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Measuring electromagnetic field characteristics
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G01R29/08
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PHYSICS
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Measuring instruments
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MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES
G01R29/00
Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
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G01R29/08
Measuring electromagnetic field characteristics
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Patents Grants
last 30 patents
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Patent Grant
Self-resetting single flux-quantum microwave photodetector
Patent number
11,982,700
Issue date
May 14, 2024
Teknologian tutkimuskeskus VTT Oy
Joonas Govenius
G01 - MEASURING TESTING
Information
Patent Grant
Over-the-air testing of millimeter wave antenna receiver arrays
Patent number
11,982,699
Issue date
May 14, 2024
National Instruments Corporation
Martin Obermaier
G01 - MEASURING TESTING
Information
Patent Grant
Measuring radio frequency electromagnetic waves using circular pola...
Patent number
11,977,107
Issue date
May 7, 2024
Quantum Valley Ideas Laboratories
Su-Peng Yu
G01 - MEASURING TESTING
Information
Patent Grant
Optical inspection of the varactor diodes in varactor metasurface a...
Patent number
11,978,958
Issue date
May 7, 2024
KYMETA CORPORATION
Hussein Esfahlani
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Antenna for use with lightning detection sensor
Patent number
11,971,438
Issue date
Apr 30, 2024
Earth Networks, Inc.
Michael Stock
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Device and method for testing the function of an antenna system for...
Patent number
11,970,069
Issue date
Apr 30, 2024
Vitesco Technologies GmbH
Christoph Haggenmiller
B60 - VEHICLES IN GENERAL
Information
Patent Grant
Systems, methods, and devices for automatic signal detection based...
Patent number
11,965,922
Issue date
Apr 23, 2024
DIGITAL GLOBAL SYSTEMS, INC.
Ronald C. Dzierwa
G08 - SIGNALLING
Information
Patent Grant
Measurement system and measurement method
Patent number
11,965,921
Issue date
Apr 23, 2024
Anritsu Corporation
Hiroaki Iida
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Anechoic chamber and construction method thereof
Patent number
11,959,952
Issue date
Apr 16, 2024
BEIJING ORIENT INSTITUTE OF MEASUREMENT AND TEST
Zibin He
G01 - MEASURING TESTING
Information
Patent Grant
Radio frequency signals detection systems
Patent number
11,962,079
Issue date
Apr 16, 2024
The United States of America, as represented by the Secretary of the Navy
Zachary A. Sechrist
G01 - MEASURING TESTING
Information
Patent Grant
Device for revealing spatial variations in the polarisation of elec...
Patent number
11,959,953
Issue date
Apr 16, 2024
Office National D'Etudes et de Recherches Aerospatiales
Daniel Prost
G01 - MEASURING TESTING
Information
Patent Grant
Sense and react tunable radio frequency systems
Patent number
11,956,935
Issue date
Apr 9, 2024
The United States of America, as represented by the Secretary of the Navy
Zachary A. Sechrist
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
System and method for testing of wireless power equipment
Patent number
11,956,029
Issue date
Apr 9, 2024
nok9 AB
Laurens Swaans
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Detection of lightning and related control strategies in electric p...
Patent number
11,953,534
Issue date
Apr 9, 2024
Schweitzer Engineering Laboratories, Inc.
Cody W. Tews
H02 - GENERATION CONVERSION OR DISTRIBUTION OF ELECTRIC POWER
Information
Patent Grant
Active noise source design
Patent number
11,953,535
Issue date
Apr 9, 2024
Teknologian tutkimuskeskus VTT Oy
Mikko Varonen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Electromagnetic wave visualization device
Patent number
11,953,536
Issue date
Apr 9, 2024
PANASONIC INTELLECTUAL PROPERTY MANAGEMENT CO., LTD.
Shinichi Tanimoto
G01 - MEASURING TESTING
Information
Patent Grant
Dual-sideband microwave interferometer
Patent number
11,946,964
Issue date
Apr 2, 2024
International Business Machines Corporation
Nicolò Crescini
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Aircraft and flight controller for aircraft
Patent number
11,947,363
Issue date
Apr 2, 2024
SUBARU CORPORATION
Hiroyuki Tsubata
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Grant
Methods and apparatus for determining electromagnetic exposure comp...
Patent number
11,940,477
Issue date
Mar 26, 2024
University of Notre Dame Du Lac
Bertrand Hochwald
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Grant
Test system
Patent number
11,933,829
Issue date
Mar 19, 2024
Rohde & Schwarz GmbH & Co. KG
Corbett Rowell
G01 - MEASURING TESTING
Information
Patent Grant
Measurement method and device
Patent number
11,933,828
Issue date
Mar 19, 2024
Huawei Technologies Co., Ltd.
Yi Tang
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Radio frequency ejector pin for production testing and radio freque...
Patent number
11,927,602
Issue date
Mar 12, 2024
SPREADTRUM COMMUNICATIONS (SHENZHEN) CO., LTD.
Chuan He
G01 - MEASURING TESTING
Information
Patent Grant
Chamber for measuring performance of antenna and system including same
Patent number
11,927,614
Issue date
Mar 12, 2024
Samsung Electronics Co., Ltd.
Youngmin Lee
G01 - MEASURING TESTING
Information
Patent Grant
Mobile terminal testing device and mobile terminal testing method
Patent number
11,927,615
Issue date
Mar 12, 2024
Anritsu Corporation
Hideyuki Endo
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus, methods, and techniques of display for obscured feature...
Patent number
11,921,143
Issue date
Mar 5, 2024
Franklin Sensors Inc.
David M. Dorrough
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to use embedded patterns and S-parameters of a...
Patent number
11,921,144
Issue date
Mar 5, 2024
Keysight Technologies, Inc.
Murthy S. Murali Upmaka
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Test apparatus and test method
Patent number
11,921,140
Issue date
Mar 5, 2024
Anritsu Corporation
Tomohiko Maruo
G01 - MEASURING TESTING
Information
Patent Grant
Broadband radiation sensor based on a resonantly-coupled graphene S...
Patent number
11,921,141
Issue date
Mar 5, 2024
California Institute of Technology
Raj M. Katti
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Measurement system and method for analyzing RF signals
Patent number
11,921,142
Issue date
Mar 5, 2024
Rohde & Schwarz GmbH & Co. KG
Thomas Ruster
G01 - MEASURING TESTING
Information
Patent Grant
Phased array over the air testing
Patent number
11,916,302
Issue date
Feb 27, 2024
Tektronix, Inc.
Donald J. Dalebroux
H01 - BASIC ELECTRIC ELEMENTS
Patents Applications
last 30 patents
Information
Patent Application
POWER MEASUREMENT CIRCUIT, CHIP AND COMMUNICATION TERMINAL
Publication number
20240142506
Publication date
May 2, 2024
SHANGHAI VANCHIP TECHNOLOGIES CO., LTD.
Yongshou WANG
G01 - MEASURING TESTING
Information
Patent Application
POWER AMPLIFIERS TESTING SYSTEM AND RELATED TESTING METHOD
Publication number
20240142544
Publication date
May 2, 2024
Taiwan Semiconductor Manufacturing company Ltd.
HSIEH-HUNG HSIEH
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Application
ELECTROMAGNETIC WAVE DETECTION APPARATUS AND ELECTROMAGNETIC WAVE D...
Publication number
20240133935
Publication date
Apr 25, 2024
Kyocera Corporation
Hiroki OKADA
G01 - MEASURING TESTING
Information
Patent Application
DIAMOND SENSOR UNIT
Publication number
20240118327
Publication date
Apr 11, 2024
Sumitomo Electric Industries, Ltd.
Yoshiki NISHIBAYASHI
G01 - MEASURING TESTING
Information
Patent Application
IN-SITU ELECTRIC FIELD DETECTION METHOD AND APPARATUS
Publication number
20240118328
Publication date
Apr 11, 2024
Applied Materials, Inc.
Yue GUO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, METHODS, AND DEVICES FOR UNMANNED VEHICLE DETECTION
Publication number
20240121499
Publication date
Apr 11, 2024
Digital Global Systems, Inc.
David William Kleinbeck
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
COMPUTER-READABLE MEDIUM, INFORMATION PROCESSING METHOD, AND INFORM...
Publication number
20240110962
Publication date
Apr 4, 2024
TDK Corporation
Masataka MIDORI
G01 - MEASURING TESTING
Information
Patent Application
SPHERICAL SCANNING TYPE ANTENNA MEASUREMENT SYSTEM AND SIGNAL TRANS...
Publication number
20240110961
Publication date
Apr 4, 2024
WAVEPRO INCORPORATED
Rong-Chung Liu
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Device and Method for Improved Antenna Testing
Publication number
20240103058
Publication date
Mar 28, 2024
JCET STATS ChipPAC Korea Limited
JinHyeok Song
G01 - MEASURING TESTING
Information
Patent Application
SYSTEMS, METHODS, AND DEVICES FOR AUTOMATIC SIGNAL DETECTION BASED...
Publication number
20240103059
Publication date
Mar 28, 2024
Digital Global Systems, Inc.
Ronald C. Dzierwa
G08 - SIGNALLING
Information
Patent Application
ANTENNA MEASUREMENT USING UNMANNED AERIAL VEHICLES
Publication number
20240094744
Publication date
Mar 21, 2024
T-Mobile USA, Inc.
Michael Scott Probasco
B64 - AIRCRAFT AVIATION COSMONAUTICS
Information
Patent Application
WIDEBAND VARIABLE IMPEDANCE LOAD FOR HIGH VOLUME MANUFACTURING QUAL...
Publication number
20240094273
Publication date
Mar 21, 2024
Applied Materials, Inc.
Yue GUO
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
THIN FILM SENSOR AND MANUFACTURING METHOD THEREOF
Publication number
20240094274
Publication date
Mar 21, 2024
BOE TECHNOLOGY GROUP CO., LTD.
Feng Wang
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMAGNETIC FIELD RECEIVER
Publication number
20240094275
Publication date
Mar 21, 2024
British Telecommunications public limited company
Fraser BURTON
G01 - MEASURING TESTING
Information
Patent Application
ELECTROMETER WITH OPTICAL RYDBERG FREQUENCY TUNING
Publication number
20240085467
Publication date
Mar 14, 2024
Northrop Grumman Systems Corporation
ERIC A. IMHOF
G01 - MEASURING TESTING
Information
Patent Application
RECOMMENDED METHOD FOR REPLACING EQUIPMENT AND ELECTRONIC DEVICE
Publication number
20240077864
Publication date
Mar 7, 2024
Wistron Corporation
Chun-Hsien Li
G01 - MEASURING TESTING
Information
Patent Application
TEST SYSTEM AND APPARATUS FOR OVER-THE-AIR TESTING OF DEVICES AND A...
Publication number
20240077525
Publication date
Mar 7, 2024
UL, LLC
Maan Ghanma
G01 - MEASURING TESTING
Information
Patent Application
SPECIFIC ABSORPTION RATE DETECTION ASSEMBLY, SPECIFIC ABSORPTION RA...
Publication number
20240069084
Publication date
Feb 29, 2024
GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
Yizhou LUO
G01 - MEASURING TESTING
Information
Patent Application
SYSTEM FOR POSITIONING ANTENNA ELEMENTS OF A DUT WITHIN A QUIET ZON...
Publication number
20240069082
Publication date
Feb 29, 2024
KEYSIGHT TECHNOLOGIES, INC.
Minu Jacob
H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information
Patent Application
DETECTION DEVICE
Publication number
20240069083
Publication date
Feb 29, 2024
Innolux Corporation
Chih-Yung Hsieh
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC DEVICE AND CONTROL METHOD THEREFOR, AND NON-TRANSITORY S...
Publication number
20240072427
Publication date
Feb 29, 2024
GUANGDONG OPPO MOBILE TELECOMMUNICATIONS CORP., LTD.
Yizhou Luo
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
METHOD AND SYSTEM FOR EVALUATING RADIO PERFORMANCE
Publication number
20240056201
Publication date
Feb 15, 2024
MEDIATEK INC.
Shih-Wei HSIEH
G01 - MEASURING TESTING
Information
Patent Application
A SUPPORT STRUCTURE FOR A DEVICE UNDER TEST ALLOWING ROTATION
Publication number
20240044962
Publication date
Feb 8, 2024
Verkotan Oy
Pertti MÄKIKYRÖ
G01 - MEASURING TESTING
Information
Patent Application
MACHINE LEARNING BASED TUNING OF RADIO FREQUENCY APPARATUSES
Publication number
20240044961
Publication date
Feb 8, 2024
ViaSat, Inc.
Bala Krishna JULURI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RF Voltage and Current (V-I) Sensors and Measurement Methods
Publication number
20240038496
Publication date
Feb 1, 2024
TOKYO ELECTRON LIMITED
Barton Lane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Detecting Radio Frequency Electromagnetic Radiation Using Vapor Cel...
Publication number
20240036094
Publication date
Feb 1, 2024
Quantum Valley Ideas Laboratories
Katelyn Dixon
G01 - MEASURING TESTING
Information
Patent Application
Reflectometry Sensing
Publication number
20240027505
Publication date
Jan 25, 2024
Divirod, Inc.
Antonio Javier Marti Canales
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
SMART 3D ENERGY PROBES FOR STOCHASTIC FIELDS
Publication number
20240027506
Publication date
Jan 25, 2024
EV-TECHNOLOGIES
Sidina WANE
G01 - MEASURING TESTING
Information
Patent Application
LIGHT SENSOR PROBE
Publication number
20240019473
Publication date
Jan 18, 2024
Seikoh Giken Co., Ltd.
Ryuji OSAWA
G01 - MEASURING TESTING
Information
Patent Application
Alternative Near-Field Gradient Probe For The Suppression Of Radio...
Publication number
20240019472
Publication date
Jan 18, 2024
Tom Lavedas
G01 - MEASURING TESTING