measure of energy-dispersion spectrum of diffracted radiation

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CPC
G01N2223/0563

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Parent Industries

GPHYSICS G01Measuring instruments G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES G01N2223/00Investigating materials by wave or particle radiation

Current Industry

G01N2223/0563measure of energy-dispersion spectrum of diffracted radiation

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring short-wavelength characteristic X-r...
- Patent number 12,099,025
- Issue date Sep 24, 2024
- THE 59TH INSTITUTE OF CHINA ORDNANCE INDUSTRY
- Lin Zheng
- G01 - MEASURING TESTING
Information Patent Grant
Screening system
- Patent number 11,913,890
- Issue date Feb 27, 2024
- Halo X Ray Technologies Limited
- Anthony Dicken
- G01 - MEASURING TESTING
Information Patent Grant
X-ray measurement apparatus and X-ray measurement method
- Patent number 11,788,976
- Issue date Oct 17, 2023
- Jeol Ltd.
- Takanori Murano
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
X-ray analysis device including a spectrometer to detect characteri...
- Patent number 11,740,190
- Issue date Aug 29, 2023
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
Energy-dispersive X-ray diffraction analyser comprising a substanti...
- Patent number 11,614,414
- Issue date Mar 28, 2023
- COMMONWEALTH SCIENTIFIC AND INDUSTRIAL RESEARCH ORGANISATION
- James Richard Tickner
- G01 - MEASURING TESTING
Information Patent Grant
Analytical method and apparatus
- Patent number 11,536,675
- Issue date Dec 27, 2022
- Jeol Ltd.
- Takanori Murano
- G01 - MEASURING TESTING
Information Patent Grant
X-ray diffraction and X-ray spectroscopy method and related apparatus
- Patent number 11,105,756
- Issue date Aug 31, 2021
- NINGBO GALAXY MATERIALS TECHNOLOGY CO. LTD.
- Xiao-dong Xiang
- G01 - MEASURING TESTING
Information Patent Grant
X-ray spectroscopic analysis apparatus and elementary analysis method
- Patent number 10,948,434
- Issue date Mar 16, 2021
- Shimadzu Corporation
- Kenji Sato
- G01 - MEASURING TESTING
Information Patent Grant
High resolution X-ray diffraction method and apparatus
- Patent number 10,753,890
- Issue date Aug 25, 2020
- Malvern Panalytical B.V.
- Detlef Beckers
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
- Patent number 10,648,932
- Issue date May 12, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
- Patent number 10,620,141
- Issue date Apr 14, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Measuring and analyzing residual stresses and their gradients in ma...
- Patent number 10,613,042
- Issue date Apr 7, 2020
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Grant
Closed-loop control of X-ray knife edge
- Patent number 10,386,313
- Issue date Aug 20, 2019
- BRUKER JV ISRAEL LTD.
- Isaac Mazor
- G01 - MEASURING TESTING
Information Patent Grant
X-ray computed tomography apparatus, medical image processing appar...
- Patent number 10,001,568
- Issue date Jun 19, 2018
- Toshiba Medical Systems Corporation
- Manabu Teshigawara
- A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE

Patents Applicationslast 30 patents

Information Patent Application
X-RAY ANALYZER
- Publication number 20240361261
- Publication date Oct 31, 2024
- Shimadzu Corporation
- Keijiro SUZUKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE
- Publication number 20240302303
- Publication date Sep 12, 2024
- MALVERN PANALYTICAL B.V.
- Milen GATESHKI
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS
- Publication number 20240280515
- Publication date Aug 22, 2024
- Sigray, Inc.
- Wenbing Yun
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Application
AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED...
- Publication number 20220057343
- Publication date Feb 24, 2022
- Commonwealth Scientific and Industrial Research Organisation
- James Richard TICKNER
- G01 - MEASURING TESTING
Information Patent Application
X-RAY ANALYSIS DEVICE AND X-RAY ANALYSIS METHOD
- Publication number 20210372953
- Publication date Dec 2, 2021
- Shimadzu Corporation
- Kenji SATO
- G01 - MEASURING TESTING
Information Patent Application
X-RAY DIFFRACTION AND X-RAY SPECTROSCOPY METHOD AND RELATED APPARATUS
- Publication number 20200158667
- Publication date May 21, 2020
- NINGBO INFINITE MATERIALS TECHNOLOGY CO., LTD.
- Xiao-dong XIANG
- G01 - MEASURING TESTING
Information Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
- Publication number 20190094158
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
- Publication number 20190094160
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...
- Publication number 20190094159
- Publication date Mar 28, 2019
- International Business Machines Corporation
- Madhana Sunder
- G01 - MEASURING TESTING
Information Patent Application
X-RAY SPECTROSCOPIC ANALYSIS APPARATUS AND ELEMENTARY ANALYSIS METHOD
- Publication number 20170160213
- Publication date Jun 8, 2017
- Shimadzu Corporation
- Kenji SATO
- G01 - MEASURING TESTING

measure of energy-dispersion spectrum of diffracted radiation

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring short-wavelength characteristic X-r...

Screening system

X-ray measurement apparatus and X-ray measurement method

X-ray analysis device including a spectrometer to detect characteri...

Energy-dispersive X-ray diffraction analyser comprising a substanti...

Analytical method and apparatus

X-ray diffraction and X-ray spectroscopy method and related apparatus

X-ray spectroscopic analysis apparatus and elementary analysis method

High resolution X-ray diffraction method and apparatus

Measuring and analyzing residual stresses and their gradients in ma...

Measuring and analyzing residual stresses and their gradients in ma...

Measuring and analyzing residual stresses and their gradients in ma...

Closed-loop control of X-ray knife edge

X-ray computed tomography apparatus, medical image processing appar...

Patents Applicationslast 30 patents

X-RAY ANALYZER

X-RAY APPARATUS AND METHOD FOR ANALYSING A SAMPLE

X-RAY DETECTOR SYSTEM WITH AT LEAST TWO STACKED FLAT BRAGG DIFFRACTORS

AN ENERGY DISPERSIVE X-RAY DIFFRACTION ANALYSER HAVING AN IMPROVED...

X-RAY ANALYSIS DEVICE AND X-RAY ANALYSIS METHOD

X-RAY DIFFRACTION AND X-RAY SPECTROSCOPY METHOD AND RELATED APPARATUS

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...

MEASURING AND ANALYZING RESIDUAL STRESSES AND THEIR GRADIENTS IN MA...

X-RAY SPECTROSCOPIC ANALYSIS APPARATUS AND ELEMENTARY ANALYSIS METHOD