Mapping zones of defects

Industry

CPC
G01N2021/8864

This industry / category may be too specific. Please go to a parent level for more data

Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES

Current Industry

G01N2021/8864Mapping zones of defects

Industries

Please log in for detailed analytics

Patents Grantslast 30 patents

Information Patent Grant
Qualitative or quantitative characterization of a coating surface
- Patent number 12,203,868
- Issue date Jan 21, 2025
- Evonik Operations GmbH
- Philipp Isken
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Syclops
- Patent number 12,198,319
- Issue date Jan 14, 2025
- Ronald Baker
- G01 - MEASURING TESTING
Information Patent Grant
Reconstruction of thin wall features marginally resolved by multi-d...
- Patent number 12,125,185
- Issue date Oct 22, 2024
- DigiM Solution LLC
- Shuang Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for characterizing defects in silicon crystal
- Patent number 12,092,588
- Issue date Sep 17, 2024
- ZING SEMICONDUCTOR CORPORATION
- Xing Wei
- C30 - CRYSTAL GROWTH
Information Patent Grant
High throughput defect detection
- Patent number 12,092,584
- Issue date Sep 17, 2024
- Applied Materials Israel Ltd.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for determining a three-dimensional definition of...
- Patent number 12,031,812
- Issue date Jul 9, 2024
- VIRELUX Inspection Systems Sàrl
- Tom Reichert
- G01 - MEASURING TESTING
Information Patent Grant
Care area based defect detection
- Patent number 11,988,613
- Issue date May 21, 2024
- Applied Materials Israel Ltd.
- Satyajit Kautkar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Damage figure creation supporting apparatus, damage figure creation...
- Patent number 11,959,862
- Issue date Apr 16, 2024
- FUJIFILM Corporation
- Shuhei Horita
- G01 - MEASURING TESTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 11,927,540
- Issue date Mar 12, 2024
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Structure management device, structure management method, and struc...
- Patent number 11,915,411
- Issue date Feb 27, 2024
- FUJIFILM Corporation
- Hiroaki Kikuchi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Detection apparatus, detection method, exposure apparatus, exposure...
- Patent number 11,835,470
- Issue date Dec 5, 2023
- Canon Kabushiki Kaisha
- Kazuya Kijima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for inspecting containers which are at least p...
- Patent number 11,815,469
- Issue date Nov 14, 2023
- Stevanato Group S.P.A.
- Luca Vallati
- G01 - MEASURING TESTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,372
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
- Patent number 11,774,373
- Issue date Oct 3, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Smart defect calibration system in semiconductor wafer manufacturing
- Patent number 11,761,904
- Issue date Sep 19, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for performing smart semiconductor wafer defect calibration
- Patent number 11,719,650
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,649
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for smart conversion and calibration of coordinate
- Patent number 11,719,648
- Issue date Aug 8, 2023
- Elite Semiconductor Inc.
- Iyun Leu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Image-based monitoring and detection of track/rail faults
- Patent number 11,433,931
- Issue date Sep 6, 2022
- Avante International Technology, Inc.
- Kevin Kwong-Tai Chung
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Information processing apparatus, information processing method, an...
- Patent number 11,408,831
- Issue date Aug 9, 2022
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of making wood flooring boards
- Patent number 11,364,589
- Issue date Jun 21, 2022
- BOA-FRANC, S.E.N.C.
- Sébastien Roy
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Heat flux measurement system
- Patent number 11,346,239
- Issue date May 31, 2022
- Raytheon Technologies Corporation
- Shayan Ahmadian
- F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information Patent Grant
Print check repeater defect detection
- Patent number 11,328,411
- Issue date May 10, 2022
- KLA Corp.
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intelligent defect identification system
- Patent number 11,320,385
- Issue date May 3, 2022
- Seagate Technology LLC
- Kurtis Dean Loken
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and system for impurity detection using multi-modal imaging
- Patent number 11,270,429
- Issue date Mar 8, 2022
- TATA Consultancy Services Limited
- Achanna Anil Kumar
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method for semiconductor wafer inspection and system thereof
- Patent number 11,231,376
- Issue date Jan 25, 2022
- Taiwan Semiconductor Manufacturing Company Ltd.
- Chien-Huei Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Appearance inspection device, transformation data generation device...
- Patent number 11,062,458
- Issue date Jul 13, 2021
- Denso Corporation
- Yoshio Yokoyama
- G01 - MEASURING TESTING
Information Patent Grant
Smart defect calibration system and the method thereof
- Patent number 11,016,035
- Issue date May 25, 2021
- Elite Semiconductor Inc.
- Iyun Leu
- G01 - MEASURING TESTING
Information Patent Grant
Image-based monitoring and detection of track/rail faults
- Patent number 10,953,899
- Issue date Mar 23, 2021
- Avante International Technology, Inc.
- Kevin Kwong-Tai Chung
- B61 - RAILWAYS
Information Patent Grant
Method and system for optically detecting and characterizing defect...
- Patent number 10,928,329
- Issue date Feb 23, 2021
- Board of Regents, The University of Texas System
- Farbod Shafiei
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...
- Publication number 20250003888
- Publication date Jan 2, 2025
- Onto Innovation Inc.
- John M. Thornell
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION SYSTEM AND METHOD, COMPUTER DEVICE, AND COMPUTER READABLE...
- Publication number 20240319159
- Publication date Sep 26, 2024
- Reemoon Technology Co., Ltd.
- Er Zhu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER
- Publication number 20240302288
- Publication date Sep 12, 2024
- Japan Tobacco Inc.
- Shota KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
DEBRIS DETERMINATION METHOD
- Publication number 20240281960
- Publication date Aug 22, 2024
- Shin-Etsu Handotai Co., Ltd.
- Tomohiro SAITO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Fault Analysis in Wafers
- Publication number 20240264090
- Publication date Aug 8, 2024
- ROBERT BOSCH GmbH
- Waldemar Smirnov
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF INSPECTING SEMICONDUCTOR DEVICE
- Publication number 20240230554
- Publication date Jul 11, 2024
- Samsung Electronics Co., Ltd.
- Daehyun JUNG
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR AUTOMATIC MONITORING OF PAVEMENT CONDITION
- Publication number 20240167962
- Publication date May 23, 2024
- IRIS R&D Group Inc.
- Emil Sylvester Ramos
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...
- Publication number 20240125594
- Publication date Apr 18, 2024
- VIRELUX INSPECTION SYSTEMS SARL
- Tom REICHERT
- G01 - MEASURING TESTING
Information Patent Application
MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING
- Publication number 20240068952
- Publication date Feb 29, 2024
- Micron Technology, Inc.
- Theodore G. DOROS
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION APPARATUS, DETECTION METHOD, EXPOSURE APPARATUS, EXPOSURE...
- Publication number 20240027365
- Publication date Jan 25, 2024
- Canon Kabushiki Kaisha
- Kazuya KIJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SUBSTRATE INSPECTION METHOD
- Publication number 20240019380
- Publication date Jan 18, 2024
- Samsung Electronics Co., Ltd.
- Kihong Chung
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
HIGH THROUGHPUT DEFECT DETECTION
- Publication number 20230341334
- Publication date Oct 26, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Boris Golberg
- G01 - MEASURING TESTING
Information Patent Application
CARE AREA BASED DEFECT DETECTION
- Publication number 20230258576
- Publication date Aug 17, 2023
- APPLIED MATERIALS ISRAEL LTD.
- Satyajit KAUTKAR
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
ULTRASOUND VIBRATING-TYPE DEFECT DETECTION APPARATUS AND WIRE DEFEC...
- Publication number 20230253266
- Publication date Aug 10, 2023
- Yamaha Robotics Holdings Co., Ltd.
- Michael KIRKBY
- B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information Patent Application
SURFACE ANALYSIS OF GEMSTONES
- Publication number 20230228690
- Publication date Jul 20, 2023
- GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
- Tsung-Han TSAI
- G01 - MEASURING TESTING
Information Patent Application
TECHNOLOGY CONFIGURED TO ENABLE FAULT DETECTION AND CONDITION ASSES...
- Publication number 20230101112
- Publication date Mar 30, 2023
- Vapar PTY LTD
- Michelle Aguilar
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR INSPECTING CONTAINERS WHICH ARE AT LEAST P...
- Publication number 20220349831
- Publication date Nov 3, 2022
- Stevanato Group S.P.A.
- Luca Vallati
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL
- Publication number 20220291145
- Publication date Sep 15, 2022
- ZING SEMICONDUCTOR CORPORATION
- Xing WEI
- G01 - MEASURING TESTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20220187215
- Publication date Jun 16, 2022
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTION APPARATUS, DETECTION METHOD, EXPOSURE APPARATUS, EXPOSURE...
- Publication number 20220178843
- Publication date Jun 9, 2022
- Canon Kabushiki Kaisha
- Kazuya KIJIMA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
CRACK EVALUATION APPARATUS, CRACK EVALUATION METHOD, AND CRACK EVAL...
- Publication number 20220148150
- Publication date May 12, 2022
- FUJIFILM CORPORATION
- Kazuma MATSUMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
- Publication number 20220136979
- Publication date May 5, 2022
- Canon Kabushiki Kaisha
- Shoichi Hoshino
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
IMAGE PROCESSING APPARATUS
- Publication number 20220113260
- Publication date Apr 14, 2022
- NEC Corporation
- Asuka ISHII
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Syclops
- Publication number 20210350525
- Publication date Nov 11, 2021
- Ronald Baker
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
- Publication number 20210342992
- Publication date Nov 4, 2021
- KLA Corporation
- Hong Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Reconstruction of Thin Wall Features Marginally Resolved by Multi-D...
- Publication number 20210304391
- Publication date Sep 30, 2021
- Shuang Zhang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DAMAGE FIGURE CREATION SUPPORTING APPARATUS, DAMAGE FIGURE CREATION...
- Publication number 20210270748
- Publication date Sep 2, 2021
- FUJIFILM CORPORATION
- Shuhei HORITA
- G01 - MEASURING TESTING
Information Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
- Publication number 20210231582
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING
- Publication number 20210231584
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
- Publication number 20210231580
- Publication date Jul 29, 2021
- ELITE SEMICONDUCTOR INC.
- IYUN LEU
- G01 - MEASURING TESTING

Mapping zones of defects

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Qualitative or quantitative characterization of a coating surface

Syclops

Reconstruction of thin wall features marginally resolved by multi-d...

Method for characterizing defects in silicon crystal

High throughput defect detection

Method and system for determining a three-dimensional definition of...

Care area based defect detection

Damage figure creation supporting apparatus, damage figure creation...

Information processing apparatus, information processing method, an...

Structure management device, structure management method, and struc...

Detection apparatus, detection method, exposure apparatus, exposure...

Apparatus and method for inspecting containers which are at least p...

Smart coordinate conversion and calibration system in semiconductor...

Smart coordinate conversion and calibration system in semiconductor...

Smart defect calibration system in semiconductor wafer manufacturing

Method for performing smart semiconductor wafer defect calibration

Method for smart conversion and calibration of coordinate

Method for smart conversion and calibration of coordinate

Image-based monitoring and detection of track/rail faults

Information processing apparatus, information processing method, an...

Method of making wood flooring boards

Heat flux measurement system

Print check repeater defect detection

Intelligent defect identification system

Method and system for impurity detection using multi-modal imaging

Method for semiconductor wafer inspection and system thereof

Appearance inspection device, transformation data generation device...

Smart defect calibration system and the method thereof

Image-based monitoring and detection of track/rail faults

Method and system for optically detecting and characterizing defect...

Patents Applicationslast 30 patents

PHOTO RESPONSE NON-UNIFORMITY CORRECTION DURING SEMICONDUCTOR INSPE...

DETECTION SYSTEM AND METHOD, COMPUTER DEVICE, AND COMPUTER READABLE...

INSPECTION DEVICE AND INSPECTION METHOD FOR FILTER

DEBRIS DETERMINATION METHOD

Method for Fault Analysis in Wafers

METHOD OF INSPECTING SEMICONDUCTOR DEVICE

SYSTEM AND METHOD FOR AUTOMATIC MONITORING OF PAVEMENT CONDITION

METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...

MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING

DETECTION APPARATUS, DETECTION METHOD, EXPOSURE APPARATUS, EXPOSURE...

SUBSTRATE INSPECTION METHOD

HIGH THROUGHPUT DEFECT DETECTION

CARE AREA BASED DEFECT DETECTION

ULTRASOUND VIBRATING-TYPE DEFECT DETECTION APPARATUS AND WIRE DEFEC...

SURFACE ANALYSIS OF GEMSTONES

TECHNOLOGY CONFIGURED TO ENABLE FAULT DETECTION AND CONDITION ASSES...

APPARATUS AND METHOD FOR INSPECTING CONTAINERS WHICH ARE AT LEAST P...

METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

DETECTION APPARATUS, DETECTION METHOD, EXPOSURE APPARATUS, EXPOSURE...

CRACK EVALUATION APPARATUS, CRACK EVALUATION METHOD, AND CRACK EVAL...

INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...

IMAGE PROCESSING APPARATUS

Syclops

PRINT CHECK REPEATER DEFECT DETECTION

Reconstruction of Thin Wall Features Marginally Resolved by Multi-D...

DAMAGE FIGURE CREATION SUPPORTING APPARATUS, DAMAGE FIGURE CREATION...

SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...

SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING

METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE