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G01N2021/8864
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PHYSICS
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Measuring instruments
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
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G01N2021/8864
Mapping zones of defects
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Patents Grants
last 30 patents
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Patent Grant
Damage figure creation supporting apparatus, damage figure creation...
Patent number
11,959,862
Issue date
Apr 16, 2024
FUJIFILM Corporation
Shuhei Horita
G01 - MEASURING TESTING
Information
Patent Grant
Information processing apparatus, information processing method, an...
Patent number
11,927,540
Issue date
Mar 12, 2024
Canon Kabushiki Kaisha
Shoichi Hoshino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Structure management device, structure management method, and struc...
Patent number
11,915,411
Issue date
Feb 27, 2024
FUJIFILM Corporation
Hiroaki Kikuchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Detection apparatus, detection method, exposure apparatus, exposure...
Patent number
11,835,470
Issue date
Dec 5, 2023
Canon Kabushiki Kaisha
Kazuya Kijima
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Apparatus and method for inspecting containers which are at least p...
Patent number
11,815,469
Issue date
Nov 14, 2023
Stevanato Group S.P.A.
Luca Vallati
G01 - MEASURING TESTING
Information
Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
Patent number
11,774,372
Issue date
Oct 3, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Smart coordinate conversion and calibration system in semiconductor...
Patent number
11,774,373
Issue date
Oct 3, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Smart defect calibration system in semiconductor wafer manufacturing
Patent number
11,761,904
Issue date
Sep 19, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for performing smart semiconductor wafer defect calibration
Patent number
11,719,650
Issue date
Aug 8, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for smart conversion and calibration of coordinate
Patent number
11,719,649
Issue date
Aug 8, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for smart conversion and calibration of coordinate
Patent number
11,719,648
Issue date
Aug 8, 2023
Elite Semiconductor Inc.
Iyun Leu
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image-based monitoring and detection of track/rail faults
Patent number
11,433,931
Issue date
Sep 6, 2022
Avante International Technology, Inc.
Kevin Kwong-Tai Chung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Information processing apparatus, information processing method, an...
Patent number
11,408,831
Issue date
Aug 9, 2022
Canon Kabushiki Kaisha
Shoichi Hoshino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method of making wood flooring boards
Patent number
11,364,589
Issue date
Jun 21, 2022
BOA-FRANC, S.E.N.C.
Sébastien Roy
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Heat flux measurement system
Patent number
11,346,239
Issue date
May 31, 2022
Raytheon Technologies Corporation
Shayan Ahmadian
F01 - MACHINES OR ENGINES IN GENERAL ENGINE PLANTS IN GENERAL STEAM ENGINES
Information
Patent Grant
Print check repeater defect detection
Patent number
11,328,411
Issue date
May 10, 2022
KLA Corp.
Hong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Intelligent defect identification system
Patent number
11,320,385
Issue date
May 3, 2022
Seagate Technology LLC
Kurtis Dean Loken
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and system for impurity detection using multi-modal imaging
Patent number
11,270,429
Issue date
Mar 8, 2022
TATA Consultancy Services Limited
Achanna Anil Kumar
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method for semiconductor wafer inspection and system thereof
Patent number
11,231,376
Issue date
Jan 25, 2022
Taiwan Semiconductor Manufacturing Company Ltd.
Chien-Huei Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Appearance inspection device, transformation data generation device...
Patent number
11,062,458
Issue date
Jul 13, 2021
Denso Corporation
Yoshio Yokoyama
G01 - MEASURING TESTING
Information
Patent Grant
Smart defect calibration system and the method thereof
Patent number
11,016,035
Issue date
May 25, 2021
Elite Semiconductor Inc.
Iyun Leu
G01 - MEASURING TESTING
Information
Patent Grant
Image-based monitoring and detection of track/rail faults
Patent number
10,953,899
Issue date
Mar 23, 2021
Avante International Technology, Inc.
Kevin Kwong-Tai Chung
B61 - RAILWAYS
Information
Patent Grant
Method and system for optically detecting and characterizing defect...
Patent number
10,928,329
Issue date
Feb 23, 2021
Board of Regents, The University of Texas System
Farbod Shafiei
G01 - MEASURING TESTING
Information
Patent Grant
Inspection apparatus and inspection method
Patent number
10,891,725
Issue date
Jan 12, 2021
Nitto Denko Corporation
Yoichi Kigawa
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and device for material web monitoring and material web insp...
Patent number
10,878,552
Issue date
Dec 29, 2020
Texmag GmbH Vertriebsgesellschaft.
Markus Herrmann
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Information processing apparatus, information processing method, an...
Patent number
10,852,245
Issue date
Dec 1, 2020
Canon Kabushiki Kaisha
Nobuaki Kuwabara
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Image processing apparatus, image processing method, and recording...
Patent number
10,852,244
Issue date
Dec 1, 2020
Omron Corporation
Yutaka Kiuchi
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Heat flux measurement system
Patent number
10,815,817
Issue date
Oct 27, 2020
Raytheon Technologies Corporation
Shayan Ahmadian
F02 - COMBUSTION ENGINES HOT-GAS OR COMBUSTION-PRODUCT ENGINE PLANTS
Information
Patent Grant
Image-based monitoring and detection of track/rail faults
Patent number
10,752,271
Issue date
Aug 25, 2020
Avante International Technology, Inc.
Kevin Kwong-Tai Chung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Self-similarity analysis for defect detection on patterned industri...
Patent number
10,726,540
Issue date
Jul 28, 2020
International Business Machines Corporation
Jing Chang Huang
G06 - COMPUTING CALCULATING COUNTING
Patents Applications
last 30 patents
Information
Patent Application
METHOD AND SYSTEM FOR DETERMINING A THREE-DIMENSIONAL DEFINITION OF...
Publication number
20240125594
Publication date
Apr 18, 2024
VIRELUX INSPECTION SYSTEMS SARL
Tom REICHERT
G01 - MEASURING TESTING
Information
Patent Application
MULTI-SENSOR TEST DEVICE FOR QUALITY CONTROL SCANNING
Publication number
20240068952
Publication date
Feb 29, 2024
Micron Technology, Inc.
Theodore G. DOROS
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTION APPARATUS, DETECTION METHOD, EXPOSURE APPARATUS, EXPOSURE...
Publication number
20240027365
Publication date
Jan 25, 2024
Canon Kabushiki Kaisha
Kazuya KIJIMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
SUBSTRATE INSPECTION METHOD
Publication number
20240019380
Publication date
Jan 18, 2024
Samsung Electronics Co., Ltd.
Kihong Chung
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
HIGH THROUGHPUT DEFECT DETECTION
Publication number
20230341334
Publication date
Oct 26, 2023
APPLIED MATERIALS ISRAEL LTD.
Boris Golberg
G01 - MEASURING TESTING
Information
Patent Application
CARE AREA BASED DEFECT DETECTION
Publication number
20230258576
Publication date
Aug 17, 2023
APPLIED MATERIALS ISRAEL LTD.
Satyajit KAUTKAR
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
ULTRASOUND VIBRATING-TYPE DEFECT DETECTION APPARATUS AND WIRE DEFEC...
Publication number
20230253266
Publication date
Aug 10, 2023
Yamaha Robotics Holdings Co., Ltd.
Michael KIRKBY
B06 - GENERATING OR TRANSMITTING MECHANICAL VIBRATIONS IN GENERAL
Information
Patent Application
SURFACE ANALYSIS OF GEMSTONES
Publication number
20230228690
Publication date
Jul 20, 2023
GEMOLOGICAL INSTITUTE OF AMERICA, INC. (GIA)
Tsung-Han TSAI
G01 - MEASURING TESTING
Information
Patent Application
TECHNOLOGY CONFIGURED TO ENABLE FAULT DETECTION AND CONDITION ASSES...
Publication number
20230101112
Publication date
Mar 30, 2023
Vapar PTY LTD
Michelle Aguilar
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR INSPECTING CONTAINERS WHICH ARE AT LEAST P...
Publication number
20220349831
Publication date
Nov 3, 2022
Stevanato Group S.P.A.
Luca Vallati
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR CHARACTERIZING DEFECTS IN SILICON CRYSTAL
Publication number
20220291145
Publication date
Sep 15, 2022
ZING SEMICONDUCTOR CORPORATION
Xing WEI
G01 - MEASURING TESTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20220187215
Publication date
Jun 16, 2022
Canon Kabushiki Kaisha
Shoichi Hoshino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DETECTION APPARATUS, DETECTION METHOD, EXPOSURE APPARATUS, EXPOSURE...
Publication number
20220178843
Publication date
Jun 9, 2022
Canon Kabushiki Kaisha
Kazuya KIJIMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
CRACK EVALUATION APPARATUS, CRACK EVALUATION METHOD, AND CRACK EVAL...
Publication number
20220148150
Publication date
May 12, 2022
FUJIFILM CORPORATION
Kazuma MATSUMOTO
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
INFORMATION PROCESSING APPARATUS, INFORMATION PROCESSING METHOD, AN...
Publication number
20220136979
Publication date
May 5, 2022
Canon Kabushiki Kaisha
Shoichi Hoshino
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE PROCESSING APPARATUS
Publication number
20220113260
Publication date
Apr 14, 2022
NEC Corporation
Asuka ISHII
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Syclops
Publication number
20210350525
Publication date
Nov 11, 2021
Ronald Baker
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
PRINT CHECK REPEATER DEFECT DETECTION
Publication number
20210342992
Publication date
Nov 4, 2021
KLA Corporation
Hong Chen
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Reconstruction of Thin Wall Features Marginally Resolved by Multi-D...
Publication number
20210304391
Publication date
Sep 30, 2021
Shuang Zhang
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
DAMAGE FIGURE CREATION SUPPORTING APPARATUS, DAMAGE FIGURE CREATION...
Publication number
20210270748
Publication date
Sep 2, 2021
FUJIFILM CORPORATION
Shuhei HORITA
G01 - MEASURING TESTING
Information
Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
Publication number
20210231582
Publication date
Jul 29, 2021
ELITE SEMICONDUCTOR INC.
IYUN LEU
G01 - MEASURING TESTING
Information
Patent Application
SMART DEFECT CALIBRATION SYSTEM IN SEMICONDUCTOR WAFER MANUFACTURING
Publication number
20210231584
Publication date
Jul 29, 2021
ELITE SEMICONDUCTOR INC.
IYUN LEU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
Publication number
20210231580
Publication date
Jul 29, 2021
ELITE SEMICONDUCTOR INC.
IYUN LEU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR PERFORMING SMART SEMICONDUCTOR WAFER DEFECT CALIBRATION
Publication number
20210231581
Publication date
Jul 29, 2021
ELITE SEMICONDUCTOR INC.
IYUN LEU
G01 - MEASURING TESTING
Information
Patent Application
METHOD FOR SMART CONVERSION AND CALIBRATION OF COORDINATE
Publication number
20210231579
Publication date
Jul 29, 2021
ELITE SEMICONDUCTOR INC.
IYUN LEU
G01 - MEASURING TESTING
Information
Patent Application
SMART COORDINATE CONVERSION AND CALIBRATION SYSTEM IN SEMICONDUCTOR...
Publication number
20210231583
Publication date
Jul 29, 2021
ELITE SEMICONDUCTOR INC.
IYUN LEU
G01 - MEASURING TESTING
Information
Patent Application
IMAGE-BASED MONITORING AND DETECTION OF TRACK/RAIL FAULTS
Publication number
20210114637
Publication date
Apr 22, 2021
AVANTE INTERNATIONAL TECHNOLOGY, INC.
Kevin Kwong-Tai Chung
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD FOR SEMICONDUCTOR WAFER INSPECTION AND SYSTEM THEREOF
Publication number
20210063319
Publication date
Mar 4, 2021
Taiwan Semiconductor Manufacturing company Ltd.
CHIEN-HUEI CHEN
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
STRUCTURE MANAGEMENT DEVICE, STRUCTURE MANAGEMENT METHOD, AND STRUC...
Publication number
20210018447
Publication date
Jan 21, 2021
FUJIFILM CORPORATION
Hiroaki KIKUCHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
METHOD AND SYSTEM FOR IMPURITY DETECTION USING MULTI-MODAL IMAGING
Publication number
20210019876
Publication date
Jan 21, 2021
TATA CONSULTANCY SERVICES LIMITED
Achanna Anil KUMAR
G06 - COMPUTING CALCULATING COUNTING