Measuring dielectric properties

Industry

CPC
G01R27/2617

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Parent Industries

GPHYSICS G01Measuring instruments G01RMEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES G01R27/00Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom

Current Industry

G01R27/2617Measuring dielectric properties

Industries

Patents Grantslast 30 patents

Information Patent Grant
Device and method for measuring characteristics of a wafer
- Patent number 12,117,489
- Issue date Oct 15, 2024
- Taiwan Semiconductor Manufacturing Company Ltd.
- Yung-Shun Chen
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant measurement method, dielectric measurement devi...
- Patent number 12,025,642
- Issue date Jul 2, 2024
- Nippon Telegraph and Telephone Corporation
- Teruo Jo
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure and testing method thereof
- Patent number 11,942,380
- Issue date Mar 26, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ming-Shiang Lin
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method for calculating dielectric versus air void content relations...
- Patent number 11,835,558
- Issue date Dec 5, 2023
- Geophysical Survey Systems, Inc.
- Roger Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for determining a distance in a conducting structure
- Patent number 11,644,558
- Issue date May 9, 2023
- Astyx MPS GmbH
- Andre Giere
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Grant
Method of calculating dielectric constant and dielectric loss of po...
- Patent number 11,579,109
- Issue date Feb 14, 2023
- Nan Ya Plastics Corporation
- Te-Chao Liao
- G01 - MEASURING TESTING
Information Patent Grant
Method for process monitoring
- Patent number 11,543,279
- Issue date Jan 3, 2023
- ENDRESS+HAUSER SE+CO.KG
- Armin Wernet
- G01 - MEASURING TESTING
Information Patent Grant
Method for calculating dielectric versus air void content relations...
- Patent number 11,513,146
- Issue date Nov 29, 2022
- Geophysical Survey Systems, Inc.
- Roger Roberts
- G01 - MEASURING TESTING
Information Patent Grant
Complex dielectric sensor
- Patent number 11,415,612
- Issue date Aug 16, 2022
- METER Group, Inc. USA
- Paolo Castiglione
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for determining a distance in a conducting structure
- Patent number 11,275,167
- Issue date Mar 15, 2022
- Astyx MPS GmbH
- Andre Giere
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Grant
Printed circuit board signal layer testing
- Patent number 11,191,152
- Issue date Nov 30, 2021
- Hewlett Packard Enterprise Development LP
- Elene Chobanyan
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for liquid crystal dielectric constant, measuring...
- Patent number 11,112,440
- Issue date Sep 7, 2021
- BOE Technology Group Co., Ltd.
- Yongchun Lu
- G01 - MEASURING TESTING
Information Patent Grant
Method for detecting and transmitting dormant failure information
- Patent number 11,005,258
- Issue date May 11, 2021
- Thales
- Mathieu Mairie
- G01 - MEASURING TESTING
Information Patent Grant
Method for calculating dielectric constant of particle-dispersed co...
- Patent number 10,883,952
- Issue date Jan 5, 2021
- Shiraishi Kogyo Kaisha, Ltd.
- Jusuke Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Semiconductor structure and testing method thereof
- Patent number 10,818,562
- Issue date Oct 27, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ming-Shiang Lin
- G01 - MEASURING TESTING
Information Patent Grant
Differential capacitive probe for measuring contact resistance
- Patent number 10,816,583
- Issue date Oct 27, 2020
- The Boeing Company
- Shahriar Khosravani
- G01 - MEASURING TESTING
Information Patent Grant
Electrically controllable radio-frequency circuit element having an...
- Patent number 10,804,587
- Issue date Oct 13, 2020
- ALCATEL LUCENT
- Senad Bulja
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Well monitoring with optical electromagnetic sensing system
- Patent number 10,704,377
- Issue date Jul 7, 2020
- Halliburton Energy Services, Inc.
- David A. Barfoot
- G01 - MEASURING TESTING
Information Patent Grant
Measuring device for determining a distance in a conducting structure
- Patent number 10,436,889
- Issue date Oct 8, 2019
- ASTYX GmbH
- Andre Giere
- G01 - MEASURING TESTING
Information Patent Grant
Dielectric constant measurement method for powder in powder-dispers...
- Patent number 10,422,763
- Issue date Sep 24, 2019
- Shiraishi Kogyo Kaisha, Ltd.
- Jusuke Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Multichannel fuel cell test station
- Patent number 10,359,456
- Issue date Jul 23, 2019
- Korea Institute of Energy Research
- Young Gi Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Capacitive sensor
- Patent number 10,337,849
- Issue date Jul 2, 2019
- Bando Chemical Industries, Ltd.
- Hideo Otaka
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Glass-sealed electrode
- Patent number 10,330,622
- Issue date Jun 25, 2019
- OneSubsea IP UK Limited
- Jean-Francois Noel
- C03 - GLASS MINERAL OR SLAG WOOL
Information Patent Grant
Method for measuring quick changes in low surface conductivity of d...
- Patent number 10,317,450
- Issue date Jun 11, 2019
- Palacky University Olomouc
- Petr Frycák
- G01 - MEASURING TESTING
Information Patent Grant
Film structure and its measuring method, display substrate and its...
- Patent number 10,139,441
- Issue date Nov 27, 2018
- BOE Technology Group Co., Ltd.
- Yujun Zhang
- G02 - OPTICS
Information Patent Grant
Test structures for dielectric reliability evaluations
- Patent number 10,103,060
- Issue date Oct 16, 2018
- GLOBALFOUNDRIES Inc.
- David G. Brochu
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus and method for evaluating non-ceramic insulators with con...
- Patent number 10,073,131
- Issue date Sep 11, 2018
- Electric Power Research Institute, Inc.
- Andrew John Phillips
- G01 - MEASURING TESTING
Information Patent Grant
Electrochromic cell for radio-frequency applications
- Patent number 10,033,080
- Issue date Jul 24, 2018
- Alcatel Lucent
- Senad Bulja
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for detecting voltage dependence in insulation sy...
- Patent number 10,001,520
- Issue date Jun 19, 2018
- AVO Multi-Amp Corporation
- Nils Peter Werelius
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of complex dielectric constant and permeability
- Patent number 9,952,269
- Issue date Apr 24, 2018
- Kerim Akel
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
DEVICE FOR MEASURING FREQUENCY RESPONSE OF A WAFER
- Publication number 20240369627
- Publication date Nov 7, 2024
- Taiwan Semiconductor Manufacturing company Ltd.
- YUNG-SHUN CHEN
- H03 - BASIC ELECTRONIC CIRCUITRY
Information Patent Application
DIAGNOSTIC DEVICE FOR THE CHARACTERIZATION OF ELECTROMAGNETIC MATER...
- Publication number 20230243900
- Publication date Aug 3, 2023
- Government of the United States, as represented by the Secretary of the Air F...
- Andrew J. Hamilton
- G01 - MEASURING TESTING
Information Patent Application
Methods for Calculating a Relative Change in Percent Voids using El...
- Publication number 20230194588
- Publication date Jun 22, 2023
- Geophysical Survey Systems, Inc.
- Roger Roberts
- G01 - MEASURING TESTING
Information Patent Application
Dielectric Constant Measurement Method, Dielectric Measurement Devi...
- Publication number 20230038341
- Publication date Feb 9, 2023
- Nippon Telegraph and Telephone Corporation
- Teruo Jo
- G01 - MEASURING TESTING
Information Patent Application
RATING SUBSTRATE SUPPORT ASSEMBLIES BASED ON IMPEDANCE CIRCUIT ELEC...
- Publication number 20220238300
- Publication date Jul 28, 2022
- Applied Materials, Inc.
- Arvind Shankar Raman
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method for Calculating Dielectric Versus Air Void Content Relations...
- Publication number 20220236309
- Publication date Jul 28, 2022
- Geophysical Survey Systems, Inc.
- Roger Roberts
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR DETERMINING A DISTANCE IN A CONDUCTING STRUCTURE
- Publication number 20220155431
- Publication date May 19, 2022
- Astyx MPS GmbH
- Andre Giere
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Application
SEMICONDUCTOR STRUCTURE AND TESTING METHOD THEREOF
- Publication number 20210057290
- Publication date Feb 25, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Shiang LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PRINTED CIRCUIT BOARD SIGNAL LAYER TESTING
- Publication number 20200236777
- Publication date Jul 23, 2020
- HEWLETT PACKARD ENTERPRISE DEVELOPMENT LP
- Elene Chobanyan
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
DIFFERENTIAL CAPACITIVE PROBE FOR MEASURING CONTACT RESISTANCE
- Publication number 20200166554
- Publication date May 28, 2020
- The Boeing Company
- Shahriar Khosravani
- G01 - MEASURING TESTING
Information Patent Application
METHOD FOR PROCESS MONITORING
- Publication number 20200158554
- Publication date May 21, 2020
- Endress+Hauser SE+Co. KG
- Armin Wernet
- G01 - MEASURING TESTING
Information Patent Application
Electrical Extraction of Piezoelectric Constants
- Publication number 20200141990
- Publication date May 7, 2020
- UNITED ARAB EMIRATES UNIVERSITY
- Mahmoud F. Y. Al Ahmad
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR DETERMINING A DISTANCE IN A CONDUCTING STRUCTURE
- Publication number 20200033466
- Publication date Jan 30, 2020
- ASTYX GMBH
- Andre GIERE
- F15 - FLUID-PRESSURE ACTUATORS HYDRAULICS OR PNEUMATICS IN GENERAL
Information Patent Application
SEMICONDUCTOR STRUCTURE AND TESTING METHOD THEREOF
- Publication number 20190164850
- Publication date May 30, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ming-Shiang LIN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRICALLY CONTROLLABLE RADIO-FREQUENCY CIRCUIT ELEMENT HAVING AN...
- Publication number 20180301783
- Publication date Oct 18, 2018
- ALCATEL LUCENT
- Senad Bulja
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR CALCULATING DIELECTRIC CONSTANT OF PARTICLE-DISPERSED CO...
- Publication number 20180292343
- Publication date Oct 11, 2018
- SHIRAISHI KOGYO KAISHA, LTD.
- Jusuke Hidaka
- G01 - MEASURING TESTING
Information Patent Application
DIELECTRIC CONSTANT MEASUREMENT METHOD FOR POWDER IN POWDER-DISPERS...
- Publication number 20180284173
- Publication date Oct 4, 2018
- SHIRAISHI KOGYO KAISHA, LTD.
- Jusuke Hidaka
- G01 - MEASURING TESTING
Information Patent Application
MULTICHANNEL FUEL CELL TEST STATION
- Publication number 20180210019
- Publication date Jul 26, 2018
- Korea Institute Of Energy Research
- Young Gi Yoon
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR DETERMINING A RELATIVE DIELECTRIC CONSTANT AND DETECTION...
- Publication number 20180100944
- Publication date Apr 12, 2018
- VALLON GMBH
- Jan Fahlbusch
- G01 - MEASURING TESTING
Information Patent Application
CAPACITIVE SENSOR
- Publication number 20170350686
- Publication date Dec 7, 2017
- BANDO CHEMICAL INDUSTRIES, LTD.
- Hideo OTAKA
- G01 - MEASURING TESTING
Information Patent Application
FILM STRUCTURE AND ITS MEASURING METHOD, DISPLAY SUBSTRATE AND ITS...
- Publication number 20170122992
- Publication date May 4, 2017
- BOE TECHNOLOGY GROUP CO., LTD.
- Yujun Zhang
- G01 - MEASURING TESTING
Information Patent Application
MEASURING DEVICE FOR DETERMINING A DISTANCE IN A CONDUCTING STRUCTURE
- Publication number 20160282459
- Publication date Sep 29, 2016
- ASTYX GMBH
- Andre GIERE
- G01 - MEASURING TESTING
Information Patent Application
PLANAR TRANSMISSION-LINE PERMITTIVITY SENSOR AND CALIBRATION METHOD...
- Publication number 20160187402
- Publication date Jun 30, 2016
- The United States of America, as Represented by the Secretary of Agriculture
- Jochem T. Roelvink
- G01 - MEASURING TESTING
Information Patent Application
Electrical Capacitance Volume Tomography Sensor for Inspection of P...
- Publication number 20160161436
- Publication date Jun 9, 2016
- Tech4Imaging LLC
- Qussai Marashdeh
- G01 - MEASURING TESTING
Information Patent Application
PLANAR STRUCTURE CHARACTERISTICS OBTAINED WITH LOOK UP TABLES
- Publication number 20140236512
- Publication date Aug 21, 2014
- Hewlett-Packard Development Company, L.P.
- John Yan
- G01 - MEASURING TESTING
Information Patent Application
DIELECTRIC ELASTOMER SELF-SENSING USING PLANE APPROXIMATION
- Publication number 20130285577
- Publication date Oct 31, 2013
- Auckland UniServices Limited
- Benjamin Marc O'Brien
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR MEASURING THE DISSIPATION FACTOR OF AN INS...
- Publication number 20130106442
- Publication date May 2, 2013
- TECHIMP TECHNOLOGIES S.R.L.
- Stefano Rolli
- G01 - MEASURING TESTING
Information Patent Application
ON-LINE MONITORING SYSTEM OF INSULATION LOSSES FOR UNDERGROUND POWE...
- Publication number 20120299603
- Publication date Nov 29, 2012
- ELECTRIC POWER RESEARCH INSTITUTE, INC.
- Tiebin Zhao
- G01 - MEASURING TESTING
Information Patent Application
Monitored Filament Insertion for Resitivity Testing
- Publication number 20120139739
- Publication date Jun 7, 2012
- Todd Bishop
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
METHOD AND DEVICE FOR MEASURING PERMITTIVITY AND/OR PERMEABILITY
- Publication number 20120098554
- Publication date Apr 26, 2012
- Commissariat A L'Energie Atomique et Aux Energies Alternatives
- Ludovic Fourneaud
- G01 - MEASURING TESTING

Measuring dielectric properties

Industry

Parent Industries

Current Industry

Patents Grantslast 30 patents

Device and method for measuring characteristics of a wafer

Dielectric constant measurement method, dielectric measurement devi...

Semiconductor structure and testing method thereof

Method for calculating dielectric versus air void content relations...

Measuring device for determining a distance in a conducting structure

Method of calculating dielectric constant and dielectric loss of po...

Method for process monitoring

Method for calculating dielectric versus air void content relations...

Complex dielectric sensor

Measuring device for determining a distance in a conducting structure

Printed circuit board signal layer testing

Measuring device for liquid crystal dielectric constant, measuring...

Method for detecting and transmitting dormant failure information

Method for calculating dielectric constant of particle-dispersed co...

Semiconductor structure and testing method thereof

Differential capacitive probe for measuring contact resistance

Electrically controllable radio-frequency circuit element having an...

Well monitoring with optical electromagnetic sensing system

Measuring device for determining a distance in a conducting structure

Dielectric constant measurement method for powder in powder-dispers...

Multichannel fuel cell test station

Capacitive sensor

Glass-sealed electrode

Method for measuring quick changes in low surface conductivity of d...

Film structure and its measuring method, display substrate and its...

Test structures for dielectric reliability evaluations

Apparatus and method for evaluating non-ceramic insulators with con...

Electrochromic cell for radio-frequency applications

System and method for detecting voltage dependence in insulation sy...

Measurement of complex dielectric constant and permeability

Patents Applicationslast 30 patents

DEVICE FOR MEASURING FREQUENCY RESPONSE OF A WAFER

DIAGNOSTIC DEVICE FOR THE CHARACTERIZATION OF ELECTROMAGNETIC MATER...

Methods for Calculating a Relative Change in Percent Voids using El...

Dielectric Constant Measurement Method, Dielectric Measurement Devi...

RATING SUBSTRATE SUPPORT ASSEMBLIES BASED ON IMPEDANCE CIRCUIT ELEC...

Method for Calculating Dielectric Versus Air Void Content Relations...

MEASURING DEVICE FOR DETERMINING A DISTANCE IN A CONDUCTING STRUCTURE

SEMICONDUCTOR STRUCTURE AND TESTING METHOD THEREOF

PRINTED CIRCUIT BOARD SIGNAL LAYER TESTING

DIFFERENTIAL CAPACITIVE PROBE FOR MEASURING CONTACT RESISTANCE

METHOD FOR PROCESS MONITORING

Electrical Extraction of Piezoelectric Constants

MEASURING DEVICE FOR DETERMINING A DISTANCE IN A CONDUCTING STRUCTURE

SEMICONDUCTOR STRUCTURE AND TESTING METHOD THEREOF

ELECTRICALLY CONTROLLABLE RADIO-FREQUENCY CIRCUIT ELEMENT HAVING AN...

METHOD FOR CALCULATING DIELECTRIC CONSTANT OF PARTICLE-DISPERSED CO...

DIELECTRIC CONSTANT MEASUREMENT METHOD FOR POWDER IN POWDER-DISPERS...

MULTICHANNEL FUEL CELL TEST STATION

METHOD FOR DETERMINING A RELATIVE DIELECTRIC CONSTANT AND DETECTION...

CAPACITIVE SENSOR

FILM STRUCTURE AND ITS MEASURING METHOD, DISPLAY SUBSTRATE AND ITS...

MEASURING DEVICE FOR DETERMINING A DISTANCE IN A CONDUCTING STRUCTURE

PLANAR TRANSMISSION-LINE PERMITTIVITY SENSOR AND CALIBRATION METHOD...

Electrical Capacitance Volume Tomography Sensor for Inspection of P...

PLANAR STRUCTURE CHARACTERISTICS OBTAINED WITH LOOK UP TABLES

DIELECTRIC ELASTOMER SELF-SENSING USING PLANE APPROXIMATION

APPARATUS AND METHOD FOR MEASURING THE DISSIPATION FACTOR OF AN INS...

ON-LINE MONITORING SYSTEM OF INSULATION LOSSES FOR UNDERGROUND POWE...

Monitored Filament Insertion for Resitivity Testing

METHOD AND DEVICE FOR MEASURING PERMITTIVITY AND/OR PERMEABILITY