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Beam current sensor
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Patent number 4,687,987
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Issue date Aug 18, 1987
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The United States of America as represented by the United States Department o...
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Moyses Kuchnir
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G01 - MEASURING TESTING
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Ion flux density probe
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Patent number 4,251,775
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Issue date Feb 17, 1981
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Santek, Inc.
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Thomas J. Michel
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G01 - MEASURING TESTING
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Ion-controlled diode
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Patent number 4,103,227
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Issue date Jul 25, 1978
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University of Pennsylvania
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Jay N. Zemel
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G01 - MEASURING TESTING
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3916305
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Patent number 3,916,305
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Issue date Oct 28, 1975
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G01 - MEASURING TESTING
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3916304
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Patent number 3,916,304
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Issue date Oct 28, 1975
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G01 - MEASURING TESTING
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3857090
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Patent number 3,857,090
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Issue date Dec 24, 1974
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G01 - MEASURING TESTING
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3851229
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Patent number 3,851,229
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Issue date Nov 26, 1974
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G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
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3566233
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Patent number 3,566,233
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Issue date Feb 23, 1971
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A61 - MEDICAL OR VETERINARY SCIENCE HYGIENE