUDING THE SAME, AND REL...

TEST FIXTURE AND TESTING MACHINE HAVING THE SAME

DEVICE TEST PAD PROBE CARD STRUCTURE WITH INDIVIDUAL PROBE MANIPULA...

PROBE STRUCTURE

ROBOT-ASSISTED HARDWARE TESTING

PROBE STRUCTURE

PROBE HEAD FOR A TESTING APPARATUS OF ELECTRONIC DEVICES WITH ENHAN...

Test and Measurement Management

METHOD FOR RETESTING WAFER

ADAPTIVE THERMAL ACTUATOR ARRAY FOR WAFER-LEVEL APPLICATIONS

SWITCHING APPARATUS AND TEST APPARATUS

Dual Probing Tip System

VERTICAL PROBE TIP ROTATIONAL SCRUB AND METHOD

METHOD FOR TESTING ELECTRONIC COMPONENTS OF A REPETITIVE PATTERN UN...

METHOD FOR PROVIDING ALIGNMENT OF A PROBE

ENCLOSED PROBE STATION

Method for Providing Alignment of a Probe

Finger Tester for Testing Unpopulated Printed Circuit Boards and Me...

Wafer probe station having a skirting component

High Resolution Analytical Probe Station

Test probe for finger tester and corresponding finger tester

Circuit board test device comprising contact needles which are driv...

Selectively configurable probe strucutres, e.g., for testing microe...

Device for testing printed circuit boards

Selectively configurable probe structures, e.g., for testing microe...