Matching signals with a database

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CPC
G01B9/02088

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Parent Industries

GPHYSICS G01Measuring instruments G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS G01B9/00Instruments as specified in the subgroups and characterised by the use of optical measuring means

Current Industry

G01B9/02088Matching signals with a database

Industries

Patents Grantslast 30 patents

Information Patent Grant
Method and system for measuring a surface of an object comprising d...
- Patent number 11,906,302
- Issue date Feb 20, 2024
- UNITY SEMICONDUCTOR
- Jean-François Boulanger
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for measuring a surface of an object comprising d...
- Patent number 11,713,960
- Issue date Aug 1, 2023
- UNITY SEMICONDUCTOR
- Jean-François Boulanger
- G01 - MEASURING TESTING
Information Patent Grant
Optical coherence tomography (OCT) apparatus and OCT method for axi...
- Patent number 11,690,516
- Issue date Jul 4, 2023
- University of Kent
- Adrian Podoleanu
- G01 - MEASURING TESTING
Information Patent Grant
Measurement device employing color appearing due to interference of...
- Patent number 11,274,916
- Issue date Mar 15, 2022
- Mitutoyo Corporation
- Masashi Ishige
- G01 - MEASURING TESTING
Information Patent Grant
Method for assessing the condition of a tissue sample with coherent...
- Patent number 9,915,642
- Issue date Mar 13, 2018
- Hill-Rom Services, Inc.
- David Ribble
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and system for regional phase unwrapping with pattern-assist...
- Patent number 9,897,433
- Issue date Feb 20, 2018
- KLA-Tencor Corporation
- Helen Liu
- G01 - MEASURING TESTING
Information Patent Grant
Method for measuring characteristics of sample
- Patent number 9,494,410
- Issue date Nov 15, 2016
- NATIONAL TAIWAN UNIVERSITY
- Tuan-Shu Ho
- G01 - MEASURING TESTING
Information Patent Grant
Program for correcting data measured by PS-OCT and PS-OCT system eq...
- Patent number 9,471,277
- Issue date Oct 18, 2016
- University of Tsukuba
- Yoshiaki Yasuno
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Method and apparatus for processing the signal in spectral domain i...
- Patent number 9,383,187
- Issue date Jul 5, 2016
- University of Kent
- Adrian Podoleanu
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determining a property of a surface
- Patent number 9,103,651
- Issue date Aug 11, 2015
- Mitutoyo Corporation
- Han Haitjema
- G01 - MEASURING TESTING
Information Patent Grant
Measuring apparatus, measuring method, and method of manufacturing...
- Patent number 9,091,534
- Issue date Jul 28, 2015
- Canon Kabushiki Kaisha
- Hitoshi Iijima
- G01 - MEASURING TESTING
Information Patent Grant
Optical three-dimensional structure measuring device and structure...
- Patent number 8,855,750
- Issue date Oct 7, 2014
- Topcon Corporation
- Yuichi Teramura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Film thickness measuring apparatus using interference and film thic...
- Patent number 8,619,263
- Issue date Dec 31, 2013
- Panasonic Corporation
- Hirotoshi Oikaze
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of atherosclerotic plaque ty...
- Patent number 8,150,496
- Issue date Apr 3, 2012
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Analyzing surface structure using scanning interferometry
- Patent number 8,126,677
- Issue date Feb 28, 2012
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometric analysis of under-resolved features
- Patent number 8,072,611
- Issue date Dec 6, 2011
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of atherosclerotic plaque ty...
- Patent number 8,050,747
- Issue date Nov 1, 2011
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Memory-based high-speed interferometer
- Patent number 7,990,542
- Issue date Aug 2, 2011
- Mitsubishi Electric Research Laboratories, Inc.
- William S. Yerazunis
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,952,724
- Issue date May 31, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,948,636
- Issue date May 24, 2011
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for measuring characteristics of surface features
- Patent number 7,924,435
- Issue date Apr 12, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometry for determining characteristics of an object surface...
- Patent number 7,884,947
- Issue date Feb 8, 2011
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for determination of atherosclerotic plaque ty...
- Patent number 7,865,231
- Issue date Jan 4, 2011
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Dental optical coherence tomograph
- Patent number 7,823,782
- Issue date Nov 2, 2010
- Shofu Inc.
- Toyohiko Yatagai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Grant
Interferometry method for ellipsometry, reflectometry, and scattero...
- Patent number 7,812,963
- Issue date Oct 12, 2010
- Zygo Corporation
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer and method for measuring characteristics of opticall...
- Patent number 7,684,049
- Issue date Mar 23, 2010
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Grant
Generating model signals for interferometry
- Patent number 7,619,746
- Issue date Nov 17, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Interferometer with multiple modes of operation for determining cha...
- Patent number 7,616,323
- Issue date Nov 10, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Grant
Signal processing using non-linear regression with a sinusoidal model
- Patent number 7,574,253
- Issue date Aug 11, 2009
- Northwestern University
- Paul A. Edney
- G01 - MEASURING TESTING
Information Patent Grant
Method and system for analyzing low-coherence interferometry signal...
- Patent number 7,564,566
- Issue date Jul 21, 2009
- Zygo Corporation
- Peter de Groot
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR MEASURING A SURFACE OF AN OBJECT COMPRISING D...
- Publication number 20230251079
- Publication date Aug 10, 2023
- Unity Semiconductor
- Jean-François BOULANGER
- G01 - MEASURING TESTING
Information Patent Application
PROGRAM FOR CORRECTING DATA MEASURED BY PS-OCT AND PS-OCT SYSTEM EQ...
- Publication number 20140115022
- Publication date Apr 24, 2014
- University of Tsukuba
- Yoshiaki Yasuno
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETERMINING A PROPERTY OF A SURFACE
- Publication number 20130335747
- Publication date Dec 19, 2013
- Han HAITJEMA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING APPARATUS, MEASURING METHOD, AND METHOD OF MANUFACTURING...
- Publication number 20130250099
- Publication date Sep 26, 2013
- Canon Kabushiki Kaisha
- Hitoshi Iijima
- G01 - MEASURING TESTING
Information Patent Application
SURFACE SHAPE MEASUREMENT METHOD AND MEASUREMENT APPARATUS
- Publication number 20130235385
- Publication date Sep 12, 2013
- Canon Kabushiki Kaisha
- Masaki NAKAJIMA
- G01 - MEASURING TESTING
Information Patent Application
Thin Films And Surface Topography Measurement Using Reduced Library
- Publication number 20120271591
- Publication date Oct 25, 2012
- Nanometrics Incorporated
- Boris V. Kamenev
- G01 - MEASURING TESTING
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY...
- Publication number 20120127475
- Publication date May 24, 2012
- DUKE UNIVERSITY
- Adam Wax
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
FILM THICKNESS MEASURING APPARATUS USING INTERFERENCE AND FILM THIC...
- Publication number 20120044501
- Publication date Feb 23, 2012
- Hirotoshi Oikaze
- G01 - MEASURING TESTING
Information Patent Application
OPTICAL THREE-DIMENSIONAL STRUCTURE MEASURING DEVICE AND STRUCTURE...
- Publication number 20120010494
- Publication date Jan 12, 2012
- Yuichi Teramura
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20100265516
- Publication date Oct 21, 2010
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...
- Publication number 20100134786
- Publication date Jun 3, 2010
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
ANALYZING SURFACE STRUCTURE USING SCANNING INTERFEROMETRY
- Publication number 20090182528
- Publication date Jul 16, 2009
- Peter de Groot
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRIC ANALYSIS OF UNDER-RESOLVED FEATURES
- Publication number 20090147268
- Publication date Jun 11, 2009
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
Memory-Based High-Speed Interferometer
- Publication number 20090112500
- Publication date Apr 30, 2009
- William S. Yerazunis
- G01 - MEASURING TESTING
Information Patent Application
Dental Optical Coherence Tomograph
- Publication number 20090079993
- Publication date Mar 26, 2009
- SHOFU INC.
- Toyohiko Yatagai
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY...
- Publication number 20090073456
- Publication date Mar 19, 2009
- DUKE UNIVERSITY
- Adam Wax
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND APPARATUS FOR DETERMINATION OF ATHEROSCLEROTIC PLAQUE TY...
- Publication number 20090043192
- Publication date Feb 12, 2009
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
METHOD AND APPARATUS FOR DETERMINATION OF ATHEROSCLEROTIC PLAQUE TY...
- Publication number 20090036770
- Publication date Feb 5, 2009
- The General Hospital Corporation
- Guillermo J. Tearney
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE
Information Patent Application
GENERATING MODEL SIGNALS FOR INTERFEROMETRY
- Publication number 20090021723
- Publication date Jan 22, 2009
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
Interferometry Method for Ellipsometry, Reflectometry, and Scattero...
- Publication number 20090015844
- Publication date Jan 15, 2009
- PETER J. DE GROOT
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...
- Publication number 20080266574
- Publication date Oct 30, 2008
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
IMAGE FORMING APPARATUS FOR FORMING IMAGE ON RECORD MEDIUM
- Publication number 20080252896
- Publication date Oct 16, 2008
- Kabushiki Kaisha Toshiba
- Hiromichi Hayashihara
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND SYSTEM FOR ANALYZING LOW-COHERENCE INTERFEROMETRY SIGNAL...
- Publication number 20080221837
- Publication date Sep 11, 2008
- Zygo Corporation
- Peter De Groot
- G01 - MEASURING TESTING
Information Patent Application
SCANNING INTERFEROMETRY FOR THIN FILM THICKNESS AND SURFACE MEASURE...
- Publication number 20080180694
- Publication date Jul 31, 2008
- Zygo Corporation
- Peter J. de Groot
- G02 - OPTICS
Information Patent Application
APPARATUS AND METHOD FOR MEASURING CHARACTERISTICS OF SURFACE FEATURES
- Publication number 20080174784
- Publication date Jul 24, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
INTERFEROMETRY FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE...
- Publication number 20080088849
- Publication date Apr 17, 2008
- Zygo Corporation
- Xavier Colonna De Lega
- G01 - MEASURING TESTING
Information Patent Application
PROFILING COMPLEX SURFACE STRUCTURES USING SCANNING INTERFEROMETRY
- Publication number 20080065350
- Publication date Mar 13, 2008
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Interferometry Method for Ellipsometry, Reflectometry, and Scattero...
- Publication number 20070247637
- Publication date Oct 25, 2007
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Profiling complex surface structures using height scanning interfer...
- Publication number 20070097380
- Publication date May 3, 2007
- Peter J. De Groot
- G01 - MEASURING TESTING
Information Patent Application
Interferometry method for ellipsometry, reflectometry, and scattero...
- Publication number 20070081167
- Publication date Apr 12, 2007
- Peter J. De Groot
- G01 - MEASURING TESTING

Matching signals with a database

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Method and system for measuring a surface of an object comprising d...

Method and system for measuring a surface of an object comprising d...

Optical coherence tomography (OCT) apparatus and OCT method for axi...

Measurement device employing color appearing due to interference of...

Method for assessing the condition of a tissue sample with coherent...

Method and system for regional phase unwrapping with pattern-assist...

Method for measuring characteristics of sample

Program for correcting data measured by PS-OCT and PS-OCT system eq...

Method and apparatus for processing the signal in spectral domain i...

Method and apparatus for determining a property of a surface

Measuring apparatus, measuring method, and method of manufacturing...

Optical three-dimensional structure measuring device and structure...

Film thickness measuring apparatus using interference and film thic...

Method and apparatus for determination of atherosclerotic plaque ty...

Analyzing surface structure using scanning interferometry

Interferometric analysis of under-resolved features

Method and apparatus for determination of atherosclerotic plaque ty...

Memory-based high-speed interferometer

Interferometer with multiple modes of operation for determining cha...

Interferometer and method for measuring characteristics of opticall...

Apparatus and method for measuring characteristics of surface features

Interferometry for determining characteristics of an object surface...

Method and apparatus for determination of atherosclerotic plaque ty...

Dental optical coherence tomograph

Interferometry method for ellipsometry, reflectometry, and scattero...

Interferometer and method for measuring characteristics of opticall...

Generating model signals for interferometry

Interferometer with multiple modes of operation for determining cha...

Signal processing using non-linear regression with a sinusoidal model

Method and system for analyzing low-coherence interferometry signal...

Patents Applicationslast 30 patents

METHOD AND SYSTEM FOR MEASURING A SURFACE OF AN OBJECT COMPRISING D...

PROGRAM FOR CORRECTING DATA MEASURED BY PS-OCT AND PS-OCT SYSTEM EQ...

METHOD AND APPARATUS FOR DETERMINING A PROPERTY OF A SURFACE

MEASURING APPARATUS, MEASURING METHOD, AND METHOD OF MANUFACTURING...

SURFACE SHAPE MEASUREMENT METHOD AND MEASUREMENT APPARATUS

Thin Films And Surface Topography Measurement Using Reduced Library

APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY...

FILM THICKNESS MEASURING APPARATUS USING INTERFERENCE AND FILM THIC...

OPTICAL THREE-DIMENSIONAL STRUCTURE MEASURING DEVICE AND STRUCTURE...

INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...

INTERFEROMETER WITH MULTIPLE MODES OF OPERATION FOR DETERMINING CHA...

ANALYZING SURFACE STRUCTURE USING SCANNING INTERFEROMETRY

INTERFEROMETRIC ANALYSIS OF UNDER-RESOLVED FEATURES

Memory-Based High-Speed Interferometer

Dental Optical Coherence Tomograph

APPARATUSES, SYSTEMS, AND METHODS FOR LOW-COHERENCE INTERFEROMETRY...

METHOD AND APPARATUS FOR DETERMINATION OF ATHEROSCLEROTIC PLAQUE TY...

METHOD AND APPARATUS FOR DETERMINATION OF ATHEROSCLEROTIC PLAQUE TY...

GENERATING MODEL SIGNALS FOR INTERFEROMETRY

Interferometry Method for Ellipsometry, Reflectometry, and Scattero...

INTERFEROMETER AND METHOD FOR MEASURING CHARACTERISTICS OF OPTICALL...

IMAGE FORMING APPARATUS FOR FORMING IMAGE ON RECORD MEDIUM

METHOD AND SYSTEM FOR ANALYZING LOW-COHERENCE INTERFEROMETRY SIGNAL...

SCANNING INTERFEROMETRY FOR THIN FILM THICKNESS AND SURFACE MEASURE...

APPARATUS AND METHOD FOR MEASURING CHARACTERISTICS OF SURFACE FEATURES

INTERFEROMETRY FOR DETERMINING CHARACTERISTICS OF AN OBJECT SURFACE...

PROFILING COMPLEX SURFACE STRUCTURES USING SCANNING INTERFEROMETRY

Interferometry Method for Ellipsometry, Reflectometry, and Scattero...

Profiling complex surface structures using height scanning interfer...

Interferometry method for ellipsometry, reflectometry, and scattero...