Marginal testing

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CPC
G01R31/3173

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GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R31/00Arrangements for testing electric properties Arrangements for locating electric faults Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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G01R31/3173Marginal testing

Industries

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Patents Grantslast 30 patents

Information Patent Grant
System and method for parallel testing of electronic device
- Patent number 12,203,982
- Issue date Jan 21, 2025
- STMICROELECTRONICS INTERNATIONAL N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Grant
Applications of adaptive microelectronic circuits that are designed...
- Patent number 12,085,611
- Issue date Sep 10, 2024
- Minima Processor Oy
- Lauri Koskinen
- G01 - MEASURING TESTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 12,072,376
- Issue date Aug 27, 2024
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Integrated circuit including test circuit and method of manufacturi...
- Patent number 12,000,888
- Issue date Jun 4, 2024
- Samsung Electronics Co., Ltd.
- Changho Han
- G01 - MEASURING TESTING
Information Patent Grant
System and method for parallel testing of electronic device
- Patent number 11,340,292
- Issue date May 24, 2022
- STMicroelectronics International N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Grant
Die-to-die connectivity monitoring
- Patent number 11,293,977
- Issue date Apr 5, 2022
- PROTEANTECS LTD.
- Eyal Fayneh
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
VMIN retention detector apparatus and method
- Patent number 10,451,675
- Issue date Oct 22, 2019
- Intel Corporation
- Vinayak Honkote
- G01 - MEASURING TESTING
Information Patent Grant
Vmin retention detector apparatus and method
- Patent number 10,018,674
- Issue date Jul 10, 2018
- Intel Corporation
- Vinayak Honkote
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
IC cores, scan paths, compare circuitry, select and enable inputs
- Patent number 9,939,489
- Issue date Apr 10, 2018
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and methods for generating a clock enable signal using a s...
- Patent number 9,812,216
- Issue date Nov 7, 2017
- Altera Corporation
- Kalyana Kantipudi
- G11 - INFORMATION STORAGE
Information Patent Grant
Enable and select inputs operate combinational logic parallel scan...
- Patent number 9,329,230
- Issue date May 3, 2016
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Power supply apparatus for test apparatus
- Patent number 9,188,633
- Issue date Nov 17, 2015
- Advantest Corporation
- Takahiko Shimizu
- G01 - MEASURING TESTING
Information Patent Grant
Method for scan testing three-dimensional chip
- Patent number 9,103,878
- Issue date Aug 11, 2015
- Tsinghua University
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
Wired-or fail flag in serial stimulus, expected/mask data test circ...
- Patent number 9,052,361
- Issue date Jun 9, 2015
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,892,972
- Issue date Nov 18, 2014
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Core circuit test architecture
- Patent number 8,656,237
- Issue date Feb 18, 2014
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,560,904
- Issue date Oct 15, 2013
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Compare circuitry with scan cell separate from serial scan circuitry
- Patent number 8,522,092
- Issue date Aug 27, 2013
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Scan chain fault diagnosis
- Patent number 8,412,991
- Issue date Apr 2, 2013
- Teseda Corporation
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Grant
Circuits and methods for characterizing random variations in device...
- Patent number 8,214,169
- Issue date Jul 3, 2012
- International Business Machines Corporation
- Azeez Bhavnagarwala
- G11 - INFORMATION STORAGE
Information Patent Grant
Core circuit test architecture
- Patent number 8,190,954
- Issue date May 29, 2012
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Gating circuitry coupling selected scan paths between I/O scan bus
- Patent number 8,037,383
- Issue date Oct 11, 2011
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Core circuit test architecture
- Patent number 7,877,650
- Issue date Jan 25, 2011
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Circuit for detecting and measuring noise in semiconductor integrat...
- Patent number 7,667,477
- Issue date Feb 23, 2010
- The New Industry Research Organization
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor device and test system thereof
- Patent number 7,543,210
- Issue date Jun 2, 2009
- Samsung Electronics Co., Ltd.
- Joung-Yeal Kim
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with embedded identification code
- Patent number 7,506,227
- Issue date Mar 17, 2009
- NXP B.V.
- Leon Maria Albertus Van De Logt
- G11 - INFORMATION STORAGE
Information Patent Grant
Closed loop controlled reference voltage calibration circuit and me...
- Patent number 7,386,410
- Issue date Jun 10, 2008
- ATI Technologies Inc.
- Boris Boskovic
- G11 - INFORMATION STORAGE
Information Patent Grant
IC with parallel scan paths and compare circuitry
- Patent number 7,356,745
- Issue date Apr 8, 2008
- Texas Instruments Incorporated
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Grant
Device for monitoring quiescent current of an electronic device
- Patent number 7,315,180
- Issue date Jan 1, 2008
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING
Information Patent Grant
Integrated circuit with configuration based on parameter measurement
- Patent number 7,107,362
- Issue date Sep 12, 2006
- Avago Technologies General IP (Singapore) Pte. Ltd.
- Thomas Omega Wheless, Jr.
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20240393390
- Publication date Nov 28, 2024
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM ON CHIP INCLUDING A PVT SENSOR AND CORRESPONDING PVT SENSING...
- Publication number 20230213578
- Publication date Jul 6, 2023
- STMicroelectronics S.r.l
- Riccardo CONDORELLI
- G01 - MEASURING TESTING
Information Patent Application
SYSTEM AND METHOD FOR PARALLEL TESTING OF ELECTRONIC DEVICE
- Publication number 20220276302
- Publication date Sep 1, 2022
- STMicroelectronics International N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20220229107
- Publication date Jul 21, 2022
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DIE-TO-DIE CONNECTIVITY MONITORING
- Publication number 20210325455
- Publication date Oct 21, 2021
- PROTEANTECS LTD.
- Eyal FAYNEH
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPLICATIONS OF ADAPTIVE MICROELECTRONIC CIRCUITS THAT ARE DESIGNED...
- Publication number 20210318377
- Publication date Oct 14, 2021
- Minima Processor Oy
- Lauri KOSKINEN
- G01 - MEASURING TESTING
Information Patent Application
System and Method for Parallel Testing of Electronic Device
- Publication number 20210011080
- Publication date Jan 14, 2021
- STMicroelectronics International N.V.
- Rajesh Narwal
- G01 - MEASURING TESTING
Information Patent Application
VMIN RETENTION DETECTOR APPARATUS AND METHOD
- Publication number 20180299506
- Publication date Oct 18, 2018
- Intel Corporation
- Vinayak Honkote
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
VMIN RETENTION DETECTOR APPARATUS AND METHOD
- Publication number 20170269155
- Publication date Sep 21, 2017
- Intel Corporation
- Vinayak Honkote
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR SCAN TESTING THREE-DIMENSIONAL CHIP
- Publication number 20150074478
- Publication date Mar 12, 2015
- TSINGHUA UNIVERSITY
- Dong Xiang
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20140359388
- Publication date Dec 4, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20140122954
- Publication date May 1, 2014
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20140115412
- Publication date Apr 24, 2014
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
RECEIVING APPARATUS FOR TEST SIGNAL, ELECTRONIC APPARATUS THEREFOR...
- Publication number 20130314103
- Publication date Nov 28, 2013
- Fujitsu Limited
- Keiji NAKAGAWA
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20130318409
- Publication date Nov 28, 2013
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
SCAN CHAIN FAULT DIAGNOSIS
- Publication number 20130219237
- Publication date Aug 22, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
Scan Chain Fault Diagnosis
- Publication number 20130061103
- Publication date Mar 7, 2013
- TESEDA CORPORATION
- Rich Ackerman
- G01 - MEASURING TESTING
Information Patent Application
POWER SUPPLY APPARATUS FOR TEST APPARATUS
- Publication number 20120218004
- Publication date Aug 30, 2012
- Advantest Corporation
- Takahiko Shimizu
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20120216087
- Publication date Aug 23, 2012
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Circuits and Methods for Characterizing Random Variations in Device...
- Publication number 20120179412
- Publication date Jul 12, 2012
- International Business Machines Corporation
- Azeez Bhavnagarwala
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20110320897
- Publication date Dec 29, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20110087937
- Publication date Apr 14, 2011
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20100162059
- Publication date Jun 24, 2010
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
CORE CIRCUIT TEST ARCHITECTURE
- Publication number 20080141087
- Publication date Jun 12, 2008
- TEXAS INSTRUMENTS INCORPORATED
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
CLOSED LOOP CONTROLLED REFERENCE VOLTAGE CALIBRATION CIRCUIT AND ME...
- Publication number 20070073506
- Publication date Mar 29, 2007
- ATI Technologies Inc.
- Boris Boskovic
- G01 - MEASURING TESTING
Information Patent Application
Semiconductor device and test system thereof
- Publication number 20070034868
- Publication date Feb 15, 2007
- SAMSUNG ELECTRONICS CO., LTD.
- Joung-Yeal Kim
- G01 - MEASURING TESTING
Information Patent Application
Circuit for detecting and measuring noise in semiconductor integrat...
- Publication number 20060221531
- Publication date Oct 5, 2006
- Makoto Nagata
- G01 - MEASURING TESTING
Information Patent Application
Integrated circuit with embedded identification code
- Publication number 20060152395
- Publication date Jul 13, 2006
- KONINKLIJKE PHILLIPS ELECTRONICS N.C.
- Leon Maria Albertus Van De Logt
- G01 - MEASURING TESTING
Information Patent Application
Core circuit test architecture
- Publication number 20050204226
- Publication date Sep 15, 2005
- Lee D. Whetsel
- G01 - MEASURING TESTING
Information Patent Application
Device for monitoring quiescent current of an electronic device
- Publication number 20050156619
- Publication date Jul 21, 2005
- Q-Star Test N.V.
- Hans Manhaeve
- G01 - MEASURING TESTING

Marginal testing

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

System and method for parallel testing of electronic device

Applications of adaptive microelectronic circuits that are designed...

Die-to-die connectivity monitoring

Integrated circuit including test circuit and method of manufacturi...

System and method for parallel testing of electronic device

Die-to-die connectivity monitoring

VMIN retention detector apparatus and method

Vmin retention detector apparatus and method

IC cores, scan paths, compare circuitry, select and enable inputs

Circuits and methods for generating a clock enable signal using a s...

Enable and select inputs operate combinational logic parallel scan...

Power supply apparatus for test apparatus

Method for scan testing three-dimensional chip

Wired-or fail flag in serial stimulus, expected/mask data test circ...

Scan chain fault diagnosis

Core circuit test architecture

Scan chain fault diagnosis

Compare circuitry with scan cell separate from serial scan circuitry

Scan chain fault diagnosis

Circuits and methods for characterizing random variations in device...

Core circuit test architecture

Gating circuitry coupling selected scan paths between I/O scan bus

Core circuit test architecture

Circuit for detecting and measuring noise in semiconductor integrat...

Semiconductor device and test system thereof

Integrated circuit with embedded identification code

Closed loop controlled reference voltage calibration circuit and me...

IC with parallel scan paths and compare circuitry

Device for monitoring quiescent current of an electronic device

Integrated circuit with configuration based on parameter measurement

Patents Applicationslast 30 patents

DIE-TO-DIE CONNECTIVITY MONITORING

SYSTEM ON CHIP INCLUDING A PVT SENSOR AND CORRESPONDING PVT SENSING...

SYSTEM AND METHOD FOR PARALLEL TESTING OF ELECTRONIC DEVICE

DIE-TO-DIE CONNECTIVITY MONITORING

DIE-TO-DIE CONNECTIVITY MONITORING

APPLICATIONS OF ADAPTIVE MICROELECTRONIC CIRCUITS THAT ARE DESIGNED...

System and Method for Parallel Testing of Electronic Device

VMIN RETENTION DETECTOR APPARATUS AND METHOD

VMIN RETENTION DETECTOR APPARATUS AND METHOD

METHOD FOR SCAN TESTING THREE-DIMENSIONAL CHIP

CORE CIRCUIT TEST ARCHITECTURE

CORE CIRCUIT TEST ARCHITECTURE

SCAN CHAIN FAULT DIAGNOSIS

RECEIVING APPARATUS FOR TEST SIGNAL, ELECTRONIC APPARATUS THEREFOR...

CORE CIRCUIT TEST ARCHITECTURE

SCAN CHAIN FAULT DIAGNOSIS

Scan Chain Fault Diagnosis

POWER SUPPLY APPARATUS FOR TEST APPARATUS

CORE CIRCUIT TEST ARCHITECTURE

Circuits and Methods for Characterizing Random Variations in Device...

CORE CIRCUIT TEST ARCHITECTURE

CORE CIRCUIT TEST ARCHITECTURE

CORE CIRCUIT TEST ARCHITECTURE

CORE CIRCUIT TEST ARCHITECTURE

CLOSED LOOP CONTROLLED REFERENCE VOLTAGE CALIBRATION CIRCUIT AND ME...

Semiconductor device and test system thereof

Circuit for detecting and measuring noise in semiconductor integrat...

Integrated circuit with embedded identification code

Core circuit test architecture

Device for monitoring quiescent current of an electronic device