Means for establishing or regulating a desired environmental condition within a sample chamber

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GPHYSICS G01Measuring instruments G01QSCANNING-PROBE TECHNIQUES OR APPARATUS APPLICATIONS OF SCANNING-PROBE TECHNIQUES G01Q30/00Auxiliary means serving to assist or improve the scanning probe techniques or apparatus

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G01Q30/08Means for establishing or regulating a desired environmental condition within a sample chamber

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Patents Grantslast 30 patents

Information Patent Grant
Sealed AFM cell
- Patent number 9,110,093
- Issue date Aug 18, 2015
- National University Corporation Kanazawa University
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Device and method for scanning probe microscopy
- Patent number 7,810,166
- Issue date Oct 5, 2010
- Nambition GmbH
- Jens Struckmeier
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Environmental scanning probe microscope
- Patent number 7,076,996
- Issue date Jul 18, 2006
- Veeco Instruments Inc.
- Stephen M. Markakis
- G01 - MEASURING TESTING
Information Patent Grant
Scanning force microscope
- Patent number 5,319,960
- Issue date Jun 14, 1994
- Topometrix
- Ronald C. Gamble
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 5,296,704
- Issue date Mar 22, 1994
- Olympus Optical Co., Ltd.
- Shuzo Mishima
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Scanning tunneling microscope
- Patent number 5,055,680
- Issue date Oct 8, 1991
- LK Technologies, Inc.
- Larry Kesmodel
- B82 - NANO-TECHNOLOGY
Information Patent Grant
Tunnel unit and scanning head for scanning tunneling microscope
- Patent number 4,947,042
- Issue date Aug 7, 1990
- Mitsubishi Denki Kabushiki Kaisha
- Tadashi Nishioka
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
DISCHARGE MEMBER FOR ANALYSIS
- Publication number 20150153386
- Publication date Jun 4, 2015
- NITTO DENKO CORPORATION
- Youhei Maeno
- G01 - MEASURING TESTING
Information Patent Application
SEALED AFM CELL
- Publication number 20140289910
- Publication date Sep 25, 2014
- Takeshi Fukuma
- B82 - NANO-TECHNOLOGY
Information Patent Application
Device and Method for Scanning Probe Microscopy
- Publication number 20080072665
- Publication date Mar 27, 2008
- NAMBITION GMBH
- Jens Struckmeier
- G01 - MEASURING TESTING
Information Patent Application
Scanning-type probe microscope
- Publication number 20070012873
- Publication date Jan 18, 2007
- TOUDAI TLO, Ltd.
- Kenjiro Miyano
- G01 - MEASURING TESTING
Information Patent Application
Atomic force microscope tip holder for imaging in liquid
- Publication number 20050241392
- Publication date Nov 3, 2005
- Yuri L. Lyubchenko
- G01 - MEASURING TESTING
Information Patent Application
Environmental scanning probe microscope
- Publication number 20040083799
- Publication date May 6, 2004
- Veeco Instruments, Inc.
- Stephen M. Markakis
- G01 - MEASURING TESTING
Information Patent Application
Method and device for checking and examining the inside surface of...
- Publication number 20040028168
- Publication date Feb 12, 2004
- Alexandr Leonidovich Suvorov
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...